| PART |
Description |
Maker |
| 50PA-392 |
LC HANDOVER TEST SYSTEM
|
JFW Industries, Inc.
|
| 6171-0 6171-2 |
Test Companion Test Kit For Fluke 20 & 70 Series DMM’s
|
Pomona Electronics
|
| IT3M-200S-BGA IT3D-200S-BGA IT3D-300S-BGA IT3M-300 |
IT3 Test Vehicle Assembly Yield Test
|
Hirose Electric
|
| 4082A |
Parametric Test System
|
Keysight Technologies
|
| 50PMA-015 |
TRANSCEIVER TEST SYSTEM
|
JFW Industries, Inc.
|
| 4082F |
Flash Memory Cell Parametric Test System
|
Keysight Technologies
|
| AD7226 AD7226BQ AD7226KN AD7226KP AD7226KR AD7226T |
-0.3, 17V; 500mW; LC2MOS quad 8-bit D/A converter. For process contol, automatic test equipment and calibration of large system parameters
|
AD[Analog Devices]
|
| C4000-VOIP C4000-IPTV C4000-VOIP-UNISTIM C4000-VOI |
T-BERD㈢/MTS-4000Multiple Services Test Platform
T-BERD?/MTS-4000Multiple Services Test Platform
T-BERD垄莽/MTS-4000Multiple Services Test Platform
|
JDS Uniphase Corporation
|
| A701 |
A701: Test slide, various cancers plus corresponding normal
A701: Test slide various cancers plus corresponding normal
A701: Test slide, various cancers plus corresponding normal
|
List of Unclassifed Manufacturers
Electronic Theatre Controls, Inc.
ETC[ETC]
|
| ST662 ST662A ST662AB ST662ABD ST662ABN ST662AC ST6 |
From old datasheet system
DC-DC CONVERTER FROM 5V TO 12V, 0.03A FOR FLASH MEMORY PROGRAMMING SUPPLY
MOSFET; Transistor Polarity:N Channel; Drain Source Voltage, Vds:40V; Continuous Drain Current, Id:14A; On-Resistance, Rds(on):9mohm; Rds(on) Test
|
http://
STMICROELECTRONICS[STMicroelectronics]
意法半导
|
| 5951A |
Test Probe Set; Connector Type A:Replaceable-Tip Probe (1 Black/1 Red); Connector Type B:Right-Angle Banana Plug; Cable Length:4ft; Current Rating:5A; Features:2 Stainless Steel Sharp Replaceable Probe Tips RoHS Compliant: NA INTERCONNECTION DEVICE
Test Probe Set Replaceable Tip
|
Pomona Electronics
|
