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SILICON EPITAXIAL PLANAR DIODE 1N6642D1A
* * * * * * Low Leakage Fast Switching Low Forward Voltage Hermetic Ceramic Package Designed as a Drop-In Replacement for "MELF-4.5 (D-5D)"/ "DO-213AA" Package. Suitable for general purpose, switching applications. Space Level and High-Reliability Screening Options Available
ABSOLUTE MAXIMUM RATINGS (TA = 25C unless otherwise stated)
VBR VRWM IO IFSM PD
(1) (1)
Breakdown Voltage Working Peak Reverse Voltage Average Rectified Output Current, TA = 75C Surge Current (half sine wave, tp = 8.3ms TA = 75C Total Power Dissipation at Total Power Dissipation at Junction Temperature Range Storage Temperature Range Derate Above 75C TSP = 75C Derate Above 75C
PD TJ Tstg
100V 75V 300mA 2.5A TBD TBD TBD TBD -65 to +200C -65 to +200C
THERMAL PROPERTIES
Symbols
RJA
(1)
Parameters
Thermal Resistance, Junction To Ambient Thermal Resistance, Junction To Solder Pads. TSP = 25C
Max.
TBD TBD
Units
C/W C/W
RJSP(IN)
Notes (1) Thermal PCB rating to be determined. Recommended solder pad layout dimensions for this device, as detailed within this datasheet for the MELF-4.5 (D-5D) device.
Semelab Limited reserves the right to change test conditions, parameter limits and package dimensions without notice. Information furnished by Semelab is believed to be both accurate and reliable at the time of going to press. However Semelab assumes no responsibility for any errors or omissions discovered in its use. Semelab encourages customers to verify that datasheets are current before placing orders. Coventry Road, Lutterworth, Leicestershire, LE17 4JB Semelab Limited Telephone +44 (0) 1455 556565 Fax +44 (0) 1455 552612 Email: sales@semelab-tt.com Document Number 8882 Issue 1 Page 1 of 4
Website: http://www.semelab-tt.com
SILICON EPITAXIAL PLANAR DIODE 1N6642D1A
ELECTRICAL CHARACTERISTICS (TA = 25C unless otherwise stated)
Symbols
VBR
Parameters
Breakdown Voltage
Test Conditions
IR = 100A IF = 10mA
Min.
100
Typ
Max.
Units
0.8 1.2 TA = 150C TA = -55C 0.8 1.2 25 500 TA = 150C 50 100 A nA V
VF
(2)
Forward Voltage
IF = 100mA IF = 10mA IF = 100mA VR = 20V
IR
Reverse Current
VR = 75V VR = 20V VR = 75V
DYNAMIC CHARACTERISTICS
C Capacitance VR = 0V VR = 1.5V IF = IR = 10mA IREC = 1.0mA f = 1.0MHz RL = 100 5 2.8 5 ns pF
trr
Reverse Recovery Time
Notes (2) Pulse Width 300us, 2%
Coventry Road, Lutterworth, Leicestershire, LE17 4JB Semelab Limited Telephone +44 (0) 1455 556565 Fax +44 (0) 1455 552612 Email: sales@semelab-tt.com
Website: http://www.semelab-tt.com
Document Number 8882 Issue 1 Page 2 of 4
SILICON EPITAXIAL PLANAR DIODE 1N6642D1A
MECHANICAL DATA
A C
DLCC1 Variant A (D1A)
SML DLCC1
D E D
PAD 1 PAD 2
ANODE CATHODE mm 4.60 0.20 2.00 0.20 1.30 0.20 0.70 0.20 3.00 0.20 1.80 0.20 Inches 0.181 0.007 0.079 0.007 0.051 0.007 0.028 0.007 0.118 0.007 0.071 0.007
B
DIMENSION A B C D E F
2
1
F
SOLDER PAD LAYOUT
A
C
B
DIMENSION A B C
mm 6.45 1.70 2.41
Inches 0.254 0.067 0.095
Soldering temperature should be 260C for a maximum of 10 seconds
The physical dimensions for the DLCC1 ceramic package are designed to be different from the published dimensions for the "MELF-4.5 (D-5D)". The DLCC1 design fully utilises the recommended solder footprint for the "MELF-4.5 (D-5D)" Package, and as such presents a drop in replacement for existing board designs.
