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512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit (x8) Multi-Purpose Flash SST39LF512 / SST39LF010 / SST39LF020 / SST39LF040 SST39VF512 / SST39VF010 / SST39VF020 / SST39VF040 SST39LF/VF512 / 010 / 020 / 0403.0 & 2.7V 512Kb / 1Mb / 2Mb / 4Mb (x8) MPF memories Data Sheet FEATURES: * Organized as 64K x8 / 128K x8 / 256K x8 / 512K x8 * Single Voltage Read and Write Operations - 3.0-3.6V for SST39LF512/010/020/040 - 2.7-3.6V for SST39VF512/010/020/040 * Superior Reliability - Endurance: 100,000 Cycles (typical) - Greater than 100 years Data Retention * Low Power Consumption: - Active Current: 10 mA (typical) - Standby Current: 1 A (typical) * Sector-Erase Capability - Uniform 4 KByte sectors * Fast Read Access Time: - 45 ns for SST39LF512/010/020/040 - 55 ns for SST39LF020/040 - 70 and 90 ns for SST39VF512/010/020/040 * Latched Address and Data * Fast Erase and Byte-Program: - Sector-Erase Time: 18 ms (typical) - Chip-Erase Time: 70 ms (typical) - Byte-Program Time: 14 s (typical) - Chip Rewrite Time: 1 second (typical) for SST39LF/VF512 2 seconds (typical) for SST39LF/VF010 4 seconds (typical) for SST39LF/VF020 8 seconds (typical) for SST39LF/VF040 * Automatic Write Timing - Internal VPP Generation * End-of-Write Detection - Toggle Bit - Data# Polling * CMOS I/O Compatibility * JEDEC Standard - Flash EEPROM Pinouts and command sets * Packages Available - 32-lead PLCC - 32-lead TSOP (8mm x 14mm) - 48-ball TFBGA (6mm x 8mm) for 1 Mbit PRODUCT DESCRIPTION The SST39LF512/010/020/040 and SST39VF512/010/ 020/040 are 64K x8, 128K x8, 256K x8 and 5124K x8 CMOS Multi-Purpose Flash (MPF) manufactured with SST's proprietary, high performance CMOS SuperFlash technology. The split-gate cell design and thick oxide tunneling injector attain better reliability and manufacturability compared with alternate approaches. The SST39LF512/ 010/020/040 devices write (Program or Erase) with a 3.03.6V power supply. The SST39VF512/010/020/040 devices write with a 2.7-3.6V power supply. The devices conform to JEDEC standard pinouts for x8 memories. Featuring high performance Byte-Program, the SST39LF512/010/020/040 and SST39VF512/010/020/ 040 devices provide a maximum Byte-Program time of 20 sec. These devices use Toggle Bit or Data# Polling to indicate the completion of Program operation. To protect against inadvertent write, they have on-chip hardware and Software Data Protection schemes. Designed, manufactured, and tested for a wide spectrum of applications, they are offered with a guaranteed endurance of 10,000 cycles. Data retention is rated at greater than 100 years. The SST39LF512/010/020/040 and SST39VF512/010/ 020/040 devices are suited for applications that require convenient and economical updating of program, configuration, or data memory. For all system applications, they (c)2001 Silicon Storage Technology, Inc. S71150-03-000 6/01 395 1 significantly improves performance and reliability, while lowering power consumption. They inherently use less energy during Erase and Program than alternative flash technologies. The total energy consumed is a function of the applied voltage, current, and time of application. Since for any given voltage range, the SuperFlash technology uses less current to program and has a shorter erase time, the total energy consumed during any Erase or Program operation is less than alternative flash technologies. These devices also improve flexibility while lowering the cost for program, data, and configuration storage applications. The SuperFlash technology provides fixed Erase and Program times, independent of the number of Erase/Program cycles that have occurred. Therefore the system software or hardware does not have to be modified or de-rated as is necessary with alternative flash technologies, whose Erase and Program times increase with accumulated Erase/Program cycles. To meet surface mount requirements, the SST39LF512/ 010/020/040 and SST39VF512/010/020/040 devices are offered in 32-lead PLCC and 32-lead TSOP packages. The 39LF/VF010 is also offered in a 48-ball TFBGA package. See Figures 1 and 2 for pinouts. The SST logo and SuperFlash are registered trademarks of Silicon Storage Technology, Inc. MPF is a trademark of Silicon Storage Technology, Inc. These specifications are subject to change without notice. 