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T6C03 TOSHIBA CMOS DIGITAL INTEGRATED CIRCUIT SILICON MONOLITHIC T6C03 COLUMN AND ROW DRIVER FOR A DOT MATRIX LCD The T6C03 is a 160-channel-output column and row driver for an STN dot matrix LCD. The T6C03 features a 42-V LCD drive voltage and an 8-MHz maximum operating frequency. The T6C03 is able to drive LCD panels with a duty ratio of up to 1 / 480. Features l Display duty application l LCD drive signal l Data transfer l Operating frequency l LCD drive voltage l Power supply voltage l Operating temperature l Display-off function l Low power consumption l EI / LP input : to 1 / 480 : 160 : Column: 4 / 8-bit bidirectional Row: Single / Dual bidirectional : 8 MHz (VDD = 5 V 10%) : 14 to 42 V : 2.7 to 5.5 V : -20 to 75C : When / DSPOF is L, all LCD drive outputs (O1 to O160) remain at the V5 level. : Cascade connection and auto enable transfer functions are available. : EI / LP input enables LSI operation. Connect EIO1 / 2 from the 1st LSI to L. l LCD drive output resistance : 1.3 k (max) (20 V, 1 / 13 bias) 000707EBE1 * TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the "Handling Guide for Semiconductor Devices," or "TOSHIBA Semiconductor Reliability Handbook" etc.. * The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury ("Unintended Usage"). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this document shall be made at the customer's own risk. * Polyimide base film is hard and thin. Be careful not to injure yourself on the film or to scratch any other parts with the film. Try to design and manufacture products so that there is no chance of users touching the film after assembly, or if they do , that there is no chance of them injuring themselves. When cutting out the film, try to ensure that the film shavings do not cause accidents. After use, treat the leftover film and reel spacers as industrial waste. * Light striking a semiconductor device generates electromotive force due to photoelectric effects. In some cases this can cause the device to malfunction. This is especially true for devices in which the surface (back), or side of the chip is exposed. When designing circuits, make sure that devices are protected against incident light from external sources. Exposure to light both during regular operation and during inspection must be taken into account. * The products described in this document are subject to the foreign exchange and foreign trade laws. * The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA CORPORATION for any infringements of intellectual property or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any intellectual property or other rights of TOSHIBA CORPORATION or others. * The information contained herein is subject to change without notice. 2001-02-13 1/12 T6C03 Block Diagram 2001-02-13 2/12 T6C03 Pin Assignment Note: The above diagram shows the pin configuration of the LSI Chip, not that of the tape carrier package. 