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HM5225645F-B60 HM5225325F-B60 256M LVTTL interface SDRAM 100 MHz 1-Mword x 64-bit x 4-bank/2-Mword x 32-bit x 4-bank PC/100 SDRAM ADE-203-1014C (Z) Rev. 1.0 Oct. 1, 1999 Description The Hitachi HM5225645F is a 256-Mbit SDRAM organized as 1048576-word x 64-bit x 4-bank. The Hitachi HM5225325F is a 256-Mbit SDRAM organized as 2097152-word x 32-bit x 4-bank. All inputs and outputs are referred to the rising edge of the clock input. It is packaged in standard 108 bump BGA. Features * * * * * * * * * Single chip wide bit solution (x 64/x 32) 3.3 V power supply Clock frequency: 100 MHz (max) LVTTL interface Extremely small foot print: 1.27 mm pitch Package: BGA (BP-108) 4 banks can operate simultaneously and independently Burst read/write operation and burst read/single write operation capability Programmable burst length: 4/8/full page 2 variations of burst sequence Sequential (BL = 4/8/full page) Interleave (BL = 4/8) Programmable CAS latency: 2/3 Byte control by DQMB * * HM5225645F-B60, HM5225325F-B60 * Refresh cycles: 4096 refresh cycles/64 ms * 2 variations of refresh Auto refresh Self refresh * Full page burst length capability Sequential burst Burst stop capability Ordering Information Type No. HM5225645FBP-B60* HM5225325FBP-B60* Frequency 100 MHz 100 MHz CAS latency 3 3 Package 14 mm x 22 mm 108 bump BGA (BP-108) Note: 66 MHz operation at CAS latency = 2. 2 HM5225645F-B60, HM5225325F-B60 Pin Arrangement (HM5225645F) 108-bump BGA 1 A B C D E F G H J K L DQ63 2 DQ62 3 DQ49 4 DQ48 5 VSS 6 DQ47 7 DQ46 8 DQ33 9 DQ32 DQ61 DQ60 DQ51 DQ50 VCC DQ45 DQ44 DQ35 DQ34 DQ59 DQ58 DQ53 DQ52 VCC DQ43 DQ42 DQ37 DQ36 DQ57 DQ MB7 DQ56 DQ MB6 DQ55 DQ54 VSS DQ41 DQ40 DQ39 DQ MB5 RAS DQ38 DQ MB4 WE CKE VCC A12 VCC A10 A13 A7 A5 VCC A1 A4 VSS A2 A3 A8 A6 VSS A0 A11 VSS A9 CS M Open N P R T U DQ MB0 DQ6 CLK VCC DQ MB2 DQ8 DQ9 VSS DQ22 DQ23 DQ24 CAS DQ MB1 DQ7 DQ MB3 DQ25 DQ4 DQ5 DQ10 DQ11 VCC DQ20 DQ21 DQ26 DQ27 DQ2 DQ3 DQ12 DQ13 VCC DQ18 DQ19 DQ28 DQ29 DQ0 DQ1 DQ14 DQ15 VSS DQ16 DQ17 DQ30 DQ31 (Top view) 3 HM5225645F-B60, HM5225325F-B60 Pin Description (HM5225645F) Pin name A0 to A13 Function Address input Row address Column address A0 to A11 A0 to A7 Bank select address A12/A13 (BS) DQ0 to DQ63 CS RAS CAS WE DQMB0 to DQMB7 CLK CKE VCC VSS Open Note: Data-input/output Chip select Row address strobe command Column address strobe command Write enable Byte data mask* 1 Clock input Clock enable Power supply Ground Open* 2 1. DQMB0: DQ0 to DQ7 DQMB1: DQ8 to DQ15 DQMB2: DQ16 to DQ23 DQMB3: DQ24 to DQ31 DQMB4: DQ32 to DQ39 DQMB5: DQ40 to DQ47 DQMB6: DQ48 to DQ55 DQMB7: DQ56 to DQ63 2. Don't connect. Internally connected with die. 4 HM5225645F-B60, HM5225325F-B60 Pin Arrangement (HM5225325F) 108-bump BGA 1 A B C D E F G H J K L DQ31 2 NC 3 NC 4 DQ24 5 VSS 6 DQ23 7 NC 8 NC 9 DQ16 DQ30 NC NC DQ25 VCC DQ22 NC NC DQ17 DQ29 NC NC DQ26 VCC DQ21 NC NC DQ18 DQ28 DQ MB3 NC NC DQ27 VSS DQ20 NC NC DQ MB2 RAS DQ19 NC NC CKE VCC WE A12 VCC A10 A13 A7 A5 VCC A1 A4 VSS A2 A3 A8 A6 VSS A0 A11 VSS A9 CS M Open N P R T U NC CLK VCC CAS DQ MB0 NC NC DQ4 VSS DQ11 NC NC DQ MB1 DQ12 DQ3 NC DQ2 NC NC DQ5 VCC DQ10 NC NC DQ13 DQ1 NC NC DQ6 VCC DQ9 NC NC DQ14 DQ0 NC NC DQ7 VSS DQ8 NC