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    CD4069UBMS FN3321

INTERSIL[Intersil Corporation]
Part No. CD4069UBMS FN3321
OCR Text ... 4. Read and Record TABLE 5. burn-IN AND LIFE TEST DELTA PARAMETERS +25OC PARAMETER Supply Current - SSI Output Current (Sink) Output Current (Source) SYMBOL IDD IOL5 IOH5A 0.1A 20% x Pre-Test Reading 20% x Pre-Test Reading DELTA LIMIT...
Description Inverter, Hex. (Unbuffered), Rad-Hard, CMOS, Logic
CMOS Hex Inverter
From old datasheet system

File Size 93.10K  /  8 Page

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AUSTIN[Austin Semiconductor]
Part No. AS10H536F16MIL AS10H536 AS10H536C16MIL
OCR Text ... D0 D1 CIN\ S1 V EE S2 D2 D3 burn-IN CONDITIONS: VTT = -2.0V MAX/ -2.2V MIN VEE = -5.7V MAX/ -5.2V MIN For more products and information please visit our web site at www.austinsemiconductor.com CIN\ Don't Care L H L H Don't Care ...
Description Universal Hexadecimal Counter

File Size 113.09K  /  5 Page

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    MAX1546ETL

MAXIM - Dallas Semiconductor
Maxim Integrated Products
Part No. MAX1546ETL
OCR Text ... addition to routine production burn-In, Maxim pulls a sample from every fabrication process three times per week and subjects it to an extended burn-In prior to shipment to ensure its reliability. The reliability control level for each lot...
Description PLASTIC ENCAPSULATED DEVICES

File Size 119.24K  /  8 Page

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    INTERSIL[Intersil Corporation]
Part No. CD4010BMS FN3078
OCR Text ... 4. Read and Record TABLE 5. burn-IN AND LIFE TEST DELTA PARAMETERS +25OC PARAMETER Supply Current - MSI-1 Output Current (Sink) Output Current (Source) SYMBOL IDD IOL5 IOH5A 0.2A 20% x Pre-Test Reading 20% x Pre-Test Reading DELTA LI...
Description From old datasheet system
CMOS Hex Buffer/Converter

File Size 77.28K  /  8 Page

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    WC16P332-16GI WC16P332-16GX WC16P332-16GC WC16P332-16GM

White Electronic Designs Corporation
Part No. WC16P332-16GI WC16P332-16GX WC16P332-16GC WC16P332-16GM
OCR Text ...ACH-EPOXY VACUUM BAKE PRE-burn-IN ELECTRICAL CURE EPOXY SEAM SEAL burn-IN METHOD 1015 WIREBOND QUAL./DESTRUCT WIRE PULL, PER MIL-STD-883 METHOD 2011 POST burn-IN ELECTRICAL MARK FINAL Q.A. METHOD 2009 WIREBOND TEM...
Description 68332 MONOLITHIC MICROCONTROLLER

File Size 127.63K  /  4 Page

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    DTL22A

List of Unclassifed Manufacturers
ETC[ETC]
Part No. DTL22A
OCR Text ...ion Static/dynamic power-supply burn-in Power-resistor substitution Real-time load simulation Capacitor discharge testing The DTL22A is an isolated (500Vdc), near-ideal (ZIN = ZOUT 10M), analog/ voltage-controlled current sink. Its 0-20...
Description Voltage-Controlled, 20 Amp 100 Watt, Electronic Loads

File Size 74.87K  /  4 Page

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    AON1610

Alpha & Omega Semiconductors
Part No. AON1610
OCR Text ...ty is restricted by the actual burn - in sample size. failure rate determination is based on jedec standard jesd 85. fit means one failure per billion hours. failure rate = chi 2 x 10 9 / [ 2 (n) (h) (af) ] = 3. 61 mt t...
Description Plastic Encapsulated Device

File Size 42.52K  /  3 Page

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    DTL24A

List of Unclassifed Manufacturers
ETC[ETC]
Part No. DTL24A
OCR Text ...OSFET's, diodes, etc.) test and burn-in applications. It is accurate (5mA offset error, 1% overall accuracy), fast (200sec full-scale step response), and capable of impressive resolution. If it is controlled with a 12-bit, 0-10V D/A convert...
Description Voltage-Controlled, 10 Amp 100 Watt, Electronic Loads

File Size 590.62K  /  4 Page

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