| PART |
Description |
Maker |
| GET-30569 |
Qualification Test Results on NE272 ser es
|
California Eastern Laboratories
|
| 1-1461491-0 2-1461491-0 3-1461491-0 1461491-1 1-14 |
Qualification Test Report
|
Tyco Electronics
|
| GET-30593 |
Qualification Test Report on NE681XX
|
California Eastern Laboratories
|
| SRF-1016Z SRF-2016Z STQ-1016Z SRQ-2116Z STQ-3016Z |
RELIABILITY QUALIFICATION REPORT
|
List of Unclassifed Manufacturers
ETC[ETC]
N.A.
|
| SRF-1016Z SRF-2016Z SRQ-2116Z |
Reliability Qualification Report 可靠性鉴定报
|
Electronic Theatre Controls, Inc.
Stanford Microdevices
|
| MICROFOX-P-ESD-DB |
Screwed precision-joint for permanent stability and optimum results
|
PHOENIX CONTACT
|
| KDB15N50 |
Low Gate Charge Qg results in Simple Drive Requirement Reduced rDS(ON)
|
TY Semiconductor Co., L...
|
| 4400-094 4400-094LF |
Electrical Testing per Tusonix standard test plans and Mil-Std-202 Test Methods
|
List of Unclassifed Manufacturers
|
| SF-LHEX-SET |
The strict manufacturing tolerances and special hardening process ensure reliability and optimum results
|
PHOENIX CONTACT
|
| 5523 3781 |
Connector assemblies, Hooks Test; RoHS Compliant: Yes INTERCONNECTION DEVICE
Minigrabber Test Clip Patch Cord
|
Pomona Electronics
|
| 0040.1211 0040.1212 0040.1213 |
TEST JACKS, TEST PROBES
|
Schurter Inc.
|
| AT17LV65A AT17LV002A-10QI |
65/128/256/512K-bit and 1/2M-bit FPGA Configurator EEPROM (3.3V and 5V). Obtain the qualification pa
|
Atmel Corp
|
