View HI5710A00_1134398.PDF datasheet online --- IC-ON-LINE

Datasheet File OCR Text:

(R)
August 2000
Features
CT UCT OD U R OD E PR ITUTE P nter at T e T OL E OBS LE SUBS upport C om/tsc IB l S tersil.c SS ica .in w A PO echn FOR act our T IL or ww nt RS E co 8-INT 1-88
HI5710A
10-Bit, 20 MSPS A/D Converter
Description
The HI5710A is a low power, 10-bit, CMOS analog-to-digital converter. The use of a 2-step architecture realizes low power consumption, 150mW, and a maximum conversion speed of 20MHz with only a 3 clock cycle data latency. The HI5710A can be powered down, disabling the chip and the digital outputs, reducing power to less than 5mW. A built-in, user controllable, calibration circuit is used to provide low linearity error, 1 LSB. The low power, high speed and small package outline make the HI5710A an ideal choice for CCD, battery, and high channel count applications. The HI5710A does not require an external sample and hold but requires an external reference and includes force and sense reference pins for increased accuracy. The digital outputs can be inverted, with the MSB controlled separately, allowing for various digital output formats. The HI5710A includes a test mode where the digital outputs can be set to a fixed state to ease in-circuit testing.
* Resolution 0.5 LSB (DNL) . . . . . . . . . . . . . . . . . . 10-Bit * Maximum Sampling Frequency . . . . . . . . . . . 20 MSPS * Low Power Consumption (Reference Current Excluded) . . . . . . . . . . . . . . 150mW * Standby Mode Power . . . . . . . . . . . . . . . . . . . . . . . 5mW * No Sample and Hold Required * TTL Compatible Inputs * Three-State TTL Compatible Outputs * Single +5V Analog Power Supply * Single +3.3V or +5V Digital Power Supply
Applications
* Video Digitizing - Multimedia * Data Communications * Image Scanners * Medical Imaging * Video Recording Equipment * Camcorders * QAM Demodulation
Part Number Information
PART NO. HI5710AJCQ TEMP. RANGE (oC) -20 to 75 PACKAGE 48 Ld MQFP PKG. NO. Q48.7x7-S
Pinout
DVSS
HI5710A (MQFP) TOP VIEW
DVDD AVSS TSTR AVSS TS CAL VIN AT NC NC NC
D0 D1 D2 D3 D4 DVSS DVDD D5 D6 D7 D8 D9
1 2 3 4 5 6 7 8 9 10 11 12
48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25 13 14 15 16 17 18 19 20 21 22 23 24
AVss VRB VRB NC NC NC VRT VRT AVSS AVSS AVDD AVDD
RESET DVSS
AVDD
TO
TESTMODE LINV
TIN
MINV CLK
SEL
OE
CE
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures. 1-888-INTERSIL or 321-724-7143 | Intersil (and design) is a registered trademark of Intersil Americas Inc. Copyright (c) Intersil Americas Inc. 2002. All Rights Reserved
File Number
3921.6
1
HI5710A Functional Block Diagram
VIN 39 S/H AMP + 8x COURSE CORRECTION AND LATCH
VRT 29 VRT 30 DAC
COURSE COMPARATOR AND ENCODE
VRB 34 VRB 35 CLK 22 OE CE 23 24 TIMING GEN AUTO CALIBRATION PULSE GENERATOR
-
12 D9 (MSB) 11 D8 10 D7 9 D6
8 D5 5 4 FINE LATCH 3 2
FINE COMPARATOR AND ENCODE
D4 D3 D2 D1
CALIBRATION UNIT
1 D0 (LSB) 21 MINV 20 LINV 19 TESTMODE 41 CAL 17 SEL 15 RESET
2
HI5710A
Absolute Maximum Ratings TA = 25oC
Supply Voltage, AVDD , DVDD . . . . . . . . . . . . . . . . . . . . . . . . . . . 7V Reference Voltage, V RT , VRB . . . . . . . . . VDD + 0.5V to VSS - 0.5V Analog Input Voltage, VIN . . . . . . . . . . . . VDD + 0.5V to VSS - 0.5V Digital Input Voltage, V IH , VIL . . . . . . . . . VDD + 0.5V to VSS - 0.5V Digital Output Voltage, V OH , VOL . . . . . . VDD + 0.5V to VSS - 0.5V
Thermal Information
Thermal Resistance (Typical, Note 1)
JA (oC/W)
MQFP Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . 111 Maximum Junction Temperature. . . . . . . . . . . . . . . . . . . . . . . 150oC Maximum Storage Temperature Range, TSTG . . . . . -65oC to 150oC Maximum Lead Temperature (Soldering 10s). . . . . . . . . . . . . 300oC (Lead Tips Only)
Operating Conditions
Supply Voltage AVDD , AVSS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +5V 0.25V DV DD , DVSS . . . . . . . . . . . . . . . . . . . . . . . . . . +3.3V to 5V 0.25V | DGND-AGND| . . . . . . . . . . . . . . . . . . . . . . . . . . . .0mV to 100mV Reference Input Voltage VRB . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1.8V to 2.8V VRT . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3.6V to 4.6V Analog Input Range, VIN . . . . . . . .(VRT - VRB) (1.8VP-P to 2.8VP-P) Clock Pulse Width tPW1. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25ns (Min) tPW0. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25ns (Min) Temperature, TA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -20oC to 75oC
CAUTION: Stresses above those listed in "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE: 1. JA is measured with the component mounted on an evaluation PC board in free air.
