ligitek electronics co.,ltd. property of ligitek only LE1030-PF tower type led lamps data sheet doc. no : qw0905-LE1030-PF rev. : a date : 31 - mar. - 2006 pb lead-free parts
page 1/5 ligitek electronics co.,ltd. property of ligitek only 4.8 package dimensions 2.0 2.5 3.5 1.5max 8.0 4.5 part no. LE1030-PF 2.54typ 1.0min 30 x 0 x -30 x directivity radiation 50% 100% 75% 25% 0 25% 100% 75% 50% -60 x 60 x note : 1.all dimension are in millimeter tolerance is ? 0.25mm unless otherwise noted. 2.specifications are subject to change without notice. ?? 0.5 typ 25.0min + -
page 2/5 ligitek electronics co.,ltd. property of ligitek only unit ratings e symbol parameter absolute maximum ratings at ta=25 j mw ma 120 100 g a j 10 -40 ~ +85 i fp pd peak forward current duty 1/10@10khz power dissipation ir t opr operating temperature reverse current @5v ma 30 i f forward current luminous intensity @10ma(mcd) forward voltage @20ma(v) spectral halfwidth ??f nm color part no material typical electrical & optical characteristics (ta=25 j ) min. typ. 10 60 4.5 max. min. 2.6 45 1.7 635 lens emitted orange orange diffused gaasp/gap LE1030-PF note : 1.the forward voltage data did not including ? 0.1v testing tolerance. 2. the luminous intensity data did not including ? 15% testing tolerance. peak wave length f pnm viewing angle 2 c 1/2 (deg) storage temperature tstg -40 ~ +100 j part no. LE1030-PF
fig.3 forward voltage vs. temperature fig.5 relative intensity vs. wavelength ambient temperature( j ) relative intensity@20ma wavelength (nm) forward voltage@20ma normalize @25 j fig.4 relative intensity vs. temperature ambient temperature( j ) relative intensity@20ma normalize @25 j typical electro-optical characteristics curve forward voltage(v) fig.1 forward current vs. forward voltage forward current(ma) forward current(ma) fig.2 relative intensity vs. forward current relative intensity normalize @20ma ligitek electronics co.,ltd. property of ligitek only 1.0 0.1 1.0 10 100 1000 1.0 10 100 1000 0.0 0.5 1.0 1.5 2.0 2.5 3.0 -40 -20 0 20 40 60 1.0 1.1 1.2 550 600 0.0 0.5 1.0 2.0 3.0 4.0 5.0 80 100 0.8 0.9 -20 -40 40 20 080100 60 2.0 0.0 0.5 1.0 1.5 2.5 3.0 650 700 750 e chip page 3/5 part no. LE1030-PF
dip soldering preheat: 120 c max preheat time: 60seconds max ramp-up 2 c/sec(max) ramp-down:-5c/sec(max) solder bath:260 c max dipping time:3 seconds max distance:2mm min(from solder joint to body) time(sec) 5 /sec max preheat 0x 0 25x 120x 50 100 2 /sec max temp(c) 260x 260 c3sec max 150 ligitek electronics co.,ltd. property of ligitek only soldering condition(pb-free) 1.iron: soldering iron:30w max temperature 350c max soldering time:3 seconds max(one time) distance:2mm min(from solder joint to body) 2.wave soldering profile page 4/5 60 seconds max part no. LE1030-PF
this test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. 1.t.sol=260 j? 5 j 2.dwell time= 10 ? 1sec. solderability test this test intended to see soldering well performed or not. 1.t.sol=230 j? 5 j 2.dwell time=5 ? 1sec solder resistance test thermal shock test high temperature high humidity test the purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. 1.ta=105 j? 5 j &-40 j? 5 j (10min) (10min) 2.total 10 cycles the purpose of this test is the resistance of the device under tropical for hours. 1.ta=65 j? 5 j 2.rh=90 %~95% 3.t=240hrs ? 2hrs mil-std-202: 210a mil-std-750: 2031 jis c 7021: a-1 mil-std-202: 208d mil-std-750: 2026 mil-std-883: 2003 jis c 7021: a-2 mil-std-202: 107d mil-std-750: 1051 mil-std-883: 1011 mil-std-202:103b jis c 7021: b-11 page 5/5 this test is conducted for the purpose of detemining the resistance of a part in electrical and themal stressed. operating life test 1.under room temperature 2.if=20ma 3.t=1000 hrs (-24hrs, + 72hrs) low temperature storage test high temperature storage test the purpose of this is the resistance of the device which is laid under condition of high temperature for hours. the purpose of this is the resistance of the device which is laid under condition of low temperature for hours. 1.ta=-40 j? 5 j 2.t=1000 hrs (-24hrs, + 72hrs) 1.ta=105 j? 5 j 2.t=1000 hrs (-24hrs, + 72hrs) reliability test: test item test condition description mil-std-750: 1026 mil-std-883: 1005 jis c 7021: b-1 jis c 7021: b-12 mil-std-883:1008 jis c 7021: b-10 reference standard ligitek electronics co.,ltd. property of ligitek only part no. LE1030-PF
|