NC DQ15 (Top view) 5 HM5225645F-B60, HM5225325F-B60 Pin Description (HM5225325F) Pin name A0 to A13 Function Address input Row address Column address A0 to A11 A0 to A8 Bank select address A12/A13 (BS) DQ0 to DQ31 CS RAS CAS WE DQMB0 to DQMB3 CLK CKE VCC VSS Open NC Note: Data-input/output Chip select Row address strobe command Column address strobe command Write enable Byte data mask* 1 Clock input Clock enable Power supply Ground Open* 2 No connection*3 1. DQMB0: DQ0 to DQ7 DQMB1: DQ8 to DQ15 DQMB2: DQ16 to DQ23 DQMB3: DQ24 to DQ31 2. Don't connect. Internally connected with die. 3. Not internally connected with die. 6 HM5225645F-B60, HM5225325F-B60 Block Diagram (HM5225645F) 14 A0 to A13 CS RAS CAS WE CLK CKE 64-Mbit SDRAM 4M x 16 64-Mbit SDRAM 4M x 16 64-Mbit SDRAM 4M x 16 64-Mbit SDRAM 4M x 16 8 DQMB 0 to DQMB 7 64 DQ 0 to DQ 63 2 16 2 16 2 16 2 16 Block Diagram (HM5225325F) 14 A0 to A13 CS RAS CAS WE CLK CKE 64-Mbit SDRAM 8M x 8 64-Mbit SDRAM 8M x 8 64-Mbit SDRAM 8M x 8 64-Mbit SDRAM 8M x 8 DQMB 0 to DQMB 3 32 DQ 0 to DQ 31 4 1 8 1 8 1 8 1 8 7 HM5225645F-B60, HM5225325F-B60 Power-up Sequence and Initialization Sequence Power up sequence 100 s VCC CKE, DQMB CLK CS, DQ 0V Low Low Low Power stabilize Initialization sequence 200 s Absolute Maximum Ratings Parameter Voltage on any pin relative to V SS Supply voltage relative to VSS Short circuit output current Operating temperature Storage temperature Note: 1. Respect to V SS Symbol VT VCC Iout Topr Tstg Value -0.5 to VCC + 0.5 ( 4.6 (max)) -0.5 to +4.6 50 0 to +70 (Tj max = 110) -55 to +125 Unit V V mA C C Note 1 1 DC Operating Conditions (Tcase = 0 to +70C [Tj max = 110C]) Parameter Supply voltage Symbol VCC VSS Input high voltage Input low voltage Notes: 1. 2. 3. 4. 5. VIH VIL Min 3.0 0 2.0 -0.3 Max 3.6 0 VCC + 0.3 0.8 Unit V V V V Notes 1, 2 3 1, 4 1, 5 All voltage referred to VSS The supply voltage with all VCC pins must be on the same level. The supply voltage with all VSS pins must be on the same level. VIH (max) = VCC + 2.0 V for pulse width 3 ns at VCC. VIL (min) = VSS - 2.0 V for pulse width 3 ns at VSS . 8 HM5225645F-B60, HM5225325F-B60 DC Characteristics (Tcase = 0 to 70C [Tj max = 110C]), VCC = 3.3 V 0.3 V, VSS = 0 V) (HM5225645F) HM5225645F -B60 Parameter Operating current (CAS latency = 2) (CAS latency = 3) Standby current in power down Standby current in power down (input signal stable) Standby current in non power down Standby current in non power down (input signal stable) Active standby current in power down Active standby current in power down (input signal stable) Active standby current in non power down Active standby current in non power down (input signal stable) Burst operating current (CAS latency = 2) (CAS latency = 3) Refresh current Self refresh current Self refresh current (L-version) Input leakage current Output leakage current Output high voltage Output low voltage Symbol I CC1 I CC1 I CC2P I CC2PS I CC2N I CC2NS I CC3P I CC3PS I CC3N I CC3NS Min -- -- -- -- -- -- -- -- -- -- Max 200 220 12 8 64 36 16 12 80 60 Unit mA mA mA mA mA mA mA mA mA mA CKE = VIL, t CK = 12 ns CKE = VIL, t CK = CKE, CS = VIH, t CK = 12 ns CKE = VIH, t CK = CKE = VIL, t CK = 12 ns CKE = VIL, t CK = CKE, CS = VIH, t CK = 12 ns