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3 kv rms dual channel digital isolators data sheet adum1280 / adum1281 / adum1285 / adum1286 rev. a document feedback information furnished by analog devices is believed to be accurate and reliable. however, no responsibility is assumed by analog devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. specifications subject to change without notice. no license is granted by implication or otherwise under any patent or patent rights of analog devices. trademarks and registered trademarks are the property of their respective owners. one technology way, p.o. box 9106, norwood, ma 02062-9106, u.s.a. tel: 781.329.4700 ?2012C2013 analog devices, inc. all rights reserved. technical support www.analog.com features up to 100 mbps data rate (nrz) low propagation delay: 20 ns typical low dynamic power consumption bidirectional communication 3 v to 5 v level translation high temperature operation: 125c high common-mode transient immunity: >25 kv/s default high output: adum1280/adum1281 default low output: adum1285/adum1286 narrow body, rohs-compliant, 8-lead soic safety and regulatory approvals (pending) ul recognition: 3000 v rms for 1 minute per ul 1577 csa component acceptance notice #5a vde certificate of conformity din v vde v 0884-10 (vde v 0884-10): 2006-12 v iorm = 560 v peak qualified for automotive applications applications general-purpose multichannel isolation data converter isolation industrial field bus isolation hybrid electric vehicles, battery monitor, and motor drive general description the adum1280/adum1281/adum1285/adum1286 1 (also referred to as adum128x in this data sheet) are dual-channel digital isolators based on the analog devices, inc., i coupler? technology. combining high speed cmos and monolithic air core transformer technology, these isolation components provide outstanding performance characteristics superior to alternatives, such as optocoupler devices and other integrated couplers. with propagation delay at 20 ns, pulse width distortion is less than 2 ns for c grade. channel-to-channel matching is tight at 5 ns for c grade. the two channels of the adum128x are independent isolation channels and are available in two channel configurations with three different data rates up to 100 mbps (see the ordering guide). industrial grade models operate with the supply voltage on either side ranging from 2.7 v to 5.5 v while automotive grades operate from 3.0 v to 5.5 v, providing compatibility with lower voltage systems as well as enabling a voltage translation functionality across the isolation barrier. unlike other optocoupler alternatives, the adum128x isolators have a patented refresh feature that ensures dc correctness in the absence of input logic transitions. when power is first applied or is not yet applied to the input side, the adum1280 and adum1281 have a default high output, and the adum1285 and adum1286 have a default low output. for more information on safety and regulatory approvals, go to http://www.analog.com/icouplersafety . functional block diagrams encode decode encode decode v dd1 v ia v ib gnd 1 v dd2 v oa v ob gnd 2 1 2 3 4 8 7 6 5 adum1280/ adum1285 10444-001 figure 1. adum1280 / adum1285 encode decode decode encode v dd1 v oa v ib gnd 1 v dd2 v ia v ob gnd 2 1 2 3 4 8 7 6 5 adum1281/ adum1286 10444-002 figure 2. adum1281 / adum1286 1 protected by u.s. patents 5,952,849; 6,873,065; 6,903,578; and 7,075,329. othe r patents are pending.