512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit Multi-Purpose Flash SST39LF512 / SST39LF010 / SST39LF020 / SST39LF040 SST39VF512 / SST39VF010 / SST39VF020 / SST39VF040 Data Sheet Device Operation Commands are used to initiate the memory operation functions of the device. Commands are written to the device using standard microprocessor write sequences. A command is written by asserting WE# low while keeping CE# low. The address bus is latched on the falling edge of WE# or CE#, whichever occurs last. The data bus is latched on the rising edge of WE# or CE#, whichever occurs first. pulse, while the command (30H) is latched on the rising edge of the sixth WE# pulse. The internal Erase operation begins after the sixth WE# pulse. The End-of-Erase can be determined using either Data# Polling or Toggle Bit methods. See Figure 9 for timing waveforms. Any commands written during the Sector-Erase operation will be ignored. Chip-Erase Operation The SST39LF512/010/020/040 and SST39VF512/010/ 020/040 devices provide a Chip-Erase operation, which allows the user to erase the entire memory array to the "1s" state. This is useful when the entire device must be quickly erased. The Chip-Erase operation is initiated by executing a sixbyte Software Data Protection command sequence with Chip-Erase command (10H) with address 5555H in the last byte sequence. The internal Erase operation begins with the rising edge of the sixth WE# or CE#, whichever occurs first. During the internal Erase operation, the only valid read is Toggle Bit or Data# Polling. See Table 4 for the command sequence, Figure 10 for timing diagram, and Figure 18 for the flowchart. Any commands written during the ChipErase operation will be ignored. Read The Read operation of the SST39LF512/010/020/040 and SST39VF512/010/020/040 device is controlled by CE# and OE#, both have to be low for the system to obtain data from the outputs. CE# is used for device selection. When CE# is high, the chip is deselected and only standby power is consumed. OE# is the output control and is used to gate data from the output pins. The data bus is in high impedance state when either CE# or OE# is high. Refer to the Read cycle timing diagram for further details (Figure 4). Byte-Program Operation The SST39LF512/010/020/040 and SST39VF512/010/ 020/040 are programmed on a byte-by-byte basis. Before programming, one must ensure that the sector, in which the byte which is being programmed exists, is fully erased. The Program operation consists of three steps. The first step is the three-byte-load sequence for Software Data Protection. The second step is to load byte address and byte data. During the Byte-Program operation, the addresses are latched on the falling edge of either CE# or WE#, whichever occurs last. The data is latched on the rising edge of either CE# or WE#, whichever occurs first. The third step is the internal Program operation which is initiated after the rising edge of the fourth WE# or CE#, whichever occurs first. The Program operation, once initiated, will be completed, within 20 s. See Figures 5 and 6 for WE# and CE# controlled Program operation timing diagrams and Figure 15 for flowcharts. During the Program operation, the only valid reads are Data# Polling and Toggle Bit. During the internal Program operation, the host is free to perform additional tasks. Any commands written during the internal Program operation will be ignored. Write Operation Status Detection The SST39LF512/010/020/040 and SST39VF512/010/ 020/040 devices provide two software means to detect the completion of a Write (Program or Erase) cycle, in order to optimize the system write cycle time. The software detection includes two status bits: Data# Polling (DQ7) and Toggle Bit (DQ6). The End-of-Write detection mode is enabled after the rising edge of WE# which initiates the internal Program or Erase operation. The actual completion of the nonvolatile write is asynchronous with the system; therefore, either a Data# Polling or Toggle Bit read may be simultaneous with the completion of the Write cycle. If this occurs, the system may possibly get an erroneous result, i.e., valid data may appear to conflict with either DQ7 or DQ6. In order to prevent spurious rejection, if an erroneous result occurs, the software routine should include a loop to read the accessed location an additional two (2) times. If both reads are valid, then the device has completed the Write cycle, otherwise the rejection is valid. Sector-Erase Operation The Sector-Erase operation allows the system to erase the device on a sector-by-sector basis. The sector architecture is based on uniform sector size of 4 KByte. The SectorErase operation is initiated by executing a six-byte-command sequence with Sector-Erase command (30H) and sector address (SA) in the last bus cycle. The sector address is latched on the falling edge of the sixth WE# (c)2001 Silicon Storage Technology, Inc. S71150-03-000 6/01 395 2 512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit Multi-Purpose Flash SST39LF512 / SST39LF010 / SST39LF020 / SST39LF040 SST39VF512 / SST39VF010 / SST39VF020 / SST39VF040 Data Sheet Data# Polling (DQ7) When the SST39LF512/010/020/040 and SST39VF512/ 010/020/040 are in the internal Program operation, any attempt to read DQ7 will produce the complement of the true data. Once the Program operation is completed, DQ7 will produce true data. The device is then ready for the next operation. During internal Erase operation, any attempt to read DQ7 will produce a `0'. Once the internal Erase operation is completed, DQ7 will produce a `1'. The Data# Polling is valid after the rising edge of fourth WE# (or CE#) pulse for Program operation. For Sector- or Chip-Erase, the Data# Polling is valid after the rising edge of sixth WE# (or CE#) pulse. See Figure 7 for Data# Polling timing diagram and Figure 16 for a flowchart. Software Data Protection (SDP) The SST39LF512/010/020/040 and SST39VF512/010/ 020/040 provide the JEDEC approved Software Data Protection scheme for all data alteration operation, i.e., Program and Erase. Any Program operation requires the inclusion of a series of three byte sequence. The three byte-load sequence is used to initiate the Program operation, providing optimal protection from inadvertent Write operations, e.g., during the system power-up or powerdown. Any Erase operation requires the inclusion of six byte load sequence. These devices are shipped with the Software Data Protection permanently enabled. See Table 4 for the specific software command codes. During SDP command sequence, invalid commands will abort the device to read mode, within TRC. Toggle Bit (DQ6) During the internal Program or Erase operation, any consecutive attempts to read DQ6 will produce alternating 0s and 1s, i.e., toggling between 0 and 1. When the internal Program or Erase operation is completed, the toggling will stop. The device is then ready for the next operation. The Toggle Bit is valid after the rising edge of fourth WE# (or CE#) pulse for Program operation. For Sector- or ChipErase, the Toggle Bit is valid after the rising edge of sixth WE# (or CE#) pulse. See Figure 8 for Toggle Bit timing diagram and Figure 16 for a flowchart. Product Identification The Product Identification mode identifies the devices as the SST39LF/VF512, SST39LF/VF010, SST39LF/VF020 and SST39LF/VF040 and manufacturer as SST. This mode may be accessed by software operations. Users may use the Software Product Identification operation to identify the part (i.e., using the device ID) when using multiple manufacturers in the same socket. For details, see Table 4 for software operation, Figure 11 for the Software ID Entry and Read timing diagram, and Figure 17 for the Software ID entry command sequence flowchart. TABLE 1: PRODUCT IDENTIFICATION Address Manufacturer's ID Device ID SST39LF/VF512 SST39LF/VF010 SST39LF/VF020 SST39LF/VF040 0000H 0001H 0001H 0001H 0001H Data BFH D4H D5H D6H D7H T1.1 395 Data Protection The SST39LF512/010/020/040 and SST39VF512/010/ 020/040 provide both hardware and software features to protect nonvolatile data from inadvertent writes. Hardware Data Protection Noise/Glitch Protection: A WE# or CE# pulse of less than 5 ns will not initiate a Write cycle. VDD Power Up/Down Detection: The Write operation is inhibited when VDD is less than 1.5V. Write Inhibit Mode: Forcing OE# low, CE# high, or WE# high will inhibit the Write operation. This prevents inadvertent writes during power-up or power-down. Product Identification Mode Exit/Reset In order to return to the standard Read mode, the Software Product Identification mode must be exited. Exit is accomplished by issuing the Software ID Exit command sequence, which returns the device to the Read operation. Please note that the Software ID Exit command is ignored during an internal Program or Erase operation. See Table 4 for software command codes, Figure 12 for timing waveform, and Figure 17 for a flowchart. (c)2001 Silicon Storage Technology, Inc. S71150-03-000 6/01 395 3 512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit Multi-Purpose Flash SST39LF512 / SST39LF010 / SST39LF020 / SST39LF040 SST39VF512 / SST39VF010 / SST39VF020 / SST39VF040 Data Sheet FUNCTIONAL BLOCK DIAGRAM X-Decoder SuperFlash Memory Memory Address Address Buffers & Latches Y-Decoder CE# OE# WE# DQ7 - DQ0 395 ILL B1.1 Control Logic I/O Buffers and Data Latches SST39LF/VF512 SST39LF/VF010 SST39LF/VF020 SST39LF/VF040 WE# WE# WE# WE# VDD A12 A15 A16 A18 VDD A12 A15 A16 VDD A12 A15 A16 NC VDD A12 A15 NC NC SST39LF/VF040 SST39LF/VF020 SST39LF/VF010 SST39LF/VF512 NC SST39LF/VF512 SST39LF/VF010 SST39LF/VF020 SST39LF/VF040 A7 A6 A5 A4 A3 A2 A1 A0 DQ0 A7 A6 A5 A4 A3 A2 A1 A0 DQ0 A7 A6 A5 A4 A3 A2 A1 A0 