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MIC5377 VJ3040 AM2912PC MK13H XXX3X PI3USB10 L239EGW WSC0001
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    IRUH33P183B1M

International Rectifier
Part No. IRUH33P183B1M
OCR Text ...SCREENING LEVEL SPACE Pre Seal burn-In Nondestructive Bond Pull Internal Visual Temperature Cycle Constant Acceleration Mechanical Shock PIND Pre burn-In-Electrical burn-In Final Electrical Seal Radiographic External Visual Optional 100% 1...
Description Ultra Low Dropout Positive Fixed Linear Regulator
From old datasheet system

File Size 54.60K  /  7 Page

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    ANALOG DEVICES INC
Part No. AD847-713Q
OCR Text ...conditions. 4.2 table iii. burn-in test delta limits . table iii test burn-in lifetest delta title endpoint en dpoint limit units v os 1 1.5 0.5 mv i b 5 7.5 2.5 a i io 300 500 200 na 5.0 life test/burn-in ci...
Description OP-AMP, CDIP8

File Size 140.94K  /  5 Page

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Part No. RTAX1000SL-1CQ352EV RTAX2000S-1LG1152EV
OCR Text ...ross leak test) 1014 100% 7 pre-burn-in electrical parameters in acco rdance with applicable actel device specification 100% 8 dynamic burn-in 1015, condition d, 160 hours at 125c or 80 hours at 150c minimum 100% 9 interim (post-burn-in)...
Description FPGA, 12096 CLBS, 1000000 GATES, CQFP352
FPGA, 21504 CLBS, 2000000 GATES, CBGA1152

File Size 6,007.68K  /  198 Page

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    UBA20261T UBA20262T

NXP Semiconductors
Part No. UBA20261T UBA20262T
OCR Text ...ntrol function for preheat and burn, a timer function and prot ection circuits. the uba20261/2 are supplied using the dv/dt current charge supply circuit from the half-bridge circuit. remark: the mains voltages given in this data sheet a...
Description Step-dimmable driver IC for CFL

File Size 222.58K  /  32 Page

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    IRUH33P253B1M

International Rectifier
Part No. IRUH33P253B1M
OCR Text ...SCREENING LEVEL SPACE Pre Seal burn-In Nondestructive Bond Pull Internal Visual Temperature Cycle Constant Acceleration Mechanical Shock PIND Pre burn-In-Electrical burn-In Final Electrical Seal Radiographic External Visual Optional 100% 1...
Description Ultra Low Dropout Positive Fixed Linear Regulator
From old datasheet system

File Size 76.97K  /  8 Page

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    AD9814S

Analog Devices
Part No. AD9814S
OCR Text ... 7.0 table iii. life test / burn-in delta limits: table iii test symbol delta limit units iavdd +/-2 ma vos +/-13.2 (+/-54) mv (lsb) gain +/-0.56 (+/-91) % (lsb) +inl +/-6 lsb -inl +/-5 lsb +dnl +/-0.5 lsb ...
Description    14-Bit CCD/CIS Signal Processor
Aerospace Low Power 14-Bit, 3-Channel CCD Signal Processor with Progammable Serial Interface and Byte-Wide Data Output Format

File Size 72.78K  /  7 Page

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    IRUH33PA13A1M IRUH33PA13A1MK IRUH33PA13A1MP

International Rectifier
Part No. IRUH33PA13A1M IRUH33PA13A1MK IRUH33PA13A1MP
OCR Text ...SCREENING LEVEL SPACE Pre Seal burn-In Nondestructive Bond Pull Internal Visual Temperature Cycle Constant Acceleration Mechanical Shock PIND Pre burn-In-Electrical burn-In Final Electrical Seal Radiographic External Visual Optional 100% 1...
Description From old datasheet system
Ultra Low Dropout Positive Adjustable Linear Regulator 3.3Vin at 3.0A

File Size 52.87K  /  7 Page

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    UBA20270 UBA20270T

NXP Semiconductors
Part No. UBA20270 UBA20270T
OCR Text ...l function both for preheat and burn, a timer function and protection circuits. the uba20270 is supplied via a dv/dt current charge supply circuit from the half-bridge circuit. remark: ma in s voltages noted are ac. 2. features and bene...
Description 600 V Driver IC for dimmable compact fluorescent lamps
Dimmable controller IC for CFL

File Size 808.61K  /  32 Page

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    AOI2N60

Alpha & Omega Semiconductors
Part No. AOI2N60
OCR Text ...e reverse bias (htrb) htgb burn - in stress is used to stress gate oxide at the elevated temperature environment hence any of the gate oxide integrity issue can be identified. htrb burn - in stress is used to verify junction deg...
Description 600V, 2A N-Channel MOSFET

File Size 95.69K  /  5 Page

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