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PALCE16V8 PALCE16V8Z
COM'L:H-5/7/10/15/25, Q-10/15/25 IND:H-10/15/25, Q-20/25 COM'L:-25 IND:-12/15/25
PALCE16V8 and PALCE16V8Z Families
EE CMOS (Zero-Power) 20-Pin Universal Programmable Array Logic DISTINCTIVE CHARACTERISTICS
x Pin and function compatible with all 20-pin PAL(R) devices x Electrically erasable CMOS technology provides reconfigurable logic and full testability x High-speed CMOS technology
GENERAL DESCRIPTION
The PALCE16V8 is an advanced PAL device built with low-power, high-speed, electricallyerasable CMOS technology. It is functionally compatible with all 20-pin GAL devices. The macrocells provide a universal device architecture. The PALCE16V8 will directly replace the PAL16R8, with the exception of the PAL16C1. The PALCE16V8Z provides zero standby power and high speed. At 30-A maximum standby current, the PALCE16V8Z allows battery-powered operation for an extended period. The PALCE16V8 utilizes the familiar sum-of-products (AND/OR) architecture that allows users to implement complex logic functions easily and efficiently. Multiple levels of combinatorial logic can always be reduced to sum-of-products form, taking advantage of the very wide input gates available in PAL devices. The equations are programmed into the device through floating-gate cells in the AND logic array that can be erased electrically. The fixed OR array allows up to eight data product terms per output for logic functions. The sum of these products feeds the output macrocell. Each macrocell can be programmed as registered or combinatorial with an active-high or active-low output. The output configuration is determined by two global bits and one local bit controlling four multiplexers in each macrocell.
Publication# 16493 Amendment/0
Rev: F Issue Date: September 2000
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x x x x x x x x x x x
-- 5-ns propagation delay for "-5" version -- 7.5-ns propagation delay for "-7" version Direct plug-in replacement for the PAL16R8 series Outputs programmable as registered or combinatorial in any combination Peripheral Component Interconnect (PCI) compliant Programmable output polarity Programmable enable/disable control Preloadable output registers for testability Automatic register reset on power up Cost-effective 20-pin plastic DIP, PLCC, and SOIC packages Extensive third-party software and programmer support Fully tested for 100% programming and functional yields and high reliability 5-ns version utilizes a split leadframe for improved performance
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BLOCK DIAGRAM
I1 - I8 CLK/I0
8
Programmable AND Array 32 x 64
MC0
MC1
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MC2 MC3 MC4 MC5 I/O2 I/O3 I/O4 I/O5
MACRO
MACRO
MACRO
MACRO
MACRO
MACRO
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MC6 I/O6
MACRO
MACRO MC7
OE/I9
I/O0
I/O1
I/O7
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FUNCTIONAL DESCRIPTION
The PALCE16V8 is a universal PAL device. The PALCE16V8Z is the zero-power version of the PALCE16V8. It has all the architectural features of the PALCE16V8. In addition, the PALCE16V8Z has zero standby power and an unused product term disable feature for reduced power consumption. It has eight independently configurable macrocells (MC0-MC7). Each macrocell can be configured as registered output, combinatorial output, combinatorial I/O or dedicated input. The programming matrix implements a programmable AND logic array, which drives a fixed OR logic array. Buffers for device inputs have complementary outputs to provide userprogrammable input signal polarity. Pins 1 and 11 serve either as array inputs or as clock (CLK) and output enable (OE), respectively, for all flip-flops. Unused input pins should be tied directly to VCC or GND. Product terms with all bits unprogrammed (disconnected) assume the logical HIGH state, and product terms with both true and complement of any input signal connected assume a logical LOW state. The programmable functions on the PALCE16V8 are automatically configured from the user's design specification. The design specification is processed by development software to verify the design and create a programming file (JEDEC). This file, once downloaded to a programmer, configures the device according to the user's desired function. The user is given two design options with the PALCE16V8. First, it can be programmed as a standard PAL device from the PAL16R8 series. The PAL programmer manufacturer will supply device codes for the standard PAL device architectures to be used with the PALCE16V8. The programmer will program the PALCE16V8 in the corresponding architecture. This allows the user to use existing standard PAL device JEDEC files without making any changes to them.
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Alternatively, the device can be programmed as a PALCE16V8. Here the user must use the PALCE16V8 device code. This option allows full utilization of the macrocell.
To Adjacent Macrocell
11 0X 10
OE VCC
11 10 00 01
SL0X SG1
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11 0X 10
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I/OX
D
Q Q
SL1X
CLK
10 11 0X SL0X
*SG1
*In macrocells MC0 and MC7, SG1 is replaced by SG0 on the feedback multiplexer.
From Adjacent Pin
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Figure 1. PALCE16V8 Macrocell
CONFIGURATION OPTIONS
Each macrocell can be configured as one of the following: registered output, combinatorial output, combinatorial I/O, or dedicated input. In the registered output configuration, the output buffer is enabled by the OE pin. In the combinatorial configuration, the buffer is either controlled by a product term or always enabled. In the dedicated input configuration, it is always disabled. With the exception of MC0 and MC7, a macrocell configured as a dedicated input derives the input signal from an adjacent I/O. MC0 derives its input from pin 11 (OE) and MC7 from pin 1 (CLK). The macrocell configurations are controlled by the configuration control word. It contains 2 global bits (SG0 and SG1) and 16 local bits (SL00 through SL07 and SL10 through SL17). SG0 determines whether registers will be allowed. SG1 determines whether the PALCE16V8 will emulate a PAL16R8 family or a PAL10H8 family device. Within each macrocell, SL0x, in conjunction with SG1, selects the configuration of the macrocell, and SL1x sets the output as either active low or active high for the individual macrocell. The configuration bits work by acting as control inputs for the multiplexers in the macrocell. There are four multiplexers: a product term input, an enable select, an output select, and a feedback select multiplexer. SG1 and SL0x are the control signals for all four multiplexers. In MC0 and MC7, SG0 replaces SG1 on the feedback multiplexer. This accommodates CLK being the adjacent pin for MC7 and OE the adjacent pin for MC0.
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Registered Output Configuration The control bit settings are SG0 = 0, SG1 = 1 and SL0x = 0. There is only one registered configuration. All eight product terms are available as inputs to the OR gate. Data polarity is determined by SL1x. The flip-flop is loaded on the LOW-to-HIGH transition of CLK. The feedback path is from Q on the register. The output buffer is enabled by OE. Combinatorial Configurations The PALCE16V8 has three combinatorial output configurations: dedicated output in a nonregistered device, I/O in a non-registered device and I/O in a registered device. Dedicated Output in a Non-Registered Device The control bit settings are SG0 = 1, SG1 = 0 and SL0x = 0. All eight product terms are available to the OR gate. Although the macrocell is a dedicated output, the feedback is used, with the exception of pins 15 and 16. Pins 15 and 16 do not use feedback in this mode. Because CLK and OE are not used in a non-registered device, pins 1 and 11 are available as input signals. Pin 1 will use the feedback path of MC7, and pin 11 will use the feedback path of MC0. Combinatorial I/O in a Non-Registered Device The control bit settings are SG0 = 1, SG1 = 1, and SL0x = 1. Only seven product terms are available to the OR gate. The eighth product term is used to enable the output buffer. The signal at the I/O pin is fed back to the AND array via the feedback multiplexer. This allows the pin to be used as an input. Because CLK and OE are not used in a non-registered device, pins 1 and 11 are available as inputs. Pin 1 will use the feedback path of MC7, and pin 11 will use the feedback path of MC0. Combinatorial I/O in a Registered Device The control bit settings are SG0 = 0, SG1 = 1 and SL0x = 1. Only seven product terms are available to the OR gate. The eighth product term is used as the output enable. The feedback signal is the corresponding I/O signal. Dedicated Input Configuration The control bit settings are SG0 = 1, SG1 = 0 and SL0x = 1. The output buffer is disabled. Except for MC0 and MC7, the feedback signal is an adjacent I/O. For MC0 and MC7, the feedback signals are pins 1 and 11. These configurations are summarized in Table 1 and illustrated in Figure 2.