Electrical Specifications
PARAMETER SYSTEM PERFORMANCE Offset Voltage
fC = 20 MSPS, AV DD = +5V, DVDD = +3.3V, V RB = 2.0V, VRT = 4.0V, TA = 25oC (Note 2) TEST CONDITIONS MIN TYP MAX UNIT
EOT EOB
40 -120 VIN = 2.0V to 4.0V -
90 -70 1.3 0.5
140 -20 2.0 1.0
mV mV LSB LSB
Integral Non-Linearity, INL Differential Non-Linearity, DNL DYNAMIC CHARACTERISTICS Maximum Conversion Speed, fC Minimum Conversion Speed, fC Effective Number of Bits, ENOB Signal to Noise and Distortion, SINAD
fIN = 1kHz Ramp
20 -
8.7 53 52 53 54 47 45 60 59 60 65 50 49 1.0 0.3
0.5 -
MSPS MSPS BIts dB dB dB dB dB dB dB dB dB dB dB dB % Degree
fIN = 3MHz fIN = 100kHz fIN = 500kHz fIN = 1MHz fIN = 3MHz fIN = 7MHz fIN = 10MHz
-
Spurious Free Dynamic Range, SFDR
fIN = 100kHz fIN = 500kHz fIN = 1MHz fIN = 3MHz fIN = 7MHz fIN = 10MHz
Differential Gain Error, DG Differential Phase Error, DP
NTSC 40 IRE Mod Ramp, fC = 14.3 MSPS
3
HI5710A
Electrical Specifications
PARAMETER ANALOG INPUTS Analog Input Bandwidth (-3dB), BW Analog Input Current VIN = 4V VIN = 2V Analog Input Capacitance, C IN REFERENCE INPUT Reference Pin Current, IRT Reference Pin Current, IRB Reference Resistance (V RT to VRB), RREF DIGITAL INPUTS Digital Input Voltage VIH VIL Digital Input Current IIH IIL DIGITAL OUTPUTS Digital Output Current IOH IOL Digital Output Leakage Current IOZH IOZL TIMING CHARACTERISTICS Output Data Delay, tDL Output Enable/Disable Delay tPZL tPLZ tPZH tPHZ Sampling Delay, tSD POWER SUPPLY CHARACTERISTIC Analog Supply Current, IA DD Digital Supply Current, IDDD Analog Standby Current Digital Standby Current NOTE: 2. Electrical specifications guaranteed only under the stated operating conditions. CE = High fIN = 1kHz Ramp Wave Input 20 27 3 34 5 1.0 1.0 mA mA mA A Load is One TTL Gate 8 10 20 10 20 2 13 15 25 15 25 4 18 20 30 20 30 6 ns ns ns ns ns ns OE = AVDD , DVDD = Max OE = AVSS , DVDD = Min VOH = DVDD -0.5V VOL = 0.4V VOH = DVDD VOL = 0V 3.5 3.5 1 1 mA mA A A DVDD = Max VIH = DVDD VIL = 0V AVDD = 4.75V to 5.25V 2.3 0.80 5 5 V V A A RESET = Low RESET = Low 5 -11 180 7 -7 280 11 -5 380 mA mA VIN = 2.5V + 0.07VRMS -50 100 9 50 MHz A A pF fC = 20 MSPS, AVDD = +5V, DVDD = +3.3V, VRB = 2.0V, VRT = 4.0V, TA = 25oC (Note 2) (Continued) TEST CONDITIONS MIN TYP MAX UNIT
4
HI5710A
5
HI5710A Timing Diagrams
tPW1 tPW0
1.65V CLOCK tSD N+1 ANALOG INPUT N N+3 N+4 DATA OUTPUT N-3 N-2 N-1 N N+2
1.65V
1.65V (DVDD = 3.3V) 2.5V (DVDD = 5.0V)
tDL = INDICATES POINT AT WHICH ANALOG DATA IS SAMPLED
FIGURE 1.
1.65V (DVDD = 3.3V) 2.5V (DVDD = 5.0V) OUTPUT ENABLE ( OE)
tPLZ tPHZ
tPZL tPZH 1.65V (DVDD = 3.3V) 2.5V (DVDD = 5.0V)
DATA OUTPUT
ACTIVE
HIGH IMPEDANCE
FIGURE 2.
