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				ON Semiconductor
Part No.	NOIH2SM1000A NOIH2SM1000A-HHC NOIH2SM1000S-HHC NOIH2SM1000S-HWC NOIH2SM1000T-HHC
OCR Text	... 100% screening is applied with burn-in limited to 168 h ? devices will be fully tested at room temperature and 85 c. ? x/y die placement is relaxed to 200 m. ? mismatching between odd and even columns in destructive readout is allowe...
Description	HAS2 Image Sensor
File Size	1,488.67K / 66 Page	View it Online	Download Datasheet

				Aeroflex Circuit Technology
Part No.	ACT-PS512K8W-012L2I ACT-PS512K8Y-017L2T ACT-PS512K8N-010L2I ACT-PS512K8X-015L2T ACT-PS512K8Y-025L2T ACT-PS512K8Y-020L2T
OCR Text	... industrial (-40c to +85c) n burn-in and temperature cycle available n 10, 12, 15, 17, 20 & 25ns access times n +5v power supply n industry standard pinouts l center power / ground pins n ttl compatible i/o n 3.3v device i/o interf...
Description	High speed 4 Megabit plastic monolithic SRAM. Options burn-in. Speed 12ns. High speed 4 Megabit plastic monolithic SRAM. Options temp cycle & burn-in. Speed 17ns. High speed 4 Megabit plastic monolithic SRAM. Options none. Speed 10ns. High speed 4 Megabit plastic monolithic SRAM. Options temp cycle. Speed 15ns. High speed 4 Megabit plastic monolithic SRAM. Options temp cycle & burn-in. Speed 25ns. High speed 4 Megabit plastic monolithic SRAM. Options temp cycle & burn-in. Speed 20ns.
File Size	71.55K / 6 Page	View it Online	Download Datasheet

				Analog Devices
Part No.	OP12S
OCR Text	...r conditions. 4.2 table iii. burn-in test delta limits . table iii test burn-in lifetest delta title limit limit limit units vos 0.15 0.225 0.075 mv ib 2.0 2.5 0.5 na 5.0 life test/burn-in circuit: 5.1 htrb is not ap...
Description	Precision Low-Input Current Operational Amplifier (Internally Compensated) Aerospace Data Sheet (Rev F, 02/2008)
File Size	137.98K / 4 Page	View it Online	Download Datasheet

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