| PART |
Description |
Maker |
| TLP3131 |
MEASUREMENT INSTRUMENTS LOGIC IC TESTERS / MEMORY TESTERS BOARD TESTERS / SCANNERS
|
Toshiba Corporation
Toshiba Semiconductor
|
| TLP3115-14 |
MEASUREMENT INSTRUMENTS LOGIC IC TESTERS / MEMORY TESTERS BOARD TESTERS / SCANNERS
|
Toshiba Semiconductor
|
| TLP3113 |
MEASUREMENT INSTRUMENTS LOGIC IC TESTERS MEMORY TESTERS BOARD TESTERS SCANNERS
|
Toshiba Corporation
Toshiba Semiconductor
|
| TLP3240 |
Logic IC Testers / Memory Testers
|
Toshiba Semiconductor
|
| 07010 19240 19250 |
Calibration Unit for Testers Installation, Operation and Maintenance
|
List of Unclassifed Manufacturers
|
| 6249-12-0 6249-24-0 6249-48-0 6249-24-2 6249-12-2 |
Test Clip To Multi-Stacking Banana Plug Test Lead
|
Pomona Electronics
|
| XC17S50APDG8C XC17S50ASO20C |
XC2S50 PROM C grade 559200 X 1 CONFIGURATION MEMORY, PDIP8
SERIAL PROM FOR 50000 SYSTEM GATE LOGIC 559200 X 1 CONFIGURATION MEMORY, PDSO20
|
Xilinx, Inc.
|
| 0040.1211 0040.1212 0040.1213 |
TEST JACKS, TEST PROBES
|
Schurter Inc.
|