6
HI5710A Calibration Timing Diagrams
10ns OR MORE 7 CLOCKS CLK
CAL
1 CLOCK OR MORE
D5 TO D9
D0 TO D4
FIGURE 3. EXTERNAL CALIBRATION PULSE TIMING DIAGRAM
INPUT
CLK
CAL
FIGURE 4A. CALIBRATION DURING H SYNC
INPUT
CLK
CAL
FIGURE 4B. CALIBRATION DURING V SYNC FIGURE 4. EXAMPLES OF EXTERNAL CALIBRATION PULSE INPUT FOR VIDEO APPLICATIONS
7
HI5710A Typical Performance Curves
MAXIMUM OPERATING FREQUENCY (MHz) 28 fC = 20MHz fIN = 1kHz RAMP WAVE AVDD = 5.0V DVDD = 3.3V 35 fIN = 1kHz RAMP WAVE AVDD = 5.0V DVDD = 3.3V
SUPPLY CURRENT (mA)
27
30
26
25
25
20
24 -20 0 25 50 75 100 AMBIENT TEMPERATURE (oC)
-20
0
25
50
75
100
AMBIENT TEMPERATURE (oC)
FIGURE 5. SUPPLY CURRENT vs AMBIENT TEMPERATURE
FIGURE 6. MAXIMUM OPERATING FREQUENCY vs AMBIENT TEMPERATURE
19 AVDD = 5.0V DVDD = 3.3V fC = 1MHz CL = 20pF
8 AVDD = 5.0V DVDD = 3.3V fC = 1MHz
OUTPUT DATA DELAY (ns)
15
SAMPLING DELAY (ns)
17
6
4
13
2
11
-20
0
25
50
75
-20
0
25
50
75
AMBIENT TEMPERATURE (oC)
AMBIENT TEMPERATURE (oC)
FIGURE 7. OUTPUT DATA DELAY vs AMBIENT TEMPERATURE
FIGURE 8. SAMPLING DELAY vs AMBIENT TEMPERATURE
8
HI5710A Typical Performance Curves
(Continued)
65 60 55 SINAD (dB) DVDD = 3.3V SFDR (dB) 50 45 40 35 30 25 0.1 AVDD = 5.0V DVDD = 3.3V fC = 20MHz VIN = 2VP-P TA = 25 oC 1 10 100
80 75 70 65 DVDD = 5V 60 55 50 45 40 35 30 0.1 AVDD = 5.0V DVDD = 3.3V fC = 20MHz VIN = 2VP-P TA = 25 oC 1 10 INPUT FREQUENCY (MHz) 100
INPUT FREQUENCY (MHz)
FIGURE 9. SINAD vs INPUT FREQUENCY
FIGURE 10. SFDR vs INPUT FREQUENCY
10 EFFECTIVE NUMBER OF BITS (BITS) 9 OUTPUT LEVEL (dB) 8 DVDD = 3.3V 7 6 5 4 AVDD = 5.0V DVDD = 3.3V fC = 20MHz VIN = 2VP-P TA = 25 oC 0.1 1 10 100 DVDD = 5V
2 1 0 -1 -2 -3 -4 -5 AVDD = 5.0V DVDD = 3.3V fC = 20MHz VIN = 2VP-P TA = 25oC 100K 1M 10M 100M
INPUT FREQUENCY (MHz)
INPUT FREQUENCY (Hz)
FIGURE 11. EFFECTIVE BITS vs INPUT FREQUENCY
FIGURE 12. INPUT BANDWIDTH
80 60 INPUT CURRENT (mA) 40 20 0 -20 -40 -60 -80 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6 3.8 4 EFFECTIVE NUMBER OF BITS (BITS) TA = 25oC
10 9.5 9 8.5 8 7.5 7 6.5 6 5 10 15 20 25 30 INPUT VOLTAGE (V) CLOCK FREQUENCY fIN = 5MHz DVDD = 5V fIN = 5MHz DVDD = 3.3V fIN = 1MHz DVDD = 5V/3.3V
FIGURE 13. ANALOG INPUT CURRENT vs INPUT VOLTAGE
FIGURE 14. ENOB vs CLOCK FREQUENCY
9
HI5710A Typical Performance Curves
(Continued)
-25 -30 -35 -40 THD (dB) SNR (dB) -45 -50 -55 -60 -65 -70 -75 0.1 1 10 100 DVDD = 3.3V DVDD = 5V
59 57 55 53 DVDD = 3.3V 51 49 47 45 100 DVDD = 5V
INPUT FREQUENCY (MHz)
1,000 10,000 INPUT FREQUENCY (MHz)
100,000
FIGURE 15. THD vs INPUT FREQUENCY
FIGURE 16. SNR vs INPUT FREQUENCY
Pin Description and I/O Pin Equivalent Circuit
PIN NUMBER 1 to 5, 8 to 12 SYMBOL D0 to D9
DVDD
EQUIVALENT CIRCUIT
DESCRIPTION Digital Outputs: D0 (LSB) to D9 (MSB).