Table 1. Macrocell Configuration
SG0 SG1 SL0X Cell Configuration Devices Emulated SG0 SG1 SL0X Cell Configuration Devices Emulated
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Device Uses Registers 0 1 0 Registered Output PAL16R8, 16R6, 16R4 1 0
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0 PAL16R6, 16R4 1 0 1 1 1 1
Device Uses No Registers Combinatorial Output PAL10H8, 12H6, 14H4, 16H2, 10L8, 12L6, 14L4, 16L2 PAL12H6, 14H4, 16H2, 12L6, 14L4, 16L2 PAL16L8
0
1
1
Combinatorial I/O
R
Input Combinatorial I/O
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PALCE16V8 and PALCE16V8Z Families
Programmable Output Polarity The polarity of each macrocell can be active-high or active-low, either to match output signal needs or to reduce product terms. Programmable polarity allows Boolean expressions to be written in their most compact form (true or inverted), and the output can still be of the desired polarity. It can also save "DeMorganizing" efforts. Selection is through a programmable bit SL1x which controls an exclusive-OR gate at the output of the AND/OR logic. The output is active high if SL1x is 1 and active low if SL1x is 0.
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PALCE16V8 and PALCE16V8Z Families
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5
OE
OE
D CLK
Q Q CLK
D
Q Q
a. Registered active low
b. Registered active high
c. Combinatorial I/O active low VCC
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Note 1
d. Combinatorial I/O active high VCC
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Note 1
e. Combinatorial output active low
f. Combinatorial output active high
Notes: 1. Feedback is not available on pins 15 and 16 in the combinatorial output mode. 2. This configuration is not available on pins 15 and 16. g. Dedicated input
Adjacent I/O pin Note 2
Figure 2. Macrocell Configurations
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PALCE16V8 and PALCE16V8Z Families
Power-Up Reset All flip-flops power up to a logic LOW for predictable system initialization. Outputs of the PALCE16V8 will depend on whether they are selected as registered or combinatorial. If registered is selected, the output will be HIGH. If combinatorial is selected, the output will be a function of the logic. Register Preload The register on the PALCE16V8 can be preloaded from the output pins to facilitate functional testing of complex state machine designs. This feature allows direct loading of arbitrary states, making it unnecessary to cycle through long test vector sequences to reach a desired state. In addition, transitions from illegal states can be verified by loading illegal states and observing proper recovery. Security Bit A security bit is provided on the PALCE16V8 as a deterrent to unauthorized copying of the array configuration patterns. Once programmed, this bit defeats readback and verification of the programmed pattern by a device programmer, securing proprietary designs from competitors. The bit can only be erased in conjunction with the array during an erase cycle. Electronic Signature Word An electronic signature word is provided in the PALCE16V8 device. It consists of 64 bits of programmable memory that can contain user-defined data. The signature data is always available to the user independent of the security bit. Programming and Erasing The PALCE16V8 can be programmed on standard logic programmers. It also may be erased to reset a previously configured device back to its unprogrammed state. Erasure is automatically performed by the programming hardware. No special erase operation is required. Quality and Testability The PALCE16V8 offers a very high level of built-in quality. The erasability of the device provides a direct means of verifying performance of all AC and DC parameters. In addition, this verifies complete programmability and functionality of the device to provide the highest programming yields and post-programming functional yields in the industry. Technology The high-speed PALCE16V8 is fabricated with Vantis' advanced electrically-erasable (EE) CMOS process. The array connections are formed with proven EE cells. Inputs and outputs are designed to be compatible with TTL devices. This technology provides strong input clamp diodes, output slew-rate control, and a grounded substrate for clean switching. PCI Compliance PALCE16V8 devices in the -5/-7/-10 speed grades are fully compliant with the PCI Local Bus Specification published by the PCI Special Interest Group. The PALCE16V8's predictable timing ensures compliance with the PCI AC specifications independent of the design. Zero-Standby Power Mode The PALCE16V8Z features a zero-standby power mode. When none of the inputs switch for an extended period (typically 50 ns), the PALCE16V8Z will go into standby mode, shutting down
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PALCE16V8 and PALCE16V8Z Families
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most of its internal circuitry. The current will go to almost zero (ICC < 15 A). The outputs will maintain the states held before the device went into the standby mode. There is no speed penalty associated with coming out of standby mode. When any input switches, the internal circuitry is fully enabled, and power consumption returns to normal. This feature results in considerable power savings for operation at low to medium frequencies. This saving is illustrated in the ICC vs. frequency graph. Product-Term Disable On a programmed PALCE16V8Z, any product terms that are not used are disabled. Power is cut off from the product terms so that they do not draw current. As shown in the ICC vs. frequency graph, product-term disabling results in considerable power savings. This saving is greater at the higher frequencies. Further hints on minimizing power consumption can be found in a separate document entitled, Minimizing Power Consumption with Zero-Power PLDs.
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PALCE16V8 and PALCE16V8Z Families
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LOGIC DIAGRAM
0 CLK/I 0 1 34 78 11 12 15 16 19 20 23 24 27 28 31
11 0X 10 VCC
11 10 00 01
20 V CC
0
SL0 7 SG1 11 0X D Q Q 10 11 0X SG0 SL0 7 10
19 I/O7
7 I1 2
SL1 7
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11 0X 10 SL0 6 SG1
R
VCC
11 10 00 01
8
11 0X D Q Q 10 11 0X SG1 SL0 6 10
18 I/O6
15 I2 3
SL16
11
0X 10
VCC
11 10 00 01
SL0 5
16
SG1
11 0X D Q Q 10 11 0X SG1 SL0 5 10
17 I/O5
23 I3 4
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SL1 5
11 0X 10 VCC
11 10 00 01
SL0 4
24
SG1
11 0X D Q Q 10
16 I/O4
31 I4 5
SL1 4 10 11 0X SG1 SL0 4
0
34
78
11 12 15 16 19 20 23 24 27 28
31
CLK OE
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PALCE16V8 and PALCE16V8Z Families
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LOGIC DIAGRAM (CONTINUED)
0 34 7 8 11 12 15 16 19 20 23 24 27 28 31
CLK OE 11 10 00 01
11 0X 10 VCC
32
SL0 3 SG1 11 0X D Q Q 10 11 0X SG1 SL0 3 10
15 I/O 3
39
SL1 3
I5 6
11 0X 10
R
SL0 2 SG1 D Q Q SL1 2 SL0 1 SG1 D Q Q SL1 1 SL0 0 SG1 D Q Q SL1 0
VCC
11 10 00 01
40
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11 0X 10
14 I/O 2
47 I6 7
10 11 0X SG1 SL0 2
11
0X 10
VCC
11 10 00 01
48
11 0X 10
13 I/O1
55 I7 8
10 11 0X SG1 SL0 1
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11
0X 10
VCC
11 10 00 01
56
11 0X 10
12 I/O 0
63 I8 9
10 11 0X SG0 SL00
11 OE/I 9
0 GND 10
34
78
11 12 15 16 19 20
23 24 27 28 31
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PALCE16V8 and PALCE16V8Z Families
ABSOLUTE MAXIMUM RATINGS
Storage Temperature . . . . . . . . . . . . . .-65C to +150C Ambient Temperature with Power Applied . . . . . . . . . . . . . .-55C to +125C Supply Voltage with Respect to Ground . . . . . . . . . . -0.5 V to +7.0 V DC Input Voltage . . . . . . . . . . . -0.5 V to VCC + 0.5 V DC Output or I/O Pin Voltage . . . . . . . . . . . . . . . . . -0.5 V to VCC + 0.5 V Static Discharge Voltage . . . . . . . . . . . . . . . . . 2001 V
Stresses above those listed under Absolute Maximum Ratings may cause permanent device failure. Functionality at or above these limits is not implied. Exposure to Absolute Maximum Ratings for extended periods may affect device reliability. Programming conditions may differ.