2001-02-13 3/12 T6C03 Pin Functions Pin Name O1 to O160 I/O Output Output for LCD drive signal (Column mode) Input / output for enable signal DIR selects In or Out. Connect EIO (IN) of 1st LSI to L. For a cascade connection, connect EIO (OUT) to EIO (IN) of next LSI. (Row mode) Input / output for shift data (Column mode) Input for data signal (Row mode) DI1 to DI7: Fix to H or L, DI8: when DF = H, use as DIN (Direction) Input for data flow direction select (Display off) / DSPOF = L : Display-off mode, (O1 to O160) remain at the V5 level / DSPOF = H : Display-on mode, (O1 to O160) are operational. (Data format) Input for data bit select (Latch pulse) Display data is latched on falling edges of LP. When EIO (IN) = L, SCP * LP = H enables the 1st LSI. (Row mode) Input for shift clock pulse FR Input (Frame) Input for frame signal (Column mode) Input for shift clock pulse (Row mode) Fix to H or L (TEST) Fix to L Input for mode select: H = Column mode, L = Row mode VDD to VSS DIR = L : EIO1 is output, EIO2 is input DIR = H : EIO1 is input, EIO2 is output Functions Level V0 to V5 EIO1, EIO2 I/O DI1 to DI8 Input DIR Input / DSPOF Input DF Input LP Input SCP Input TEST S/C Input Input 2001-02-13 4/12 T6C03 Pin Name VDD VSS V5L * R V3 / 4L * R V2 / 1L * R V0L * R VCCL * R, VSSL * R I/O Power supply for internal logic (+5.0 V) Power supply for internal logic (0 V) Power supply for LCD drive circuit Power supply for LCD drive circuit Power supply for LCD drive circuit Power supply for LCD drive circuit Power supply for LCD drive circuit Functions Level Relation Between FR, Data Input and Output Level FR L L H H (Note) Data Input L H L H (Note) / Dspof H H H H L Output Level (Column Mode) V3 V5 V2 V0 V5 Output Level (Row Mode) V4 V0 V1 V5 V5 Note: Don't Care 2001-02-13 5/12 T6C03 Data Input Format Column Mode DIR H L L 4-BIT OUT IN DF BIT Mode Enable Pin EIO1 EIO2 IN OUT (Note 1) L F L F L F L F DI1 O160 O4 O1 O157 O160 O8 O1 O153 DI2 O159 O3 O2 O158 O159 O7 O2 O154 Input Data Line and Output Buffers DI3 DI4 DI5 DI6 O158 O2 O3 O159 O158 O6 O3 O155 O157 O1 O4 O160 O157 O5 O4 O156 O156 O4 O5 O157 O155 O3 O6 O158 DI7 O154 O2 O7 O159 DI8 O153 O1 O8 O160 H H L 8-BIT IN OUT OUT IN Note 1: L: Last Data F: First Data Row Mode DIR L H L H H DF L Data Flow O160 O1 O1 O160 O160 O81 O80 O1 O1 O80 O81 O160 EIO1 OUT IN OUT IN Data Input Terminals EIO2 IN OUT IN OUT DIN IN IN 2001-02-13 6/12 Timing Diagram (Column mode) 2001-02-13 T6C03 7/12 T6C03 Timing Diagram (Row mode) 2001-02-13 8/12 T6C03 Absolute Maximum Ratings Item Supply Voltage (1) Supply Voltage (2) Supply Voltage (3) Supply Voltage (4) Input Voltage Operating Temperature Storage Temperature (Ensure that the following conditions are maintained, VCC V0 V2 V3 V5 VSS) Symbol VDD VCC V0, V2 V3, V5 VIN Topr Tstg Pin Name VDD VCCL / R V0L / R V2L / R V3L / R V5L / R (Note 2) Rating -0.3 to 7.0 -0.3 to 45.0 -0.3 to VCC + 0.3 -0.3 to 7.0 -0.3 to VDD + 0.3 -20 to 75 -40 to 125 Unit V V V V V C C Note 2: SCP, FR, LP, DIR, DF, S / C, EIO1, EIO2, DI1 to 8, / DSPOF, TEST Electrical Characteristics DC Characteristics Item Supply Voltage 1 Supply Voltage 2 H Level Input Voltage L Level H Level L Level H Level Output Resistance M Level L Level VIL VOH VOL ROH ROM ROL Symbol VDD VCC VIH (Unless otherwise noted, VSS = 0 V, VDD = 2.7 to 5.5 V, Ta = -20 to 75C) Test Circuit (Note 2) IOH = - 0.5 mA IOL = 0.5 mA VOUT = V0 - 0.5 V VOUT = V2 0.5 V VOUT = V3 0.5 V VOUT = V5 + 0.5 V (Note 