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i ( i iwe-fqund i hil-s-19500/380b 4 june 1991 svpsl!5editk mil-s-19500/180a( sll 17 septerber 1968 n2l2tary specip3caticn ssn203n3wxur dsv2ce, twsisiwr, npn, s2liixn, m types 2n4865, 2n5250, 2n5251, jaiwx, jan2?xv, ~ jans ms s~ification is approved for w hy e21 cept- usxts and lq~cies of the deprt.uent of defense. 1. scope 1.1 ~. this ~ification covers the detail reguirerents for wn per transistors. ?k= levels of product snaurance are provided for each &vice t~ as qecified in nil-s-19500. 1.2 fivsical dimensions. see figure 1 (?f3-114). 1.3 fiuimum ra tinqs . f ?vp 2n4865 2n525c 2n5251 t= = +25?c k 350 350 350 t. = t50?c h 300 300 300 t. = +ioo?c h 200 200 200 ll7c lcih! 0.5 0.5 0.5 v cm ~ 100 125 100 1/ lioear deratina fartor = 2.0 wc < t. = +200c. j pulsed (see 4.j.l herein) =90 a, - - 2/ tqsrature range = -55c to +200?c. i ii ~vat~e range = -65?c b +200?c. u 80 100 150 1- ~ 10 10 10 m 50 50 50 t {opl case @eoeficia3 mamnts (remrendst.ions, additions, deletions) and any @nent &b tich ray he of use in @roving this drcuuent ahrdd be addre$sed @ ccmander, vs w i&mat-q cmand, ~: wet-r-s, fort nonnr)uth, w 07703-5302, !y oetig tie standardization kurent ?qroverent propsa3 (dd porm 1426) appearing at the eod:of this drwent or hy letter. ansc n/a n2sttu otm wmueur & b @proved for public release; distritation is unlimited. fsc 5961
n2l-s-19500/380b 1.4 primrv electrial ch aracteristics. m k 11 v c-,..., u ic=90adc ic=70adc ic=40adc ~=20adc ~=70adc ic=40adc v==5vdc v= q 5vdc v==5vdc vm=5vdc 1.=loadc ib= 4a& t4illt4!m 14i!lt4!z2 l@lt@ i!i!lf@ hi!lt@x hi!l& tiu ti~ 2n4f165 5.0 --- 10 40 15 50 30 90 --- 2.5 --- 1.8 2n5250 5.0 --- 10 40 15 50 30 90 --- 2.5 --- 1.8 2n5251 540 --- 10 40 15 50 30 90 -? 2.5 ?- 1.8 m , r 14b& mhkx y(!c vdc ydc vti 2n4865 2.0 1.0 2n5250 2.0 1.0 2n5151 2.0 1.0 h r. :=1ohsz ~=lovdc ,= 5a& kiotl% 1.0 7.0 1.0 7.0 1.0 7.0 i kax@ em 2.0 1,5 2.0 1.5 2.0 1.5 ii mj ikal!dz !jsie!q 0.s 2.0 1.5 0.5 2.0 1.5 0.5 2.0 1.5 ? isa iq 0.5 0.5 0.5 1/ pulsed (see 4.3.1) herein. 2. applicaw mxowmis 2.1 wverment documnt$. 2.1.1 @cificatiom, stan dxds, and han dhxwks. fie fcjlwing ~ificationa, atarrdards, and handbmks form a @ of this dmumnt to the etit specified herein. mess otherwise qaified, tha issues of these dccumnte are those listed in the issua of the dapartnent of oafenae max of sp?cificatims and standarde (ch2diss) and supplemnt theretq cited in the mlicitat.ion (see 6.2), spscistcatiix4 - f412j?msy ? hws-19500 - setimnductor cevices, cenera2 .specification for.