DQ0 A7 A6 A5 A4 A3 A2 A1 A0 DQ0 5 6 7 8 9 10 11 12 13 SST39LF/VF040 SST39LF/VF020 SST39LF/VF010 SST39LF/VF512 4 3 2 1 32 31 30 29 28 27 26 25 24 23 22 NC A17 NC A17 A14 A13 A8 A9 A11 OE# A10 CE# DQ7 A14 A13 A8 A9 A11 OE# A10 CE# DQ7 A14 A13 A8 A9 A11 OE# A10 CE# DQ7 A14 A13 A8 A9 A11 OE# A10 CE# DQ7 32-lead PLCC Top View 21 14 15 16 17 18 19 20 DQ1 DQ2 VSS DQ3 DQ4 DQ5 DQ6 395 ILL F02b.3 DQ1 DQ2 VSS DQ3 DQ4 DQ5 DQ5 DQ5 DQ1 DQ2 VSS DQ3 DQ4 DQ1 DQ2 VSS DQ3 DQ4 FIGURE 1: PIN ASSIGNMENTS FOR 32-LEAD PLCC (c)2001 Silicon Storage Technology, Inc. S71150-03-000 6/01 395 4 DQ6 DQ6 DQ6 512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit Multi-Purpose Flash SST39LF512 / SST39LF010 / SST39LF020 / SST39LF040 SST39VF512 / SST39VF010 / SST39VF020 / SST39VF040 Data Sheet SST39LF/VF040 SST39LF/VF020 SST39LF/VF010 SST39LF/VF512 A11 A9 A8 A13 A14 A17 WE# VDD A18 A16 A15 A12 A7 A6 A5 A4 A11 A9 A8 A13 A14 A17 WE# VDD NC A16 A15 A12 A7 A6 A5 A4 A11 A9 A8 A13 A14 NC WE# VDD NC A16 A15 A12 A7 A6 A5 A4 A11 A9 A8 A13 A14 NC WE# VDD NC NC A15 A12 A7 A6 A5 A4 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 32 31 30 29 28 27 26 25 24 23 22 21 20 19 18 17 SST39LF/VF512 SST39LF/VF010 SST39LF/VF020 SST39LF/VF040 OE# A10 CE# DQ7 DQ6 DQ5 DQ4 DQ3 VSS DQ2 DQ1 DQ0 A0 A1 A2 A3 OE# A10 CE# DQ7 DQ6 DQ5 DQ4 DQ3 VSS DQ2 DQ1 DQ0 A0 A1 A2 A3 OE# A10 CE# DQ7 DQ6 DQ5 DQ4 DQ3 VSS DQ2 DQ1 DQ0 A0 A1 A2 A3 OE# A10 CE# DQ7 DQ6 DQ5 DQ4 DQ3 VSS DQ2 DQ1 DQ0 A0 A1 A2 A3 Standard Pinout Top View Die Up 395 ILL F01.0 FIGURE 2: PIN ASSIGNMENTS FOR 32-LEAD TSOP (8MM X 14MM) TOP VIEW (balls facing down) SST39LF/VF010 6 5 A9 A8 A11 A12 NC A10 DQ6 DQ7 4 3 2 1 395 ILL F01a.0.eps WE# NC NC NC DQ5 NC VDD DQ4 NC NC NC NC DQ2 DQ3 VDD NC A7 NC A6 A3 A4 A2 A5 DQ0 NC A1 NC DQ1 A14 A13 A15 A16 NC NC NC VSS A0 CE# OE# VSS A B C D E F G H FIGURE 3: PIN ASSIGNMENT FOR 48-BALL TFBGA (6MM X 8MM) FOR 1 MBIT (c)2001 Silicon Storage Technology, Inc. S71150-03-000 6/01 395 5 512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit Multi-Purpose Flash SST39LF512 / SST39LF010 / SST39LF020 / SST39LF040 SST39VF512 / SST39VF010 / SST39VF020 / SST39VF040 Data Sheet TABLE 2: PIN DESCRIPTION Symbol AMS1-A0 DQ7-DQ0 Pin Name Address Inputs Data Input/output Functions To provide memory addresses. During Sector-Erase AMS-A12 address lines will select the sector. During Block-Erase AMS-A16 address lines will select the block. To output data during Read cycles and receive input data during Write cycles. Data is internally latched during a Write cycle. The outputs are in tri-state when OE# or CE# is high. To activate the device when CE# is low. To gate the data output buffers. To control the Write operations. To provide power supply voltage: 3.0-3.6V for SST39LF512/010/020/040 2.7-3.6V for SST39VF512/010/020/040 CE# OE# WE# VDD VSS NC Chip Enable Output Enable Write Enable Power Supply Ground No Connection Unconnected pins. T2.1 395 1. AMS = Most significant address AMS = A15 for SST39LF/VF512, A16 for SST39LF/VF010, A17 for SST39LF/VF020, and A18 for SST39LF/VF040 TABLE 3: OPERATION MODES SELECTION Mode Read Program Erase Standby Write Inhibit Product Identification Software Mode VIL VIL VIH See Table 4 T3.4 395 CE# VIL VIL VIL VIH X X OE# VIL VIH VIH X VIL X WE# VIH VIL VIL X X VIH DQ DOUT DIN X1 High Z High Z/ DOUT High Z/ DOUT Address AIN AIN Sector address, XXH for Chip-Erase X X X 1. X can be VIL or VIH, but no other value. (c)2001 Silicon Storage Technology, Inc. S71150-03-000 6/01 395 6 512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit Multi-Purpose Flash SST39LF512 / SST39LF010 / SST39LF020 / SST39LF040 SST39VF512 / SST39VF010 / SST39VF020 / SST39VF040 Data Sheet TABLE 4: SOFTWARE COMMAND SEQUENCE Command Sequence Byte-Program Sector-Erase Chip-Erase Software ID Software ID Entry4,5 Exit6 1st Bus Write Cycle Addr1 5555H 5555H 5555H 5555H XXH 5555H Data AAH AAH AAH AAH F0H AAH 2AAAH 55H 5555H F0H T4.2 395 2nd Bus Write Cycle Addr1 2AAAH 2AAAH 2AAAH 2AAAH Data 55H 55H 55H 55H 3rd Bus Write Cycle Addr1 5555H 5555H 5555H 5555H Data A0H 80H 80H 90H 4th Bus Write Cycle Addr1 BA2 5555H 5555H Data Data AAH AAH 5th Bus Write Cycle Addr1 2AAAH 2AAAH Data 55H 55H 6th Bus Write Cycle Addr1 SAX3 5555H Data 30H 10H Software ID Exit6 1. Address format A14-A0 (Hex), Address A15 can be VIL or VIH, but no other value, for the Command sequence for SST39LF/VF512. Addresses A15-A16 can be VIL or VIH, but no other value, for the Command sequence for SST39LF/VF010. Addresses A15-A17 can be VIL or VIH, but no other value, for the Command sequence for SST39LF/VF020. Addresses A15-A18 can be VIL or VIH, but no other value, for the Command sequence for SST39LF/VF040. 