CKE = VIH, t CK = 6 7 4 9 1, 2, 6 2, 7 1, 2, 4 2, 9 Test conditions Burst length = 1 t RC = min Notes 1, 2, 3 I CC4 I CC4 I CC5 I CC6 I CC6 I LI I LO VOH VOL -- -- -- -- -- -4 -6 2.4 -- 220 270 380 4 1.6 4 6 -- 0.4 mA mA mA mA mA A A V V t CK = min, BL = 4 1, 2, 5 t RC = min VIH VCC - 0.2 V VIL 0.2 V 0 Vin VCC 0 Vout VCC DQ = disable I OH = -4 mA I OL = 4 mA 3 8 9 HM5225645F-B60, HM5225325F-B60 DC Characteristics (Tcase = 0 to 70C [Tj max = 110C]), VCC = 3.3 V 0.3 V, VSS = 0 V) (HM5225325F) HM5225325F -B60 Parameter Operating current (CAS latency = 2) (CAS latency = 3) Standby current in power down Standby current in power down (input signal stable) Standby current in non power down Standby current in non power down (input signal stable) Active standby current in power down Active standby current in power down (input signal stable) Active standby current in non power down Active standby current in non power down (input signal stable) Burst operating current (CAS latency = 2) (CAS latency = 3) Refresh current Self refresh current Self refresh current (L-version) Input leakage current Output leakage current Output high voltage Output low voltage Symbol I CC1 I CC1 I CC2P I CC2PS I CC2N I CC2NS I CC3P I CC3PS I CC3N I CC3NS Min -- -- -- -- -- -- -- -- -- -- Max 180 200 12 8 64 36 16 12 80 60 Unit mA mA mA mA mA mA mA mA mA mA CKE = VIL, t CK = 12 ns CKE = VIL, t CK = CKE, CS = VIH, t CK = 12 ns CKE = VIH, t CK = CKE = VIL, t CK = 12 ns CKE = VIL, t CK = CKE, CS = VIH, t CK = 12 ns CKE = VIH, t CK = 6 7 4 9 1, 2, 6 2, 7 1, 2, 4 2, 9 Test conditions Burst length = 1 t RC = min Notes 1, 2, 3 I CC4 I CC4 I CC5 I CC6 I CC6 I LI I LO VOH VOL -- -- -- -- -- -4 -6 2.4 -- 200 250 380 4 1.6 4 6 -- 0.4 mA mA mA mA mA A A V V t CK = min, BL = 4 1, 2, 5 t RC = min VIH VCC - 0.2 V VIL 0.2 V 0 Vin VCC 0 Vout VCC DQ = disable I OH = -4 mA I OL = 4 mA 3 8 10 HM5225645F-B60, HM5225325F-B60 Notes: 1. I CC depends on output load condition when the device is selected. ICC (max) is specified at the output open condition. 2. One bank operation. 3. Input signals are changed once per one clock. 4. Input signals are changed once per two clocks. 5. Input signals are changed once per four clocks. 6. After power down mode, CLK operating current. 7. After power down mode, no CLK operating current. 8. After self refresh mode set, self refresh current. 9. Input signals are V IH or VIL fixed. Capacitance (Ta = 25C, VCC = 3.3 V 0.3 V) Parameter Input capacitance (CLK) Input capacitance (Input except DQM) Input capacitance (DQM) Output capacitance (DQ) Notes: 1. 2. 3. 4. Symbol CI1 CI2 CI3 CO Min 10 10 2.5 3 Max 14 14 5 5 Unit pF pF pF pF Notes 1, 2, 4 1, 2, 4 1, 2, 4 1, 2, 3, 4 Capacitance measured with Boonton Meter or effective capacitance measuring method. Measurement condition: f = 1 MHz, 1.4 V bias, 200 mV swing. DQMB = VIH to disable Dout. This parameter is sampled and not 100% tested. 