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INTEGRATED CIRCUITS
74F3037 Quad 2-input NAND 30 driver
Product specification IC15 Data Handbook 1990 Feb 09
Philips Semiconductors
Philips Semiconductors
Product specification
Quad 2-input NAND 30 driver
74F3037
FEATURES
* 30 line driver * 67mA output drive capability in the high state * High speed * Facilitates incident wave switching * 3nh lead inductance each on VCC and GND when both * 160mA output drive capability in the low state * Industrial temperature range available (-40C to +85C)
DESCRIPTION
The 74F3037 is a high current line driver composed of four 2-input NAND gates. It has been designed to deal with the side pins are used
transmission line effects of PC boards which appear when fast edge rates are used. The drive capability of the 74F3037 is 67mA source and 160mA sink with a VCC as low as 4.5V. This guarantees incident wave switching with VOH not less than 2.0V and VOL not more than 0.8mA while driving impedances as low as 30 ohms. This is applicable with any combination of outputs using continuous duty. The propagation delay of the part is minimally affected by reflections when terminated only by the TTL inputs of other devices. Performances may be improved by full or partial line termination.
TYPE 74F3037 TYPICAL PROPAGATION DELAY 2.0ns TYPICAL SUPPLY CURRENT( TOTAL) 16mA
ORDERING INFORMATION
ORDER CODE COMMERCIAL RANGE DESCRIPTION VCC = 5V 10%, Tamb = 0C to +70C 16-pin plastic DIP 16-pin plastic SOL N74F3037N N74F3037D INDUSTRIAL RANGE VCC = 5V 10%, Tamb = -40C to +85C I74F3037N I74F3037D SOT38-4 SOT162-1 PKG DWG #
INPUT AND OUTPUT LOADING AND FAN OUT TABLE
PINS Dna, Dnb Data inputs DESCRIPTION 74F (U.L.) HIGH/LOW 1.0/1.0 3350/266 LOAD VALUE HIGH/LOW 20A/0.6mA 67mA/160mA
Qn Data output Note to input and output loading and fan out table One (1.0) FAST unit load is defined as: 20A in the high state and 0.6mA in the low state.
LOGIC DIAGRAM
D0a D0b 2 7 D1a 8 D1b D2a D2b 10 11 1 3 Q0
FUNCTION TABLE
INPUTS Dna L L
9 Q2
OUTPUT Dnb L H L H Qn H H H L
6
Q1
H H
VCC = Pin 12,13 GND = Pin 4, 5
14 D3a 15 D3b
16
Q3
SF00569
Notes to function table H = High voltage level L = Low voltage level
February 9, 1990
2
853 0021 98744
Philips Semiconductors
Product specification
Quad 2-input NAND 30 driver
74F3037
PIN CONFIGURATION
D0a D0b Q0 GND GND Q1 D1a D1b 1 2 3 4 5 6 7 8 16 15 14 13 12 11 Q3 D3b D3a VCC VCC D2a
IEC/IEEE SYMBOL
1 2 7 8 10 11 14 15 16 9 6 & 3
10 D2b 9 Q2
SF00570
SF00572
LOGIC SYMBOL
1 2 7 8 10 11 14 15
D0a D0b D1a D1a D2a D2b D3a D3b
Q0
Q1
Q2 Q3
VCC = Pin 12,13 GND = Pin 4, 5
3
6
9
16
SF00571
ABSOLUTE MAXIMUM RATINGS
(Operation beyond the limit set forth in this table may impair the useful life of the device. Unless otherwise noted these limits are over the operating free air temperature range.) SYMBOL VCC VIN IIN VOUT IOUT Tamb Supply voltage Input voltage Input current Voltage applied to output in high output state Current applied to output in low output state Operating free air temperature range Commercial range Industrial range Tstg Storage temperature range PARAMETER RATING -0.5 to +7.0 -0.5 to +7.0 -30 to +5 -0.5 to VCC 320 0 to +70 -40 to +85 -65 to +150 UNIT V V mA V mA
C C C
February 9, 1990
3
Philips Semiconductors
Product specification
Quad 2-input NAND 30 driver
74F3037
RECOMMENDED OPERATING CONDITIONS
SYMBOL UNIT VCC VIH VIL IIk IOH IOL Tamb Supply voltage High-level input voltage Low-level input voltage Input clamp current High-level output current Low-level output current Operating free air temperature range Commercial range Industrial range 0 -40 PARAMETER MIN 4.5 2.4 0.8 -18 -67 160 +70 +85 LIMITS NOM 5.0 MAX 5.5 TA = -40 to +85C V V V mA mA mA
C C
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.) SYMBOL PARAMETER TEST CONDITIONS1 VCC = MIN, VOH High-level output voltage VIL = MAX, VIH = MIN VOL Low-level output voltage VCC = MIN, VIL = MAX, VIH = MIN VIK II IIH IIL IO ICC Input clamp voltage Input current at maximum input voltage High-level input current Low-level input current Output current5 Supply current (total) ICCH ICCL VCC = MIN, II = IIK VCC = MAX, VI = 7.0V VCC = MAX, VI = 2.7V VCC = MAX, VI = 0.5V VCC = MAX, VO = 2.25V VCC = MAX -100 6.0 30 IOH1 = -67mA3 IOL = 100mA IOL1 = 160mA4 IOH = -45mA MIN LIMITS TYP2 MAX V V V 0.30 0.30 -0.73 0.50 0.50 -1.2 100 20 -0.6 -200 9.0 40 V V V UNIT
10%VCC 5%VCC 10%VCC 10%VCC 5%VCC
2.5 2.7 2.0
A A
mA mA mA
mA Notes to DC electrical characteristics 1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type. 2. All typical values are at VCC = 5V, Tamb = 25C. 3. IOH1 is the current necessary to guarantee the low to high transition in a 30 ohm transmission line on the incident wave. 4. IOL1 is the current necessary to guarantee the high to low transition in a 30 ohm transmission line on the incident wave. 5. IO is tested under conditions that produce current approximately one half of the true short-circuit current (IOS).
