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 Advance Product Information
Ka Band 2 Watt Power Amplifier
Key Features and Performance
* * * * * * 0.25 um pHEMT Technology 20 dB Nominal Gain 2W Nominal Pout -30 dBc IMR3 @ 26 dBm SCL Bias 7V @ 1.4 A Chip Dimensions 5.89 mm x 3.66 mm
TGA1055-EPU
Primary Applications
* * * LMDS Point-to-Point Radio Satellite Ground Terminal
Release Status
* Currently shipping Engineering Prototype Units
EG1055B Bias Testing: Vd=7V, Id=1.38A, T=25C, Freq=29GHz
35 33 Output Power (dBm) & Gain (dB) 31 29 27 25 23 21 19 17 15 5 6 7 8 9 10 11 12 13 14 15 Input Power (dBm ) 20 18 16 14 12 10 8 6 4 2 0 Power Added Efficiency (%)
Pout Gain PAE
Chip Dimensions 5.89 mm x 3.66 mm Preliminary Pout, Gain and PAE Data at 29GHz
Note: Devices designated as EPU are typically early in their characterization process prior to finalizing all electrical and process specifications. Specifications are subject to change without notice.
TriQuint Semiconductor Texas : Phone (972)994 8465
Fax (972)994 8504 Web: www.triquint.com
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Advance Product Information
TriQuint Semiconductor Texas : Phone (972)994 8465
Fax (972)994 8504 Web: www.triquint.com
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Advance Product Information
Chip Assembly and Bonding Diagram
Reflow process assembly notes: * * * * * AuSn (80/20) solder with limited exposure to temperatures at or above 300 C alloy station or conveyor furnace with reducing atmosphere no fluxes should be utilized coefficient of thermal expansion matching is critical for long-term reliability storage in dry nitrogen atmosphere
Component placement and adhesive attachment assembly notes: * * * * * * * vacuum pencils and/or vacuum collets preferred method of pick up avoidance of air bridges during placement force impact critical during auto placement organic attachment can be used in low-power applications curing should be done in a convection oven; proper exhaust is a safety concern microwave or radiant curing should not be used because of differential heating coefficient of thermal expansion matching is critical
Interconnect process assembly notes: * * * * * thermosonic ball bonding is the preferred interconnect technique force, time, and ultrasonics are critical parameters aluminum wire should not be used discrete FET devices with small pad sizes should be bonded with 0.0007-inch wire maximum stage temperature: 200 C
GaAs MMIC devices are susceptible to damage from Electrostatic Discharge. Proper precautions should be observed during handling, assembly and test.
TriQuint Semiconductor Texas : Phone (972)994 8465 Fax (972)994 8504 Web: www.triquint.com
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