D1
DVSS
13 7, 45 6, 16, 48 27, 28, 36, 43, 44 17
TO DVDD DVSS AVSS SEL
AVDD
Test Pin, Leave Pin Open. Digital VDD . Digital VSS . Analog VSS . Controls calibration input pulse selection after completion of the internal start-up calibration function. High: Selects the internal auto calibration pulse generation function Low: Selects the external calibration pulse input, CAL pin 41.
17
AVSS
10
HI5710A Pin Description and I/O Pin Equivalent Circuit
PIN NUMBER 22 SYMBOL CLK EQUIVALENT CIRCUIT
AVDD
(Continued) DESCRIPTION Clock Pin.
22
AVSS
41
CAL
AVDD
Calibration Pulse Input, calibration starts on a falling edge, normally high.
41
AVSS
15
RESET
AVDD
Calibration Circuit Reset and Internal Calibration Function Restart, resets with a negative pulse, normally high.
15
AVSS
14 29, 30 34, 35
TIN VRT VRB
29, 30 AVDD
Factory Test Signal Input, normally tied to AVSS or AVDD . Reference Top, normally 4.0V. Reference Bottom, normally 2.0V.
AVSS
34, 35
38 42 37
AT TS TSTR
Factory Test Signal Output, leave pin open. Factory Test Signal Input, tie to AVDD . Factory Test Signal Input, tie to AVSS .
11
HI5710A Pin Description and I/O Pin Equivalent Circuit
PIN NUMBER 23 SYMBOL OE EQUIVALENT CIRCUIT
AVDD
(Continued) DESCRIPTION D0 to D9 Output Enable. Low: Outputs Enabled. High: High Impedance State.
23
AVSS
24
CE
AVDD
Chip Enable. Low: Active State. High: Standby State.
24
AVSS
19
TESTMODE
AVDD
Test Mode. High: Normal Output State. Low: Output fixed.
19
AVSS
20
LINV
AVDD
Output Inversion. High: D0 to D8 are inverted. Low: D0 to D8 are normal.
20
AVSS
21
MINV
AVDD
Output Inversion. High: D9 is inverted. Low: D9 is normal.
21
AVSS
18, 25, 26 39
AV DD VIN
AVDD
Analog VDD . Analog Input.
39
+
-
AVSS
12
HI5710A
A/D OUTPUT CODE TABLE INPUT SIGNAL VOLTAGE VRT * * * * * * * * VRB NOTE: 3. This table shows the correlation between the analog input voltage and the digital output code. (TESTMODE = 1, MINV and LINV= 0) DIGITAL OUTPUT CODE STEP 1023 * * * 512 511 * * * 0 0 0 0 0 1 0 0 1 0 1 0 1 MSB 1 1 1 1 1 * * * 0 1 * * * 0 0 0 0 0 0 0 0 1 0 1 0 1 0 1 0 1 0 1 1 1 1 1 1 LSB 1
DIGITAL OUTPUT DATA FORMAT TABLE TESTMODE 1 1 1 1 0 0 0 0 NOTES: 4. This table shows the output state for the combination of TESTMODE, LINV, and MINV states. 5. N: Non-Inverted Output. 6. I: Inverted Output. LINV 0 1 0 1 0 1 0 1 MINV 0 0 1 1 0 0 1 1 D0 N I N I 1 0 1 0 D1 N I N I 0 1 0 1 D2 N I N I 1 0 1 0 D3 N I N I 0 1 0 1 D4 N I N I 1 0 1 0 D5 N I N I 0 1 0 1 D6 N I N I 1 0 1 0 D7 N I N I 0 1 0 1 D8 N I N I 1 0 1 0 D9 N N I I 0 0 1 1
Detailed Description
The HI5710A is a two step A/D converter featuring a 5-bit upper comparator group and a 5-bit lower comparator group. A user controllable internal calibration unit is used to improve linearity. The voltage references must be supplied externally, with VRB and VRT typically being set to 2.0V and 4.0V respectively. Both chip enable and output enable pins are provided for flexibility and to reduce power consumption. The digital outputs can be inverted by control inputs LINV and MINV, where LINV controls outputs D0 through D8 and MINV controls output D9 (MSB). This allows for various digital output data formats, such as straight binary, inverted binary, offset two's complement or inverted offset two's complement. Analog Input The analog input typically requires a 2V P-P full scale input signal. The full scale input can range from 1.8V P-P to 2.8VP-P dependent on the voltage references used. The input capacitance is small when compared with other flash
type A/D converters. However, it is necessary to drive the input with an amplifier with sufficient bandwidth and drive capability. Op amps such as the HA5020 should make an excellent input amplifier depending on the application requirements. In order to prevent parasitic oscillation, it may be necessary to insert a resistor between the output of the amplifier and the A/D input. Be sure to consider the amplifiers settling time in CCD applications or where step inputs are expected. Reference Input The analog input voltage range of the A/D is set by the voltage difference between the VRT and VRB voltage references. The HI5710A is designed for use with external voltage references of 2.0V and 4.0V on VRB and V RT , respectively. The analog input voltage range of the A/D will now be from 2.0V to 4.0V. The VRB voltage reference range is 1.8V to 2.8V and the VRT voltage reference range is 3.6V to 4.6V. The voltage difference between the VRT and VRB voltage references, (VRT - VRB), can range from 1.8V to 2.8V. The VRT and VRB voltage reference input pins must be decoupled to analog ground to minimize noise on these references. A 0.1F capacitor is usually adequate.