adum1280/adum1281/adum1285/adum1286 data sheet rev. a | page 2 of 20 table of contents features .....................................................................................1 applications ...............................................................................1 general description ..................................................................1 functional block diagrams .......................................................1 revision history ........................................................................2 specifications .............................................................................3 electrical characteristics 5 v operation (all grades) .........3 electrical characteristics 3 v operation (a, b, and c grades) ..................................................................................4 electrical characteristics mixed 5 v/3 v operation (a, b, and c grades) ........................................................................5 electrical characteristics mixed 3 v/5 v operation (a, b, a nd c grades) ........................................................................6 electrical characteristics 3 v ope r at ion ( wa, w b, an d wc grades) ..................................................................................7 electrical characteristics mixed 5 v/3 v opera t ion ( wa, wb, and wc grades) ............................................................8 electrical characteristics mixed 3 v/5 v operation (wa, wb, and wc grades) ............................................................9 package characterist ics ........................................................10 regulatory information ....................................................... 10 insulation and safety - related specifications ....................... 10 din v vde v 0884 - 10 (vde v 0884 - 10): 2006 - 12 insulation characteristics .................................................... 11 recommended operating conditions ................................. 11 absolute maximum ratings .................................................... 12 esd caution ........................................................................ 12 pin configurations and function descriptions ....................... 13 typical performance characteristics ....................................... 15 applications information ........................................................ 16 pc board layout ................................................................. 16 propagation delay - related parameters ................................ 16 dc correctness and magnetic field immunity ................... 16 power consumption ............................................................ 17 insulation lifetime .............................................................. 18 outline dimensions ................................................................ 19 ordering guide ................................................................... 19 automotive products ........................................................... 19 revision history 3 /13 rev . 0 to r ev. a changes to features section , applications section, and general descri ption section ...................................................................1 added table 13 to table 21 ; renumbererd sequentially ............7 changes to table 26 ................................................................. 11 changes to table 29 and table 30 ............................................13 changes to ordering guide .....................................................1 9 added automotive products section .......................................19 5/12 revision 0: initial version
data sheet adum1280/adum1281/adum1285/adum1286 rev. a | page 3 of 20 specifications electrical character istic s 5 v operation (a ll grades) all typical specifications are at t a = 25c, v dd1 = v dd2 = 5 v. minimum/maximum specifications apply over the entire recommended operation range: 4.5 v v dd1 5.5 v, 4.5 v v dd2 5.5 v, ? 40c t a 1 2 5c , unless otherwise noted. switching specifications are tested with c l = 15 pf and cmos signal levels , unless otherwise noted. table 1. a , wa grade s b , wb grade s c , wc grade s parameter symbol min typ min min typ max min typ max unit test conditions switching specifications pulse width pw 1000 4 0 10 ns within pwd limit data rate 1 25 100 mbps within pwd limit propagation delay t phl , t plh 50 35 13 18 24 ns 50% input to 50% output pulse width distortion pwd 10 3 2 ns |t plh ? t phl | change vs. temperature 7 3 1.5 ps/ c propagation delay skew t psk 38 1 2 9 ns between any two units at same operating conditions channel matching codirectional t pskcd 5 3 2 ns opposing direction t psko d 10 6 5 ns jitter 2 2 1 ns table 2. parameter symbol 1 mbps C a, b, c ,wa, wb, wc grade s 25 mbps C b, c , wb, wc grade s 100 mbps C c , wc grade s unit test conditions min typ min min typ max min typ max supply current no load adum1280 / adum1285 i dd1 1. 1 1.6 6.2 7.0 20 2 5 ma i dd2 2.7 4. 5 4.8 7.0 9.5 1 5 ma adum1281 / adum1286 i dd1 2.1 2.6 4 .9 6.0 15 19 ma i dd2 2.3 2.9 4.7 6. 4 15.6 19 ma table 3. for all models parameter symbol min typ max unit test conditions dc specifications logic high input threshold v ih 0.7 v ddx v logic low input threshold v il 0.3 v ddx v logic high output voltages v oh v ddx ? 0.1 5.0 v i ox = ?20 a, v ix = v ixh v ddx ? 0.4 4.8 v i ox = ?4 ma, v ix = v ixh logic low output voltages v ol 0.0 0.1 v i ox = 20 a, v ix = v ixl 0.2 0.4 v i ox = 4 ma, v ix = v ixl input current per channel i i ?10 +0.01 +10 a 0 v v ix v ddx su pply current per channel quiescent input supply current i ddi(q ) 0. 54 0.8 ma quiescent output supply current i ddo (q ) 1. 6 2.0 ma dynamic input supply current i ddi(d) 0. 09 ma/ mbps dynamic output supply current i ddo (d) 0.0 4 ma/ mbps underv o ltage lockout positive v ddx threshold v ddxuv+ 2. 6 v negative v ddx threshold v ddxuv - 2. 4 v v ddx hysteresis v ddxuvh 0.2 v ac specifications output rise/fall time t r /t f 2.5 ns 10% to 90% common - mode transient immunity 1 |cm| 25 35 kv/s v ix = v ddx , v cm = 1000 v, transient magnitude = 800 v refresh period t r 1.6 s 1 |cm| is the maximum common - mode voltage slew rate that can be sustained while maintaining v o > 0.8 v ddx . the common - mode voltage slew rates apply to both rising and falling common - mode voltage edges.
