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Zarlink Semiconductor
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Part No. |
MAR5104
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OCR Text |
... request ** Worst case galactic cosmic ray upset - interplanetary/high altitude orbit
Figure 16: Radiation Hardness Parameters
SINGLE EVENT UPSET CHARACTERISTICS
UPSET BIT CROSS-SECTION (cm2/bit)
Ion LET (MeV.cm2/mg)
Figure 1... |
Description |
RADIATION HARD 4096 x 1 BIT STATIC RAM
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File Size |
198.90K /
12 Page |
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Sony, Corp.
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Part No. |
DRM001
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OCR Text |
...alization . . . . 73 Section 6. cosmic M68HC08 Complier . . . . . . . . . . . . . . 77 Section 7. Windows(R) 95/98/NT Program (pir_plot.exe) . . . . . . . . . . . . . . . . . . . . . . . . 87 Appendix A. Fresnel Lens Mounting. . . . . . . .... |
Description |
Passive Infrared (PIR) Intruder Detection Using the MC68HC908JK1/3. Incorporating Remote Control Adjustment Using the MC68HC908GP32 被动式红外(PIR)报告的入侵检测使用MC68HC908JK1 / 3。结合远程控制调整使用海底热
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File Size |
1,932.63K /
298 Page |
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Intersil, Corp. INTERSIL[Intersil Corporation]
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Part No. |
HCS109HMSR HCS109KMSR FN2466 HCS109MS HCS109D HCS109DMSR HCS109K
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OCR Text |
...t >1010 RAD (Si)/s 20ns Pulse * cosmic Ray Upset Immunity < 2 x 10-9 Errors/Bit-Day (Typ) * Latch-Up Free Under Any Conditions * Military Temperature Range: -55oC to +125oC
* Significant Power Reduction Compared to LSTTL ICs * DC Operati... |
Description |
Radiation Hardened Dual JK Flip Flop HC/UH SERIES, DUAL POSITIVE EDGE TRIGGERED J-KBAR FLIP-FLOP, COMPLEMENTARY OUTPUT, CDIP16 Radiation Hardened Dual JK Flip Flop(抗辐射双J-K触发 辐射加固JK触发器拖鞋(抗辐射双JK触发器) From old datasheet system Flip Flop, JK, Dual, Rad-Hard, High-Speed, CMOS, Logic
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File Size |
170.33K /
9 Page |
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Intersil
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Part No. |
HCS161MS
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OCR Text |
...>10 10 rad (si)/s 20ns pulse ? cosmic ray upset immunity 2 x 10 -9 error/bit day (typ) ? latch-up free under any conditions ? military temperature range: -55 o c to +125 o c ? significant power reduction compared to lsttl ics ? dc operati... |
Description |
Counter, Synchronous, 4-Input Binary, Asnchronous Reset, Look Ahead Carry, Rad-Hard, High-Speed, CMOS, Logic
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File Size |
149.61K /
9 Page |
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it Online |
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Price and Availability
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