| PART |
Description |
Maker |
| TND307 |
Graphical Data Test Circuits for the NCP1650
|
ONSEMI
ON Semiconductor
|
| AN677 |
ST6 - PAINLESS MICROCONTROLLER CODE BY GRAPHICAL APPLICATION DESCRIPTION
|
SGS Thomson Microelectronics
|
| 4400-094 4400-094LF |
Electrical Testing per Tusonix standard test plans and Mil-Std-202 Test Methods
|
List of Unclassifed Manufacturers
|
| 0040.1031 0040.1032 0040.1033 0040.1034 0040.1035 |
TEST JACKS, TEST PROBES / PRUFSTECKER, PRUFBUCHSEN
|
Schurter Inc.
|
| 44281-0003 |
4.20mm (.165) Pitch Mini-Fit? Test Plug, Dual Row, 8 Circuits
|
Molex Electronics Ltd.
|
| 44281-0001 |
4.20mm (.165) Pitch Mini-Fit Test Plug, Dual Row, 4 Circuits
|
Molex Electronics Ltd.
|
| 0040.1211 0040.1212 0040.1213 |
TEST JACKS, TEST PROBES
|
Schurter Inc.
|
| 0040.1022 0040.1023 0040.1021 40.1024-ND 0040.1151 |
TEST JACKS, TEST PROBES
|
Schurter Inc.
|
| STM32F479AI STM32F479NI STM32F479IG STM32F479NG ST |
ARMCortex-M4 32b MCU FPU, 225DMIPS, up to 2MB Flash/384 4KB RAM, USB OTG HS/FS, Ethernet, FMC, dual Quad-SPI, Crypto, Graphical accelerator, Camera IF, LCD-TFT & MIPI DSI
|
STMicroelectronics
|
| MN4164-15 MN4164P-20 MN4164-25 MN4164-20 MN4164P-2 |
difital integrated circuits data
|
Panasonic Semiconductor
|
| K4D623238B-GQC |
512K x 32Bit x 4 Banks Double Data Rate Synchronous RAM wi Extended Data Out Data Sheet
|
Samsung Electronic
|
| HD4008 HD-4028 |
Integrated Circuits Data Book 1975
|
Harris Semiconductor
|