OPERATING RANGES
Commercial (C) Devices
Ambient Temperature (TA) Operating in Free Air . . . . . . . . . . . . . . . 0C to +75C Supply Voltage (VCC) with Respect to Ground . . . . . . . . . +4.75 V to +5.25 V
Operating ranges define those limits between which the functionality of the device is guaranteed.
DC CHARACTERISTICS OVER COMMERCIAL OPERATING RANGES
Parameter Symbol VOH VOL VIH VIL IIH IIL IOZH IOZL ISC ICC (Static) ICC (Dynamic) Parameter Description Output HIGH Voltage Output LOW Voltage Input HIGH Voltage Input LOW Voltage Test Description Min 2.4 0.5 2.0 0.8 10 -100 10 -100 -30 -150 125 115 Max Unit V V V V A A A A mA mA mA
Input LOW Leakage Current
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Input HIGH Leakage Current
U
Off-State Output Leakage Current HIGH Off-State Output Leakage Current LOW Output Short-Circuit Current Supply Current for -5 Supply Current for -7
Notes: 1. These are absolute values with respect to device ground, and all overshoots due to system or tester noise are included. 2. I/O pin leakage is the worst case of IIL and IOZL (or IIH and IOZH). 3. Not more than one output should be shorted at a time, and the duration of the short-circuit should not exceed one second. VOUT = 0.5 V has been chosen to avoid test problems caused by tester ground degradation.
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IOH = -3.2 mA, VIN = VIH or VIL, VCC = Min IOL = 24 mA, VIN = VIH or VIL, VCC = Min Guaranteed Input Logical HIGH Voltage for all Inputs (Note 1) Guaranteed Input Logical LOW Voltage for all Inputs (Note 1) VIN = 5.25 V, VCC = Max (Note 2) VIN = 0 V, VCC = Max (Note 2) VOUT = 5.25 V, VCC = Max VIN = VIH or VIL (Note 2) VOUT = 0 V, VCC = Max VIN = VIH or VIL (Note 2) VOUT = 0.5 V, VCC = Max (Note 3) Outputs Open (IOUT = 0 mA), VIN = 0 V VCC = Max Outputs Open (IOUT = 0 mA), VCC = Max, f = 25 MHz
PALCE16V8H-5/7 (Com'l)
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Latchup Current (TA = 0C to 75C) . . . . . . . . . 100 mA
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CAPACITANCE1
Parameter Symbol CIN COUT Parameter Description Input Capacitance Output Capacitance VIN = 2.0 V VOUT = 2.0 V Test Conditions VCC = 5.0 V, TA = 25 C, f = 1 MHz Typ 5 8 Unit pF pF
Note: 1. These parameters are not 100% tested, but are evaluated at initial characterization and at any time the design is modified where capacitance may be affected.
SWITCHING CHARACTERISTICS OVER COMMERCIAL OPERATING RANGES1
R
-5
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Parameter Description Min 1
Parameter Symbol tPD tS tH tCO tSKEWR tWL tWH
-7 Min 3 5 0
2
2
Max 5
Max 7.5
Unit ns ns ns
Input or Feedback to Combinatorial Output
Setup Time from Input or Feedback to Clock Hold Time Clock to Output
3
0
1
4 1
1
5 1
ns ns ns ns MHz MHz MHz
Skew Between Registered Outputs (Note 3) LOW Clock Width
3
4 4 100 125 125 6 5 6 5 1 1 3 3 6 6 9 9
HIGH
3
External Feedback fMAX
1/(tS+tCO)
142.8 166
Maximum Frequency Internal Feedback (fCNT) (Note 4) No Feedback OE to Output Enable OE to Output Disable
1/(tS+tCF) (Note 5) 1/(tWH+tWL)
166 1
tPZX tPXZ tEA tER
ns ns ns ns
Input to Output Enable Using Product Term Control
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1
2
Input to Output Disable Using Product Term Control
2
Notes: 1. See "Switching Test Circuit" for test conditions. 2. Output delay minimums for tPD, tCO, tPZX, tPXZ, tEA, and tER are defined under best case conditions. Future process improvements may alter these values; therefore, minimum values are recommended for simulation purposes only. 3. Skew testing takes into account pattern and switching direction differences between outputs that have equal loading. 4. These parameters are not 100% tested, but are calculated at initial characterization and at any time the design is modified where frequency may be affected. 5. tCF is a calculated value and is not guaranteed. tCF can be found using the following equation: tCF = 1/fMAX (internal feedback) - tS.
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PALCE16V8H-5/7 (Com'l)
ABSOLUTE MAXIMUM RATINGS
Storage Temperature . . . . . . . . . . . . . .-65C to +150C Ambient Temperature with Power Applied . . . . . . . . . . . . . .-55C to +125C Supply Voltage with Respect to Ground . . . . . . . . . . -0.5 V to + 7.0 V DC Input Voltage . . . . . . . . . . . -0.5 V to VCC + 0.5 V DC Output or I/O Pin Voltage . . . . . . . . . . . . . . . . . -0.5 V to VCC + 0.5 V Static Discharge Voltage . . . . . . . . . . . . . . . . . 2001 V Latchup Current (TA = -40C to +85C). . . . . . . 100 mA
Stresses above those listed under Absolute Maximum Ratings may cause permanent device failure. Functionality at or above these limits is not implied. Exposure to Absolute Maximum Ratings for extended periods may affect device reliability. Programming conditions may differ.
OPERATING RANGES
Commercial (C) Devices
Ambient Temperature (TA) Operating in Free Air . . . . . . . . . . . . . . . 0C to +75C Supply Voltage (VCC) with Respect to Ground . . . . . . . . . +4.75 V to +5.25 V
Industrial (I) Devices
Temperature (TA) Operating in Free Air . . . . . . . . . . . . . . . . . . . . . . -40C to +85C
DC CHARACTERISTICS OVER COMMERCIAL AND INDUSTRIAL OPERATING RANGES
Parameter Symbol VOH VOL VIH VIL IIH IIL IOZH IOZL ISC ICC (Dynamic) Parameter Description Output HIGH Voltage Output LOW Voltage Input HIGH Voltage Input LOW Voltage Test Description Min 2.4 0.5 2.0 0.8 10 -100 10 -100 -30 -150 115 130 Max Unit V V V V A A A A mA mA mA
Input HIGH Leakage Current
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U
Input LOW Leakage Current
Off-State Output Leakage Current HIGH Off-State Output Leakage Current LOW Output Short-Circuit Current Commercial Supply Current Industrial Supply Current
Notes: 1. These are absolute values with respect to device ground, and all overshoots due to system or tester noise are included. 2. I/O pin leakage is the worst case of IIL and IOZL (or IIH and IOZH). 3. Not more than one output should be shorted at a time, and the duration of the short-circuit should not exceed one second. VOUT = 0.5 V has been chosen to avoid test problems caused by tester ground degradation.
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IOH = -3.2 mA, VIN = VIH or VIL, VCC = Min IOL = 24 mA, VIN = VIH or VIL, VCC = Min Guaranteed Input Logical HIGH Voltage for all Inputs (Note 1) Guaranteed Input Logical LOW Voltage for all Inputs (Note 1) VIN = 5.25 V, VCC = Max (Note 2) VIN = 0 V, VCC = Max (Note 2) VOUT = 5.25 V, VCC = Max VIN = VIH or VIL (Note 2) VOUT = 0 V, VCC = Max VIN = VIH or VIL (Note 2) VOUT = 0.5 V, VCC = Max (Note 3) Outputs Open (IOUT = 0 mA) VCC = Max, f = 15 MHz
Operating ranges define those limits between which the functionality of the device is guaranteed.
