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  U1FWJ44L 2006-11-13 1 toshiba schottky barrier rectifier schottky barrier type U1FWJ44L high speed rectifier applications z low forward voltage : v fm = 0.40v (max) z average forward current : i f (av) = 1.0a z repetitive peak reverse voltage : v rrm = 30v absolute maximum ratings (ta = 25c) characteristic symbol rating unit repetitive peak reverse voltage v rrm 30 v average forward current i f (av) 1.0 a peak one cycle surge forward current (non ? repetitive) i fsm 20 (50hz) a junction temparature t j ? 40~125 c storage temparature range t stg ? 40~125 c note: using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. please design the appropriate reliability upon reviewing the toshiba semiconductor reliability handbook (?handling precautions?/derating concept and methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). electrical characteristics (ta = 25c) characteristic symbol test condition min typ. max unit peak forward voltage v fm i fm = 1.0a D D 0.40 v repetitive peak reverse current i rrm v rrm = 30v D D 0.8 ma junction capacitance c j v r = 10v, f = 1mhz D 60 D pf marking abbreviation code part no. 1fl U1FWJ44L standard soldering pad unit: mm jedec ? jeita ? toshiba 3-4d1a weight: 0.06 g (typ.)
U1FWJ44L 2006-11-13 2 handling precaution schottky barrier diodes have reverse current characteristic compared to the other diodes. there is a possibility sbd may cause thermal runaway when it is used under high temperature or high voltage. this device is v f -i rrm trade-off type, lower v f higher i rrm ; therefore, thermal runaway might occur when voltage is applied. please take forward and reverse loss into consideration during design. the absolute maximum ratings denote the absolute maximum ratings, which are rated values and must not be exceeded during operation, even for an instant. the following are the general derating methods that we recommend when you design a circuit with a device. v rrm : use this rating with reference to the above. v rrm has a temperature coefficient of 0.1%/c. take this temperature coefficient into account designing a device at low temperature. i f(av) : we recommend that the worst case current be no greater than 80% of the absolute maximum rating of i f(av) and t j be below 100c. when using this device, take the margin into consideration by using an allowable tamax-i f(av) curve. i fsm : this rating specifies the non-repetitive peak current. this is only applied for an abnormal operation, which seldom occurs during the lifespan of the device. t j : derate this rating when using a device in order to ensure high reliability. we recommend that the device be used at a t j of below 100c. thermal resistance between junction and ambient fluctuates depending on the device?s mounting condition. when using a device, please design a circuit board and a soldering land size to match the appropriate thermal resistance value. please refer to the rectifiers databook for further information.
U1FWJ44L 2006-11-13 3
U1FWJ44L 2006-11-13 4
U1FWJ44L 2006-11-13 5 ? the information contained herein is subject to change without notice. ? the information contained herein is presented only as a guide for the applications of our products. no responsibility is assumed by toshiba for any infringements of patents or other rights of the third parties which may result from its use. no license is granted by implication or otherwise under any patent or patent rights of toshiba or others. ? toshiba is continually working to improve the quality an d reliability of its products. nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. it is the responsibility of the buyer, when utilizing toshiba products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such toshiba products could cause loss of human life, bodily injury or damage to property. in developing your designs, please ensure that toshiba products are used within specified operating ranges as set forth in the most recent toshiba products specifications. also, please keep in mind the precautions and conditions set forth in the ?handling guide for semiconductor devices,? or ?toshiba semiconductor reliability handbook? etc.. ? the toshiba products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.). these toshiba products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfuncti on or failure of which may cause loss of human life or bodily injury (?unintended usage?). unintended usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. unintended usage of toshiba products listed in this document shall be made at the customer?s own risk. ? toshiba products should not be embedded to the downstream products which are prohibited to be produced and sold, under any law and regulations. 030619eaa restrictions on product use


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