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For microscopy Found Datasheets File :: 153    Search Time::1.563ms    
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    AN1955

Freescale Semiconductor, Inc
Part No. AN1955
OCR Text ...j ) measurement infrared (ir) microscopy is used to determine the die surface temperature (t j ) during amplifier operation. because this ir measurement method requires a direct view of the die, the protective ceramic lid is removed and ...
Description Thermal Measurement Methodology of RF Power Amplifiers

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    SFME28-461

Crane Aerospace & Electronics.
Part No. SFME28-461
OCR Text ...RF-38534 SEM: Scanning Electron microscopy SLAMTM: Scanning Laser Acoustic microscopy C-SAM: C - Mode Scanning Acoustic microscopy Applies to the following products: SMFLHP Series SMFL Series SMHP Series (O&H only) SMTR Series SSP Series SM...
Description EMI INPUT FILTER 28 VOLT INPUT

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    SFME120-46 SFME120-461

Interpoint Corporation Company
Part No. SFME120-46 SFME120-461
OCR Text ...RF-38534 SEM: Scanning Electron microscopy SLAMTM: Scanning Laser Acoustic microscopy C-SAM: C - Mode Scanning Acoustic microscopy Applies to the following products: SMFLHP Series SMFL Series SMHP Series (O&H only) SMTR Series SSP Series SM...
Description EMI INPUT FILTER 120 VOLT INPUT

File Size 62.60K  /  5 Page

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    INTERPOINT[Interpoint Corporation Company]
Part No. SMHP120
OCR Text ...RF-38534 SEM: Scanning Electron microscopy SLAMTM: Scanning Laser Acoustic microscopy C-SAM: C - Mode Scanning Acoustic microscopy Applies to the following products: SMFLHP Series SMFL Series SMHP Series (O&H only) SMTR Series SSP Series SM...
Description DC/DC CONVERTERS 120 VOLT INPUT

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    INTERPOINT[Interpoint Corporation Company]
Part No. STF28-461
OCR Text ...RF-38534 SEM: Scanning Electron microscopy SLAMTM: Scanning Laser Acoustic microscopy C-SAM: C - Mode Scanning Acoustic microscopy Applies to the following products: SMFLHP Series SMFL Series SMHP Series (O&H only) SMTR Series SSP Series SM...
Description EMI INPUT FILTER 28 VOLT INPUT

File Size 56.48K  /  4 Page

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    SFCS28-461SKH SFCS28-461DKH

Crane Aerospace & Electronics.
Part No. SFCS28-461SKH SFCS28-461DKH
OCR Text ...RF-38534 SEM: Scanning Electron microscopy SLAMTM: Scanning Laser Acoustic microscopy C-SAM: C - Mode Scanning Acoustic microscopy www.craneae.com Page 7 of 9 Rev B - 20070404 Crane Aerospace & Electronics Power Solutions sFcs2...
Description SFCS28-461 EMI Input Filters

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    CREE[Cree, Inc]
Part No. W3NRD0T-0200-X
OCR Text ...cal imaging and/or atomic force microscopy and/or CL. Following etching or polishing, small-diameter shallow pits are formed at the site of threading dislocations and are readily observed by atomic force microscopy. The dislocation density ...
Description GaN Substrate Products

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    STF28-461_HH STF28-461_KH STF28-461/KH STF28-461HH STF28-461/HH

Crane Aerospace & Electronics.
Part No. STF28-461_HH STF28-461_KH STF28-461/KH STF28-461HH STF28-461/HH
OCR Text ...RF-38534 SEM: Scanning Electron microscopy SLAMTM: Scanning Laser Acoustic microscopy C-SAM: C - Mode Scanning Acoustic microscopy www.craneae.com Page 8 of 10 Rev A - 20070509 Crane Aerospace & Electronics Power Solutions STF28...
Description STF28-461 EMI Input Filters

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    Agilent (Hewlett-Packard)
Part No. AMMC-5033
OCR Text ...50c as measured using infrared microscopy. thermal resistance at backside temperature (tb) = 25c calculated from measured data. 3. channel-to-backside thermal resistance ( ch-b) = 24c/w at tchannel (tc) = 150c as measured using infrare...
Description AMMC-5033 · 17.7-32 GHz Power Amplifier

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For microscopy Found Datasheets File :: 153    Search Time::1.563ms    
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