PALCE16V8H-10 (Com'l, Ind)
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Supply Voltage (VCC) with Respect to Ground . . . . . . . . . . . +4.5 V to +5.5 V
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CAPACITANCE1
Parameter Symbol CIN COUT Parameter Description Input Capacitance Output Capacitance VIN = 2.0 V VOUT = 2.0 V Test Conditions VCC = 5.0 V, TA = 25 C, f = 1 MHz Typ 5 8 Unit pF pF
Note: 1. These parameters are not 100% tested, but are evaluated at initial characterization and at any time the design is modified where capacitance may be affected.
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SWITCHING CHARACTERISTICS OVER COMMERCIAL AND INDUSTRIAL OPERATING RANGES1
Parameter Symbol tPD tS tH tCO tWL tWH
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Parameter Description
-10 Min 3 7.5 0 3 6 6 66.7 71.4 83.3 2 2 3 3 10 10 10 10 7.5
2
Max 10
Unit ns ns ns ns ns ns MHz MHz MHz ns ns ns ns
Input or Feedback to Combinatorial Output
Setup Time from Input or Feedback to Clock Hold Time Clock to Output Clock Width
LOW
HIGH
fMAX
External Feedback Maximum Frequency Internal Feedback (fCNT) (Note 3) No Feedback OE to Output Enable OE to Output Disable
1/(tS+tCO)
1/(tS+tCF) (Note 4) 1/(tWH+tWL)
tPZX tPXZ tEA tER
Input to Output Enable Using Product Term Control
Input to Output Disable Using Product Term Control
Notes: 1. See "Switching Test Circuit" for test conditions. 2. Output delay minimums for tPD, tCO, tPZX, tPXZ, tEA, and tER are defined under best case conditions. Future process improvements may alter these values; therefore, minimum values are recommended for simulation purposes only. 3. These parameters are not 100% tested, but are calculated at initial characterization and at any time the design is modified where frequency may be affected. 4. tCF is a calculated value and is not guaranteed. tCF can be found using the following equation: tCF = 1/fMAX (internal feedback) - tS.
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PALCE16V8H-10 (Com'l, Ind)
ABSOLUTE MAXIMUM RATINGS
Storage Temperature . . . . . . . . . . . . . .-65C to +150C Ambient Temperature with Power Applied . . . . . . . . . . . . . .-55C to +125C Supply Voltage with Respect to Ground . . . . . . . . . . -0.5 V to +7.0 V DC Input Voltage . . . . . . . . . . . -0.5 V to VCC + 0.5 V DC Output or I/O Pin Voltage . . . . . . . . . . . . . . . . . -0.5 V to VCC + 0.5 V Static Discharge Voltage . . . . . . . . . . . . . . . . . 2001 V
Stresses above those listed under Absolute Maximum Ratings may cause permanent device failure. Functionality at or above these limits is not implied. Exposure to Absolute Maximum Ratings for extended periods may affect device reliability. Programming conditions may differ.
OPERATING RANGES
Commercial (C) Devices
Ambient Temperature (TA) Operating in Free Air . . . . . . . . . . . . . . . 0C to +75C Supply Voltage (VCC) with Respect to Ground . . . . . . . . . +4.75 V to +5.25 V
Operating ranges define those limits between which the functionality of the device is guaranteed.
DC CHARACTERISTICS OVER COMMERCIAL OPERATING RANGES
Parameter Symbol VOH VOL VIH VIL IIH IIL IOZH IOZL ISC ICC Parameter Description Output HIGH Voltage Output LOW Voltage Input HIGH Voltage Input LOW Voltage Test Description Min 2.4 0.5 2.0 0.8 10 -100 10 -100 -30 -150 55 Max Unit V V V V A A A A mA mA
Input LOW Leakage Current
SE
Input HIGH Leakage Current
U
Off-State Output Leakage Current HIGH Off-State Output Leakage Current LOW Output Short-Circuit Current Supply Current (Dynamic)
Notes: 1. These are absolute values with respect to device ground, and all overshoots due to system or tester noise are included. 2. I/O pin leakage is the worst case of IIL and IOZL (or IIH and IOZH). 3. Not more than one output should be shorted at a time, and the duration of the short-circuit should not exceed one second. VOUT = 0.5 V has been chosen to avoid test problems caused by tester ground degradation.
G N AL EW D EV D ES IC IG ES NF SO
IOH = -3.2 mA, VIN = VIH or VIL, VCC = Min IOL = 24 mA, VIN = VIH or VIL, VCC = Min Guaranteed Input Logical HIGH Voltage for all Inputs (Note 1) Guaranteed Input Logical LOW Voltage for all Inputs (Note 1) VIN = 5.25 V, VCC = Max (Note 2) VIN = 0 V, VCC = Max (Note 2) VOUT = 5.25 V, VCC = Max VIN = VIH or VIL (Note 2) VOUT = 0 V, VCC = Max VIN = VIH or VIL (Note 2) VOUT = 0.5 V, VCC = Max (Note 3) Outputs Open (IOUT = 0 mA), VCC = Max, f = 15 MHz
PALCE16V8Q-10 (Com'l)
R
Latchup Current (TA = 0C to 75C) . . . . . . . . . 100 mA
15
CAPACITANCE1
Parameter Symbol CIN COUT Parameter Description Input Capacitance Output Capacitance VIN = 2.0 V VOUT = 2.0 V Test Conditions VCC = 5.0 V, TA = 25 C, f = 1 MHz Typ 5 8 Unit pF pF
Note: 1. These parameters are not 100% tested, but are evaluated at initial characterization and at any time the design is modified where capacitance may be affected.
SWITCHING CHARACTERISTICS OVER COMMERCIAL OPERATING RANGES1
tPD tS tH tCO tWL tWH
Input or Feedback to Combinatorial Output
G N AL EW D EV D ES IC IG ES NF SO
Parameter Symbol
R
-10 Min 3 7.5 0 3 6 6 66.7 71.4 83.3 2 2 3 3 10 10 10 10 7.5
2
Parameter Description
Max 10
Unit ns ns ns ns ns ns MHz MHz MHz ns ns ns ns
Setup Time from Input or Feedback to Clock Hold Time Clock to Output Clock Width
LOW
HIGH
fMAX
External Feedback Maximum Frequency Internal Feedback (fCNT) (Note 3) No Feedback OE to Output Enable OE to Output Disable
1/(tS+tCO)
1/(tS+tCF) (Note 4) 1/(tWH+tWL)
tPZX tPXZ tEA tER
Input to Output Enable Using Product Term Control
Input to Output Disable Using Product Term Control
Notes: 1. See "Switching Test Circuit" for test conditions. 2. Output delay minimums for tPD, tCO, tPZX, tPXZ, tEA, and tER are defined under best case conditions. Future process improvements may alter these values; therefore, minimum values are recommended for simulation purposes only. 3. These parameters are not 100% tested, but are calculated at initial characterization and at any time the design is modified where frequency may be affected. 4. tCF is a calculated value and is not guaranteed. tCF can be found using the following equation: tCF = 1/fMAX (internal feedback) - tS.
