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publication number 2xws-n_to_ws-p_an revision 01e issue date october 3, 2006 1. introduction migrating from the S71WS512N to the monolithic s71ws512p is a simple process; however, the user should be aware of a few differences between these two parts. these differences are the result of the S71WS512N using two s29ws256n die in series while the s71ws512p uses a single s29ws512p configuration. this application note describes these differences in detail so users currently using the S71WS512N configuration can plan ahe ad and include the necessary software to ensure a smooth migration to the s71ws512p. both software and hardware considerations are covered. table 1.1 shows a comparison of the key features between the two flash device cores. S71WS512N to s71ws512p migrating from the s71w s512n to the s71ws512p application note by daisuke nakata table 1.1 comparison of key features futures s29ws256n s29ws512p technology mirrorbit ? mirrorbit ? process rule 110 nm 90 nm v cc 1.70 v to 1.95 v 1.70 v to 1.95 v v io (v ccq )=v cc =v cc max density 256 mb 512 mb configuration register cr0-cr15 cr0.0 - cr0.15, cr1.0 - cr1.15 sector architecture 16 k-words small sector 64 k-words large sector 16 k-words small sector 64 k-words large sector bank architecture 16 bank structure 16 bank structure bank size 2 mb 4mb boot option top / bottom / dual top / bottom / dual common flash interface (cfi) yes yes simultaneous read/write yes yes asynchronous read mode yes yes page mode read yes yes page size 4-words 8-words synchronous (burst) read mode yes yes burst frequency 54 mhz / 66 mhz / 80 mhz 54 mhz / 66 mhz / 80 mhz / 108 mhz burst length 8 / 16 / 32 continuous 8 / 16 / 32 continuous single word / write buffer program yes yes write buffer size 32-words 32-words program suspend / program resume yes yes sector erase / chip erase yes yes erase suspend / erase resume yes yes unlock bypass / fast mode yes yes accelerated program / chip erase yes yes sector protection hardware: wp# software: asp hardware: wp# software: asp secured silicon area 128-words factory locked 128-words customer lockable 128-words factory locked 128-words customer lockable
2 S71WS512N to s71ws512p 2xws- n_to_ws-p_an_01e october 3, 2006 application note 2. performance characteristics the 90 nm mirrorbit ? technology, on which the s29ws512p is ba sed, allows performance improvements over the s29ws256n, which is based on 110 nm mirrorbit technology. table 2.1 shows the performance comparison between the two devices. note: under worst case conditions of 90c. v cc = 1.70 v. 100,000 cycles. 3. electrical specification changes i/o descriptions - package and pin layout there are also a few hardware changes required fo r the migration. since the entire s29ws512p is addressed with a single chip select, address line a24 has to be connected. note that some systems may require a pull down resistor on a24. the two block diagrams in figure 3.1 illustrate these changes. figure 3.1 block diagrams note: pull down resistor may be required for some systems. table 2.1 performance comparison access time s29ws256n s29ws512p read access time vcc=1.70 v to 1.95 v cl=30pf max. async. access (t acc )80ns80ns max. async. page access (t pac c )20ns 20ns max. sync. burst access (t bacc )9ns 7ns single word programming time ty p 4 0 s 30 s max (see note) 400 s 150 s total 32-words buffer programming time typ 300 s 192 s max (see note) 3000 s 960 s effective word programming time ty p 9 . 