PACKAGE MASS Gold Plated Solder Pad Finish = 40mg
Coventry Road, Lutterworth, Leicestershire, LE17 4JB Semelab Limited Telephone +44 (0) 1455 556565 Fax +44 (0) 1455 552612 Email: sales@semelab-tt.com
Website: http://www.semelab-tt.com
Document Number 8882 Issue 1 Page 3 of 4
SILICON EPITAXIAL PLANAR DIODE 1N6642D1A
SCREENING OPTIONS
Space Level (JQRS/ESA) and High Reliability options are available in accordance with the High Reliability and Screening Options Handbook available for download from the from the TT electronics Semelab web site. ESA Quality Level Products are based on the testing procedures specified in the generic ESCC 5000 and in the corresponding part detail specifications. Semelab's QR216 and QR217 processing specifications (JQRS), in conjunction with the companies ISO 9001:2000 approval present a viable alternative to the American MILPRF-19500 space level processing. QR217 (Space Level Quality Conformance) is based on the quality conformance inspection requirements of MIL-PRF19500 groups A (table V), B (table VIa), C (table VII) and also ESA / ESCC 5000 (chart F4) lot validation tests. QR216 (Space Level Screening) is based on the screening requirements of MIL-PRF-19500 (table IV) and also ESA /ESCC 5000 (chart F3). JQRS parts are processed to the device data sheet and screened to QR216 with conformance testing to Q217 groups A and B in accordance with MIL-STD-750 methods and procedures. Additional conformance options are available, for example Pre-Cap Visual Inspection, Buy-Off Visit or Data Packs. These are chargeable and must be specified at the order stage (See Ordering Information). Minimum order quantities may apply. Alternative or additional customer specific conformance or screening requirements would be considered. Contact Semelab sales with enquires.
ORDERING INFORMATION
Part numbers are built up from Type, Package Variant, and screening level. The part numbers are extended to include the additional options as shown below. Type - See Electrical Stability Characteristics Table Package Variant - See Mechanical Data Screening Level - See Screening Options (ESA / JQRS) Additional Options:
Customer Pre-Cap Visual Inspection Customer Buy-Off visit Data Pack Solderability Samples Scanning Electron Microscopy Radiography (X-ray) Total Dose Radiation Test MIL-PRF-19500 (QR217) Group B charge Group B destructive mechanical samples Group C charge Group C destructive electrical samples Group C destructive mechanical samples ESA/ESCC Lot Validation Testing (subgroup 1) charge LVT1 destructive samples (environmental) LVT1 destructive samples (mechanical) Lot Validation Testing (subgroup 2) charge LVT2 endurance samples (electrical) Lot Validation Testing (subgroup 3) charge LVT3 destructive samples (mechanical) .CVP .CVB .DA .SS .SEM .XRAY .RAD .GRPB .GBDM (12 pieces) .GRPC .GCDE (12 pieces) .GCDM (6 pieces) .LVT1 .L1DE (15 pieces) .L1DM (15 pieces) .LVT2 .L2D (15 pieces) .LVT3 .L3D (5 pieces)
Additional Option Notes: 1) All `Additional Options' are chargeable and must be specified at order stage. 2) When Group B,C or LVT is required, additional electrical and mechanical destructive samples must be ordered 3) All destructive samples are marked the same as other production parts unless otherwise requested.
MARKING DETAILS
Parts can be laser marked with approximately 7 characters on two lines and always includes cathode identification. Typical marking would include part or specification number, week of seal or serial number subject to available space and legibility. Customer specific marking requirements can be arranged at the time of order. Example Marking:
Example ordering information: The following example is for the 1N6642 part with package variant A, JQRS screening, additional Group C conformance testing and a Data pack. Part Numbers: 1N6642D1A-JQRS (Include quantity for flight parts) 1N6642D1A-JQRS.GRPC (chargeable conformance option) 1N6642D1A-JQRS.GCDE (charge for destructive parts) 1N6642D1A-JQRS.GCDM (charge for destructive parts) 1N6642D1A-JQRS.DA (charge for Data pack) Customers with any specific requirements (e.g. marking or screening) may be supplied with a similar alternative part number (there is maximum 20 character limit to part numbers). Contact Semelab sales with enquiries
High Reliability and Screening Options Handbook link: http://www.semelab.co.uk/pdf/misc/documents/hirel_and_screening_options.pdf
Coventry Road, Lutterworth, Leicestershire, LE17 4JB Semelab Limited Telephone +44 (0) 1455 556565 Fax +44 (0) 1455 552612 Email: sales@semelab-tt.com
Website: http://www.semelab-tt.com
Document Number 8882 Issue 1 Page 4 of 4

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