| PART |
Description |
Maker |
| AD8331ARQZ-RL AD8334-EVALZ AD8332ACPZ-R2 |
Ultralow Noise VGAs with Preamplifier and Programmable RIN SPECIALTY CONSUMER CIRCUIT, PDSO20
|
Analog Devices, Inc.
|
| LTC2984ILXPBF |
Multi-Sensor High Accuracy Digital Temperature Measurement System with EEPROM
|
Linear Technology
|
| LTC2978A LTC2978AIUPPBF LTC2978ACUPPBF |
8-Channel PMBus Power System Manager Featuring Accurate Output Voltage Measurement
|
Linear Technology
|
| SL-COBRAT5TUBE |
According to CIE publication: NO. 84 “The measurement of luminous flux. Luminous intensity distribution was measured by Goniophotometer system.
|
Everlight Electronics Co., Ltd
|
| TLP3116 |
MEASUREMENT INSTRUMENTS LOGIC IC TESTERS/MEMORY TESTERS BOARD TESTERS/SCANNERS
From old datasheet system
|
Toshiba Corporation
TOSHIBA[Toshiba Semiconductor]
|
| ICL762101 ICL7621DCPA ICL7621 ICL7621BCPA ICL7621D |
Op Amp, CMOS, Rail-to-Rail Output, Low Voltage 1-8Vdc, Rin=10E12, Ibias=1pA, Dual
Dual, Low Power CMOS Operational Amplifiers
|
INTERSIL[Intersil Corporation]
|
| B57871S0303_000 B57871S0103_001 B57871S0103_002 B5 |
Temperature Measurement
|
EPCOS[EPCOS]
|
| TLP3118 |
Measurement Instruments
|
Toshiba Semiconductor
|
| TLP798GA TLP798GA07 |
Measurement Instrumentation
|
Toshiba Semiconductor
|
| B57885S0303_000 B57885S0103_001 B57885S0103_002 B5 |
Temperature Measurement
|
EPCOS[EPCOS]
|
| TLP597A |
MEASUREMENT INSTRUMENTATION
|
Toshiba Semiconductor
|
| CSE7758 |
Energy Measurement IC
|
ETC
|