adum1280/adum1281/adum1285/adum1286 data sheet rev. a | page 4 of 20 electrical character istics 3 v operation (a, b , and c grades) all typical specifications are at t a = 25c, v dd1 = v dd2 = 3.0 v. minimum/maximum specifications apply over the entire recommended operation range: 2.7 v v dd1 3.6 v, 2.7 v v dd2 3.6 v, ? 40c t a 1 2 5c , unless otherwise noted. switching specifications are tested with c l = 15 pf and cmos signal levels , unless otherwise noted . table 4. a grade b grade c grade parameter symbol min typ min min typ max min typ max unit test conditions switching specifications pulse width pw 1000 40 10 ns within pwd limit data rate 1 25 100 mbps within pwd limit propagation delay t phl , t plh 50 35 20 25 33 ns 50% input to 50% output pulse width distortion pwd 10 3 2.5 ns |t plh ? t phl | change vs. temperature 7 3 1.5 ps/ c propagation delay skew t psk 38 16 12 ns between any two units at same operating conditions channel matching codirectional t pskcd 5 3 2.5 ns opposing - direction t psko d 10 6 5 ns jitter 2 2 1 ns 7 codir ec t ional c hannel m at c hing is t he abs olut e value of t he dif f er enc e in pr opagat ion delays bet ween any t wo c hannels wit h in p u t s o n t h e s a m e s id e o f t h e is o la t io n b a r r ie r . op p o s in g - dir ec t ional c hannel m at c hing is t he abs olut e value of t he dif f er enc e in pr opagat ion delays bet ween any t wo c hannels wit h input s on oppos ing s ides of t he is ol ation barrier. table 5. parameter symbol 1 mbps C a, b, c grade 25 mbps C b , c grade 100 mbps C c grade unit tes t conditions min typ min min typ max min typ max supply current no load adum1280 / adum1285 i dd1 0.75 1.4 5.1 9. 0 17 2 3 ma i dd2 2.0 3.5 2.7 4.6 4.8 9 ma adum1281 / adum1286 i dd1 1. 6 2.1 3. 8 5 .0 11 15 ma i dd2 1. 7 2.3 3. 9 6. 2 11 15 ma table 6. for all models parameter symbol min typ max unit test conditions dc specifications logic high input threshold v ih 0.7 v ddx v logic low input threshold v il 0.3 v ddx v logic high output voltages v oh v ddx ? 0.1 3.0 v i ox = ?20 a, v ix = v ixh v ddx ? 0.4 2.8 v i ox = ?4 ma, v ix = v ixh logic low output voltages v ol 0.0 0.1 v i ox = 20 a, v ix = v ixl 0.2 0.4 v i ox = 4 ma, v ix = v ixl input current per channel i i ?10 +0.01 +10 a 0 v v ix v ddx su pply current per channel quiescent input supply current i ddi(q ) 0. 4 0.6 ma quiescent output supply current i ddo (q ) 1. 2 1.7 ma dynamic input supply current i ddi(d) 0.08 ma/mbps dynamic output supply current i ddo (d) 0.0 15 ma/mbps undervo ltage lockout positive v ddx threshold v ddx uv+ 2.6 v negative v ddx threshold v ddx uv ? 2.4 v v ddx hysteresis v ddx uvh 0.2 v ac specifications output rise/fall time t r /t f 3 ns 10% to 90% common - mode transient immunity 1 |cm| 25 35 kv/s v ix = v ddx , v cm = 1000 v, transient magnitude = 800 v refresh period t r 1.6 s 1 |cm| is the maximum common - mode voltage slew rate that can be sustained while maintaining v o > 0.8 v ddx . the common - mode voltage slew rates apply to both rising and falling common - mode voltage edges .