16
U
SE
PALCE16V8Q-10 (Com'l)
ABSOLUTE MAXIMUM RATINGS
Storage Temperature . . . . . . . . . . . . . .-65C to +150C Ambient Temperature with Power Applied . . . . . . . . . . . . . .-55C to +125C Supply Voltage with Respect to Ground . . . . . . . . . . -0.5 V to + 7.0 V DC Input Voltage . . . . . . . . . . . -0.5 V to VCC + 0.5 V DC Output or I/O Pin Voltage . . . . . . . . . . . . . . . . . -0.5 V to VCC + 0.5 V Static Discharge Voltage . . . . . . . . . . . . . . . . . 2001 V Latchup Current (TA = -40C to +85C). . . . . . . 100 mA
Stresses above those listed under Absolute Maximum Ratings may cause permanent device failure. Functionality at or above these limits is not implied. Exposure to Absolute Maximum Ratings for extended periods may affect device reliability. Programming conditions may differ.
OPERATING RANGES
Commercial (C) Devices
Ambient Temperature (TA) Operating in Free Air . . . . . . . . . . . . . . . 0C to +75C Supply Voltage (VCC) with Respect to Ground . . . . . . . . . +4.75 V to +5.25 V
Industrial (I) Devices
Temperature (TA) Operating in Free Air . . . . . . . . . . . . . . . . . . . . . . -40C to +85C
DC CHARACTERISTICS OVER COMMERCIAL AND INDUSTRIAL OPERATING RANGES
Parameter Symbol VOH VOL VIH VIL IIH IIL IOZH IOZL ISC Parameter Description Output HIGH Voltage Output LOW Voltage Input HIGH Voltage Input LOW Voltage Test Description Min 2.4 0.5 2.0 0.8 10 -100 10 -100 -30 H Commercial Supply Current ICC (Dynamic) Industrial Supply Current Q 65 Notes: 1. These are absolute values with respect to device ground, and all overshoots due to system or tester noise are included. 2. I/O pin leakage is the worst case of IIL and IOZL (or IIH and IOZH). 3. Not more than one output should be shorted at a time, and the duration of the short-circuit should not exceed one second. VOUT = 0.5 V has been chosen to avoid test problems caused by tester ground degradation. Outputs Open (IOUT = 0 mA) VCC = Max, f = 15 MHz Q H 55 130 mA -150 90 mA Max Unit V V V V A A A A mA
Input HIGH Leakage Current
SE
U
Input LOW Leakage Current
Off-State Output Leakage Current HIGH Off-State Output Leakage Current LOW Output Short-Circuit Current
PALCE16V8H-15/25 (Com'l, Ind), Q-15/25 (Com'l), Q-20/25 (Ind)
G N AL EW D EV D ES IC IG ES NF SO
IOH = -3.2 mA, VIN = VIH or VIL, VCC = Min IOL = 24 mA, VIN = VIH or VIL, VCC = Min Guaranteed Input Logical HIGH Voltage for all Inputs (Note 1) Guaranteed Input Logical LOW Voltage for all Inputs (Note 1) VIN = 5.25 V, VCC = Max (Note 2) VIN = 0 V, VCC = Max (Note 2) VOUT = 5.25 V, VCC = Max VIN = VIH or VIL (Note 2) VOUT = 0 V, VCC = Max VIN = VIH or VIL (Note 2) VOUT = 0.5 V, VCC = Max (Note 3)
Operating ranges define those limits between which the functionality of the device is guaranteed.
R
Supply Voltage (VCC) with Respect to Ground . . . . . . . . . . . +4.5 V to +5.5 V
17
CAPACITANCE1
Parameter Symbol CIN COUT Parameter Description Input Capacitance Output Capacitance VIN = 2.0 V VOUT = 2.0 V Test Conditions VCC = 5.0 V, TA = 25 C, f = 1 MHz Typ 5 8 Unit pF pF
Note: 1. These parameters are not 100% tested, but are evaluated at initial characterization and at any time the design is modified where capacitance may be affected.
Parameter Symbol tPD tS tH tCO tWL tWH Maximum Frequency (Note 2)
Parameter Description Input or Feedback to Combinatorial Output
G N AL EW D EV D ES IC IG ES NF SO
Min Max 15 Min
-15
R
-20
SWITCHING CHARACTERISTICS OVER COMMERCIAL AND INDUSTRIAL OPERATING RANGES1
-25 Min Max 25 15 0 11 12 12 37 40 41.6 18 18 18 18 20 20 20 20 12 Unit ns ns ns ns ns ns MHz MHz MHz ns ns ns ns Max 20
Setup Time from Input or Feedback to Clock Hold Time Clock to Output LOW Clock Width
12 0
13 0
10
8
10
HIGH
8
10
External Feedback fMAX Internal Feedback (fCNT) No Feedback tPZX tPXZ tEA tER OE to Output Enable OE to Output Disable
1/(tS+tCO)
45.5 50
41.6
1/(tS+tCF) (Note 3)
45.4
1/(tWH+tWL)
62.5
50.0
15
SE
15
Input to Output Enable Using Product Term Control
15
Input to Output Disable Using Product Term Control
U
15
Notes: 1. See "Switching Test Circuit" for test conditions. 2. These parameters are not 100% tested, but are calculated at initial characterization and at any time the design is modified where frequency may be affected. 3. tCF is a calculated value and is not guaranteed. tCF can be found using the following equation: tCF = 1/fMAX (internal feedback) - tS.
18
PALCE16V8H-15/25 (Com'l, Ind), Q-15/25 (Com'l), Q-20/25 (Ind)
ABSOLUTE MAXIMUM RATINGS
Storage Temperature . . . . . . . . . . . . . .-65C to +150C Ambient Temperature with Power Applied . . . . . . . . . . . . . .-55C to +125C Supply Voltage with Respect to Ground . . . . . . . . . . -0.5 V to + 7.0 V DC Input Voltage . . . . . . . . . . . -0.5 V to VCC + 0.5 V DC Output or I/O Pin Voltage . . . -0.5 V to VCC + 0.5 V Static Discharge Voltage . . . . . . . . . . . . . . . . . 2001 V Latchup Current (TA = -40C to +85C). . . . . . . 100 mA
Stresses above those listed under Absolute Maximum Ratings may cause permanent device failure. Functionality at or above these limits is not implied. Exposure to Absolute Maximum Ratings for extended periods may affect device reliability. Programming conditions may differ.
OPERATING RANGES
Industrial (I) Devices
Ambient Temperature (TA) Operating in Free Air . . . . . . . . . . . . . . -40C to +85C Supply Voltage (VCC) with Respect to Ground . . . . . . . . . . . +4.5 V to +5.5 V
Operating ranges define those limits between which the functionality of the device is guaranteed.
DC CHARACTERISTICS OVER INDUSTRIAL OPERATING RANGES
Parameter Symbol VOH Parameter Description Output HIGH Voltage Test Description Min 3.84 VCC - 0.1 V 0.5 0.33 0.1 2.0 0.9 10 -10 10 -10 -30 f = 0 MHz f = 15 MHz -150 30 75 Max Unit V V V V V V V A A A A mA A mA
VOL
Output LOW Voltage
VIH VIL IIH IIL IOZH IOZL ISC ICC
Input HIGH Voltage Input LOW Voltage
Input HIGH Leakage Current Input LOW Leakage Current
SE
U
Off-State Output Leakage Current HIGH Off-State Output Leakage Current LOW Output Short-Circuit Current Supply Current (Static) Supply Current (Dynamic)
Notes: 1. These are absolute values with respect to device ground, and all overshoots due to system or tester noise are included. 2. Represents the worst case of HC and HCT standards, allowing compatibility with either. 3. I/O pin leakage is the worst case of IIL and IOZL (or IIH and IOZH). 4. Not more than one output should be shorted at a time, and the duration of the short-circuit should not exceed one second. VOUT = 0.5 V has been chosen to avoid test problems caused by tester ground degradation.
