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| LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only SUPER BRIGHT ROUND TYPE LED LAMPS Pb Lead-Free Parts LHRF3333S/S46-PF DATA SHEET DOC. NO : REV. DATE : QW0905-LHRF3333S/S46-PF-B01 A : 29 - Oct. - 2009 DCC LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO. LHRF3333S/S46-PF Page 1/5 Package Dimensions 5.0 5.9 7.6 8.6 1.5MAX 0.5 TYP 25.0MIN 1.0MIN 2.54TYP + Note : 1.All dimension are in millimeter tolerance is O 0.25mm unless otherwise noted. 2.Specifications are subject to change without notice. Directivity Radiation 0X -30X 30X -60X 60X 100% 75% 50% 25% 0 25% 50% 75% 100% LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO. LHRF3333S/S46-PF Page 2/5 Absolute Maximum Ratings at Ta=25J Ratings Parameter Symbol HRFS Forward Current Peak Forward Current Duty 1/10@10KHz Power Dissipation Reverse Current @5V Electrostatic Discharge( * ) Operating Temperature Storage Temperature IF IFP PD Ir ESD Topr Tstg 30 60 72 10 2000 -40 ~ +85 -40 ~ +100 mA mA mW UNIT g A V J J Static the Use of conductive wrist band or anti-electrosatic *glove isElectricity or power surge will damageLED.LED.devices, aequipment and machinery must be properly recommended when handing these All grounded. Typical Electrical & Optical Characteristics (Ta=25J ) PART NO MATERIAL Emitted COLOR Forward Dominant Spectral voltage wave halfwidth @20mA(V) length f nm f Dnm Viewing angle @20mA(mcd) 2c 1/2 (deg) Luminous intensity Lens Water Clear 625 20 Min. Max. Min. 1.5 2.4 Typ. 30 LHRF3333S/S46-PF AlGaInP Red 3400 5000 Note : 1.The forward voltage data did not including O 0.1V testing tolerance. 2. The luminous intensity data did not including O 15% testing tolerance. LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO. LHRF3333S/S46-PF Page 3/5 Typical Electro-Optical Characteristics Curve HRFS CHIP Fig.1 Forward current vs. Forward Voltage Fig.2 Luminous Intensity vs. Forward Current Forward Current(mA) 150 6.0 Luminous Intensity Normalize @20mA 5.0 4.0 3.0 2.0 1.0 0.0 0 50 100 150 100 50 0 0 0.5 1.0 1.5 2.0 2.5 3.0 Forward Voltage(V) Fig.3 Forward Voltage vs. Temperature Forward Current(mA) Fig.4 Luminous Intensity vs. Temperature Luminous Intensity@20mA Normalize @25J Forward Voltage@20mA Normalize @25J 1.06 1.04 1.02 1.00 0.98 0.96 0.94 -40 -20 0 20 40 60 80 100 1.2 1.0 0.8 0.6 0.4 0.2 0.0 -40 -20 0 20 40 60 80 100 Ambient Temperature(J ) Ambient Temperature(J ) Fig.5 Relative Intensity vs. Wavelength Relative Intensity@20mA 1.0 0.5 0 550 600 650 700 Wavelength (nm) LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO. LHRF3333S/S46-PF Page 4/5 Soldering Condition(Pb-Free) 1.Iron: Soldering Iron:30W Max Temperature 350C Max Soldering Time:3 Seconds Max(One time only) Distance:2mm Min(From solder joint to body) 2.Wave Soldering Profile Dip Soldering Preheat: 120 C Max Preheat time: 60seconds Max Ramp-up 2 C/sec(max) Ramp-Down:-5 C/sec(max) Solder Bath:260 C Max Dipping Time:3 seconds Max Distance:2mm Min(From solder joint to body) Temp(C) 260 C3sec Max 260X 5 /sec max 120X 2 /sec max Preheat 60 Seconds Max 25X 0X0 50 100 150 Time(sec) Note: 1.Wave solder should not be made more than one time. 2.You can just only select one of the soldering conditions as above. LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO. LHRF3333S/S46-PF Page 5/5 Reliability Test: Test Item Test Condition 1.Under Room Temperature 2.If=20mA 3.t=1000 hrs (-24hrs, +72hrs) Description This test is conducted for the purpose of detemining the resistance of a part in electrical and themal stressed. Reference Standard MIL-STD-750: 1026 MIL-STD-883: 1005 JIS C 7021: B-1 Operating Life Test High Temperature Storage Test 1.Ta=105JO 5J 2.t=1000 hrs (-24hrs, +72hrs) The purpose of this is the resistance of the device which is laid under condition of high temperature for hours. MIL-STD-883:1008 JIS C 7021: B-10 Low Temperature Storage Test 1.Ta=-40JO 5J 2.t=1000 hrs (-24hrs, +72hrs) The purpose of this is the resistance of the device which is laid under condition of low temperature for hours. JIS C 7021: B-12 High Temperature High Humidity Test 1.Ta=65JO 5J 2.RH=90%~95% 3.t=240hrsO 2hrs The purpose of this test is the resistance of the device under tropical for hours. MIL-STD-202:103B JIS C 7021: B-11 Thermal Shock Test 1.Ta=105JO 5J &-40JO (10min) (10min) 2.total 10 cycles 5J The purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. This test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. MIL-STD-202: 107D MIL-STD-750: 1051 MIL-STD-883: 1011 Solder Resistance Test 1.T.Sol=260JO 5J 2.Dwell time= 10O 1sec. MIL-STD-202: 210A MIL-STD-750: 2031 JIS C 7021: A-1 Solderability Test 1.T.Sol=230JO 5J 2.Dwell time=5 O 1sec This test intended to see soldering well performed or not. MIL-STD-202: 208D MIL-STD-750: 2026 MIL-STD-883: 2003 JIS C 7021: A-2 |
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