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 STL20NM20N
N-CHANNEL 200V - 0.11 - 20A PowerFLATTM ULTRA LOW GATE CHARGE MDmeshTM II MOSFET
TARGET DATA TYPE STL20NM20N
s s s s s s s s
VDSS 200 V
RDS(on) < 0.13
ID 20 A
WORLDWIDE LOWEST GATE CHARGE TYPICAL RDS(on) = 0.11 IMPROVED DIE-TO-FOOTPRINT RATIO VERY LOW PROFILE PACKAGE (1mm MAX) VERY LOW THERMAL RESISTANCE LOW GATE RESISTANCE LOW INPUT CAPACITANCE HIGH dv/dt and AVALANCHE CAPABILITIES
PowerFLATTM(6x5) (Chip Scale Package)
DESCRIPTION This 200V MOSFET with a new advanced layout brings all unique advantages of MDmesh technology to lower voltages. The device exhibits worldwide lowest gate charge for any given on-resistance.Its use is therefore ideal as primary switch in isolated DC-DC converters for Telecom and Computer applications.Used in combination with secondary-side low-voltage STripFETTM products, it contributes to reducing losses and boosting efficiency.The new PowerFLATTM package allows a significant reduction in board space without compromising performance. APPLICATIONS The MDmeshTM family is very suitable for increasing power density allowing system miniaturization and higher efficiencies
INTERNAL SCHEMATIC DIAGRAM
ORDERING INFORMATION
SALES TYPE STL20NM20N MARKING L20NM20N PACKAGE PowerFLAT PACKAGING TUBE
June 2003
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STL20NM20N
ABSOLUTE MAXIMUM RATINGS
Symbol VDS VDGR VGS ID (2) IDM (3) PTOT (2) PTOT (4) dv/dt (5) Parameter Drain-source Voltage (VGS = 0) Drain-gate Voltage (RGS = 20 k) Gate- source Voltage Drain Current (continuous) at TC = 25C (Steady State) Drain Current (continuous) at TC = 100C Drain Current (pulsed) Total Dissipation at TC = 25C (Steady State) Total Dissipation at TC = 25C (Steady State) Derating Factor (2) Peak Diode Recovery voltage slope Value 200 200 30 20 12.5 80 2.5 80 0.02 10 Unit V V V A A A W W W/C V/ns
THERMAL DATA
Symbol Rthj-F Tj Tstg Parameter Thermal Resistance Junction-Foot (Drain) 35 -55 to 150 Max. Operating Junction Temperature Storage Temperature Typ. Max. 1.56 50 Unit C/W C/W C
Rthj-amb (2) Thermal Resistance Junction-ambient
AVALANCHE CHARACTERISTICS
Symbol IAR EAS Parameter Avalanche Current, Repetitive or Not-Repetitive (pulse width limited by Tj max) Single Pulse Avalanche Energy (starting Tj = 25 C, ID = IAR, VDD = 35 V) Max Value TBD TBD Unit A mJ
ELECTRICAL CHARACTERISTICS (TCASE = 25 C UNLESS OTHERWISE SPECIFIED) ON/OFF
Symbol V(BR)DSS IDSS IGSS VGS(th) RDS(on) Parameter Drain-source Breakdown Voltage Zero Gate Voltage Drain Current (VGS = 0) Gate-body Leakage Current (VDS = 0) Gate Threshold Voltage Static Drain-source On Resistance Test Conditions ID = 1 mA, VGS = 0 VDS = Max Rating VDS = Max Rating, TC = 125 C VGS = 30 V VDS = VGS, ID = 250 A VGS = 10 V, ID = 2 A 3.5 4.2 0.11 Min. 200 1 10 100 5 0.13 Typ. Max. Unit V A A nA V
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STL20NM20N
ELECTRICAL CHARACTERISTICS (CONTINUED) DYNAMIC