i niirs-19500/380b i i stnkwds i i fmsal fsbsid-e38 - screw thread standards for federal services. niij?.sy 14had-750 - wet hetbcda for $miccudoctor mires. i fonless otherwise indid.ed, codies of federal and militarv awificatims, s~dard% and h~~ks ~ avail~le fmm tb~ standmiization cmumnts?gmi& desk, mild@ 4d, 700 %b~ns avenue, pbiladel~a, pa 19111-5094. ) 2.2 grcler of precedence. in the avant of a conflict mwaen the text of this dccumnt and the references cited herein, the text of tie dmuvmt takes premlenm. nothing in tjis dccumnt, hcwever, supersedes a@icable laws and regulatims onless a specific eremption has been obtained. 3. lwqo3p&lms 3.1 detail mecifica tiou. ?i?be individual item requiremnta shell k.? in accordance with ml-s-19500 and as specified herein. 1.2 abbreviations, mids, and d f e initions. amraviations, ayrbds, and definitions used herein shall ke as specified in f41ls-19500. 3.3 ksion. c onstrmtion, and dhvsical dismeions. l%e design, instruction, and physical dimnaions ebdl k as specified in n3m-19500 and figure 1 berein. 3.3.1 lead material shall te eddersble as defined in kiha9500, lui#i%750 md herein. like a choim of lead mterial or finish is desired, it shell be sp?cified in the contract or purchase order (see 6.2). 3.4 u. mrking shall be in accordance with hil-s-19500, except at the option of the manufacturer, the follming mrkings my te mitted frm the my of the device tmt ebe21 be rew on the initial container: a. manufacturer?s identification. h. cmntry of origin. s, ..-4 3
i f41l-s-19500/3e0b p t4ax top vi le&d or option [se ... ,. , < figure 1. phvsical dimensions (tc- 114 ~. 4
llil-s-19500/380b dim. a b c d e f g b j inch 1.062 a a a .115 .185 .815 .125 1.6%0 .317 .154 .340 m 26.98 $5# w u 19.69 4.699 20.70 3.175 42.67 6.451 8.636 tbtes 2 2,s 2 1 1 dim. k? l h n p r t v ,h inch 1.260 .485 .270 .910 .037 .450 .512 .206 .104 ml 32.00 12.32 6.858 23,11 .940 11.43 11.01 5.232 2.642 mm ms : 1. 2. 3. 4. 5. 6. 7. 8. 9. 10. 11. dia?ensiona are in inches. imric eguivaleota are given for general information 0n3y. position of leads with resmt to the hexaqon is not controlled. the case teqerature my k mesured any%h~e on the seating plane within .125 inch of the stud. the mllect.or is in elwtrice3 contact with the use. l%e mllectnr teti my be a hmk or ti at w option of the ramfactocer. for a21 3 terminals (except tab if utilized). * unthreaded dimension. dinmsion n is reamed from center line of hook or outside edge of tab. a 90 angle lead orientation as simm my h used at the option of the ranufecturer. a21 dimnaiona of the basic outline except h, n, end the 120? lead angle apply to this option. t&aada in accordanm with ped-sl?h2b. f?igvre 1. +: phv sical dim sions [?m-l 141- cmtinmd. ,? 5
hil-s-19500/380b 4. qwlitv pssutwce provisions 4.1 s.@inq and inswectiq. sampling end inspection shall be in accordance with 141l-s-1%00 and as specified herein, 4.1 @ala ion. @a2ification inspection shall be in accordance with him-19500 and as s~ified in table n herein. 4.3 &@mina ijms, jldn?xv, and jm2?x 1 vels 0~. e screening shall he in accordance with hil-s-19500 [mle 11) end as spcified herein. lhe follming eeasvremnta shell be mde in scmrdance with lible i herein. l!.evicee that exceed the limits of tile i herein shall not b? acceptable. thernd respse will be done after screen 5 (p2no) [see 4.3.2). screen (see table ii neasuremnt of n3l-s-19500) i jms level jmcxand jau2?7/le ve18 li therml respmse (see 4.1.2) therm3 respnae [see 4.3.2) 9 km, h=, test nuubers 2 aud 4 of not applimble table v ahs21 h aeasured and tie data remrded. 