PART |
Description |
Maker |
2950132 |
Lamp testing modules
|
PHOENIX CONTACT
|
305-0811Y-3 305-0811S-1 305-0811-5 305-0811-3 305- |
Military, Space and Testing Equipment
|
Emerson Network Power
|
CTS224 |
Automatic Testing / Marking Machine for Radial Capacitors
|
Kemet Corporation
|
IQCM-EV |
Designed to allow simplified testing and evaluation of the clock modules
|
IQD Frequency Products ...
|
BO10 |
Industrial Connectors:Measuring and Testing Equipment:Sockets:4 mm system
|
List of Unclassifed Manufacturers
|
5992-1603 |
Propsim Channel Emulation MIMO Over-the-Air (OTA) Testing
|
Keysight Technologies
|
DS2188 |
T1/CEPT Jitter Attenuator(T1/CEPT 抖动衰减 DATACOM, PCM JITTER ATTENUATOR, PDIP16
|
Maxim Integrated Products, Inc.
|
SHPCIE100 |
3.3V HCSL Low Jitter 100MHz PCIe? 2.0 XO 3.3V HCSL Low Jitter 100MHz PCIe垄莽 2.0 XO
|
Pericom Semiconductor Corporation
|
SK210 |
Additional testing can be offered upon request
|
Sangdest Microelectroni...
|
CY23EP05SXI-1T CY23EP05SXC-1HT CY23EP05SXI-1HT CY2 |
2.5 V or 3.3 V,10-220-MHz, Low Jitter, 5 Output Zero Delay Buffer 2.5V or 3.3V,10- 220 MHz, Low Jitter, 5 Output Zero Delay Buffer 23EP SERIES, PLL BASED CLOCK DRIVER, 4 TRUE OUTPUT(S), 0 INVERTED OUTPUT(S), PDSO8
|
Cypress Semiconductor, Corp.
|