2. BA = Program Byte address 3. SAX for Sector-Erase; uses AMS-A12 address lines AMS = Most significant address AMS = A15 for SST39LF/VF512, A16 for SST39LF/VF010, A17 for SST39LF/VF020, and A18 for SST39LF/VF040 4. The device does not remain in Software Product ID Mode if powered down. 5. With AMS-A1 =0; SST Manufacturer's ID= BFH, is read with A0 = 0, SST39LF/VF512 Device ID = D4H, is read with A0 = 1 SST39LF/VF010 Device ID = D5H, is read with A0 = 1 SST39LF/VF020 Device ID = D6H, is read with A0 = 1 SST39LF/VF040 Device ID = D7H, is read with A0 = 1 6. Both Software ID Exit operations are equivalent Absolute Maximum Stress Ratings (Applied conditions greater than those listed under "Absolute Maximum Stress Ratings" may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these conditions or conditions greater than those defined in the operational sections of this data sheet is not implied. Exposure to absolute maximum stress rating conditions may affect device reliability.) Temperature Under Bias . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -55C to +125C Storage Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -65C to +150C D. C. Voltage on Any Pin to Ground Potential . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.5V to VDD + 0.5V Transient Voltage (<20 ns) on Any Pin to Ground Potential . . . . . . . . . . . . . . . . . . . . . . . . . . . . -1.0V to VDD + 1.0V Voltage on A9 Pin to Ground Potential . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.5V to 13.2V Package Power Dissipation Capability (Ta = 25C) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1.0W Output Short Circuit Current1 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50 mA 1. Outputs shorted for no more than one second. No more than one output shorted at a time. OPERATING RANGE Range Commercial FOR SST39LF512/010/020/040 VDD 3.0-3.6V AC CONDITIONS OF TEST Ambient Temp 0C to +70C FOR Input Rise/Fall Time . . . . . . . . . . . . . . . 5 ns Output Load CL = 30 pF for SST39LF512/010/020/040 CL = 100 pF for SST39VF512/010/020/040 See Figures 13 and 14 OPERATING RANGE Range Commercial Industrial SST39VF512/010/020/040 VDD 2.7-3.6V 2.7-3.6V Ambient Temp 0C to +70C -40C to +85C (c)2001 Silicon Storage Technology, Inc. S71150-03-000 6/01 395 7 512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit Multi-Purpose Flash SST39LF512 / SST39LF010 / SST39LF020 / SST39LF040 SST39VF512 / SST39VF010 / SST39VF020 / SST39VF040 Data Sheet TABLE 5: DC OPERATING CHARACTERISTICS VDD = 3.0-3.6V FOR SST39LF512/010/020/040 Limits Symbol IDD Parameter Power Supply Current Read Write ISB ILI ILO VIL VIH VIHC VOL VOH Standby VDD Current Input Leakage Current Output Leakage Current Input Low Voltage Input High Voltage Input High Voltage (CMOS) Output Low Voltage Output High Voltage VDD-0.2 0.7VDD VDD-0.3 0.2 20 20 15 1 10 0.8 mA mA A A A V V V V V Min Max Units Test Conditions Address input=VIL/VIH, at f=1/TRC Min VDD=VDD Max CE#=OE#=VIL, WE#=VIH, all I/Os open CE#=WE#=VIL, OE#=VIH CE#=VIHC, VDD=VDD Max VIN=GND to VDD, VDD=VDD Max VOUT=GND to VDD, VDD=VDD Max VDD=VDD Min VDD=VDD Max VDD=VDD Max IOL=100 A, VDD=VDD Min IOH=-100 A, VDD=VDD Min T5.2 395 AND 2.7-3.6V FOR SST39VF512/010/020/040 TABLE 6: RECOMMENDED SYSTEM POWER-UP TIMINGS Symbol TPU-READ1 TPU-WRITE 1 Parameter Power-up to Read Operation Power-up to Program/Erase Operation Minimum 100 100 Units s s T6.1 395 1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter. TABLE 7: CAPACITANCE Parameter CI/O 1 (Ta = 25C, f=1 Mhz, other pins open) Description I/O Pin Capacitance Input Capacitance Test Condition VI/O = 0V VIN = 0V Maximum 12 pF 6 pF T7.0 395 CIN1 1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter. TABLE 8: RELIABILITY CHARACTERISTICS Symbol NEND1 TDR1 ILTH1 Parameter Endurance Data Retention Latch Up Minimum Specification 10,000 100 100 + IDD Units Cycles Years mA Test Method JEDEC Standard A117 JEDEC Standard A103 JEDEC Standard 78 T8.2 395 1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter. (c)2001 Silicon Storage Technology, Inc. S71150-03-000 6/01 395 8 512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit Multi-Purpose Flash SST39LF512 / SST39LF010 / SST39LF020 / SST39LF040 SST39VF512 / SST39VF010 / SST39VF020 / SST39VF040 Data Sheet AC CHARACTERISTICS TABLE 9: READ CYCLE TIMING PARAMETERS VDD = 3.0-3.6V FOR SST39LF512/010/020/040 SST39LF512-45 SST39LF010-45 SST39LF020-45 SST39LF040-45 Symbol Parameter TRC TCE TAA TOE TCLZ1 TOLZ1 TCHZ1 TOHZ1 TOH1 Read Cycle Time Chip Enable Access Time Address Access Time Output Enable Access Time CE# Low to Active Output OE# Low to Active Output CE# High to High-Z Output OE# High to High-Z Output Output Hold from Address Change AND 2.7-3.6V FOR SST39VF512/010/020/040 