11 ~~, h=, test numbers 2 and 4 of 1=, h=, test numbers table v she21 te retested and the data 2end40f table vsha21te remrded. al= = i100 frament, or mmured and the data 10 m, whichever is greater. ahm recorded, = i20 m-mnt. 1 12 isee 4.3.1 see 4 .3.1 1 13 & and h=, of table i shall be i- md hm, of tile i retested and the data ramrded. ml te retested and the ai- = ~100 @cent or 10 @, data remrded. al= = i100 whichever is greater. ahm = i20 permnt or 10 pa, tichever pxmrlt. is greater. ah== i20 4.3.1 mm? -4. %mr burn-in conditions ae aa follows: t= = +187.5sc !12.5c vm=25!5vdc ta = +30?c i5c iutb: no heat sink of forrtd air moling on the devices si%ll tie pxmitted. :4 6
i nim-19500/leob 4.3.2 therml r esmnse iav.. m amcemnt.~ the avu masuremnts sba21 be parfomed in acmrde.me with nifa~750, mthrd 1131. l%; iv_ conditions (1. end v,) and eaximm limit shell b derived by each vendor. the chosen av= meaurauent end mnditiona for esch device in the gmlification lot sha21 te submitted in the gudification rqmt end a usa response curve shall h plotm. ?rhs chosen av= sm1 be mnsidered find after the mnuf.scturer haa had tie op~rtunity b test five cme-mtive lots. the follcuing pwareter masuremnte 8m1 apply: a. i.mmsuremnt( oraanae)mrrent- ----------- 10 e!a. b. va applied or forced vol@e [approx. = v,,] ------ 25 v. c. 1. applied or forced mrrent (approx. = i= = 1,) -?- --- 6 a. d. v. arllector-emitter vnhage (sam as v=) -------- 25 v. e< ~heatkg orpmvsrtim ------ ----------- 100 lwj. f. t.dalay tiurr=~+ ~--------- -------- 400 pa. g. f4aximm delta v~ limit -------- --------- 200mv. calcu2ationof 8~reguiras kfactor ca2ibret.ion asrameduring goalificetion, grnup e. 4.4 gualitv con formme ins tectiou. @ality mofomanc=e inapactim sbdl te in accordance with fum-19500, and as specified herein. 4.4.1 grouo a ills @ion. group a inspection shall be mnducted in accordance with !tim-19500 and tile i herein. 4.4.2 gmup b inspection. group b inspection shsll be mnducted in accordance with the conditions specified for su!qroup testing in table iva (jansi and table ill (jan, jm?l?x, and jfdfi?kvl of nih-19500, and tables iia and hb herein. electrical ueaeuremnts (end pints) and delta ts@ksmii~ shsll h in amordance with the applimble steps of table v barein, 4.4.1 ~ ins&. group c inapectim shall be mnducted in amnrdance with the renditions specified for mtgroup testing in table v of hil-s-19500 and table iii berein. elect-rid .maauremnta (end pints) and delta regniremnte shall be in accordance with the applicable steps of table v herein. . . 4.5 pethoda of inmxticq. .hsthnda of ins@tion and test shall be as aycified in the approprieta tables and as follws: 4.5.1 haemsenre. rents. hil-s?iw750. conditions for pulss maaureuent shall be se spxified in section 4 of .:. 1
nil-s-19500 /380b 4.5.1 j?berml re sistancg. ?ilerml resistanm remurerents shall 141 wc0-750, mthcd 3111. the following details shall apply: te conducted in accordance with a. b. c. d. e. f. ~. i.masureuent ------------ ----- vamdmremnt voltage -------- ---- i.mllector heatkgmrrent --- -?~-- --- v, mllector-emitter heating volt,age ------ t. heating tim ------------- --- ~masureuentdelay tire ------- ----- kqletirrim tire --------- ---- 10 d. 25 v dc. 3 a. 15 v dc. steady-sme (aeetul-stc-750, nethcd 3131 for definitional. 400 ps. 10 us mximro. 5. pacfj+sing 5.1 packaainar eauirments. ths requiremnta for pdaging shall te in amordame with ium-19500. 8