4 s 6s max (see note) 94 s 30 s sector erase time ty p 150 ms: 16 k-words 600 ms: 64 k-words 150 ms: 16 k-words 600 ms: 64 k-words max (see note) 2000 ms: 16 k-words 3500 ms: 64 k-words 1750 ms: 16 k-words 3000 ms: 64 k-words a0-a22 ws512p flash memory 128mb cellularram memory a0-a22 clk avd# f-ce# f-oe# f-rst# f-acc f-wp# f-we# a0-a22 clk avd# ce# oe# reset# acc wp# we# dq0-dq15 vss vcc vccq rdy dq0-dq15 vss f-vcc vccq rdy/wait dq0-dq15 vcc vccq vss r-vcc r-ce# r-lb# r-ub# r-cre clk avd# ce# oe# lb# ub# we# cre a23 a24 (note) a23 a24 (note) r-oe# r-we# wait# v id v cc rdy psram flash 1 dq15 to dq0 flash-only address shared address f1-ce# acc r-ub# r-ce2 r-cre r-vcc v cc v ccq f-vcc 22 clk clk wp# oe# we# f-rst# avd# ce# acc wp# oe# we# reset# avd# rdy v ss v ssq dq15 to dq0 16 i/o15 to i/o0 16 r-ce1# ce# we# oe# ub# r-lb# lb# 22 f2-ce# clk avd# flash 2 wait# cre# s71ws-n s71ws-p october 3, 2006 2xws-n_to_ws-p_an_01e S71WS512N to s71ws512p 3 application note v cc and v ccq ramp on the ws512p, v cc and v ccq (v io ) must ramp up simultaneously. this restriction is not required on the S71WS512N. regarding v cc ramp rates, the ws512p places no restriction on v cc ; (some earlier revisions of the ws256n required the ramp rate to be great er than 1 v/100 s, or a reset pulse would have to be issued. table 3.1 shows parameters that have been changed in the s29ws512p. 4. basic architectural changes 4.1 sector architecture both the s29ws256n and the s29ws512p feature sectors of the same size, that is, 128 kb sectors and the smaller 32 kb (boot) sectors. however, the S71WS512N co ntains a total of 16 small flash sectors, while the s71ws512p contains only 8 small flash sectors. figure 4.1 illustrates this. figure 4.1 flash sector architecture of the s71ws256n and s71ws512p table 3.1 v cc / reset# / ce# timing parameter comparison parameter description s29ws256n s29ws512p t vcs v cc setup time 1ms 30s t rph reset# low to ce# low n/a 10 s s71ws256n 32kb 32kb 32kb 32kb 32kb 254 128kb sectors 32kb 32kb 32kb 32kb 32kb 32kb 32kb 254 128kb sectors 32kb 32kb 32 k b 32kb 32kb 32kb 32kb 32kb 510 128kb sectors 32kb 32kb 32kb 32kb s71ws512p 4 S71WS512N to s71ws512p 2xws- n_to_ws-p_an_01e october 3, 2006 application note when designing software compatible with both devices, users must account for the 8 additional boot sectors in the s71ws256n, situated logicall y in the middle of the sector map. 4.2 bank architecture the flash core of the S71WS512N consists of a total of 32 banks, each of which is 2 mb. the flash core of the s71ws512p contains a total of 16 banks, each of which is 4 mb. this variation may be important to consider in cases where the simultaneous read/write feature of the devices is being used to ensure that the proper bank boundaries are accounted for in both cases. 4.3 chip select since the S71WS512N employs two chip selects (one chip select addresses one 32 mb region), it is possible to configure the address range to be non-contiguous fo r the two 32 mb regions. however, the s71ws512p is a monolithic device that can be addre ssed with only one chip select and has a contiguous address range. if the S71WS512N is configured with an address gap after t he first 32 mb, users must ensure that the software can also handle a contiguous address range in the s71ws512p. 4.4 burst configuration register the S71WS512N has two conf iguration registers (see table 4.1 ) of the same type (one in each die) that need to be configured individually for proper operation of the device. the s71ws512p has two different types of configuration registers. the s71ws512p has an additional configuration register (see table 4.2 ) in which two bit fields are used. cr1.0 is used to provide additio nal programmable wait states. in addition, cr 0.6, can be used to select zero hold mode. finally, the