G N AL EW D EV D ES IC IG ES NF SO
VIN = VIH or VIL, VCC = Min IOH = 6 mA IOH = 20 A IOL = 6 mA IOL = 24 mA VIN = VIH or VIL, VCC = Min IOL = 20 A Guaranteed Input Logical HIGH Voltage for all Inputs (Notes 1 and 2) Guaranteed Input Logical LOW Voltage for all Inputs (Notes 1 and 2) VIN = 5.25 V, VCC = Max (Note 3) VIN = 0 V, VCC = Max (Note 3) VOUT = 5.25 V, VCC = Max VIN = VIH or VIL (Note 3) VOUT = 0 V, VCC = Max VIN = VIH or VIL (Note 3) VOUT = 0.5 V, VCC = Max (Note 4) Outputs Open (IOUT = 0 mA) VCC = Max
PALCE16V8Z-12 (Ind)
R
19
CAPACITANCE1
Parameter Symbol CIN COUT Parameter Description Input Capacitance Output Capacitance VIN = 2.0 V VOUT = 2.0 V Test Conditions VCC = 5.0 V, TA = 25 C, f = 1 MHz Typ 5 8 Unit pF pF
Note: 1. These parameters are not 100% tested, but are evaluated at initial characterization and at any time the design is modified where capacitance may be affected.
SWITCHING CHARACTERISTICS OVER INDUSTRIAL OPERATING RANGES1
tPD tS tH tCO tWL tWH
Input or Feedback to Combinatorial Output (Note 2) Setup Time from Input or Feedback to Clock Hold Time Clock to Output Clock Width
G N AL EW D EV D ES IC IG ES NF SO
Parameter Symbol
Parameter Description
R
-12 Min Max 12 8 0 8 5 5 62.5 77 100 8 8 13 13 Unit ns ns ns ns ns ns MHz MHz MHz ns ns ns ns
LOW
HIGH
fMAX
External Feedback Maximum Frequency Internal Feedback (fCNT) (Notes 3 and 4) No Feedback OE to Output Enable OE to Output Disable
1/(tS+tCO)
1/(tS+tCF)
1/(tWH+tWL)
tPZX tPXZ tEA tER
Input to Output Enable Using Product Term Control
Input to Output Disable Using Product Term Control
Notes: 1. See "Switching Test Circuit" for test conditions. 2. This parameter is tested in standby mode. 3. These parameters are not 100% tested, but are calculated at initial characterization and at any time the design is modified where frequency may be affected. 4. Output delay minimums for tPD, tCO, tPZX, tPXZ, tEA, and tER are defined under best case conditions. Future process improvements may alter these values therefore, minimum values are recommended for simulation purposes only. 5. tCF is a calculated value and is not guaranteed. tCF can be found using the following equation: tCF = 1/fMAX (internal feedback) - tS.
20
U
SE
PALCE16V8Z-12 (Ind)
ABSOLUTE MAXIMUM RATINGS
Storage Temperature . . . . . . . . . . . . . .-65C to +150C Ambient Temperature with Power Applied . . . . . . . . . . . . . .-55C to +125C Supply Voltage with Respect to Ground . . . . . . . . . . -0.5 V to + 7.0 V DC Input Voltage . . . . . . . . . . . -0.5 V to VCC + 0.5 V DC Output or I/O Pin Voltage . . . -0.5 V to VCC + 0.5 V Static Discharge Voltage . . . . . . . . . . . . . . . . . 2001 V Latchup Current (TA = -40C to +85C). . . . . . . 100 mA
Stresses above those listed under Absolute Maximum Ratings may cause permanent device failure. Functionality at or above these limits is not implied. Exposure to Absolute Maximum Ratings for extended periods may affect device reliability. Programming conditions may differ.
OPERATING RANGES
Industrial (I) Devices
Ambient Temperature (TA) Operating in Free Air . . . . . . . . . . . . . . -40C to +85C Supply Voltage (VCC) with Respect to Ground . . . . . . . . . . . +4.5 V to +5.5 V
Operating ranges define those limits between which the functionality of the device is guaranteed.
DC CHARACTERISTICS OVER INDUSTRIAL OPERATING RANGES
Parameter Symbol VOH Parameter Description Output HIGH Voltage Test Description Min 3.84 VCC - 0.1 V 0.5 0.33 0.1 2.0 0.9 10 -10 10 -10 -30 f = 0 MHz f = 25 MHz -150 15 75 Max Unit V V V V V V V A A A A mA A mA
VOL
Output LOW Voltage
VIH VIL IIH IIL IOZH IOZL ISC ICC
Input HIGH Voltage Input LOW Voltage
Input HIGH Leakage Current Input LOW Leakage Current
SE
U
Off-State Output Leakage Current HIGH Off-State Output Leakage Current LOW Output Short-Circuit Current Supply Current (Static) Supply Current (Dynamic)
Notes: 1. These are absolute values with respect to device ground, and all overshoots due to system or tester noise are included. 2. Represents the worst case of HC and HCT standards, allowing compatibility with either. 3. I/O pin leakage is the worst case of IIL and IOZL (or IIH and IOZH). 4. Not more than one output should be shorted at a time, and the duration of the short-circuit should not exceed one second. VOUT = 0.5 V has been chosen to avoid test problems caused by tester ground degradation.
G N AL EW D EV D ES IC IG ES NF SO
VIN = VIH or VIL, VCC = Min IOH = 6 mA IOH = 20 A IOL = 6 mA IOL = 24 mA VIN = VIH or VIL, VCC = Min IOL = 20 A Guaranteed Input Logical HIGH Voltage for all Inputs (Notes 1 and 2) Guaranteed Input Logical LOW Voltage for all Inputs (Notes 1 and 2) VIN = 5.25 V, VCC = Max (Note 3) VIN = 0 V, VCC = Max (Note 3) VOUT = 5.25 V, VCC = Max VIN = VIH or VIL (Note 3) VOUT = 0 V, VCC = Max VIN = VIH or VIL (Note 3) VOUT = 0.5 V, VCC = Max (Note 4) Outputs Open (IOUT = 0 mA) VCC = Max
PALCE16V8Z-15 (Ind)
R
21
CAPACITANCE1
Parameter Symbol CIN COUT Parameter Description Input Capacitance Output Capacitance VIN = 2.0 V VOUT = 2.0 V Test Conditions VCC = 5.0 V, TA = 25 C, f = 1 MHz Typ 5 8 Unit pF pF
Note: 1. These parameters are not 100% tested, but are evaluated at initial characterization and at any time the design is modified where capacitance may be affected.
SWITCHING CHARACTERISTICS OVER INDUSTRIAL OPERATING RANGES1
tPD tS tH tCO tWL tWH
Input or Feedback to Combinatorial Output
G N AL EW D EV D ES IC IG ES NF SO
Parameter Symbol
R
-15 Min
2
Parameter Description
Max 15
Unit ns ns ns
Setup Time from Input or Feedback to Clock Hold Time Clock to Output Clock Width
10 0 10 8 8 50 58.8 62.5 15 15 15 15
ns ns ns MHz MHz MHz ns ns ns ns
LOW
HIGH Maximum Frequency (Notes 3 and 4) OE to Output Enable OE to Output Disable
External Feedback
1/(tS+tCO)
fMAX
Internal Feedback (fCNT) No Feedback
1/(tS+tCF)
1/(tWH+tWL)
tPZX tPXZ tEA tER
Input to Output Enable Using Product Term Control
Input to Output Disable Using Product Term Control
Notes: 1. See "Switching Test Circuit" for test conditions. 2. This parameter is tested in standby mode. 3. These parameters are not 100% tested, but are calculated at initial characterization and at any time the design is modified where frequency may be affected. 4. tCF is a calculated value and is not guaranteed. tCF can be found using the following equation: tCF = 1/fMAX (internal feedback) - tS.