SST39VF512-70 SST39VF010-70 SST39VF020-70 SST39VF040-70 Min 70 55 55 30 70 70 35 0 0 15 15 25 25 0 0 0 0 30 30 Max SST39VF512-90 SST39VF010-90 SST39VF020-90 SST39VF040-90 Min 90 90 90 45 Max Units ns ns ns ns ns ns ns ns ns T9.2 395 SST39LF020-55 SST39LF040-55 Min 55 Max Min 45 Max 45 45 30 0 0 15 15 0 0 0 0 1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter. TABLE 10: PROGRAM/ERASE CYCLE TIMING PARAMETERS Symbol TBP TAS TAH TCS TCH TOES TOEH TCP TWP TWPH1 TCPH TDS TDH TSE TSCE 1 1 Parameter Byte-Program Time Address Setup Time Address Hold Time WE# and CE# Setup Time WE# and CE# Hold Time OE# High Setup Time OE# High Hold Time CE# Pulse Width WE# Pulse Width WE# Pulse Width High CE# Pulse Width High Data Setup Time Data Hold Time Software ID Access and Exit Time Sector-Erase Chip-Erase Min 0 30 0 0 0 10 40 40 30 30 40 0 Max 20 Units s ns ns ns ns ns ns ns ns ns ns ns ns TIDA1 150 25 100 ns ms ms T10.1 395 1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter. (c)2001 Silicon Storage Technology, Inc. S71150-03-000 6/01 395 9 512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit Multi-Purpose Flash SST39LF512 / SST39LF010 / SST39LF020 / SST39LF040 SST39VF512 / SST39VF010 / SST39VF020 / SST39VF040 Data Sheet TRC ADDRESS AMS-0 TAA CE# TCE OE# VIH WE# TOLZ TOE TOHZ TCHZ HIGH-Z DATA VALID 395 ILL F03.0 DQ7-0 HIGH-Z TCLZ TOH DATA VALID Note: AMS = Most significant address AMS = A15 for SST39LF/VF512, A16 for SST39LF/VF010, A17 for SST39LF/VF020 and A18 for SST39LF/VF040 FIGURE 4: READ CYCLE TIMING DIAGRAM INTERNAL PROGRAM OPERATION STARTS TBP ADDRESS AMS-0 5555 TAH TWP WE# TAS OE# TCH CE# TCS DQ7-0 AA SW0 Note: 55 SW1 A0 SW2 DATA BYTE (ADDR/DATA) 395 ILL F04.0 2AAA 5555 ADDR TDH TWPH TDS AMS = Most significant address AMS = A15 for SST39LF/VF512, A16 for SST39LF/VF010, A17 for SST39LF/VF020 and A18 for SST39LF/VF040 FIGURE 5: WE# CONTROLLED PROGRAM CYCLE TIMING DIAGRAM (c)2001 Silicon Storage Technology, Inc. S71150-03-000 6/01 395 10 512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit Multi-Purpose Flash SST39LF512 / SST39LF010 / SST39LF020 / SST39LF040 SST39VF512 / SST39VF010 / SST39VF020 / SST39VF040 Data Sheet INTERNAL PROGRAM OPERATION STARTS TBP ADDRESS AMS-0 5555 TAH TCP CE# TAS OE# TCH WE# TCS DQ7-0 AA SW0 Note: 55 SW1 A0 SW2 DATA BYTE (ADDR/DATA) TCPH TDS 2AAA 5555 ADDR TDH 395 ILL F05.0 AMS = Most significant address AMS = A15 for SST39LF/VF512, A16 for SST39LF/VF010, A17 for SST39LF/VF020 and A18 for SST39LF/VF040 FIGURE 6: CE# CONTROLLED PROGRAM CYCLE TIMING DIAGRAM ADDRESS AMS-0 TCE CE# TOEH OE# TOE WE# TOES DQ7 Note: D D# D# D 395 ILL F06.0 AMS = Most significant address AMS = A15 for SST39LF/VF512, A16 for SST39LF/VF010, A17 for SST39LF/VF020 and A18 for SST39LF/VF040 FIGURE 7: DATA# POLLING TIMING DIAGRAM (c)2001 Silicon Storage Technology, Inc. S71150-03-000 6/01 395 11 512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit Multi-Purpose Flash SST39LF512 / SST39LF010 / SST39LF020 / SST39LF040 SST39VF512 / SST39VF010 / SST39VF020 / SST39VF040 Data Sheet ADDRESS AMS-0 TCE CE# TOEH OE# TOE TOES WE# DQ6 TWO READ CYCLES Note: WITH SAME OUTPUTS AMS = Most significant address AMS = A15 for SST39LF/VF512, A16 for SST39LF/VF010, A17 for SST39LF/VF020 and A18 for SST39LF/VF040 395 ILL F07.0 FIGURE 8: TOGGLE BIT TIMING DIAGRAM SIX-BYTE CODE FOR SECTOR-ERASE ADDRESS AMS-0 5555 2AAA 5555 5555 2AAA SAX TSE CE# OE# TWP WE# DQ7-0 AA SW0 55 SW1 80 SW2 AA SW3 55 SW4 30 SW5 334 ILL F08.0 Note: This device also supports CE# controlled Sector-Erase operation. The WE# and CE# signals are interchageable as long as minmum timings are met. (See Table 10) SAX = Sector Address AMS = Most significant address AMS = A15 for SST39LF/VF512, A16 for SST39LF/VF010, A17 for SST39LF/VF020 and A18 for SST39LF/VF040 FIGURE 9: WE# CONTROLLED SECTOR-ERASE TIMING DIAGRAM (c)2001 Silicon Storage Technology, Inc. S71150-03-000 6/01 395 12 512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit Multi-Purpose Flash SST39LF512 / SST39LF010 / SST39LF020 / SST39LF040 SST39VF512 / SST39VF010 / SST39VF020 / SST39VF040 Data Sheet SIX-BYTE CODE FOR CHIP-ERASE ADDRESS AMS-0 5555 2AAA 5555 5555 2AAA 5555 TSCE CE# OE# TWP WE# DQ7-0 AA SW0 55 SW1 80 SW2 AA SW3 55 SW4 10 SW5 334 ILL F17.0 Note: This device also supports CE# controlled Chip-Erase operation. The WE# and CE# signals are interchageable as long as minmum timings are met. (See Table 10) AMS = Most significant address AMS = A15 for SST39LF/VF512, A16 for SST39LF/VF010, A17 for SST39LF/VF020 and A18 for SST39LF/VF040 FIGURE 10: WE# CONTROLLED CHIP-ERASE TIMING DIAGRAM Three-byte sequence for Software ID Entry ADDRESS A14-0 5555 2AAA 5555 0000 0001 CE# OE# TWP WE# TWPH DQ7-0 AA SW0 55 