configurat ion registers must be programmed in order (cr0 first and then cr1) or programming will be ignored. table 4.1 s29ws256n configuration register cr bit function settings cr 15 set device read mode 0: burst read mode 1: asynchronous read mode cr 14 reserved 0: all others 1: s29ws256n at 6 or 7 wait settings 2nd 3rd 4th 5th 6th 7th initial data is valid on the 2nd (3rd, 4th...9th) rising clk edge after addresses are latched. cr 13 programmable wait state 000011 cr 12 0 0 1 1 0 0 cr 11 0 1 0 1 0 1 cr 10 rdy polarity 0: rdy signal active low 1: rdy signal active high (default) cr 9 reserved 1: default cr 8 rdy 0: rdy active 1-clock cycle before data 1: rdy active with data cr 7 reserved 1: default cr 6 reserved 1: default cr 5 reserved 0: default cr 4 reserved 0: default cr 3 burst wrap around 0: no wrap around burst 1: wrap around burst (default) continuous (default) 8-word linear burst 16-word linear burst 32-word linear burst cr 2 burst length 0001 cr 1 0110 cr 0 0010 october 3, 2006 2xws-n_to_ws-p_an_01e S71WS512N to s71ws512p 5 application note table 4.2 s29ws512p configuration register cr bit function settings cr 0.15 set device read mode 0: burst read mode 1: asynchronous read mode cr 0.14 reserved 0: reserved 1: reserved (default) 2nd3rd4th5th6th7th8th9th initial data is valid on the 2nd (3rd, 4th...9th) rising clk edge after addresses are latched. cr 1.0 programmable wait state 00000011 cr 0.13 00001100 cr 0.12 00110000 cr 0.11 01010101 cr 0.10 rdy polarity 0: rdy signal active low 1: rdy signal active high (default) cr 0.9 reserved 1: default cr 0.8 rdy 0: rdy active 1-clock cycle before data 1: rdy active with data cr 0.7 reserved 1: default cr 0.6 mode of operation 0: zero hold mode 1: legacy mode (default) cr 0.5 data rate 0: default cr 0.4 rdy function 0: default cr 0.3 burst wrap around 0: no wrap around burst 1: wrap around burst (default) continuous (default) 8-word linear burst 16-word linear burst 32-word linear burst cr 0.2 burst length 0001 cr 0.1 0110 cr 0.0 0010 cr 1.15 reserved 1: default cr 1.14 reserved 1: default cr 1.13 reserved 1: default cr 1.12 reserved 1: default cr 1.11 reserved 1: default cr 1.10 reserved 1: default cr 1.9 reserved 1: default cr 1.8 reserved 1: default cr 1.7 reserved 1: default cr 1.6 reserved 1: default cr 1.5 reserved 1: default cr 1.3 reserved 1: default cr 1.2 reserved 1: default cr 1.1 reserved 1: default 6 S71WS512N to s71ws512p 2xws- n_to_ws-p_an_01e october 3, 2006 application note figure 4.2 shows an example of how to set the configurat ion register for 80 mhz 8-burst with wrap read (7- wait), rdy active- h 1 cycle prior. figure 4.2 example configuration register settings 4.5 page mode read both devices are capable of page mode reads, which pr ovides random read access speed for locations within a page. table 4.4 shows the page size comparison differences between the S71WS512N and the s71ws512p. table 4.3 configuration register access command comparison command cycles bus cycles first second third fourth fifth sixth addr data addr data addr data addr data addr data addr data s29ws256n set configuration register 4 555 aa 2aa 55 555 d0 x00 cr read configuration register 4 555 aa 2aa 55 555 c6 x00 cr s29ws512p set configuration register 5 555 aa 2aa 55 555 d0 x00 cr0 x01 cr1 read configuration register 4 555 aa 2aa 55 555 c6 x0 or x1 cr0 or cr1 cycle operation byte address word address data cycle operation byte address word address data : u l w h % $ $ $ $ k % $ k $ $ k : u l w h % $ $ $ $ k % $ k $ $ k : u l w h % $ k % $ $ $ k k : u l w h % $ k % $ $ $ k k : u l w h % $ $ $ $ k % $ k ' k : u l w h % $ $ $ $ k % $ k ' k : u l w h % $ % $ k & |