22
U
SE
PALCE16V8Z-15 (Ind)
ABSOLUTE MAXIMUM RATINGS
Storage Temperature . . . . . . . . . . . . . .-65C to +150C Ambient Temperature with Power Applied . . . . . . . . . . . . . .-55C to +125C Supply Voltage with Respect to Ground . . . . . . . . . . -0.5 V to + 7.0 V DC Input Voltage . . . . . . . . . . . -0.5 V to VCC + 0.5 V DC Output or I/O Pin Voltage . . . -0.5 V to VCC + 0.5 V Static Discharge Voltage . . . . . . . . . . . . . . . . . 2001 V Latchup Current (TA = -40C to +85C). . . . . . . 100 mA
Stresses above those listed under Absolute Maximum Ratings may cause permanent device failure. Functionality at or above these limits is not implied. Exposure to Absolute Maximum Ratings for extended periods may affect device reliability. Programming conditions may differ.
OPERATING RANGES
Commercial (C) Devices
Ambient Temperature (TA) Operating in Free Air . . . . . . . . . . . . . . . 0C to +75C Supply Voltage (VCC) with Respect to Ground . . . . . . . . . +4.75 V to +5.25 V
Industrial (I) Devices
Temperature (TA) Operating in Free Air . . . . . . . . . . . . . . . . . . . . . . -40C to +85C
DC CHARACTERISTICS OVER COMMERCIAL AND INDUSTRIAL OPERATING RANGES
Parameter Symbol VOH Parameter Description Output HIGH Voltage Test Description Min 3.84 VCC - 0.1 V 0.5 0.33 0.1 2.0 0.9 10 -10 10 -10 -30 f = 0 MHz f = 25 MHz -150 15 90 Max Unit V V V V V V V A A A A mA A mA
VOL
Output LOW Voltage
VIH VIL IIH IIL IOZH IOZL ISC ICC
Input HIGH Voltage Input LOW Voltage
Input HIGH Leakage Current Input LOW Leakage Current
SE
U
Off-State Output Leakage Current HIGH Off-State Output Leakage Current LOW Output Short-Circuit Current Supply Current (Static) Supply Current (Dynamic)
Notes: 1. These are absolute values with respect to device ground, and all overshoots due to system or tester noise are included. 2. Represents the worst case of HC and HCT standards, allowing compatibility with either. 3. I/O pin leakage is the worst case of IIL and IOZL (or IIH and IOZH). 4. Not more than one output should be shorted at a time, and the duration of the short-circuit should not exceed one second. VOUT = 0.5 V has been chosen to avoid test problems caused by tester ground degradation.
G N AL EW D EV D ES IC IG ES NF SO
VIN = VIH or VIL, VCC = Min IOH = 6 mA IOH = 20 A IOL = 6 mA IOL = 24 mA VIN = VIH or VIL, VCC = Min IOL = 20 A Guaranteed Input Logical HIGH Voltage for all Inputs (Notes 1 and 2) Guaranteed Input Logical LOW Voltage for all Inputs (Notes 1 and 2) VIN = 5.25 V, VCC = Max (Note 3) VIN = 0 V, VCC = Max (Note 3) VOUT = 5.25 V, VCC = Max VIN = VIH or VIL (Note 3) VOUT = 0 V, VCC = Max VIN = VIH or VIL (Note 3) VOUT = 0.5 V, VCC = Max (Note 4) Outputs Open (IOUT = 0 mA) VCC = Max
Operating ranges define those limits between which the functionality of the device is guaranteed.
PALCE16V8Z-25 (Com'l, Ind)
R
Supply Voltage (VCC) with Respect to Ground . . . . . . . . . . . +4.5 V to +5.5 V
23
CAPACITANCE1
Parameter Symbol CIN COUT Parameter Description Input Capacitance Output Capacitance VIN = 2.0 V VOUT = 2.0 V Test Conditions VCC = 5.0 V, TA = 25 C, f = 1 MHz Typ 5 8 Unit pF pF
Note: 1. These parameters are not 100% tested, but are evaluated at initial characterization and at any time the design is modified where capacitance may be affected.
R
SWITCHING CHARACTERISTICS OVER COMMERCIAL AND INDUSTRIAL OPERATING RANGES1
Parameter Symbol tPD tS tH tCO tWL tWH Maximum Frequency (Notes 4 and 5) OE to Output Enable OE to Output Disable
G N AL EW D EV D ES IC IG ES NF SO
Parameter Description
-25 Min
2
Max 25
Unit ns ns ns
Input or Feedback to Combinatorial Output (Note 3) Setup Time from Input or Feedback to Clock Hold Time Clock to Output Clock Width
20 0 10 8 8 33.3 50 50 25 25 25 25
ns ns ns MHz MHz MHz ns ns ns ns
LOW
HIGH
External Feedback
1/(tS+tCO)
fMAX
Internal Feedback (fCNT) No Feedback
1/(tS+tCF)
1/(tWH+tWL)
tPZX tPXZ tEA tER
Input to Output Enable Using Product Term Control
Input to Output Disable Using Product Term Control
Notes: 1. See "Switching Test Circuit" for test conditions. 2. This parameter is tested in standby mode. 3. This parameter is tested in Standby Mode. When the device is not in Standby Mode, the tPD will typically be 2 ns faster. 4. These parameters are not 100% tested, but are calculated at initial characterization and at any time the design is modified where frequency may be affected. 5. tCF is a calculated value and is not guaranteed. tCF can be found using the following equation: tCF = 1/fMAX (internal feedback) - tS.
24
U
SE
PALCE16V8Z-25 (Com'l, Ind)
SWITCHING WAVEFORMS
Input or Feedback VT tPD Combinatorial Output VT
16493E-3
VT tS VT tH
Input or Feedback
Clock Registered Output
tCO VT
16493E-5
a. Combinatorial output
b. Registered output
G N AL EW D EV D ES IC IG ES NF SO
Input tER
R
VT tEA VOH - 0.5V VOL + 0.5V VT
16493E-6
tWH Clock
VT
Output
tWL
16493E-4
c. Clock width
d. Input to output disable/enable
VT
OE
tPXZ
tPZX
Output
VOH - 0.5V
VOL + 0.5V
VT
SE
16493E-7
e. OE to output disable/enable
Notes: 1. VT = 1.5 V 2. Input pulse amplitude 0 V to 3.0 V. 3. Input rise and fall times 2 ns to 5 ns typical.
U
PALCE16V8 and PALCE16V8Z Families
25
KEY TO SWITCHING WAVEFORMS
WAVEFORM INPUTS Must be Steady May Change from H to L May Change from L to H Don't Care, Any Change Permitted Does Not Apply OUTPUTS Will be Steady Will be Changing from H to L Will be Changing from L to H Changing, State Unknown
SWITCHING TEST CIRCUIT
SE
U
Specification tPD, tCO tEA
S1 Closed Z H: Open Z L: Closed H Z: Open L Z: Closed
G N AL EW D EV D ES IC IG ES NF SO
Center Line is HighImpedance "Off" State 5V S1 R1 Output R2 CL Test Point Commercial CL R1 R2 390 200 5 pF H-5: 200 50 pF
KS000010-PAL
16493E-8
R
Measured Output Value 1.5 V 1.5 V H Z: VOH - 0.5 V L Z: VOL + 0.5 V
tER
26
PALCE16V8 and PALCE16V8Z Families
TYPICAL ICC CHARACTERISTICS
VCC = 5 V, TA = 25C
150
125
16V8H-5
100
G N AL EW D D EV ES IC IG ES NF SO
10 20 30 Frequency (MHz) 40
R
16V8H-7 16V8H-10 16V8H-15/25 16V8Z-12/15 16V8Q-10/15/25 ICC (mA) 75 50 16V8Z-25 25 0 0
U SE
50
16493E-9
ICC vs. Frequency
The selected "typical" pattern utilized 50% of the device resources. Half of the macrocells were programmed as registered, and the other half were programmed as combinatorial. Half of the available product terms were used for each macrocell. On any vector, half of the outputs were switching. By utilizing 50% of the device, a midpoint is defined for ICC. From this midpoint, a designer may scale the ICC graphs up or down to estimate the ICC requirements for a particular design.