ins@ion 1/ s.!!!m@ .sual and uechanica? esrmination $lkamud 1 ilector tn emitter cutoff mrrent 2n4865 2n5250 2n5251 mard-currant transfer ratio uttar to bee cutnf f current ilector t-n tase breakdown voltage 2n4865 2n5250 2n5251 ilector to ardtter breakdown vokqe 2n4865 2n5250 2n5251 itb?r to he breakdown voltage .- nil-s- 19500 /380b table 1. group a immection. + n l-sin 75 2011 3041 bias cnndition c vce=80vdc, vw=0 v=, = 100 v k, v.z = o vce=150vdc, v==o 1076 msed (see 4.5.1] vc. =5 vdc, ~=90adc 1061 eiaa condition d, vm=8vdc, k=o 1001 bias condition d, &=loopadc, ib=o, b.ilsed (see 4.5.1) i 1011 bias condition d, ~=200madc, im=o, fulsed (see 4.5.1] 3026 bias conditiou d, l==.lmadc li yiq 5 10 !5 10 10 )0 jo l @x 10 10 10 5 10 utit ii dc adc a dc kdc v dc v dc v dc v dc v dc vdc v dc see fmtnote at end of tablet . . . j 9
inspection 4/ mqrnd 1 - continued mard-current tram fer ratio rward-current transfer ratio mmrd-cumant tranafer ratio me to emitter volbqa (aatorated) ke tn emitter voltage [saturated] jlectm to emitter voltage [ aaturatad) ilector to titter voltage (saturated) mbi71qm .gh tqarature opxation: collector to emitter cutoff current m taqeretnra op-atica: forhard-mrrent tranafer ratio forbard-curmnt tranafer ratio .- hil-s-19500/3aob table 1. grcud a instectiod - continued. - 3076 3076 3076 3066 3066 3071 3071 3041 3076 3076 see fmtnota at end of table. fulsed (see 4.5.1], vcz=5vdc, ~=20adc fulsed [see 4.5.1), vcx.5vdc, ~=40adc msad (see 4.5.1), vce=5vdc, ~=70adc test condition a, plsed (see 4.5.1], 1~= 4a, &=40adc tast condition at pulsed ( s?e 4.5.1), 1,= 10 a, 1== 70adc fulsad (see 4.5.1), 1.=4 a,~=40adc wad [see 4.5.1], 1.=10 a, ic=70adc bias condition c, t. q +150?c vm=loovdc, v., =o t, = -55?c, @ed (we 4.5.1), vc==5vdc, ~=40adc ta = -55?c, @seal (sea 4.5.1), vc==5vdcr~=70adc ,,,,. . 10 h ml h -3 h fe. vn=(aat)l vm[6at)2 v=(sat}l vce[aat)2 l- h m, h fe. li! ihl 10 [5 10 ,0 b ~ ml? 90 50 40 1. 2. 1. 1. 00 hit ?
ins@ion 1/ i s!l??md magnitude of mmm- emitter mall-signal short circuit forward curcent transfer reti ?i?ucn-on time storage tire fs21 till? safe operating area (mntinuoua dc] nisrs-19500/380b table i. ~mu a ~ soection - continued. 241l-sto-75 o whcd condmo s . n 3306 3251 3005 3051) test 1 [all typ) test 2- 2n5250 (only) test 2- 2n5251 [ordy) 1--- see fmtnote at hd of ?table. vc==lovdc, f=lohsz ~=5.oadc test condition a, l=70adc, 1.[1) = 10 a dc, 1.(2) =-10 adc, see figure2 ~=70adc, i.(l) =loadc, 1.[2) =-10 adc, e@efiguce2 &=70 adc, ijl)=loadc, 1.(2) =-10 adc, aeefique2 t== 100?c pre-puked conditioc, see figure 2end3, vm=o, k=0, ,wlse condition (see 4.5.1) t = 60 setonds, k <6 seconds t, s 6 seconds, 1 cycle vc. =4.0 vdcr~= 50a&, p= q 200 h v== = 26 v dc, ic = 7.8 a &, p= = 200 h vm=37vdc, ic=5.4adq p= = 200 h syubol 4 ml 1 ~ ma 7 1 0 10 ? m ? is is is .:,, . . ,, . . .* 11
sukmup 5- continued jncl@ inductive sweep end points war oups 6 end 7. not applicable hil-s-19500/3aob tims 1. &oud a kdiw - continued. hiirsl%750 e t. = 25?c, i= q 500 ma dc, ~=5adc, l=5ms, & = .1 ohm, see figure 4 t= = 25*c, 1, = 3 a de, &=30 adcf l=5m, :.ti~ll; v=(claup) q 150 v, see table v, steps 1, 2, and 3 syubal l/ for sanpling plsn, see hws-19500. ii b ? l bs- ? ? hit ? ?
nil-s-19500 /3 bob tams ha. &oud b imrection for jans devices. ins@ion 1/ iysiral dimns ions ~ ]merability ?sishnce to solvents mm j enpatura cycling (air-b-air) ermtic seal fine leak gross leak lectrical ceasuremnts decap-internel vied (design verification) send atrangth die shear intermittent operation life electrical nmatienmti --- see fmtnota at end of tile. nil-sm-750 mi cnnti tions . . . . . !066 sea f igrrre 1 1026 1022 [051 1071 test rendition g or e, mxiem leak rate = 5 x 10-? atm m?ls, except 5 x 10-7 ah m?ls for devices with intarnd cavity >0.3 m?. test condition a, c, d, e, j, or k. se-a table v, steps 1, 2, and 3. /075 2037 2017 . 1037 l = 3 minutes ti, ~,, = 3 minutes mhinmn, 2,000 cycles, (see 4.3.1). saa tile v, steps 1, 2, and 3.