data sheet adum1280/adum1281/adum1285/ad um1286 rev. a | page 5 of 20 electrical character istics mixed 5 v/3 v operat ion (a, b , and c grades) all typical specifications are at t a = 25c, v dd1 = 5 v, v dd2 = 3.0 v. minimum/maximum specifications apply over the entire recommended operation range: 4 .5 v v dd1 5.5 v, 2.7 v v dd2 3.6 v; and ? 40c t a 1 2 5c , unless otherwise noted. switching specifications are tested with c l = 15 pf and cmos signal levels unless otherwise noted. table 7. a grade b grade c grade par ameter symbol min typ min min typ max min typ max unit test conditions switching specifications pulse width pw 1000 40 10 ns within pwd limit data rate 1 25 100 mbps within pwd limit propagation delay t phl , t plh 50 35 13 2 0 26 ns 50% input to 50% output pulse width distortion pwd 10 3 2 ns |t plh ? t phl | change vs. temperature 7 3 1.5 ps/?c propagation delay skew t psk 38 16 12 ns between any two units at same operating conditions channel matching codirectional t pskcd 5 3 2 ns opposing - direction t psko d 10 6 5 ns jitter 2 2 1 ns 7 codir ec t ional c hannel m at c hing is t he abs olut e value of t he dif f er enc e in pr opagat ion delays bet ween any t wo c hannels wit h in p u t s o n t h e s a m e s id e o f t h e is o la t io n b a r r ie r . op p o s in g - dir ec t ional c hannel m at c hing is t he abs olut e value of t he dif f er enc e in pr opagat ion delays bet ween any t wo c hannels wit h input s on oppos ing s ides of t he is olat io n barrier. table 8. parameter symbol 1 mbps C a, b, c grade 25 mbps C b, c grade 100 mbps C c grade unit test c onditions min typ min min typ max min typ max supply current no load adum1280 / adum1285 i dd1 1. 1 1.6 6.2 7.0 2 0 25 ma i dd2 2. 0 3.5 2.7 4.6 4.8 9.0 ma adum1281 / adum1286 i dd1 2.1 2.6 4. 9 6.0 1 5 19 ma i dd2 1. 7 2.3 3. 9 6.2 11 1 5 ma table 9. for all models parameter symbol min typ max unit test conditions dc specifications logic high input threshold v ih 0.7 v ddx v logic low input threshold v il 0.3 v ddx v logic high output voltages v oh v ddx ? 0.1 v ddx v i ox = ?20 a, v ix = v ixh v ddx ? 0.4 v ddx ? 0.2 v i ox = ?4 ma, v ix = v ixh logic low output voltages v ol 0.0 0.1 v i ox = 20 a, v ix = v ixl 0.2 0.4 v i ox = 4 ma, v ix = v ixl input current per channel i i ?10 +0.01 +10 a 0 v v ix v ddx supply current per channel quiescent input supply current i ddi(q ) 0. 54 0.75 ma quiescent output supply current i ddo (q ) 1. 2 2.0 ma dynamic input supply current i ddi(d) 0. 09 ma/mbps dynamic output supply current i ddo (d) 0.02 ma/mbps undervoltage lockout positive v ddx threshold v ddx uv+ 2.6 v negative v ddx threshold v ddx uv ? 2.4 v v ddx hysteresis v ddx uvh 0.2 v ac specifications output rise/fall time t r /t f 2.5 ns 10% to 90% common - mode transient immunity 1 |cm| 25 35 kv/s v ix = v ddx , v cm = 1000 v, transient magnitude = 800 v refresh period t r 1.6 s 1 |cm| is the maximum common - mode voltage slew rate that can be sustained while maintaining v o > 0.8 v ddx . the common - mode voltage slew rates apply to both rising and falling common - mode voltage edges.