PALCE16V8 and PALCE16V8Z Families
27
ENDURANCE CHARACTERISTICS
The PALCE16V8 is manufactured using Vantis' advanced electrically-erasable (EE) CMOS process. This technology uses an EE cell to replace the fuse link used in bipolar parts. As a result, the device can be erased and reprogrammed--a feature which allows 100% testing at the factory.
Symbol tDR N Parameter Min Pattern Data Retention Time Max Operating Temperature Min Reprogramming Cycles Normal Programming Conditions 20 100 Years Cycles Test Conditions Max Storage Temperature Value 10 Unit Years
ROBUSTNESS FEATURES
INPUT/OUTPUT EQUIVALENT SCHEMATICS FOR PALCE16V8
VCC
VCC
U SE
ESD Protection and Clamping
G N AL EW D EV D ES IC IG ES NF SO
> 50 k Programming Pins Only Programming Voltage Detection
PALCE16V8X-X/5 devices have some unique features that make them extremely robust, especially when operating in high-speed design environments. Pull-up resistors on inputs and I/O pins cause unconnected pins to default to a known state. Input clamping circuitry limits negative overshoot, eliminating the possibility of false clocking caused by subsequent ringing. A special noise filter makes the programming circuitry completely insensitive to any positive overshoot that has a pulse width of less than about 100 ns for the /5 versions. Selected /4 devices are also being retrofitted with these robustness features.
Positive Overshoot Filter
R
Programming Circuitry
Typical Input
VCC
VCC
> 50 k
Provides ESD Protection and Clamping Preload Feedback Circuitry Input 16493E-10
Typical Output
28
PALCE16V8 and PALCE16V8Z Families
INPUT/OUTPUT EQUIVALENT SCHEMATICS FOR PALCE16V8Z
VCC
G N AL EW D D EV ES IC IG ES NF SO
VCC
Typical Input
R
16493E-11
ESD Input Protection Transition and Detection Clamping
Programming Pins Only
Programming Voltage Detection
Positive Overshoot Filter
Programming Circuitry
Provides ESD Protection and Clamping
Preload Feedback Input Circuitry Input Transition Detection
Typical Output
POWER-UP RESET
The PALCE16V8 has been designed with the capability to reset during system power-up. Following power-up, all flip-flops will be reset to LOW. The output state will be HIGH independent of the logic polarity. This feature provides extra flexibility to the designer and is especially valuable in simplifying state machine initialization. A timing diagram and parameter table are shown below. Due to the synchronous operation of the power-up reset and the wide range of ways VCC can rise to its steady state, two conditions are required to ensure a valid power-up reset. These conditions are: x The VCC rise must be monotonic.
x
Following reset, the clock input must not be driven from LOW to HIGH until all applicable input and feedback setup times are met.
Parameter Symbol Parameter Descriptions Power-Up Reset Time Input or Feedback Setup Time See Switching Characteristics Clock Width LOW Min Max 1000 Unit ns
tPR tS tWL
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PALCE16V8 and PALCE16V8Z Families
29
4V Power tPR Registered Output tS Clock
VCC
tWL
16493E-12
TYPICAL THERMAL CHARACTERISTICS
Measured at 25C ambient. These parameters are not tested.
Parameter Symbol jc ja Parameter Description
G N AL EW D EV D ES IC IG ES NF SO
Figure 3. Power-Up Reset Waveform
PDID 25
R
Typ PLCC 22 64 55 51 47 45 Unit C/W C/W C/W C/W C/W C/W Thermal impedance, junction to case Thermal impedance, junction to ambient 71 200 lfpm air 400 lfpm air 61 55 jma Thermal impedance, junction to ambient with air flow 600 lfpm air 800 lfpm air 51 47
Plastic jc Considerations
The data listed for plastic jc are for reference only and are not recommended for use in calculating junction temperatures. The heat-flow paths in plastic-encapsulated devices are complex, making the jc measurement relative to a specific location on the package surface. Tests indicate this measurement reference point is directly below the die-attach area on the bottom center of the package. Furthermore, jc tests on packages are performed in a constant-temperature bath, keeping the package surface at a constant temperature. Therefore, the measurements can only be used in a similar environment.
30
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PALCE16V8 and PALCE16V8Z Families
CONNECTION DIAGRAMS
Top View
DIP/SOIC
CLK/I0 I1 I2 I3 I4 I5 I6 I7 I8 GND 1 2 3 4 5 6 7 8 9 10 20 19 18 17 16 15 14 13 12 11 VCC I/O7 I/O6 I/O5 I/O4 I/O3 I/O2 I/O1 I/O0 I3 I4 I5 I6 I7 4 5
PLCC
CLK/I0 VCC I/O7
I2 3
I1 2
1
20 19 18 17 I/O6 I/O5 I/O4 I/O3 I/O2
R
9 10 11 12 13 GND OE/I9 I/O0 I/O1 I8
6 7
16 15 14
Note: Pin 1 is marked for orientation.
G N AL EW D D EV ES IC IG ES NF SO
8 OE/I9
16493E-9
16493E-10
PIN DESIGNATIONS
CLK = Clock GND = Ground I I/O OE VCC = Input = Input/Output = Output Enable
= Supply Voltage
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PALCE16V8 and PALCE16V8Z Families
31
ORDERING INFORMATION
Commercial and Industrial Products
Lattice/Vantis programmable logic products for commercial and industrial applications are available with several ordering options. The order number (Valid Combination) is formed by a combination of: PAL CE 16 V 8 H -5 J C /5
FAMILY TYPE PAL = Programmable Array Logic TECHNOLOGY CE = CMOS Electrically Erasable NUMBER OF ARRAY INPUTS OUTPUT TYPE V = Versatile NUMBER OF OUTPUTS
POWER H = Half Power (90-125 mA ICC) Q = Quarter Power (55 mA ICC) Z = Zero Power (15 A ICC Standby) SPEED -5 = -7 = -10 = -12 = -15 = -20 = -25 = 5 ns tPD 7.5 ns tPD 10 ns tPD 12 ns tPD 15 ns tPD 20 ns tPD 25 ns tPD
Valid Combinations
SE
PALCE16V8H-5 PALCE16V8H-7 PALCE16V8H-10 PALCE16V8Q-10 PALCE16V8H-15 PALCE16V8Q-15 PALCE16V8Q-20 PALCE16V8H-25 PALCE16V8Q-25 PALCE16V8Z-12
JC
PC, JC, SC
U
PC, JC, SC, PI, JI JC PC, JC, SC PC, JC PI, JI PC, JC, SC, PI, JI PC, JC, PI, JI PI, JI
PALCE16V8Z-15 PALCE16V8Z-25 PC, JC, SC, PI, JI, SI
32
G N AL EW D EV D ES IC IG ES NF SO
/5 /4 /5 /4
PROGRAMMING DESIGNATOR Blank = Initial Algorithm /4 = First Revision /5 = Second Revision (Same Algorithm as /4)
OPERATING CONDITIONS C = Commercial (0C to +75C) I = Industrial (-40C to +85C) PACKAGE TYPE P = 20-Pin Plastic DIP (PD 020) J = 20-Pin Plastic Leaded Chip Carrier (PL 020) S = 20-Pin Plastic Gull-Wing Small Outline Package (SO 020)
Valid Combinations
Valid Combinations lists configurations planned to be supported in volume for this device. Consult the local Lattice/ Vantis sales office to confirm availability of specific valid combinations and to check on newly released combinations.
PALCE16V8 and PALCE16V8Z Families
R

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