13
HI5710A
Clock Input The HI5710A samples the input signal on the rising edge of the clock with the digital data being latched at the digital outputs (D0 - D9) after 3 clock cycles. The HI5710A is designed for use with a 50% duty cycle square wave, but a 10% variation should not affect performance. The clock input can be driven from +3.3V CMOS or +5V TTL/CMOS logic. When using a +3.3V digital supply, HC or AC CMOS logic will work well. Digital Inputs The digital inputs can be driven from +3.3V CMOS or +5V TTL/CMOS logic. When using a +3.3V digital supply, HC or AC CMOS logic will work well. Digital Outputs The digital outputs are CMOS outputs. The LINV control input will invert outputs D0 through D8 and MINV control input will invert output D9 (MSB). This allows the user to set the digital output data for a number of different digital formats. The outputs can also be three-stated by pulling the OE control input high. The digital output supply can run from +3.3V or +5V. The digital outputs will generate less radiated noise using +3.3V, but the outputs will have less drive capability. The digital outputs will only swing to DVDD , therefore exercise care if interfacing to +5V logic when using a +3.3V supply. The digital output data can also be set to a fixed, predetermined state, through the use of the TESTMODE, LINV and MINV control input signals, see the Digital Output Data Format table. By setting the TESTMODE pin low, the outputs go to a defined digital pattern. This pattern is varied by the MINV and LINV control inputs. This feature can be used for in-circuit testing of the digital output data bus. Calibration Function The HI5710A has a built-in calibration unit which is designed to provide superior linearity by correcting the gain error of the subrange amplification circuitry. In addition to the calibration unit, the HI5710A provides a built-in auto calibration pulse generation function. Figure 20 shows a functional block diagram of the auto calibration pulse generator circuit. The calibration pulse generation functions provided can be subdivided into four operational areas. The first function is the generation of the calibration pulses required to complete the initial (power-up) calibration process when power is first supplied to the converter. The next two functions accommodated are the generation of periodic calibration pulses, either internally or externally, to maintain calibration. The last function is the provision for externally initiating or reinitiating the power-up calibration process. Power-up Calibration Function The initial power-up calibration requires over 600 calibration pulses in order to complete the calibration process when power is first applied to the converter. The power-up calibration function provided by the auto calibration pulse generator automatically generates these pulses internally and completes the initial calibration process. The following five conditions must be satisfied in order for the auto calibration pulse generator power-up calibration process to be initiated : a) The voltage between AVDD and AVSS is approximately 2.5V or more. b) The voltage between VRT and VRB is approximately 1.0V or more. c) The RESET control input pin (Pin 15) must be high (logic 1). d) The CE control input pin (Pin 24) must be low (logic 0). e) Condition b must be met after condition a. Once all five of these conditions is satisfied the power-up calibration pulses are generated. These power-up calibration pulses are derived from a divided-by sixteen sample clock (CLK/16). A 14-bit counter is also counting the CLK/16 signal and when the 14-bit counter reaches the end of its count range the carry out from the counter is used to gate off or mask the CLK/16 power-up calibration pulses. The time required for the power-up calibration process to be completed after the above five conditions has been met can be calculated using the following equation: tPower-Up Cal = (24 x 214)/(fCLK) = 218/fCLK . For example, if the sample clock frequency is 20MHz, the time required for the power-up calibration process to be completed, after the above five conditions has been met, is tPower-Up Cal = 218/fCLK = 218/20x106 = 262,144/20 x 106 , tPower-Up Cal = 13.1ms. Auto Calibration Pulse Generation Function The auto calibration pulse generator provides the user with the choice of internal or external periodic calibration pulse generation following the completion of the power-up calibration process. The selection of internal or external periodic calibration pulse generation is made through the use of the SEL control input pin (pin 17). Setting the SEL control input pin high (logic 1) selects the internal periodic calibration pulse generation function. Setting the SEL control input pin low (logic 0) selects the external calibration pulse input pin (CAL, pin 41). For the case where the internal periodic calibration pulse generation function has been chosen, SEL control input pin high, the auto calibration pulse generator periodically generates calibration pulses internally so that calibration is performed constantly without the need to provide calibration input pulses from an external source. These periodic calibration pulses are derived from the divided-by sixteen sample clock (CLK/16). The CLK/16 signal drives a 24-bit counter which generates a carry-out that is used as the internal calibration pulse. The time between calibration pulses when using the internal auto calibration pulse generator can be calculated using the following equation: tInternal Cal Pulse = (24 x 224)/(fCLK) = 228/fCLK .