11 HM5225645F-B60, HM5225325F-B60 AC Characteristics (Tcase = 0 to 70C [Tj max = 110C]), VCC = 3.3 V 0.3 V, VSS = 0 V) HM5225645F/HM5225325F -B60 Parameter System clock cycle time (CAS latency = 2) (CAS latency = 3) CLK high pulse width CLK low pulse width Access time from CLK (CAS latency = 2) (CAS latency = 3) Data-out hold time CLK to Data-out low impedance CLK to Data-out high impedance (CAS latency = 2, 3) Input setup time CKE setup time for power down exit Input hold time HITACHI Symbol t CK t CK t CKH t CKL t AC t AC t OH t LZ t HZ t AS , t CS, t DS, Tsi t CES t CESP Tpde PC/100 Symbol Tclk Tclk Tch Tcl Tac Tac Toh Min 15 10 3 3 -- -- 3 2 -- 2 2 1 70 50 20 20 10 20 1 -- Max -- -- -- -- 8 6 -- -- 6 -- -- -- -- 120000 -- -- -- -- 5 64 Unit ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ms 1, 2 1, 2, 3 1, 4 1, 5, 6 1 1, 5 1 1 1 1 1 1 1 1 1, 2 Notes 1 t AH, t CH, t DH, Thi t CEH Trc Tras Trcd Trp Tdpl Trrd Ref/Active to Ref/Active command t RC period Active to Precharge command period Active command to column command (same bank) Precharge to active command period Write recovery or data-in to precharge lead time Active (a) to Active (b) command period Transition time (rise and fall) Refresh period t RAS t RCD t RP t DPL t RRD tT t REF 12 HM5225645F-B60, HM5225325F-B60 Notes: 1. 2. 3. 4. 5. 6. AC measurement assumes t T = 1 ns. Reference level for timing of input signals is 1.5 V. Access time is measured at 1.5 V. Load condition is CL = 50 pF. t LZ (min) defines the time at which the outputs achieves the low impedance state. t HZ (max) defines the time at which the outputs achieves the high impedance state. t CES define CKE setup time to CLK rising edge except power down exit command. t AS /tAH: Address, tCS/tCH: CS, RAS, CAS, WE, DQM. t DS/tDH: Data-in, tCES/tCEH: CKE Test Conditions * Input and output timing reference levels: 1.5 V * Input waveform and output load: See following figures 2.4 V input 0.4 V 2.0 V 0.8 V I/O CL t T tT 13 HM5225645F-B60, HM5225325F-B60 Package Dimensions HM5225645FBP Series HM5225325FBP Series (BP-108) Unit: mm Preliminary 0.20 0.35 C -C- 4xC1.2 14.00 4x A -A987654321 A B C D E F G H J K L M N P R T U 1.27 Pin 1 Index 21.0 0.10 -B13.0 0.10 0.60 2.10 108x 0.75 0.30 M C A B 0.15 M C 2.35 Max Details of the part A Hitachi Code JEDEC EIAJ Weight (reference value) 1.27 0.15 C 22.00 BP-108 -- -- 1.2 g 14 HM5225645F-B60, HM5225325F-B60 Cautions 1. Hitachi neither warrants nor grants licenses of any rights of Hitachi's or any third party's patent, copyright, trademark, or other intellectual property rights for information contained in this document. Hitachi bears no responsibility for problems that may arise with third party's rights, including intellectual property rights, in connection with use of the information contained in this document. 2. Products and product specifications may be subject to change without notice. Confirm that you have received the latest product standards or specifications before final design, purchase or use. 3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However, contact Hitachi's sales office before using the product in an application that demands especially high quality and reliability or where its failure or malfunction may directly threaten human life or cause risk of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation, traffic, safety equipment or medical equipment for life support. 