i+il-s-19500/mob table iia. gmtm b inspection for jms device s - continued. inspection i/ s!&m?@ xelerated steady-state operation life lectrical mmmmnts md strength (m-au die intercollneft9 ody) $!@mw!i iemd resistanm hil- s?iti-750 ethcd conditions 1027 t, = 275c (minim ) for 96 boors minimum. siss conditims as s~cified. see table v, steps 4 and 5 2037 3131 sea 4.5.2.
i mil-s-19500/360b tasle iib. group b insmtion for janfx and jaumv. inspection 1/ w-m -750 mathcd $ltmnu, 1 olderability 2026 ?sistance to solvents 1022 enqerature cycling [air-b-air) 1051 emetic ad 1071 fine leak test condition g or e, mximm leak rate = 5 x 10-? atm m?ls, for devices with internal cavity >0.3 m?. gross leak test rendition a, c, d, e, j, or k. lectrical ueaauremnts see tile v, steps 1, 2, and 3. sutamuq 3 ntemittent opsration life 1037 tm = 3 minutes mininnm, u,, = 3 minutes b, 2,000 cycles, see 4.3.1. lect.rical nmaumments see tame v, steps 1, 2, and 3. subqcoud ~ md stren@ 2037 ~ap internal viaua3 (design verif icationl 2075 visual criteria in accordance with @if ied design. sjilpm@ ot applicable suburoup 6 ? igh tqerature (nonoperatkg ] 1032 340 +12, -24 hours. lectriral mmremnts see @le v, steps 1, 2, end 3. . . .,. : 1/ for eaupling plan, see iul-s-19500. 15
i llil-s-19500/380b tm%? iii. gmu d c inswtion. inspection l/ wm2lvll physical dinmsions s@i?m!_? ~ t&m@ shmk (glass strain) ~ terminal strength ilermtic seal fine leel gross leak moisture resistance electrical neamremnts svk?uq@ shd vibration, variable frequency constdnt accelemtion electrical amsuremota m231qk. . sa3t atnqhere (mrrosion] ~ ml- ?m 75 2066 1056 2036 1071 1021 ?oi6 1056 1006 1041 see figure 1. test rendition a! emept test condition b for devices with pm?r rating of >5 watts at u = 25c, l--- see fmtnote at end of table. 16 m epecif ied. lkst rendition g or e, !raxhm leak rate q 5 x 10-a atm cm31st exqt 5 x 10-7atm m?ls, for devices with internal cavity > 0.1 m?. test mnditiori a, c, d, e, j, or k, see tile v, steps 1, 2, and 3. one ainute minim in each orientation, xl, yl, and el at 20,000 g?s mind, except at 10,000 g?s tiimm fo devices with per rating of l 10 watts at t= = 25?c. see table v, ataps 4 and 5
f41l-s-19500/380b tabls iii. gmuo c instectioq - continued. inspection 1/ n1trstd-7 50 hethal contitlon ,. s not applicable intermittent operation life 1017 see 4.3.1. &, = 3 udnutes m.inimm, l,c = 1 &lutes minim, 4,000 cycles electrical ueamments see table v, steps 1, 2, 3, and 4 u ebr aanpling plan, aee hil-s-19500. :.. ,. ,. ,,.: 17
f41l-s-19500/3bob tasle iv. !lmm e inmectian [all aualitv levele.1 for auahfwa~ . ?on only. inspection flil-sid-750 qualification mnformnce method condition9 irqd.ion summud ~ 12 devices, c= hema3 shock 1056 o*cto 100?c, 100qcles ermtic sea3 1071 lectrical msuremnts see table v, steps 1, 2, and 3 s9turouo 1 45 devices, c = teady-state & blrcking life 103e condition a; 1,000 houcs or 1049 lectcica3 nmmremnts see table v, steps 1 and 4 s.u@!!@ 3 devices, c = estructive physical analysis 2102 s!mswli 22 devims, c = hecml resistance 3131 ~c q 0.5?ciw & $!ml?j@ ot applicable . . . 18
