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MAXIM[Maxim Integrated Products]
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| Part No. |
MAX8557ETE
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| OCR Text |
... addition to routine production burn-In, Maxim pulls a sample from every fabrication process three times per week and subjects it to an extended burn-In prior to shipment to ensure its reliability. The reliability control level for each lot... |
| Description |
PLASTIC ENCAPSULATED DEVICES
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| File Size |
160.86K /
8 Page |
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it Online |
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MAXIM[Maxim Integrated Products]
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| Part No. |
MAX8863TEUK
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| OCR Text |
... addition to routine production burn-In, Maxim pulls a sample from every fabrication process three times per week and subjects it to an extended burn-In prior to shipment to ensure its reliability. The reliability control level for each lot... |
| Description |
PLASTIC ENCAPSULATED DEVICES
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| File Size |
139.38K /
8 Page |
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it Online |
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MAXIM - Dallas Semiconductor
MAXIM[Maxim Integrated Products]
Maxim Integrated Products, Inc.
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| Part No. |
MAX9018AEKA
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| OCR Text |
... addition to routine production burn-In, Maxim pulls a sample from every fabrication process three times per week and subjects it to an extended burn-In prior to shipment to ensure its reliability. The reliability control level for each lot... |
| Description |
PLASTIC ENCAPSULATED DEVICES
Contact Gender:Socket; Circular Shell Style:Straight Plug; Insert Arrangement:11-13 RoHS Compliant: No
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| File Size |
89.62K /
8 Page |
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it Online |
Download Datasheet |
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MAXIM[Maxim Integrated Products]
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| Part No. |
MAX9020EKA
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| OCR Text |
... addition to routine production burn-In, Maxim pulls a sample from every fabrication process three times per week and subjects it to an extended burn-In prior to shipment to ensure its reliability. The reliability control level for each lot... |
| Description |
PLASTIC ENCAPSULATED DEVICES
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| File Size |
76.01K /
6 Page |
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it Online |
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MAXIM - Dallas Semiconductor
MAXIM[Maxim Integrated Products]
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| Part No. |
MAX5028 MAX5027 MAX5026EUT MAX5025 MAX5026
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| OCR Text |
... addition to routine production burn-In, Maxim pulls a sample from every fabrication process three times per week and subjects it to an extended burn-In prior to shipment to ensure its reliability. The reliability control level for each lot... |
| Description |
500kHz 36V Output SOT23 PWM Step-Up DC-DC Converters
RELIABILITY REPORT FOR MAX5026EUT PLASTIC ENCAPSULATED DEVICES
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| File Size |
88.71K /
8 Page |
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it Online |
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INTERSIL[Intersil Corporation]
Intersil, Corp.
HARRIS SEMICONDUCTOR
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| Part No. |
HCS05DMSR FN3557 HCS05MS HCS05D HCS05HMSR HCS05K HCS05KMSR
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| OCR Text |
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TABLE 8. STATIC AND DYNAMIC burn-IN TEST CONNECTIONS OSCILLATOR OPEN GROUND VCC = 6V 0.5V 1/2 VCC = 3V 0.5V 50kHz 25kHz
STATIC burn-IN I TEST CONDITIONS (Note 1) 1, 3, 5, 7, 9, 11, 13 2, 4, 6, 8, 10, 12, 14 -
STATIC burn-IN II T... |
| Description |
Inverter, Hex, Open Drain, Rad-Hard, High-Speed, CMOS, Logic
From old datasheet system
JFET-N-CHANNEL SWITCH
Radiation Hardened Hex Inverter with Open Drain HC/UH SERIES, HEX 1-INPUT INVERT GATE, UUC14
JFET; Transistor Polarity:N Channel; Breakdown Voltage, V(br)gss:-30V; Zero Gate Voltage Drain Current Min, Idss:50mA; Gate-Source Cutoff Voltage Max, Vgs(off):-10V; Current Rating:50mA; Voltage Rating:30V
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| File Size |
106.16K /
7 Page |
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it Online |
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http://
INTERSIL[Intersil Corporation]
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| Part No. |
ACS00KMSR ACS00K FN3563 ACS00MS ACS00D ACS00DMSR ACS00HMSR
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| OCR Text |
...rn-In) PDA Interim Test 3 (Post-burn-In) PDA Final Test Group A (Note 1) Group B Subgroup B-5 Subgroup B-6 Group D NOTE: 1. Alternate Group A testing may be exercised in accordance with MIL-STD-883, Method 5005. METHOD 100%/5004 100%/5004 1... |
| Description |
Radiation Hardened Quad 2-Input NAND Gate
From old datasheet system
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| File Size |
67.98K /
8 Page |
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it Online |
Download Datasheet |
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Price and Availability
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