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  october 2000 ? 2000 fairchild semiconductor corporation fdn5618p rev c(w) fdn5618p 60v p-channel logic level powertrench ? ? ? ? mosfet general description this 60v p-channel mosfet uses fairchild?s high voltage powertrench process. it has been optimized for power management applications. applications ? dc-dc converters ? load switch ? power management features ? ?1.25 a, ?60 v. r ds(on) = 0.170 ? @ v gs = ?10 v r ds(on) = 0.230 ? @ v gs = ?4.5 v ? fast switching speed ? high performance trench technology for extremely low r ds(on) g d s supersot -3 tm d s g absolute maximum ratings t a =25 o c unless otherwise noted symbol parameter ratings units v dss drain-source voltage ?60 v v gss gate-source voltage 20 v i d drain current ? continuous (note 1a) ?1.25 a ? pulsed ?10 maximum power dissipation (note 1a) 0.5 p d (note 1b) 0.46 w t j , t stg operating and storage junction temperature range ?55 to +150 c thermal characteristics r ja thermal resistance, junction-to-ambient (note 1a) 250 c/w r jc thermal resistance, junction-to-case (note 1) 75 c/w package marking and ordering information device marking device reel size tape width quantity 618 fdn5618p 7?? 8mm 3000 units fdn5618p
fdn5618p rev c(w) electrical characteristics t a = 25c unless otherwise noted symbol parameter test conditions min typ max units off characteristics bv dss drain?source breakdown voltage v gs = 0 v, i d = ?250 a ?60 v ? bv dss === ? t j breakdown voltage temperature coefficient i d = ?250 a,referenced to 25 c ?58 mv/ c i dss zero gate voltage drain current v ds = ?48 v, v gs = 0 v ?1 a i gssf gate?body leakage, forward v gs = 20v, v ds = 0 v 100 na i gssr gate?body leakage, reverse v gs = ?20 v v ds = 0 v ?100 na on characteristics (note 2) v gs(th) gate threshold voltage v ds = v gs , i d = ?250 a ?1 ?1.6 ?3 v ? v gs(th) === ? t j gate threshold voltage temperature coefficient i d = ?250 a,referenced to 25 c 4 mv/ c r ds(on) static drain?source on?resistance v gs = ?10 v, i d = ?1.25 a v gs = ?4.5 v, i d = ?1.0 a v gs = ?10 v, i d = ?3 a t j =125 c 0.148 0.185 0.245 0.170 0.230 0.315 ? i d(on) on?state drain current v gs = ?10 v, v ds = ?5 v ?5 a g fs forward transconductance v ds = ?5 v, i d = ?1.25 a 4.3 s dynamic characteristics c iss input capacitance 430 pf c oss output capacitance 52 pf c rss reverse transfer capacitance v ds = ?30 v, v gs = 0 v, f = 1.0 mhz 19 pf switching characteristics (note 2) t d(on) turn?on delay time 6.5 13 ns t r turn?on rise time 8 16 ns t d(off) turn?off delay time 16.5 30 ns t f turn?off fall time v dd = ?30 v, i d = ?1 a, v gs = ?10 v, r gen = 6 ? 48ns q g total gate charge 8.6 13.8 nc q gs gate?source charge 1.5 nc q gd gate?drain charge v ds = ?30 v, i d = ?1.25 a, v gs = ?10 v 1.3 nc drain?source diode characteristics and maximum ratings i s maximum continuous drain?source diode forward current ?0.42 a v sd drain?source diode forward voltage v gs = 0 v, i s = ?0.42 (note 2) ?0.7 ?1.2 v notes: 1. r ja is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the so lder mounting surface of the drain pins. r jc is guaranteed by design while r ca is determined by the user's board design. a) 250 c/w when mounted on a 0.02 in 2 pad of 2 oz. copper. b) 270c/w when mounted on a minimum pad. scale 1 : 1 on letter size paper 2. pulse test: pulse width = 300 s, duty cycle = 2.0 fdn5618p