SW1 90 SW2 TAA BF Device ID 395 ILL F09.2 TIDA Note: Device ID = D4H for SST39LF/VF512, D5H for SST39LF/VF010, D6H for SST39LF/VF020, and D7H for SST39LF/VF040. FIGURE 11: SOFTWARE ID ENTRY AND READ (c)2001 Silicon Storage Technology, Inc. S71150-03-000 6/01 395 13 512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit Multi-Purpose Flash SST39LF512 / SST39LF010 / SST39LF020 / SST39LF040 SST39VF512 / SST39VF010 / SST39VF020 / SST39VF040 Data Sheet THREE-BYTE SEQUENCE FOR SOFTWARE ID EXIT AND RESET ADDRESS A14-0 5555 2AAA 5555 DQ7-0 AA 55 F0 TIDA CE# OE# TWP WE# T WHP SW0 SW1 SW2 395 ILL F10.0 FIGURE 12: SOFTWARE ID EXIT AND RESET (c)2001 Silicon Storage Technology, Inc. S71150-03-000 6/01 395 14 512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit Multi-Purpose Flash SST39LF512 / SST39LF010 / SST39LF020 / SST39LF040 SST39VF512 / SST39VF010 / SST39VF020 / SST39VF040 Data Sheet VIHT INPUT VIT REFERENCE POINTS VOT OUTPUT VILT 395 ILL F12.1 AC test inputs are driven at VIHT (0.9 VDD) for a logic "1" and VILT (0.1 VDD) for a logic "0". Measurement reference points for inputs and outputs are VIT (0.5 VDD) and VOT (0.5 VDD). Input rise and fall times (10% 90%) are <5 ns. Note: VIT - VINPUT Test VOT - VOUTPUT Test VIHT - VINPUT HIGH Test VILT - VINPUT LOW Test FIGURE 13: AC INPUT/OUTPUT REFERENCE WAVEFORMS TO TESTER TO DUT CL 395 ILL F11.1 FIGURE 14: A TEST LOAD EXAMPLE (c)2001 Silicon Storage Technology, Inc. S71150-03-000 6/01 395 15 512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit Multi-Purpose Flash SST39LF512 / SST39LF010 / SST39LF020 / SST39LF040 SST39VF512 / SST39VF010 / SST39VF020 / SST39VF040 Data Sheet Start Load data: AAH Address: 5555H Load data: 55H Address: 2AAAH Load data: A0H Address: 5555H Load Byte Address/Byte Data Wait for end of Program (TBP, Data# Polling bit, or Toggle bit operation) Program Completed 395 ILL F13.1 FIGURE 15: BYTE-PROGRAM ALGORITHM (c)2001 Silicon Storage Technology, Inc. S71150-03-000 6/01 395 16 512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit Multi-Purpose Flash SST39LF512 / SST39LF010 / SST39LF020 / SST39LF040 SST39VF512 / SST39VF010 / SST39VF020 / SST39VF040 Data Sheet Internal Timer Byte-Program/ Erase Initiated Toggle Bit Byte-Program/ Erase Initiated Data# Polling Byte-Program/ Erase Initiated Wait TBP, TSCE, or TSE Read byte Read DQ7 Program/Erase Completed Read same byte No Is DQ7 = true data? Yes No Does DQ6 match? Yes Program/Erase Completed Program/Erase Completed 395 ILL F14.0 FIGURE 16: WAIT OPTIONS (c)2001 Silicon Storage Technology, Inc. S71150-03-000 6/01 395 17 512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit Multi-Purpose Flash SST39LF512 / SST39LF010 / SST39LF020 / SST39LF040 SST39VF512 / SST39VF010 / SST39VF020 / SST39VF040 Data Sheet Software ID Entry Command Sequence Software ID Exit & Reset Command Sequence Load data: AAH Address: 5555H Load data: AAH Address: 5555H Load data: F0H Address: XXH Load data: 55H Address: 2AAAH Load data: 55H Address: 2AAAH Wait TIDA Load data: 90H Address: 5555H Load data: F0H Address: 5555H Return to normal operation Wait TIDA Wait TIDA Read Software ID Return to normal operation 395 ILL F15.2 FIGURE 17: SOFTWARE ID COMMAND FLOWCHARTS (c)2001 Silicon Storage Technology, Inc. S71150-03-000 6/01 395 18 512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit Multi-Purpose Flash SST39LF512 / SST39LF010 / SST39LF020 / SST39LF040 SST39VF512 / SST39VF010 / SST39VF020 / SST39VF040 Data Sheet Chip-Erase Command Sequence Load data: AAH Address: 5555H Sector-Erase Command Sequence Load data: AAH Address: 5555H Load data: 55H Address: 2AAAH Load data: 55H Address: 2AAAH Load data: 80H Address: 5555H Load data: 80H Address: 5555H Load data: AAH Address: 5555H Load data: AAH Address: 5555H Load data: 55H Address: 2AAAH Load data: 55H Address: 2AAAH Load data: 10H Address: 5555H Load data: 30H Address: SAX Wait TSCE Wait TSE Chip erased to FFH Sector erased to FFH 395 ILL F16.1 FIGURE 18: ERASE COMMAND SEQUENCE (c)2001 Silicon Storage Technology, Inc. S71150-03-000 6/01 395 19 512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit Multi-Purpose Flash SST39LF512 / SST39LF010 / SST39LF020 / SST39LF040 SST39VF512 / SST39VF010 / SST39VF020 / SST39VF040 Data Sheet PRODUCT ORDERING INFORMATION Device SST39xFxxx Speed XX Suffix1 XX Suffix2 XX Package Modifier H = 32 leads K = 48 balls Numeric = Die modifier Package Type N = PLCC W = TSOP (die up) (8mm x 14mm) B3 = TFBGA (6mm x 8mm) Temperature Range C = Commercial = 0C to +70C I = Industrial = -40C to +85C Minimum Endurance 4 = 10,000 cycles Read Access Speed 45 = 45 ns 55 = 55 ns 70 = 70 ns 90 = 90 ns Device Density 512 = 512 Kilobit 010 = 1 Megabit 020 = 2 Megabit 