adum1280/adum1281/ad um1285/adum1286 data sheet rev. a | page 6 of 20 electrical characteristicsmixed 3 v/5 v operation (a, b, and c grades) all typical specifications are at t a = 25c, v dd1 = 3.0 v, v dd2 = 5 v. minimum/maximum specifications apply over the entire recommended operation range: 2.7 v v dd1 3.6 v, 4.5 v v dd2 5.5 v; and ?40c t a 125c; unless otherwise noted. switching specifications are tested with c l =15 pf and cmos signal levels, unless otherwise noted. table 10. a grade b grade c grade parameter symbol min typ min min typ max min typ max unit test conditions switching specifications pulse width pw 1000 40 10 ns within pwd limit data rate 1 25 100 mbps within pwd limit propagation delay t phl , t plh 50 35 16 24 30 ns 50% input to 50% output pulse width distortion pwd 10 3 2.5 ns |t plh ? t phl | change vs. temperature 7 3 1.5 ps/?c propagation delay skew t psk 38 16 12 ns between any two units at same operating conditions channel matching codirectional t pskcd 5 3 2.5 ns opposing-direction t pskod 10 6 5 ns jitter 2 2 1 ns 7 codirectional channel matching is the absolute value of the difference in propagation delays between any two channels with inp uts on the same side of the isolation barrier. opposing-directional channel matching is the absolute value of the difference in propagation delays between any two channels with inputs on opposing sides of the isolation barrier. table 11. parameter symbol 1 mbpsCa, b, c grade 25 mbpsCb, c grade 100 mbpsCc grade unit test conditions min typ min min typ max min typ max supply current no load adum1280/adum1285 i dd1 0.75 1.4 5.1 9.0 17 23 ma i dd2 2.7 4.5 4.8 7.0 9.5 15 ma adum1281/adum1286 i dd1 1.6 2.1 3.8 5.0 11 15 ma i dd2 1.7 2.3 3.9 6.2 11 15 ma table 12. for all models parameter symbol min typ max unit test conditions dc specifications logic high input threshold v ih 0.7 v ddx v logic low input threshold v il 0.3 v ddx v logic high output voltages v oh v ddx ? 0.1 v ddx v i ox = ?20 a, v ix = v ixh v ddx ? 0.4 v ddx ? 0.2 v i ox = ?4 ma, v ix = v ixh logic low output voltages v ol 0.0 0.1 v i ox = 20 a, v ix = v ixl 0.2 0.4 v i ox = 4 ma, v ix = v ixl input current per channel i i ?10 +0.01 +10 a 0 v v ix v ddx supply current per channel quiescent input supply current i ddi(q) 0.4 0.75 ma quiescent output supply current i ddo(q) 1.6 2.0 ma dynamic input supply current i ddi(d) 0.08 ma/mbps dynamic output supply current i ddo(d) 0.03 ma/mbps undervoltage-lockout positive v ddx threshold v ddxuv+ 2.6 v negative v ddx threshold v ddxuv? 2.4 v v ddx hysteresis v ddxuvh 0.2 v ac specifications output rise/fall time t r /t f 2.5 ns 10% to 90% common-mode transient immunity 1 |cm| 25 35 kv/s v ix = v ddx , v cm = 1000 v, transient magnitude = 800 v refresh period t r 1.6 s 1 |cm| is the maximum common-mode voltage slew rate that can be sustained while maintaining v o > 0.8 v ddx. the common-mode voltage slew rates apply to both rising and falling common-mode voltage edges.