fdn5618p rev c(w) typical characteristics 0 1 2 3 4 5 01234 -v ds , drain-source voltage (v) -4.5v - 6.0v -2.5v -4.0v -3.5v v gs = -10v -3.0v 0.8 1 1.2 1.4 1.6 1.8 2 2.2 012345 -i d , drain current (a) v gs = -3.0v -4.0v -1 0 v -4.5v -6.0v -3.5v figure 1. on-region characteristics. figure 2. on-resistance variation with drain current and gate voltage. 0.8 0.9 1 1.1 1.2 1.3 -50 -25 0 25 50 75 100 125 150 t j , junction temperature ( o c) i d = -1.25a v gs = -10v 0.1 0.2 0.3 0.4 0.5 0.6 246810 -v gs , gate to source voltage (v) i d = -0.65 a t a = 125 o c t a = 25 o c figure 3. on-resistance variation withtemperature. figure 4. on-resistance variation with gate-to-source voltage. 0 1 2 3 4 5 6 11.522.533.54 -v gs , gate to source voltage (v) t a = 125 o c 25 o c v ds = - 5v -55 o c 0.0001 0.001 0.01 0.1 1 10 0 0.2 0.4 0.6 0.8 1 1.2 1.4 -v sd , body diode forward voltage (v) t a = 125 o c 25 o c -55 o c v gs = 0v figure 5. transfer characteristics. figure 6. body diode forward voltage variation with source current and temperature. fdn5618p
fdn5618p rev c(w) typical characteristics 0 2 4 6 8 10 0246810 q g , gate charge (nc) i d = -1.25a v ds = -20v -40v -30v 0 100 200 300 400 500 600 700 024681012 -v ds , drain to source voltage (v) c iss c rss c oss f = 1mhz v gs = 0 v figure 7. gate charge characteristics. figure 8. capacitance characteristics. 0.001 0.01 0.1 1 10 100 0.1 1 10 100 -v ds , drain-source voltage (v) -i d , drain current (a ) dc 10s 1s 100ms r ds(on) limit v gs =-10v single pulse r ja = 270 o c/w t a = 25 o c 10ms 1ms 0 5 10 15 20 0.001 0.01 0.1 1 10 100 1000 t 1 , time (sec) single pulse r ja = 270c/w t a = 25c figure 9. maximum safe operating area. figure 10. single pulse maximum power dissipation. 0.001 0.01 0.1 1 0.0001 0.001 0.01 0.1 1 10 100 1000 t 1 , time (sec) r ja (t) = r(t) + r ja r ja = 270 c/w t j - t a = p * r ja (t) duty cycle, d = t 1 / t 2 p(pk) t 1 t 2 single pulse 0.01 0.02 0.05 0.1 0.2 d = 0.5 figure 11. transient thermal response curve. thermal characterization performed using the conditions described in note 1b. transient thermal response will change depending on the circuit board design. fdn5618p
trademarks the following are registered and unregistered trademarks fairchild semiconductor owns or is authorized to use and is not intended to be an exhaustive list of all such trademarks. life support policy fairchilds products are not authorized for use as critical components in life support devices or systems without the express written approval of fairchild semiconductor corporation. as used herein: 1. life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, or (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in significant injury to the user. 2. a critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. product status definitions definition of terms datasheet identification p roduct status definition advance information preliminary no identification needed obsolete this datasheet contains the design specifications for product development. specifications may change in any manner without notice. this datasheet contains preliminary data, and supplementary data will be published at a later date. fairchild semiconductor reserves the right to make changes at any time without notice in order to improve design. this datasheet contains final specifications. fairchild semiconductor reserves the right to make changes at any time without notice in order to improve design. this datasheet contains specifications on a product that has been discontinued by fairchild semiconductor. the datasheet is printed for reference information only. formative or in design first production full production not in production disclaimer fairchild semiconductor reserves the right to make changes without further notice to any products herein to improve reliability, function or design. fairchild does not assume any liability arising out of the application or use of any product or circuit described herein; neither does it convey any license under its patent rights, nor the rights of others. qfet? qs? qt optoelectronics? quiet series? supersot?-3 supersot?-6 supersot?-8 syncfet? tinylogic? uhc? fastr? globaloptoisolator? gto? hisec? isoplanar? microwire? optologic? optoplanar? pop? powertrench ? rev. f1 acex? bottomless? coolfet? crossvolt? dome? e 2 cmos tm ensigna tm fact? fact quiet series? fast ? vcx?


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