| PART |
Description |
Maker |
| TLP3115-14 |
MEASUREMENT INSTRUMENTS LOGIC IC TESTERS / MEMORY TESTERS BOARD TESTERS / SCANNERS
|
Toshiba Semiconductor
|
| TLP3130 |
MEASUREMENT INSTRUMENTS LOGIC IC TESTERS / MEMORY TESTERS BOARD TESTERS / SCANNERS
|
Toshiba Corporation
Toshiba Semiconductor
|
| TLP3113 |
MEASUREMENT INSTRUMENTS LOGIC IC TESTERS MEMORY TESTERS BOARD TESTERS SCANNERS
|
Toshiba Corporation
Toshiba Semiconductor
|
| TLP311407 TLP3114 |
LOGIC IC TESTERS / MEMORY TESTERS
|
Toshiba Semiconductor
|
| TLP3122 |
Logic Testers / Memory Testers
|
Toshiba Semiconductor
|
| TLP3214 |
LOGIC IC TESTERS / MEMORY TESTERS
|
Toshiba Semiconductor
|
| 6171-0 6171-2 |
Test Companion Test Kit For Fluke 20 & 70 Series DMM’s
|
Pomona Electronics
|
| XC17S50APDG8C XC17S50ASO20C |
XC2S50 PROM C grade 559200 X 1 CONFIGURATION MEMORY, PDIP8
SERIAL PROM FOR 50000 SYSTEM GATE LOGIC 559200 X 1 CONFIGURATION MEMORY, PDSO20
|
Xilinx, Inc.
|
| 0040.1012 0040.1013 0040.1015 0040.1011 0040.1014 |
TEST JACKS, TEST PROBES / PRUFSTECKER, PRUFBUCHSEN
|
Schurter Inc.
|
| 0040.1031 0040.1032 0040.1033 0040.1034 0040.1035 |
TEST JACKS, TEST PROBES / PRUFSTECKER, PRUFBUCHSEN
|
Schurter Inc.
|
| SAB80C535-N-T40/85 SAB80C515-M-T40/85 SAB80C515-N- |
High Speed CMOS Logic Quad 2-Input Multiplexers with Non-Inverting 3-State Outputs 16-PDIP -55 to 125
High Speed CMOS Logic Quad 2-Input Multiplexers with Non-Inverting 3-State Outputs 16-SOIC -55 to 125
8-Bit CMOS Single-Chip Microcontroller 8-BIT, MROM, 12 MHz, MICROCONTROLLER, PQCC68
8-Bit Microcontrollers - 8-Bit CMOS microcontroller for external memory (12MHz)
8-Bit Microcontrollers - 8-Bit CMOS Microcontroller for external memory (16 MHz)
8-Bit Microcontrollers - 8-Bit CMOS microcontroller for external memory (16MHz)
8-Bit Microcontrollers - 8-Bit CMOS microcontroller for external memory(12MHz)
|
Siemens Semiconductor Group
SIEMENS AG
http://
Infineon
Siemens Semiconductor G...
|
