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A0100 VISHAY IRFB3 LT101 40NJ4K5E FST6040 1N6173A MPS9623
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  pressurized Datasheet PDF File

For pressurized Found Datasheets File :: 157    Search Time::1.14ms    
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    2MBI225U4J-120-50

Fuji Electric
Part No. 2MBI225U4J-120-50
OCR Text ... Humidity Storage 4 Unsaturated pressurized Vapor Test Method 402 method Test Method 201 Test Method 202 Test Method 103 Test code C Test Method 103 Test code E Test Method 105 5 5 5 5 (0:1) (0:1) (0:1) (0:1) 5 (0:1) Envir...
Description IGBT Module

File Size 640.61K  /  15 Page

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    2MBI1200U4G-120 YG912S6R

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Fuji Electric
Part No. 2MBI1200U4G-120 YG912S6R
OCR Text ... Humidity Storage 4 Unsaturated pressurized Vapor Test Method 201 Test Method 202 Test Method 103 Test code C Test Method 103 Test code E Test Method 105 5 5 5 (0:1) (0:1) (0:1) 5 (0:1) Environment Tests 5 Temperature C...
Description LOW LOSS SUPER HIGH SPEED RECTIFIER
IGBT-Module

File Size 577.92K  /  14 Page

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    ESAC83M-006RR

Fuji Electric
Part No. ESAC83M-006RR
OCR Text ...nology Co .,Ltd. Unsaturated pressurized Vapor Temperature : 1302C Relative humidity : 855% Vapor pressure : 230kPa Test duration : 48h EIAJ ED4701/103 test code F 22 Endurance test 6 Temperature Cycle High temp. side ...
Description SILICON DIODE

File Size 480.38K  /  12 Page

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    ESAC85-009R

Fuji Electric
Part No. ESAC85-009R
OCR Text ...nology Co .,Ltd. Unsaturated pressurized Vapor Temperature : 1302C Relative humidity : 855% Vapor pressure : 230kPa Test duration : 48h EIAJ ED4701/103 test code F 22 Endurance test 6 Temperature Cycle High temp. side ...
Description SILICON DIODE

File Size 433.83K  /  12 Page

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    YA985C6R

Fuji Electric
Part No. YA985C6R
OCR Text ...ature humidity bias Unsaturated pressurized vapor Testing methods and conditions Temperature : stg max Test duration : 1000h Temperature : stg min Test duration : 1000h Temperature : 852C Relative humidity : 855% Test duration : 1000h Te...
Description SILICON DIODE

File Size 182.02K  /  12 Page

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    YA982S6R

Fuji Electric
Part No. YA982S6R
OCR Text ...ature humidity bias Unsaturated pressurized vapor Testing methods and conditions Temperature : stg max Test duration : 1000h Temperature : stg min Test duration : 1000h Temperature : 852C Relative humidity : 855% Test duration : 1000h Te...
Description SILICON DIODE

File Size 163.61K  /  12 Page

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    YA982C6R

Fuji Electric
Part No. YA982C6R
OCR Text ...ature humidity bias Unsaturated pressurized vapor Testing methods and conditions Temperature : stg max Test duration : 1000h Temperature : stg min Test duration : 1000h Temperature : 852C Relative humidity : 855% Test duration : 1000h Te...
Description SILICON DIODE

File Size 186.43K  /  12 Page

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    ESAC92-02R

Fuji Electric
Part No. ESAC92-02R
OCR Text ...nology Co .,Ltd. Unsaturated pressurized Vapor Temperature : 1302C Relative humidity : 855% Vapor pressure : 230kPa Test duration : 48h EIAJ ED4701/103 test code F 22 Endurance test 6 Temperature Cycle High temp. side ...
Description SILICON DIODE

File Size 478.59K  /  12 Page

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    ESAD92-02R

Fuji Electric
Part No. ESAD92-02R
OCR Text ...nology Co .,Ltd. Unsaturated pressurized Vapor Temperature : 1302C Relative humidity : 855% Vapor pressure : 230kPa Test duration : 48h EIAJ ED4701/103 test code F 22 Endurance test 6 Temperature Cycle High temp. side ...
Description SILICON DIODE

File Size 480.84K  /  12 Page

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    ESAD92-03R

Fuji Electric
Part No. ESAD92-03R
OCR Text ...nology Co .,Ltd. Unsaturated pressurized Vapor Temperature : 1302C Relative humidity : 855% Vapor pressure : 230kPa Test duration : 48h EIAJ ED4701/103 test code F 22 Endurance test 6 Temperature Cycle High temp. side ...
Description SILICON DIODE

File Size 478.21K  /  12 Page

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For pressurized Found Datasheets File :: 157    Search Time::1.14ms    
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