 |
|
| If you can't view the Datasheet, Please click here to try to view without PDF Reader . |
|
|
|
| If you can't view the Datasheet, Please click here to try to view without PDF Reader . |
|
|
| Datasheet File OCR Text: |
| DICE SPECIFICATION RH1009 2.5V Reference 2 DIE CROSS REFERENCE 3 LTC Finished Part Number RH1009 RH1009 Order DICE CANDIDATE Part Number Below RH1009 DICE RH1009 DWF PAD FUNCTION 1. V + 2. ADJ 3. V - NOTE: CONNECT SUBSTRATE TO V - 1 50 x 54 mils DICE ELECTRICAL TEST LI ITS SYMBOL VZ V PARAMETER Reverse Breakdown Voltage Reverse Breakdown Voltage Change with Current IR Z Information furnished by Linear Technology Corporation is believed to be accurate and reliable. However, no responsibility is assumed for its use. Linear Technology Corporation makes no representation that the interconnection of its circuits as described herein will not infringe on existing patent rights. W TJ = 25C. Preirradiation CONDITIONS IR = 1mA 400A IR 10mA MIN 2.495 MAX 2.505 6 UNITS V mV 1 DICE SPECIFICATION RH1009 Wafer level testing is performed per the indicated specifications for dice. Considerable differences in performance can often be observed for dice versus packaged units due to the influences of packaging and assembly on certain devices and/or parameters. Please consult factory for more information on dice performance and lot qualifications via lot sampling test procedures. Dice data sheet subject to change. Please consult factory for current revision in production. I.D.No. 66-13-1009 2 Linear Technology Corporation 1630 McCarthy Blvd., Milpitas, CA 95035-7417 (408) 432-1900 FAX: (408) 434-0507 LT/LT 0203 PRINTED IN USA www.linear.com (c) LINEAR TECHNOLOGY CORPORATION 2003 |
Price & Availability of RH1009DICE
 |
|
|
|
|
All Rights Reserved © IC-ON-LINE 2003 - 2022 |
| [Add Bookmark] [Contact Us] [Link exchange] [Privacy policy] |
|
Mirror Sites : [www.datasheet.hk]
[www.maxim4u.com] [www.ic-on-line.cn]
[www.ic-on-line.com] [www.ic-on-line.net]
[www.alldatasheet.com.cn]
[www.gdcy.com]
[www.gdcy.net] |