Symbol gfs (6) Ciss Coss Crss Coss eq. (*) RG Parameter Forward Transconductance Input Capacitance Output Capacitance Reverse Transfer Capacitance Equivalent Output Capacitance Gate Input Resistance Test Conditions VDS = 15 V, ID = 2 A VDS = 25 V, f = 1 MHz, VGS = 0 Min. Typ. 1.4 670 180 12 TBD TBD Max. Unit S pF pF pF pF
VGS = 0V, VDS = 0V to 400V f = 1 MHz Gate DC Bias = 0 Test Signal Level = 20 mV Open Drain
(*) Coss eq. is defined as a constant equivalent capacitance giving the same charging time as Coss when VDS increases from 0 to 80% VDSS
SWITCHING ON
Symbol td(on) tr Qg Qgs Qgd Parameter Turn-on Delay Time Rise Time Total Gate Charge Gate-Source Charge Gate-Drain Charge Test Conditions VDD = 100 V, ID = 2 A RG = 4.7 VGS = 10 V (see test circuit, Figure 3) VDD = 160 V, ID = 4 A, VGS = 10 V Min. Typ. TBD TBD 19 3.5 11 Max. Unit ns ns nC nC nC
SWITCHING OFF
Symbol tr(Voff) tf tc Parameter Off-Voltage RiseTime Fall Time Cross-Over Time Test Conditions VDD = 100 V, ID = 2 A, RG = 4.7, VGS = 10 V (see test circuit, Figure 3) Min. Typ. TBD TBD TBD Max. Unit ns ns ns
SOURCE DRAIN DIODE
Symbol ISD ISDM (3) VSD (6) trr Qrr IRRM trr Qrr IRRM
Note: 1. 2. 3. 4. 5. 6.
Parameter Source-drain Current Source-drain Current (pulsed) Forward On Voltage Reverse Recovery Time Reverse Recovery Charge Reverse Recovery Current Reverse Recovery Time Reverse Recovery Charge Reverse Recovery Current
Test Conditions
Min.
Typ.
Max. 20 80
Unit A A V ns nC A ns nC A
ISD = 2 A, VGS = 0 ISD = 2 A, di/dt = 100 A/s, VDD = 100 V, Tj = 25C (see test circuit, Figure 5) ISD = 2 A, di/dt = 100 A/s, VDD = 100 V, Tj = 150C (see test circuit, Figure 3) 89 300 6.5 TBD TBD TBD
1.3
Current Limited by Package. The value is rated according to Rthj-F. When Mounted on FR-4 Board of 1inch2, 2 oz Cu Pulse width limited by safe operating area The value is rated according to Rthj-F. ISD 20A, di/dt 400A/s, VDD V(BR)DSS, TJ T JMAX Pulsed: Pulse duration = 300 s, duty cycle 1.5 %
3/6
STL20NM20N
Fig. 1: Switching Times Test Circuit For Resistive Load Fig. 2: Gate Charge test Circuit
Fig. 3: Test Circuit For Diode Recovery Behaviour
4/6
STL20NM20N
PowerFLATTM(6x5) MECHANICAL DATA
mm. MIN. A A1 b C D D2 E E2 e F G H I L 0.70 3.55 1.27 1.99 2.20 0.40 0.219 0.90 0.028 4.15 6.00 3.65 0.140 0.049 0.078 0.086 0.015 0.0086 0.035 0.35 1.61 5.00 4.25 0.163 0.236 0.144 0.80 0.02 0.47 0.014 0.063 0.197 0.167 TYP MAX. 1.00 MIN. 0.031 0.001 0.018 inch TYP. MAX. 0.039
DIM.
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STL20NM20N
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics. (c) The ST logo is a registered trademark of STMicroelectronics (c) 2003 STMicroelectronics - Printed in Italy - All Rights Reserved STMicroelectronics GROUP OF COMPANIES Australia - Brazil - Canada - China - Finland - France - Germany - Hong Kong - India - Israel - Italy - Japan - Malaysia - Malta - Morocco Singapore - Spain - Sweden - Switzerland - United Kingdom - United States. (c) http://www.st.com
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