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| LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only LED ARRAY LA15B/GHV5-W37 DATA SHEET DOC. NO : REV. DATE : : QW0905-LA15B/GHV5-W37 A 06 - Apr - 2005 LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO. LA15B/GHV5-W37 Page 1/4 Package Dimensions 4.75 3.10.5 0.8 11.4 Wire: 24AWG U.L.1061, Anode-Red;Cathode-Black. RED WIRE BLACK WIRE 30510 2.54 2.54 +- LG3133/S43 4.75 +Vcc IF Vcc=5Volts RL RL=240ohmsO 20% 1.5MAX 7.65 VF IF= Vcc-VF RL 0.5 TYP 2.54TYP 4.0 O 0.5 + - Note : 1.All dimension are in millimeter tolerance is O 0.25mm unless otherwise noted. 2.Specifications are subject to change without notice. LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO. LA15B/GHV5-W37 Page 2/4 Absolute Maximum Ratings at Ta=25 J Absolute Maximum Ratings Parameter Symbol G Forward Voltage Reverse Voltage Operating Temperature Storage Temperature VF VR Topr Tstg 5 8 -40 ~ +85 V V UNIT J J -40 ~ +100 Typical Electrical & Optical Characteristics (Ta=25 J ) PART NO MATERIAL Emitted COLOR Peak Spectral wave halfwidth length f nm f Pnm Lens Water Clear 565 30 Luminous Reverse Viewing intensity current angle (mcd) (g A) 2c 1/2 @5V VR=5V (deg) Max. Min. Max. Min. Typ. 8 20 10 18 100 50 Forward current (mA) @5V LA15B/GHV5-W37 GaP Green Note : 1.The forward voltage data did not including O 0.1V testing tolerance. 2. The luminous intensity data did not including O 15% testing tolerance. LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO. LA15B/GHV5-W37 Typical Electro-Optical Characteristics Curve G CHIP Fig.1 Forward current vs. Forward Voltage 1000 Page 3/4 Fig.2 Relative Intensity vs. Forward Current 3.5 Forward Current(mA) 100 10 1.0 0.1 1.0 2.0 3.0 4.0 5.0 Relative Intensity Normalize @20mA 1.0 3.0 2.5 2.0 1.5 1.0 0.5 0.0 10 100 1000 Forward Voltage(V) Fig.3 Forward Voltage vs. Temperature 1.2 1.1 1.0 0.9 0.8 -20 0 20 40 60 80 100 Forward Current(mA) Fig.4 Relative Intensity vs. Temperature 3.0 2.5 2.0 1.5 1.0 0.5 0.0 -40 -20 0 20 40 60 80 100 Forward Voltage@20mA Normalize @25J -40 Relative Intensity@20mA Normalize @25J Ambient Temperature(J ) Ambient Temperature(J ) Fig.5 Relative Intensity vs. Wavelength Relative Intensity@20mA 1.0 0.5 0.0 500 550 600 650 Wavelength (nm) LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO. LA15B/GHV5-W37 Page 4/4 Reliability Test: Test Item Test Condition 1.Under Room Temperature 2.If=20mA 3.t=1000 hrs (-24hrs, +72hrs) Description This test is conducted for the purpose of detemining the resisance of a part in electrical and themal stressed. The purpose of this is the resistance of the device which is laid under ondition of hogh temperature for hours. Reference Standard MIL-STD-750: 1026 MIL-STD-883: 1005 JIS C 7021: B-1 Operating Life Test High Temperature Storage Test 1.Ta=105 JO5J 2.t=1000 hrs (-24hrs, +72hrs) MIL-STD-883:1008 JIS C 7021: B-10 Low Temperature Storage Test 1.Ta=-40 JO5J 2.t=1000 hrs (-24hrs, +72hrs) The purpose of this is the resistance of the device which is laid under condition of low temperature for hours. JIS C 7021: B-12 High Temperature High Humidity Test 1.Ta=65JO5J 2.RH=90 %~95% 2hrs 3.t=240hrs O The purpose of this test is the resistance of the device under tropical for hous. MIL-STD-202:103B JIS C 7021: B-11 Thermal Shock Test 1.Ta=105 JO5J &-40JO5J (10min) (10min) 2.total 10 cycles The purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. MIL-STD-202: 107D MIL-STD-750: 1051 MIL-STD-883: 1011 |
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