4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly for maximum rating, operating supply voltage range, heat radiation characteristics, installation conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable failure rates or failure modes in semiconductor devices and employ systemic measures such as fail-safes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other consequential damage due to operation of the Hitachi product. 5. This product is not designed to be radiation resistant. 6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without written approval from Hitachi. 7. Contact Hitachi's sales office for any questions regarding this document or Hitachi semiconductor products. Hitachi, Ltd. Semiconductor & Integrated Circuits. Nippon Bldg., 2-6-2, Ohte-machi, Chiyoda-ku, Tokyo 100-0004, Japan Tel: Tokyo (03) 3270-2111 Fax: (03) 3270-5109 URL NorthAmerica : http:semiconductor.hitachi.com/ Europe : http://www.hitachi-eu.com/hel/ecg Asia (Singapore) : http://www.has.hitachi.com.sg/grp3/sicd/index.htm Asia (Taiwan) : http://www.hitachi.com.tw/E/Product/SICD_Frame.htm Asia (HongKong) : http://www.hitachi.com.hk/eng/bo/grp3/index.htm Japan : http://www.hitachi.co.jp/Sicd/indx.htm For further information write to: Hitachi Europe GmbH Electronic components Group Dornacher Strae 3 D-85622 Feldkirchen, Munich Germany Tel: <49> (89) 9 9180-0 Fax: <49> (89) 9 29 30 00 Hitachi Europe Ltd. Electronic Components Group. Whitebrook Park Lower Cookham Road Maidenhead Berkshire SL6 8YA, United Kingdom Tel: <44> (1628) 585000 Fax: <44> (1628) 778322 Hitachi Asia Pte. Ltd. 16 Collyer Quay #20-00 Hitachi Tower Singapore 049318 Tel: 535-2100 Fax: 535-1533 Hitachi Asia Ltd. Taipei Branch Office 3F, Hung Kuo Building. No.167, Tun-Hwa North Road, Taipei (105) Tel: <886> (2) 2718-3666 Fax: <886> (2) 2718-8180 Hitachi Asia (Hong Kong) Ltd. Group III (Electronic Components) 7/F., North Tower, World Finance Centre, Harbour City, Canton Road, Tsim Sha Tsui, Kowloon, Hong Kong Tel: <852> (2) 735 9218 Fax: <852> (2) 730 0281 Telex: 40815 HITEC HX Hitachi Semiconductor (America) Inc. 179 East Tasman Drive, San Jose,CA 95134 Tel: <1> (408) 433-1990 Fax: <1>(408) 433-0223 Copyright (c) Hitachi, Ltd., 1998. All rights reserved. Printed in Japan. 15 HM5225645F-B60, HM5225325F-B60 Revision Record Rev. Date 0.0 0.1 Feb. 1, 1999 Contents of Modification Initial issue Drawn by S. Hatano S. Hatano Approved by S. Hatano S. Hatano Feb. 19, 1999 Pin arrangement Correct pin No. to JEDEC standard Package dimenssion Correct illustration and indexes 0.2 1.0 Apr. 1, 1999 Oct. 1, 1999 Ordering information Correct error of type No. Programmable CAS latency: 3 to 2/3 Ordering information Addition of note Pin description Addition of note 1 DC Characteristics (HM5225645F) I CC1 max (CL = 2): 280 mA to 200 mA I CC1 max (CL = 3): 300 mA to 220 mA I CC4 max (CL = 2): 280 mA to 220 mA I CC4 max (CL = 3): 360 mA to 270 mA I CC5 max: 460 mA to 380 mA DC Characteristics (HM5225325F) I CC1 max (CL = 2): 260 mA to 180 mA I CC1 max (CL = 3): 280 mA to 200 mA I CC4 max (CL = 2): 260 mA to 200 mA I CC4 max (CL = 3): 320 mA to 250 mA I CC5 max: 460 mA to 380 mA Capacitance CI1 max: 16 pF to 14 pF CI2 max: 20 pF to 14 pF CO min: 4 pF to 3 pF CO max: 6.5 pF to 5 pF Package dimension Change tolerance of height S. Hatano S. Hatano 16 |
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