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TRIQUINT[TriQuint Semiconductor]
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Part No. |
TQHIP
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OCR Text |
...itivity Test Run (DST): * Yield analysis * Design Sensitivity to Process Variation * 14 Wafer Start; Spread of Vp and Cgs values
* *
*
TQHiP is a fully released and qualified process Reliability Reports * TQHiP Process Qualificatio... |
Description |
Precision, 100UA Gain Selectable Amplifier
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File Size |
116.18K /
4 Page |
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it Online |
Download Datasheet |
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TRIQUINT[TriQuint Semiconductor]
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Part No. |
TQTRX
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OCR Text |
...ty Test (DST) Wafer Run * Yield analysis * Design Sensitivity to Process Variation * 14 Wafer Start; Spread of Vp Values * *
TQTRp
Process Qualification Status
TQTRp is a fully released qualified process Reliability Reports * TQTRp P... |
Description |
Advanced Passives & MESFET Foundry Service
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File Size |
172.25K /
6 Page |
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it Online |
Download Datasheet |
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EXAR[Exar Corporation]
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Part No. |
XRDAN30
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OCR Text |
...nt Circuit at Full Scale for AC analysis
%
%$ + $
'
& Figures 3, 4 and 5.2& 3) $
& )
) $ )
1
4,
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-. -. -
Gain (dB)
Amp Main Pole P1
/01
,(% +4 2
Figure... |
Description |
CMOS Current Output D/A Converter Design Concepts for Wide Bandwidth Applications
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File Size |
126.50K /
4 Page |
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it Online |
Download Datasheet |
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INFINEON[Infineon Technologies AG]
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Part No. |
SLE66C168PE SLE66C168PEM5 SLE66C168PEC
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OCR Text |
...l attacks such as: Simple Power analysis (SPA) , Differential Power analysis (DPA), Protection against Differential Fault analysis (DFA), Electromagnetic Emanation Attack (EMA) and other possible HW or SW attacks
Peripherals: The CRC mod... |
Description |
Security & Chip Card ICs
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File Size |
59.24K /
8 Page |
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it Online |
Download Datasheet |
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Price and Availability
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