3) (Note 3) (Note 3) (Note 3) 0 VDD - 0.5 0 0.6 0.6 0.6 0.6 0.2 VDD VDD 0.5 1.3 1.3 1.3 1.3 k O1 to O160 Test Condition Min 2.7 14 0.8 VDD Typ. 5.0 Max 5.5 42 VDD V Unit Pin Name VDD VCCL / R SCP, FR, LP, DIR, DF, S / C, EIO1, EIO2, DI1 to 8, / DSPOF, TEST EIO1, EIO2 Output Voltage Current Consumption (Note 4) IDD VDD = 5.5 V VCC = 42 V fLP = 33 kHz fFR = 8.3 kHz fscp = 8.0 MHz Input Data: every bit inverted VIH = 5.5 V, VIL = 0 V 4.0 mA VDD Note 3: VCC = 20 V, 1 / 13 bias Note 4: Current consumption while the internal data receiver is operating 2001-02-13 9/12 T6C03 AC Electrical Characteristics (Column mode) Test Conditions (1) (VSS = 0 V, VDD = 5 V 10%, VCC = 14 to 42 V, Ta = - 20 to 75C) Item Clock Cycle SCP Pulse Width Data Set-Up Time Data Hold Time SCP Rise / Fall Time LP Rise Time LP Fall Time LP Pulse Width SCP-to-LP Delay Time LP-to-SCP Delay Time EIO IN Fall Time EIO IN Pulse Width SCP-to-EIO Delay Time EIO-OUT Delay Time Symbol tC tCWH, tCWL tDSU tDHD tr, tf tLRP tLFP tLW tSL tLS tEIFP tEIW tSE tEOD Test Condition (Note 6) Min 125 50 50 50 50 50 45 40 40 40 40 20 Max (Note 5) 80 Unit ns ns ns ns ns ns ns ns ns ns ns ns ns ns Note 5: tr, tf (tC - tCWH - tCWL) / 2 and tr, tf 50 ns Note 6: CL = 30 pF 2001-02-13 10/12 T6C03 Test Conditions (2) (VSS = 0 V, VDD = 2.7 to 4.5 V, VCC = 14 to 42 V, Ta = -20 to 75C) Item Clock Cycle SCP Pulse Width Data Set-Up Time Data Hold Time SCP Rise / Fall Time LP Rise Time LP Fall Time LP Pulse Width SCP-to-LP Delay Time LP-to-SCP Delay Time EIO IN Fall Time EIO IN Pulse Width SCP-to-EIO Delay Time EIO-OUT Delay Time Symbol tC tCWH, tCWL tDSU tDHD tr, tf tLRP tLFP tLW tSL tLS tEIFP tEIW tSE tEOD Test Condition (Note 8) Min 500 240 240 240 220 240 240 70 100 240 240 50 Max (Note 7) 260 Unit ns ns ns ns ns ns ns ns ns ns ns ns ns ns Note 7: tr, tf (tC - tCWH - tCWL) / 2 and tr, tf 50 ns Note 8: CL = 30 pF 2001-02-13 11/12 T6C03 AC Electrical Characteristics (Row mode) Test Conditions (1) (VSS = 0 V, VDD = 4.5 to 5.5 V, VCC = 14 to 42 V, Ta = -20 to 75C) Item LP Pulse Width H LP Pulse Width L SCP Rise / Fall Time Data Set-up Time Data Hold Time EIO-OUT Delay Time A EIO-OUT Delay Time A LCD Drive Data Delat Time (Note 9) (Note 9) (Note 10) Symbol tCWH tCWL tr, tf tDSU tDHD tpdA tpdB tPHL Test Condition LP LP LP, FR, EIO1, EIO2, DIN EIO1, EIO2, DIN EIO1, EIO2, DIN EIO1, EIO2, DIN EIO1, EIO2, DIN O1 to O120 Min 30 195 80 0 5 Max 20 150 800 Unit ns ns ns ns ns ns ns ns Test Conditions (2) (VSS = 0 V, VDD = 2.7 to 5.5 V, VCC = 14 to 42 V, Ta = -20 to 75C) Item LP Pulse Width H LP Pulse Width L SCP Rise / Fall Time Data Set-up Time Data Hold Time EIO-OUT Delay Time A EIO-OUT Delay Time A LCD Drive Data Delat Time (Note 9) (Note 9) (Note 10) Symbol tCWH tCWL tr, tf tDSU tDHD tpdA tpdB tPHL Test Condition LP LP LP, FR, EIO1, EIO2, DIN EIO1, EIO2, DIN EIO1, EIO2, DIN EIO1, EIO2, DIN EIO1, EIO2, DIN O1 to O120 Min 100 400 100 0 5 Max 20 400 1000 Unit ns ns ns ns ns ns ns ns Note 9: CL = 30 pF Note 10: CL = 20 pF Note: Insert the bypass capacitor (0.1 F) between VDD and VSS, to decrease power supply noise. Place the bypass capacitor as close to the LSI as possible. 2001-02-13 12/12 |
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