14
HI5710A
For example, if the sample clock frequency is 20MHz, the time between internal auto calibration pulses is: tInternal Cal Pulse = 228/fCLK = 228/20 x 106 = 268,435,456/20 x 106, tInternal Cal Pulse = 13.4s. Since a calibration is completed once every seven calibration pulses, the time required to complete a calibration cycle is: tInternal Cal Cycle = (7 x 228)/fCLK . Therefore, if the sample clock frequency is 20MHz, the internal calibration cycle is: tInternal Cal Cycle = (7 x 228)/20 x 106 = 93.95s. It should be noted that this method of periodic calibration may not be acceptable if the fixing of the lower five output bits during the calibration (see the discussion below on external calibration pulse input function) would cause problems since the calibration is executed asynchronously without regard to the analog input signal. External Calibration Pulse Input Function If the auto calibration pulse generation function cannot be used then periodic calibration can be performed by providing externally input calibration pulses to the CAL input pin (pin 41) and setting the SEL control input pin (pin 17) low. Refer to Figure 3, External Calibration Pulse Timing Diagram, for details on the required timing of the externally supplied calibration pulses. A setup time of 10ns or longer is required for the CAL input and it must stay low for at least one sample clock (CLK) period. Calibration starts when the falling edge of the externally supplied calibration pulse, input to the CAL pin, is detected. One calibration is completed in 11 sample clock cycles. Seven sample clock cycles after the falling edge of the externally supplied calibration pulse is detected, the calibration circuit takes exclusive possession of the lower comparators, D0 through D4, for four sample clock cycles. During this time, the D0 through D4 outputs are latched with the previous data (cycle seven data). The upper 5 bits, D5 through D9, will operate as usual during the calibration. The calibration must be done when the part is first powered up, if the sampling frequency changes, when the supplies vary more than 100mV or when (VRT - VRB) changes more than 200mV. Figure 4 shows several possible external calibration pulse timing schemes where the calibration is performed outside the active video interval by using the video sync signal as the externally supplied CAL input. It is not necessary to calibrate as often as these figures show, these are only design ideas. It is also possible to use only the power-up calibration function by leaving the SEL control input pin (pin 17) low and fixing the CAL input pin (pin 41) either high or low. Note, however, that using only the powerup calibration function will require the above restrictions on the sample frequency and the fluctuation range of the power supply voltage and the reference voltage differential be maintained. Initiating/Re-Initiating Power-up Calibration Function The power-up calibration function can be initiated/re-initiated after the power supply voltage and the reference voltages are stabilized by using the CE (pin 24) or RESET (pin 15) control input pins. This might prove useful in a situation where the turn-on characteristics of the power supply and reference voltages is unstable/indeterminate or where the sequence of power-up does not meet the required conditions stated earlier. Power, Grounding, and Decoupling To reduce noise effects, keep the analog and digital grounds separated. Bypass both the digital and analog VDD pins to their respective grounds with a ceramic 0.1F capacitor close to the input pin. A larger capacitor (1F to 10F) should be placed somewhere on the PC board for low frequency decoupling of both analog and digital supplies. The analog supply should be present before the digital supply to reduce the risk of latch-up. The digital supply can run from +3.3V or +5V. A +3.3V supply generates less radiated noise at the digital outputs, but results in less drive capability. The specifications do not change with digital supply levels. Remember, the digital outputs will only swing to DV DD . To obtain full expected performance from the converter be sure that the circuit board has a large ground plane to provide as low an impedance as possible. It is recommended that the converter be mounted directly to the
15
HI5710A
circuit board and the use of a socket is highly discouraged.
Test Circuits
+V
S2
+
-
S1
S1: ON IF A < B S2: ON IF A > B
-V AB 10 COMPARATOR A10 A1 A0 B10 B1 B0 BUFFER
DVM CLK (20MHz)
"0"
"1" 10 000 * * * 00 TO 111 * * * 10
CONTROLLER
FIGURE 17. INTEGRAL AND DIFFERENTIAL NON-LINEARITY ERROR TEST CIRCUIT
fC -1kHz SG
4.0V SCOPE 2.0V 1 2 AMP VIN 10 1 2 VECTOR SCOPE DG DP 2V
DUT HI5710A
12-BIT D/A CLK
NTSC SIGNAL SOURCE
100 IRE 0 - 40
40 IRE MODULATION BURST
4V
SG (CW)
SYNC
fC
FIGURE 18. MAXIMUM OPERATIONAL SPEED AND DIFFERENTIAL GAIN /PHASE ERROR TEST CIRCUIT
4V 2V
VDD VRT VIN VRB CLK OE GND VOL
IOL
4V 2V
VDD VRT VIN VRB CLK
IOH
+
OE GND
VOH
+
-
-
FIGURE 19A. FIGURE 19. DIGITAL OUTPUT TEST CIRCUIT
FIGURE 19B.
