hermetically sealed, wide supply voltage optocouplers reliability data sheet description the reliability data shown includes agilent reliability test data from the past three years on this product family. all of these products use the same leds, the same logic gate ics, the same dscc approved packaging materials, processes, stress conditions and testing. the data in tables 1 and 2 reflect actual test data on dual channel devices. the single channel hcpl- 5201 data in table 3 is inferred from the demonstrated life test data using the factor (1.5) found in the photodiode detector isolator section of mil-hdbk- 217, combined with any single channel data obtained. this data definition of failure inability to switch, i.e., functional failure, is the definition of failure in this data sheet. specifically, failure occurs when the device fails to switch on with 2 times the minimum recommended drive current (but not exceeding the max. rating) or fails to switch off when there is no input current. failure rate projections the demonstrated point mean time to failure (mttf) is measured at the absolute maximum stress condition. the failure rate projections in tables 2 and 3 use the arrhenius acceleration relationship, where a 0.43 ev activation energy is used as in the hybrid section of mil- hdbk-217. applications information the data of tables 1, 2, and 3 were obtained on mil-prf-38534 screened devices with high temperature operating life duration up to 5000 hours. an exponential (random) failure distribution is assumed, expressed in units of fit (failures per billion is taken from testing on agilent technologies devices using internal agilent processes, material specifications, design standards, and statistical process controls. they are not transferable to other manufacturers similar part types. device hours) are only defined in the random failure portion of the reliability curve. for valid system reliability calculations, it is necessary to adjust for the time when the system is not in operation. note that if you are using mil- hdbk-217 for predicting component reliability, the results may not be comparable to those given in tables 2 and 3 due to the different conditions and factors operating life test table 1. demonstrated operating life test performance, hcpl-5231 demonstrated demonstrated stress test total devices total device number of mttf (hr)@ fits @ condition tested hours failed units t a = +125 ct a = +125 c i f = 8 ma 430 1,747,000 1 1,747,000 572 i out = -15 ma v cc = 20 v t a = +125 c t j = +155 c agilent 5962-8876901px, 5962-8876904kpx hcpl-5231, hcpl-523k 5962-8876801px, 5962-8876802kpx hcpl-5201, hcpl-520k 5962-88769022a, 5962-8876905K2A hcpl-6231, hcpl-623k 5962-8876903fc, 5962-8876906kfc hcpl-6251, hcpl-625k
www.semiconductor.agilent.com data subject to change. copyright ? 2000 agilent technologies, inc. obsoletes 5967-6008e 5968-9397e (2/00) environmental testing all high reliability hermetic optocouplers listed meet the 100% screening and quality conformance inspection testing of mil-prf-38534, class h or class k as applicable. table 4. esds classification per method 3015, mil-std-883 that have been accounted for in mil-hdbk-217. for example, it is unlikely that your application will exercise all available channels at full rated power with the led(s) always on as agilent testing does. thus, your application total power and duty cycle must be carefully considered when comparing tables 2 and 3 to predictions using mil-hdbk-217. electrostatic discharge sensitivity part number esd class 5962-8876904kpx, hcpl-523k 3 5962-8876901px, hcpl-5231 3 5962-8876802kpx, hcpl-520k 1 5962-8876801px, hcpl-5201 1 5962-8876905K2A, hcpl-623k 1 5962-88769022a, hcpl-6231 1 5962-8876906kfc, hcpl-625k 3 5962-8876903fc, hcpl-6251 3 table 3. reliability projections for single channel devices listed in title typical (60% confidence) 90% confidence ambient junction mttf fits mttf fits temperature ( c) temperature ( c) (hr/fail) (fail/10 9 hr) (hr/fail) (fail/10 9 hr)) 125 145 1,297,000 771 674,000 1,484 120 140 1,498,000 668 778,000 1,285 110 130 2,018,000 496 1,051,000 952 100 120 2,759,000 362 1,440,000 695 90 110 3,836,000 261 2,006,000 499 80 100 5,429,000 184 2,844,000 352 70 90 7,830,000 128 4,111,000 243 60 80 11,531,000 87 6,069,000 165 50 70 17,369,000 58 9,164,000 109 40 60 26,814,000 37 14,186,000 70 30 50 42,522,000 24 22,560,000 44 25 45 54,133,000 18 28,763,000 35 table 2. reliability projections for dual channel devices listed in title typical (60% confidence) 90% confidence ambient junction mttf fits mttf fits temperature ( c) temperature ( c) (hr/fail) (fail/10 9 hr) (hr/fail) (fail/10 9 hr)) 125 155 865,000 1,157 449,000 2,227 120 150 992,000 1,009 515,000 1,941 110 140 1,317,000 759 686,000 1,458 100 130 1,774,000 564 925,000 1,081 90 120 2,427,000 412 1,268,000 789 80 110 3,374,000 296 1,767,000 566 70 100 4,774,000 209 2,505,000 399 60 90 6,886,000 145 3,622,000 276 50 80 10,141,000 99 5,346,000 187 40 70 15,274,000 65 8,073,000 124 30 60 23,580,000 42 12,496,000 80 25 55 29,589,000 34 15,703,000 64
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