| PART |
Description |
Maker |
| DS1208 |
dallas semiconductor reliability report
|
List of Unclassifed Manufacturers
ETC[ETC]
MAXIM - Dallas Semiconductor
|
| ERO25THD1002 EROS2THD1002 ERO-S2PHF3301 EROS2C ERO |
Metal Film Resistors Performance, Reliability Low T.C.R. and noise, high reliability
|
Panasonic Semiconductor
|
| GSELDIRUH33PA13B20K |
ELDRS Test Report
|
International Rectifier
|
| TR636E-10018 |
COMPREHENSIVE TEST REPORT
|
Hirose Electric
|
| MAX15091A |
Solution with Current Report Output
|
Maxim Integrated Products
|
| GET-30593 |
Qualification Test Report on NE681XX
|
California Eastern Labs
|
| RT3070 |
USB 1T1R Test Report
|
Ralink
|
| GET-BC-0004 |
Qualification Test Report on NE292
|
California Eastern Laboratories
|
| RIC7113 |
Total Ionizing Dose Test Report
|
International Rectifier
|
| GSIONIRUH33P253B1M |
Total Ionizing Dose Test Report
|
International Rectifier
|
| MBM29F016A-12 MBM29F016A-90PFTR MBM29F016A-12PFTR |
16M (2M X 8) BIT
2.2A, 2.7-5.5V Single Hot-Swap IC Hi-Side MOSFET, Fault Report, Act-High Enable 8-SOIC -40 to 85
1.65A, 2.7-5.5V Single Hot-Swap IC Hi-Side MOSFET, Fault Report, Act-High Enable 8-SOIC -40 to 85
|
Fujitsu Component Limited.
Fujitsu Limited
|
