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| TPC8208 TOSHIBA Field Effect Transistor Silicon N Channel MOS Type (U-MOSIII) TPC8208 Lithium Ion Battery Applications Notebook PC Applications Portable Equipment Applications * * * * * Small footprint due to small and thin package Low drain-source ON resistance: RDS (ON) = 38 m (typ.) High forward transfer admittance: |Yfs| = 6.3 S (typ.) Low leakage current: IDSS = 10 A (max) (VDS = 20 V) Enhancement mode: Vth = 0.5 to 1.2 V (VDS = 10 V, ID = 200 A) Unit: mm Absolute Maximum Ratings (Ta = 25C) Characteristics Drain-source voltage Drain-gate voltage (RGS = 20 k) Gate-source voltage Drain current DC Pulse (Note 1) (Note 1) Symbol VDSS VDGR VGSS ID IDP PD (1) PD (2) PD (1) PD (2) EAS IAR EAR Tch Tstg Rating 20 20 12 5 20 1.5 W 1.1 Unit V V V A JEDEC JEITA TOSHIBA 2-6J1E Single-device Drain power operation (Note 3a) dissipation (t = 10 s) Single-device value (Note 2a) at dual operation (Note 3b) Single-device Drain power operation (Note 3a) dissipation (t = 10 s) Single-device value (Note 2b) at dual operation (Note 3b) Single pulse avalanche energy (Note 4) Avalanche current Repetitive avalanche energy Single-device value at dual operation (Note 2a, 3b, 5) Channel temperature Storage temperature range Weight: 0.080 g (typ.) 0.75 W 0.45 Circuit Configuration 8 7 6 5 16.3 5 0.1 150 -55 to 150 mJ A mJ C C 1 2 3 4 Note: Note 1, Note 2, Note 3, Note 4 and Note 5: See the next page. Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). This transistor is an electrostatic-sensitive device. Please handle with caution. 1 2006-11-16 TPC8208 Thermal Characteristics Characteristics Single-device operation (Note 3a) Symbol Rth (ch-a) (1) Rth (ch-a) (2) Rth (ch-a) (1) Rth (ch-a) (2) Max 83.3 C/W 114 Unit Thermal resistance, channel to ambient (Note 2a) Single-device value at (t = 10 s) dual operation (Note 3b) Thermal resistance, channel to ambient (Note 2b) Single-device value at (t = 10 s) dual operation (Note 3b) Single-device operation (Note 3a) 167 C/W 278 Marking (Note 6) TPC8208 Part No. (or abbreviation code) Lot No. A line indicates lead (Pb)-free package or lead (Pb)-free finish. Note 1: Ensure that the channel temperature does not exceed 150C. Note 2: a) Device mounted on a glass-epoxy board (a) FR-4 25.4 x 25.4 x 0.8 (unit: mm) b) Device mounted on a glass-epoxy board (b) FR-4 25.4 x 25.4 x 0.8 (unit: mm) (a) (b) Note 3: a) b) The power dissipation and thermal resistance values are shown for a single device. (During single-device operation, power is only applied to one device.) The power dissipation and thermal resistance values are shown for a single device. (During dual operation, power is evenly applied to both devices.) Note 4: VDD = 16 V, Tch = 25C (initial), L = 0.5 mH, RG = 25 , IAR = 5 A Note 5: Repetitive rating:pulse width limited by maximum channel temperature Note 6: * on lower left of the marking indicates Pin 1. Weekly code: (Three digits) Week of manufacture (01 for the first week of a year: sequential number up to 52 or 53) Year of manufacture (The last digit of a year) 2 2006-11-16 TPC8208 Electrical Characteristics (Ta = 25C) Characteristics Gate leakage current Drain cut-OFF current Drain-source breakdown voltage Gate threshold voltage Symbol IGSS IDSS V (BR) DSS V (BR) DSX Vth Test Condition VGS = 10 V, VDS = 0 V VDS = 20 V, VGS = 0 V ID = 10 mA, VGS = 0 V ID = 10 mA, VGS = -12 V VDS = 10 V, ID = 200 A VGS = 2.0 V, ID = 2.5 A Drain-source ON resistance RDS (ON) VGS = 2.5 V, ID = 2.5 A VGS = 4.0 V, ID = 2.5 A Forward transfer admittance Input capacitance Reverse transfer capacitance Output capacitance Rise time Turn-ON time Switching time Fall time Turn-OFF time Total gate charge (gate-source plus gate-drain) Gate-source charge 1 Gate-drain ("miller") charge tf toff Qg Qgs1 Qgd VDD 16 V, VGS = 5 V, ID = 5 A - |Yfs| Ciss Crss Coss tr ton VGS 5 V 0V ID = 2.5 A VOUT VDS = 10 V, VGS = 0 V, f = 1 MHz VDS = 10 V, ID = 2.5 A Min Typ. Max Unit 20 8 0.5 57 46 38 6.3 780 90 100 5.0 12 2.7 21 9.5 2.0 2.2 10 10 A A V V 1.2 100 70 50 3.2 m S pF RL = 4 4.7 ns nC VDD 10 V - Duty < 1%, tw = 10 s = Source-Drain Ratings and Characteristics (Ta = 25C) Characteristics Drain reverse current Forward voltage (diode) Pulse (Note 1) Symbol IDRP VDSF Test Condition Min Typ. Max 20 Unit A V IDR = 5 A, VGS = 0 V -1.2 3 2006-11-16 TPC8208 ID - VDS 10 4 8 3 1.7 6 1.6 4 1.5 2 VGS = 1.4 V 0 0 0 0 10 20 2 1.9 2.5 1.8 Common source Ta = 25C Pulse test Common source ID - VDS 10 5 2.6 4 3 2.4 (A) (A) 16 Ta = 25C Pulse test 2.2 12 2.0 8 1.8 4 1.6 VGS = 1.4 V ID Drain current Drain current ID 0.2 0.4 0.6 0.8 1 0.4 0.8 1.2 1.6 2.0 Drain-source voltage VDS (V) Drain-source voltage VDS (V) ID - VGS 10 Common source VDS = 10 V Pulse test 1.0 VDS - VGS Common source Ta = 25C Pulse test (V) VDS Drain-source voltage 8 0.8 ID (A) 6 0.6 Drain current 4 25 2 Ta = -55C 0 0 0.5 1 1.5 2 2.5 100 0.4 2.5 0.2 1.2 0 0 2 4 6 8 10 12 ID = 5 A Gate-source voltage VGS (V) Gate-source voltage VGS (V) |Yfs| - ID 100 Common source VDS = 10 V Pulse test 1000 RDS (ON) - ID Common source Ta = 25C Pulse test Forward transfer admittance Yfs (S) Ta = -55C 10 25 100 Drain-source ON resistance RDS (ON) (m) 100 VGS = 2.5 V 4 1 10 0.1 0.1 1 10 30 1 0.1 1 10 100 Drain current ID (A) Drain current ID (A) 4 2006-11-16 TPC8208 RDS (ON) - Ta 100 Common source 80 Pulse test 100 IDR - VDS Drain reverse current IDR (A) Drain-source ON resistance RDS (ON) (m) 60 VGS = 2.5 V 40 4V 20 ID = 5 A 10 5 3 1 VGS = 0 V 2.5 A, 1.2 A ID = 5 A, .2.5 A, 1.2A 1 0 -80 -40 0 40 80 120 160 0.1 -0 Common source Ta = 25C Pulse test -0.2 -0.4 -0.6 -0.8 -1 -1.2 -1.4 Ambient temperature Ta (C) Drain-source voltage VDS (V) Capacitance - VDS 10000 1.4 1.2 1.0 0.8 0.6 0.4 0.2 Vth - Ta Common source VDS = 10 V ID = 1 mA Pulse test (pF) Ciss 100 Coss Crss Common source Ta = 25C VGS = 0 V f = 1 MHz 1 10 100 Gate threshold voltage 1000 Capacitance C Vth (V) 10 0.1 0 -80 -40 0 40 80 120 160 Ambient temperature Ta (C) Drain-source voltage VDS (V) PD - Ta 2.0 Device mounted on a glass-epoxy board (a) (Note 2a) (1) Single-device operation (Note 3a) (2) Single-device value at dual operation (Note 3b) Device mounted on a glass-epoxy board (b) (Note 2b) (3) Single-device operation (Note 3a) (4) Single-device value at dual operation (Note 3b) t = 10 s Dynamic input/output characteristics 20 VDD = 16 V VDS 12 8 4 8 VDD = 16 V 4 4 4 Common source ID = 5 A Ta = 25C Pulse test 12 16 20 (W) (V) PD Drain power dissipation Drain-source voltage 1.0 (3) 8 8 0.5 (4) 0 0 50 100 150 200 0 0 5 10 15 0 20 Ambient temperature Ta (C) Total gate charge Qg (nC) 5 2006-11-16 Gate-source voltage (2) VDS 1.5 (1) 16 VGS (V) TPC8208 rth - tw 1000 Single pulse (4) (3) (2) (1) 100 Normalized transient thermal impedance rth (C/W) 10 1 Device mounted on a glass-epoxy board (a) (Note 2a) (1) Single-device operation (Note 3a) (2) Single-device value at dual operation (Note 3b) Device mounted on a glass-epoxy board (b) (Note 2b) (3) Single-device operation (Note 3a) (4) Single-device value at dual operation (Note 3b) t = 10 s 0.1 0.001 0.01 0.1 1 10 100 1000 Pulse width tw (S) Safe operating area 100 50 30 ID max (pulse) * 10 Single-device value at dual operation (Note 3b) 1 ms * 10 ms * (A) Drain current ID 5 3 1 0.5 0.3 0.1 * Single pulse 0.05 Ta = 25C 0.03 Curves must be derated linearly with increase in temperature. 0.01 0.01 0.03 0.1 0.3 1 VDSS max 3 10 30 100 Drain-source voltage VDS (V) 6 2006-11-16 TPC8208 RESTRICTIONS ON PRODUCT USE * The information contained herein is subject to change without notice. 030619EAA * The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of TOSHIBA or others. * TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the "Handling Guide for Semiconductor Devices," or "TOSHIBA Semiconductor Reliability Handbook" etc.. * The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury ("Unintended Usage"). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this document shall be made at the customer's own risk. * TOSHIBA products should not be embedded to the downstream products which are prohibited to be produced and sold, under any law and regulations. 7 2006-11-16 |
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