16
HI5710A Test Circuits
(Continued)
AVDD 1 16 14-BIT COUNTER CLR AVDD AVSS VRT VRB RESET CE SENCE AMP 1 24-BIT COUNTER CLR CO D CO CLR Q
OUT
CLK
SENCE AMP 2
SEL CAL
FIGURE 20. CALIBRATION PULSE GENERATION CIRCUIT
Typical Application Circuits
2.0V
+ AVDD AVDD VRT AVSS AVSS AVss VRB VRB VRT NC NC NC
-
4.0V
+
-
+5VA 0.1F
TSTR 4.0V 2.0V AT VIN NC CAL TS AVSS AVSS DVDD 10F 0.1F NC NC DVSS
37 38 39 40 41 42 43 44 45 46 47 48
36 35 34 33 32 31 30 29 28 27 26 25 24 23 22 21 20 HI5710A 19 18 17 16 15 14 1 23 4 5 67 13 8 9 10 11 12
CE OE CLK MINV LINV TESTMODE AVDD SEL DVSS RESET TIN TO 0.1F +5VA 10F CLOCK INPUT
+5VA 0.1 +3.3VD
AVSS D4 DVSS D0 D1 D2 D3 D5 D6 D7 D8 D9
DVSS
+3.3VD 0.1
DIGITAL OUTPUTS
FIGURE 21A. POWER-UP CALIBRATION WITH INTERNAL AUTO CALIBRATION SELECTED
17
HI5710A Typical Application Circuits
(Continued)
2.0V
+ AVDD AVDD VRT AVSS AVSS AVss VRB VRB VRT NC NC NC
-
4.0V
+
-
+5VA 0.1F
TSTR 4.0V 2.0V CALIBRATION PULSE +5VA 0.1 +3.3VD 10F 0.1F AT VIN NC CAL TS AVSS AVSS DVDD NC NC DVSS
37 38 39 40 41 42 43 44 45 46 47 48
36 35 34 33 32 31 30 29 28 27 26 25 24 23 22 21 20 HI5710A 19 18 17 16 15 14 1 23 4 5 67 13 8 9 10 11 12
CE OE CLK MINV LINV TESTMODE AVDD SEL DVSS RESET TIN TO 0.1F +5VA 10F CLOCK INPUT
AVSS D4 DVSS D0 D1 D2 D3 D5 D6 D7 D8 D9
DVSS
+3.3VD 0.1
DIGITAL OUTPUTS
FIGURE 21B. POWER-UP CALIBRATION WITH EXTERNAL CALIBRATION PULSE INPUT SELECTED
18
HI5710A Typical Application Circuits
+ 4.0V
(Continued)
+
-
+5VA 0.1F AVDD AVDD VRT AVSS AVSS
2.0V
AVss
VRB
VRB
TSTR 4.0V 2.0V AT VIN NC CAL TS AVSS AVSS DVDD 10F 0.1F NC NC DVSS
37 38 39 40 41 42 43 44 45 46 47 48
36 35 34 33 32 31 30 29 28 27 26 25 24 23 22 21 20 HI5710A 19 18 17 16 15 14 1 23 4 5 67 13 8 9 10 11 12
VRT
NC NC NC
CE OE CLK MINV LINV TESTMODE AVDD SEL DVSS RESET TIN TO 0.1F +5VA 10F CLOCK INPUT
+5VA 0.1 +3.3VD
AVSS D4 DVSS D0 D1 D2 D3 D5 D6 D7 D8 D9
DVSS
+3.3VD 0.1
DIGITAL OUTPUTS
FIGURE 21C. ONLY POWER-UP CALIBRATION BEING UTILIZED
19
Timing Definitions
Sampling Delay, is the time delay between the external sample command (the rising edge of the clock) and the time at which the analog input signal is actually sampled. This delay is due to internal clock path propagation delays. Data Latency, after the analog sample is taken, the digital representation is output on the digital data output bus after the 3rd cycle of the clock. This is due to the pipeline nature of the converter where the data has to ripple through the stages. This delay is specified as the data latency. After the data latency time, the data representing each succeeding analog input sample is output on the following rising edge of the clock pulse. The digital data output lags the analog input sample by 3 sampling clock cycles. Power-up Initialization, this time is defined as the maximum number of clock cycles that are required to initialize the converter at power-up. The requirement arises from the need to initialize some dynamic circuits within the converter.