i i i i mil-s-19500/3eob tablev. &u ~ nts. step inspection kif s?m-750 symtol limits tit m &mditions & & _ 1 titter to base cutoff 3061 biae condition d i- 5 pa dc current v=. = bvdc, ~.~ 1 collector to emitter 3041 bias condition c, 1= cutoff current v.= = o 2n4865 v=, = 80vdc 100 pa dc 2n5250 v== = 100 v dc 100 #a& 2n5251 v=, = 150vdc 100 padc 3 forward cm-rent 3076 fulsed (see 4.5.1) tl=, 15 50 transfer ratio vc==svdc, l=40adc 4 forward mu-rant 3076 pulsed [see 4.5.1) h=, 5 transfer ratio v.= = 5 v dc, &=90adc 5 turn-on tine 3251 test condition a, & 1.0 p 2c=40adc 1,(1) =4 adc, 1.[2) = -4 adc, see figure 2 s torage tire 2c=40adc t . 0.7 ps 1 ,(1/ =4 adc, i .[2) =-4 adc, s ee figure 2 p all the i .=40adc t , 6 00 ire i .[1) = 4 adc, i ,(2) =-4 adc, see figore 2 ., .j 19
scope ?01 -+ rl (q) vu scope 1 bi -+ rl (q) v~~ 141l-s-19500/180b circuit conditions at 1. = 70 adc 10< v,, <25vdc r. (noninductive] =v= -vc,( sat) 70 where: v=(sat} =valueat ic=70a, ib= 10a 1,, =-1., = 10a circuit conditionsat i==40adc 10< vc. f25vdc r. (nminductive) =va -vc=[eatl 40 where: vm(sat) =valueat ic=40a, i,=4a 1., = -1., = 4 a .: figlre 2. nfl man test ci ?ts. 20
! i t41l-s-19500/180b 50 10 i .0 .1 .01 i 10 50 100 500 1000 ?c e (volts) j f2m 3. wad safe ousra tinu srq. 21
mil-s-19500/laob i ?lest flu droce i dure: ilith switch s, closed, apply specified is end & (at s~ified t= conditions 1. as soon as 1 etmve is affected and ascertained, op ewitch s,. oevice fails if, now, second breakdam occllks. perform spified end-point tests. l=5ti, [aeefiqure5 data] p.s = 0.29 (mniodictive, 1.0 percent tolerance, mxinsim) pim 4. ynchrd inductive sum t est circu ?t diaar~, l = 5 uie; chiqo st?d ~: transf. corp. type c = 2689 p21ter choke, sam es spxifieil on figure 4 akove, .03!2, 22.5 m (or equiv. ) except use the following reapertive & = 0. iq, (ncuinductive, l.0 percent tolerance, mximm) i c monitor tt -1- ? 2n4865 = 80 t?, +0, -5 2n5250 = 100 v, to, -5 2n5251 = 150 v, to, -5 figurz 5. mug d inductive swssd test cjrcut dqqtui. 22
nil-s-19500 /190b 6. tfjtss (this section rontains information of a general or esplamtmy nature that my be helpful, but is not ndatory. i 6.1 6.2 a. b. c. w. the notes spcified in iul-s-19500 are applicable to this s~cification. c@erina data. acquisition dmumnta mst specify the follwing: title, number, and date of the specification. issue of ixidiss to k cited in the solicitation, and if required, the s~cific issue of individual docunents referenmd (see 2.1.1). lead mterial end finish (see 1.3.1). 6.1 $ubst{ tution ii&k@&. devices covered by this spmifird.ion aks substitutable for tbe manufacturer?s and user? 9 part nmker. this information in no way @lies that manufacturer?s part numbers sre suibble as a substitute for the military part or idsntifyinq nonker (pin). 6.4 jan substitu tioo. ja!fi?x dsvices m a dirert aubatitute for ji# devices. 6.5 cj@kms frwl dre vious issue, asterisks are mt used in this revision to identify changes with respect to the prwioua issue due to the extensiveness of the changes. ccnclud2ng fwer2al custodians: arq-sr navy - ec air force -17 nma-na review activity: air force -85 prep3ring activity: army-m agent: dia-e5 (koject 5961-1222] 23
i i - . . . . ---- --- ?= . .

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