data sheet adum1280/adum1281/adum1285/ad um1286 rev. a | page 7 of 20 electrical character istics 3 v operation (wa, wb , and wc grades) all typical specifications are at t a = 25c, v dd1 = v dd2 = 3.0 v. minimum/maximum specifications apply over the entire recommended operation range: 3 . 0 v v dd1 3.6 v, 3.0 v v dd2 3.6 v, ? 40c t a 125c , unless otherwise noted. switching specifications are tested with c l = 15 pf and cmos signal levels , unless otherwise noted . table 13. w a grade w b grade w c grade para meter symbol min typ min min typ max min typ max unit test conditions switching specifications pulse width pw 1000 40 10 ns within pwd limit data rate 1 25 100 mbps within pwd limit propagation delay t phl , t plh 50 35 20 25 33 ns 50% input to 50% output pulse width distortion pwd 10 3 2.5 ns |t plh ? t phl | change vs. temperature 7 3 1.5 ps/c propagation delay skew t psk 38 16 12 ns between any two units at same operating conditions channel matching codirectional t pskcd 5 3 2.5 ns opposing - direction t psko d 10 6 5 ns jitter 2 2 1 ns 7 codir ec t ional c hannel m at c hing is t he abs olut e value of t he dif f er enc e in pr opagat ion delays bet ween any t wo c hannels wit h in p u t s o n t h e s a m e s id e o f t h e is o la t io n b a r r ie r . op p o s in g - dir ec t ional c hannel m at c hing is t he abs olut e value of t he dif f er enc e in pr opagat ion delays bet ween any t wo c hannels wit h input s on oppos ing s ides of t he is ol ation barrier. table 14. parameter symbol 1 mbps C w a, w b, w c grade s 25 mbps C w b, w c grade s 100 mbps C w c grade unit test conditions min typ min min typ max min typ max supply current no load adum1280 / adum1285 i dd1 0.75 1. 4 5.1 9.0 17 23 ma i dd2 2.0 3.5 2.7 4.6 4.8 9 ma adum1281 / adum1286 i dd1 1. 6 2.1 3. 8 5.0 11 15 ma i dd2 1. 7 2.3 3. 9 6.2 11 15 ma table 15 . for all models parameter symbol min typ max unit test conditions dc specifications logic high input threshold v ih 0.7 v ddx v logic low input threshold v il 0.3 v ddx v logic high output volt ages v oh v ddx ? 0.1 3.0 v i ox = ?20 a, v ix = v ixh v ddx ? 0.4 2.8 v i ox = ?4 ma, v ix = v ixh logic low output voltages v ol 0.0 0.1 v i ox = 20 a, v ix = v ixl 0.2 0.4 v i ox = 4 ma, v ix = v ixl input current per channel i i ?10 +0.01 +10 a 0 v v ix v ddx su pply current per channel quiescent input supply current i ddi(q ) 0. 4 0.6 ma quiescent output supply current i ddo (q ) 1. 2 1.7 ma dynamic input supply current i ddi(d) 0.08 ma/mbps dynamic output supply current i ddo (d) 0.0 15 ma/mbps undervo ltage lockout positive v ddx threshold v ddx uv+ 2.6 v negative v ddx threshold v ddx uv ? 2.4 v v ddx hysteresis v ddx uvh 0.2 v ac specifications output rise/fall time t r /t f 3 ns 10% to 90% common - mode transient immunity 1 |cm| 25 35 kv/s v ix = v ddx , v cm = 1000 v, transient magnitude = 800 v refresh period t r 1.6 s 1 |cm| is the maximum common - mode voltage slew rate that can be sustained while maintaining v o > 0.8 v ddx . the common - mode voltage slew rates apply to both rising and falling common - mode voltage edges .