AC ELECTRICAL CHARACTERISTICS
LIMITS Tamb = +25C SYMBOL PARAMETER TEST CONDITION VCC = +5.0V CL = 50pF, RL = 500 MIN tPLH tPHL Propagation delay Dna, Dnb to Qn Waveform 1 1.0 1.0 TYP 2.0 2.0 MAX 5.0 4.5 Tamb = 0C to +70C VCC = +5.0V 10% CL = 50pF, RL = 500 MIN 1.0 1.0 MAX 5.5 5.0 Tamb =-40C to +85C VCC = +5.0V 10% CL = 50pF, RL = 500 MIN 1.0 1.0 MAX 5.5 5.0 ns UNIT
February 9, 1990
4
Philips Semiconductors
Product specification
Quad 2-input NAND 30 driver
74F3037
AC WAVEFORMS
Dna, Dnb VM tPHL VM tPLH
Qn
VM
VM
SF00005
Waveform 1. Propagation delay for inverting outputs Note to AC waveforms For all waveforms, VM = 1.5V.
TEST CIRCUIT AND WAVEFORMS
VCC NEGATIVE PULSE VIN PULSE GENERATOR RT D.U.T. VOUT 90% VM 10% tTHL (tf ) CL RL tw VM 10% tTLH (tr ) 0V 90% AMP (V)
tTLH (tr ) 90% POSITIVE PULSE VM 10% tw
tTHL (tf ) AMP (V) 90% VM 10% 0V
Test Circuit for Totem-Pole Outputs DEFINITIONS: RL = Load resistor; see AC ELECTRICAL CHARACTERISTICS for value. CL = Load capacitance includes jig and probe capacitance; see AC ELECTRICAL CHARACTERISTICS for value. RT = Termination resistance should be equal to ZOUT of pulse generators.
Input Pulse Definition INPUT PULSE REQUIREMENTS family amplitude VM 74F 3.0V 1.5V rep. rate 1MHz tw 500ns tTLH 2.5ns tTHL 2.5ns
SF00006
February 9, 1990
5
Philips Semiconductors
Product specification
Quad 2-input NAND 30 driver
74F3037
DIP16: plastic dual in-line package; 16 leads (300 mil)
SOT38-4
1990 Feb 09
6
Philips Semiconductors
Product specification
Quad 2-input NAND 30 driver
74F3037
SO16: plastic small outline package; 16 leads; body width 7.5 mm
SOT162-1
1990 Feb 09
7
Philips Semiconductors
Product specification
Quad 2-input NAND 30 driver
74F3037
Data sheet status
Data sheet status Objective specification Preliminary specification Product specification Product status Development Qualification Definition [1] This data sheet contains the design target or goal specifications for product development. Specification may change in any manner without notice. This data sheet contains preliminary data, and supplementary data will be published at a later date. Philips Semiconductors reserves the right to make chages at any time without notice in order to improve design and supply the best possible product. This data sheet contains final specifications. Philips Semiconductors reserves the right to make changes at any time without notice in order to improve design and supply the best possible product.
Production
[1] Please consult the most recently issued datasheet before initiating or completing a design.
Definitions
Short-form specification -- The data in a short-form specification is extracted from a full data sheet with the same type number and title. For detailed information see the relevant data sheet or data handbook. Limiting values definition -- Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or at any other conditions above those given in the Characteristics sections of the specification is not implied. Exposure to limiting values for extended periods may affect device reliability. Application information -- Applications that are described herein for any of these products are for illustrative purposes only. Philips Semiconductors make no representation or warranty that such applications will be suitable for the specified use without further testing or modification.
Disclaimers
Life support -- These products are not designed for use in life support appliances, devices or systems where malfunction of these products can reasonably be expected to result in personal injury. Philips Semiconductors customers using or selling these products for use in such applications do so at their own risk and agree to fully indemnify Philips Semiconductors for any damages resulting from such application. Right to make changes -- Philips Semiconductors reserves the right to make changes, without notice, in the products, including circuits, standard cells, and/or software, described or contained herein in order to improve design and/or performance. Philips Semiconductors assumes no responsibility or liability for the use of any of these products, conveys no license or title under any patent, copyright, or mask work right to these products, and makes no representations or warranties that these products are free from patent, copyright, or mask work right infringement, unless otherwise specified. Philips Semiconductors 811 East Arques Avenue P.O. Box 3409 Sunnyvale, California 94088-3409 Telephone 800-234-7381 (c) Copyright Philips Electronics North America Corporation 1998 All rights reserved. Printed in U.S.A. print code Document order number: Date of release: 10-98 9397-750-05203
Philips Semiconductors
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