Dynamic Performance Definitions
Fast Fourier Transform (FFT) techniques are used to evaluate the dynamic performance of the HI5710A. A low distortion sine wave is applied to the input, it is sampled, and the output is stored in RAM. The data is then transformed into the frequency domain with a 2048 point FFT and analyzed to evaluate the dynamic performance of the A/D. The analog sine wave input signal to the converter is -0.5dB down from full scale for all these tests. The distortion numbers are quoted in dBc (decibels with respect to carrier) and DO NOT include any correction factors for normalizing to full scale. Signal-to-Noise Ratio, SNR, is the measured RMS signal to RMS noise for a specified analog input frequency and sampling frequency. The noise is the RMS sum of all of the spectral components excluding the fundamental and the first five harmonics. Signal-to-Noise + Distortion Ratio, SINAD, is the measured RMS signal to RMS sum of all other spectral components below the Nyquist frequency excluding DC. Effective Number Of Bits, ENOB, the effective number of bits (ENOB) is calculated from the measured SINAD data. as follows: ENOB = (SINAD - 1.76 + V CORR) / 6.02, where: VCORR = 0.5dB. VCORR adjusts the ENOB for the amount the analog input signal is below full scale. 2nd and 3rd Harmonic Distortion, is the ratio of the RMS value of the 2nd and 3rd harmonic component, respectively, to the RMS value of the measured input signal. Analog Input Bandwidth, is the frequency at which the amplitude of the digitally reconstructed output has decreased 3dB below the amplitude of the input sine wave. The input sine wave has a peak-to-peak amplitude equal to the differential reference voltage. The bandwidth given is measured at the specified sampling frequency.
Static Performance Definitions
Differential Linearity Error, DNL, is the worst case deviation of a code width from the ideal value of 1 LSB. The converter is guaranteed to have no missing codes over the operating temperature range. Integral Linearity Error, INL, is the worst case deviation of a code center from a best fit straight line calculated from the measured data.
20
AMP
A/D
DSP/P
D/A
AMP
HFA1135 HFA1245 HA5020
HI5710A HI5767/2 HI5767/4
HSP9501 HSP48410 HSP48908 HSP48212 HSP43891 HSP43168 HSP43216
HI1171 HI3050 HI3338
HA5020 HA2842 HFA1115
HFA1135: HFA1245: HA5020: HI5710A: HI5767/2/4: HSP9501: HSP48410: HSP48908: HSP48212: HSP43891: HSP43168: HSP43216: HI1171: HI3338: HI3050: HA2842: HFA1115:
350MHz Op Amp with Output Limiting Dual 350MHz Op Amp with Disable/Enable 100MHz Video Op Amp 10-Bit, 20 MSPS, A/D Converter 10-Bit, 20/40 MSPS, Low Power A/D Converter with Internal Reference Programmable Data Buffer Histogrammer/Accumulating Buffer, 10-Bit Pixel Resolution 2-D Convolver, 3 x 3 Kernal Convolution, 8-Bit Digital Video Mixer Digital Filter, 30MHz, 9-Bit Dual FIR Filter, 10-Bit, 33MHz/45MHz Digital Half Band Filter 8-Bit, 40MHz, Video D/A Converter 8-Bit, 50MHz, Video D/A Converter Triple 10-Bit, 50MHz, Video DAC High Output Current, Video Op Amp 350MHz Programmable Gain Buffer with Output Limiting
CMOS Logic Available in HC, HCT, AC, ACT, and FCT. FIGURE 22. 10-BIT VIDEO IMAGING COMPONENTS
AMP
A/D
DSP/P
D/A
AMP
HFA3600 HFA3102 HFA3101 HFA1100
HI5710A HI5767/2 HI5767/4
HSP43168 HSP43216 HSP43891 HSP50016 HSP50110 HSP50210
HI5721 HI20201 HI20203 HI5780
HFA1115
HFA3600: HFA3102: HFA3101: HFA1100: HI5710A: HI5767/2/4: HSP43168: HSP43216: HSP43891: HSP50016: HSP50110: HSP50210: HI5721: HI5780: HI20201: HI20203: HFA1115:
Low Noise Amplifier/Mixer Dual Long-Tailed Pair Transistor Array Gilbert Cell Transistor Array 850MHz Op Amp 10-Bit, 20 MSPS, A/D Converter 10-Bit, 20/40 MSPS, Low Power A/D Converter with Internal Reference Dual FIR Filter, 10-Bit, 33MHz/45MHz Digital Half Band Filter Digital Filter, 30MHz, 9-Bit Digital Down Converter Digital Quadrature Tuner Digital Costas Loop 10-Bit, 100MHz, Communications D/A Converter 10-Bit, 80MHz CMOS D/A Converter 10-Bit, 160MHz, High Speed D/A Converter 8-Bit, 160MHz, High Speed D/A Converter 350MHz Programmable Gain Buffer with Output Limiting
CMOS Logic Available in HC, HCT, AC, ACT, and FCT. FIGURE 23. 10-BIT COMMUNICATIONS COMPONENTS
21

▲Up To Search▲

Price & Availability of HI5710A00

	To Download HI5710A00 Datasheet File
If you can't view the Datasheet, Please click here to try to view without PDF Reader .