040 = 4 Megabit Voltage L = 3.0-3.6V V = 2.7-3.6V (c)2001 Silicon Storage Technology, Inc. S71150-03-000 6/01 395 20 512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit Multi-Purpose Flash SST39LF512 / SST39LF010 / SST39LF020 / SST39LF040 SST39VF512 / SST39VF010 / SST39VF020 / SST39VF040 Data Sheet Valid combinations for SST39LF512 SST39LF512-45-4C-NH SST39LF512-45-4C-WH Valid combinations for SST39VF512 SST39VF512-70-4C-NH SST39VF512-90-4C-NH SST39VF512-90-4C-U4 SST39VF512-70-4I-NH SST39VF512-90-4I-NH SST39VF512-70-4C-WH SST39VF512-90-4C-WH SST39VF512-70-4I-WH SST39VF512-90-4I-WH Valid combinations for SST39LF010 SST39LF010-45-4C-NH SST39LF010-45-4C-WH SST39LF010-45-4C-B3K Valid combinations for SST39VF010 SST39VF010-70-4C-NH SST39VF010-90-4C-NH SST39VF010-90-4C-U4 SST39VF010-70-4I-NH SST39VF010-90-4I-NH SST39VF010-70-4C-WH SST39VF010-90-4C-WH SST39VF010-70-4I-WH SST39VF010-90-4I-WH SST39VF010-70-4C-B3K SST39VF010-90-4C-B3K SST39VF010-70-4I-B3K SST39VF010-90-4I-B3K Valid combinations for SST39LF020 SST39LF020-45-4C-NH SST39LF020-55-4C-NH SST39LF020-45-4C-WH SST39LF020-55-4C-WH Valid combinations for SST39VF020 SST39VF020-70-4C-NH SST39VF020-90-4C-NH SST39VF020-90-4C-U4 SST39VF020-70-4I-NH SST39VF020-90-4I-NH SST39VF020-70-4C-WH SST39VF020-90-4C-WH SST39VF020-70-4I-WH SST39VF020-90-4I-WH Valid combinations for SST39LF040 SST39LF040-45-4C-NH SST39LF040-55-4C-NH SST39LF040-45-4C-WH SST39LF040-55-4C-WH Valid combinations for SST39VF040 SST39VF040-70-4C-NH SST39VF040-90-4C-NH SST39VF040-90-4C-U1 SST39VF040-70-4I-NH SST39VF040-90-4I-NH Note: SST39VF040-70-4C-WH SST39VF040-90-4C-WH SST39VF040-70-4I-WH SST39VF040-90-4I-WH Valid combinations are those products in mass production or will be in mass production. Consult your SST sales representative to confirm availability of valid combinations and to determine availability of new combinations. (c)2001 Silicon Storage Technology, Inc. S71150-03-000 6/01 395 21 512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit Multi-Purpose Flash SST39LF512 / SST39LF010 / SST39LF020 / SST39LF040 SST39VF512 / SST39VF010 / SST39VF020 / SST39VF040 Data Sheet PACKAGING DIAGRAMS TOP VIEW .485 .495 .447 .453 .042 .048 2 1 32 SIDE VIEW .106 .112 .020 R. MAX. .023 x 30 .029 .030 R. .040 BOTTOM VIEW Optional Pin #1 Identifier .042 .048 .585 .595 .547 .553 .026 .032 .013 .021 .400 BSC .490 .530 .050 BSC. .015 Min. .050 BSC. .125 .140 .075 .095 .026 .032 Note: 1. Complies with JEDEC publication 95 MS-016 AE dimensions, although some dimensions may be more stringent. 2. All linear dimensions are in inches (min/max). 3. Dimensions do not include mold flash. Maximum allowable mold flash is .008 inches. 32.PLCC.NH-ILL.2 4. Coplanarity: 4 mils. 32-LEAD PLASTIC LEAD CHIP CARRIER (PLCC) SST PACKAGE CODE: NH Pin # 1 Identifier 1.05 0.95 .50 BSC 8.10 7.90 .270 .170 12.50 12.30 0.15 0.05 0.70 0.50 14.20 13.80 32.TSOP-WH-ILL.4 Note: 1. Complies with JEDEC publication 95 MO-142 BA dimensions, although some dimensions may be more stringent. 2. All linear dimensions are in millimeters (min/max). 3. Coplanarity: 0.1 (.05) mm. 4. Maximum allowable mold flash is 0.15mm at the package ends, and 0.25mm between leads. 32-LEAD THIN SMALL OUTLINE PACKAGE (TSOP) 8MM SST PACKAGE CODE: WH X 14MM (c)2001 Silicon Storage Technology, Inc. S71150-03-000 6/01 395 22 512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit Multi-Purpose Flash SST39LF512 / SST39LF010 / SST39LF020 / SST39LF040 SST39VF512 / SST39VF010 / SST39VF020 / SST39VF040 Data Sheet BOTTOM VIEW 8.00 0.20 TOP VIEW 5.60 0.80 6 5 4 3 2 1 ABCDEFGH A1 CORNER 0.80 HGFEDCBA 4.00 6.00 0.20 6 5 4 3 2 1 0.45 0.05 (48X) A1 CORNER SIDE VIEW 1.10 0.10 SEATING PLANE 0.35 0.05 0.15 48ba-TFBGA-B3K-6x8-450mic-ILL.0 1mm Note: 1. Although many dimensions are similar to those of JEDEC Publication 95, MO-210, this specific package is not registered. 2. All linear dimensions are in millimeters (min/max). 3. Coplanarity: 0.1 (.05) mm. 4. The actual shape of the corners may be slightly different than as portrayed in the drawing. 48-BALL THIN-PROFILE, FINE-PITCH BALL GRID ARRAY (TFBGA) 6MM SST PACKAGE CODE: B3K X 8MM (c)2001 Silicon Storage Technology, Inc. S71150-03-000 6/01 395 23 512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit Multi-Purpose Flash SST39LF512 / SST39LF010 / SST39LF020 / SST39LF040 SST39VF512 / SST39VF010 / SST39VF020 / SST39VF040 Data Sheet Silicon Storage Technology, Inc. * 1171 Sonora Court * Sunnyvale, CA 94086 * Telephone 408-735-9110 * Fax 408-735-9036 www.SuperFlash.com or www.ssti.com (c)2001 Silicon Storage Technology, Inc. S71150-03-000 6/01 395 24 |
Price & Availability of SST39LF010-90-4I-NH
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