adum1280/adum1281/ad um1285/adum1286 data sheet rev. a | page 8 of 20 electrical characteristicsmixed 5 v/3 v operation (wa, wb, and wc grades) all typical specifications are at t a = 25c, v dd1 = 5 v, v dd2 = 3.0 v. minimum/maximum specifications apply over the entire recommended operation range: 4.5 v v dd1 5.5 v, 3.0 v v dd2 3.6 v; and ?40c t a 125c, unless otherwise noted. switching specifications are tested with c l = 15 pf and cmos signal levels unless otherwise noted. table 16. wa grade wb grade wc grade parameter symbol min typ min min typ max min typ max unit test conditions switching specifications pulse width pw 1000 40 10 ns within pwd limit data rate 1 25 100 mbps within pwd limit propagation delay t phl , t plh 50 35 13 20 26 ns 50% input to 50% output pulse width distortion pwd 10 3 2 ns |t plh ? t phl | change vs. temperature 7 3 1.5 ps/?c propagation delay skew t psk 38 16 12 ns between any two units at same operating conditions channel matching codirectional t pskcd 5 3 2 ns opposing-direction t pskod 10 6 5 ns jitter 2 2 1 ns 7 codirectional channel matching is the absolute value of the difference in propagation delays between any two channels with inp uts on the same side of the isolation barrier. opposing-directional channel matching is the absolute value of the difference in propagation delays between any two channels with inputs on opposing sides of the isolation barrier. table 17. parameter symbol 1 mbpsCwa, wb, wc grades 25 mbpsCwb, wc grades 100 mbpsCwc grade unit test conditions min typ min min typ max min typ max supply current no load adum1280/adum1285 i dd1 1.1 1.6 6.2 7.0 20 25 ma i dd2 2.0 3.5 2.7 4.6 4.8 9.0 ma adum1281/adum1286 i dd1 2.1 2.6 4.9 6.0 15 19 ma i dd2 1.7 2.3 3.9 6.2 11 15 ma table 18. for all models parameter symbol min typ max unit test conditions dc specifications logic high input threshold v ih 0.7 v ddx v logic low input threshold v il 0.3 v ddx v logic high output voltages v oh v ddx ? 0.1 v ddx v i ox = ?20 a, v ix = v ixh v ddx ? 0.4 v ddx ? 0.2 v i ox = ?4 ma, v ix = v ixh logic low output voltages v ol 0.0 0.1 v i ox = 20 a, v ix = v ixl 0.2 0.4 v i ox = 4 ma, v ix = v ixl input current per channel i i ?10 +0.01 +10 a 0 v v ix v ddx supply current per channel quiescent input supply current i ddi(q) 0.54 0.75 ma quiescent output supply current i ddo(q) 1.2 2.0 ma dynamic input supply current i ddi(d) 0.09 ma/mbps dynamic output supply current i ddo(d) 0.02 ma/mbps undervoltage lockout positive v ddx threshold v ddxuv+ 2.6 v negative v ddx threshold v ddxuv? 2.4 v v ddx hysteresis v ddxuvh 0.2 v ac specifications output rise/fall time t r /t f 2.5 ns 10% to 90% common-mode transient immunity 1 |cm| 25 35 kv/s v ix = v ddx , v cm = 1000 v, transient magnitude = 800 v refresh period t r 1.6 s 1 |cm| is the maximum common-mode vo ltage slew rate that can be sustained while maintaining v o > 0.8 v ddx . the common-mode voltage slew rates apply to both rising and falling common-mode voltage edges.
data sheet adum1280/adum1281/adum1285/adum1286 rev. a | page 9 of 20 electrical characteristicsmixed 3 v/5 v operation (wa, wb, and wc grades) all typical specifications are at t a = 25c, v dd1 = 3.0 v, v dd2 = 5 v. minimum/maximum specifications apply over the entire recommended operation range: 3.0 v v dd1 3.6 v, 4.5 v v dd2 5.5 v; and ?40c t a 125c; unless otherwise noted. switching specifications are tested with c l =15 pf and cmos signal levels, unless otherwise noted. table 19. wa grade wb grade wc grade parameter symbol min typ min min typ max min typ max unit test conditions switching specifications pulse width pw 1000 40 10 ns within pwd limit data rate 1 25 100 mbps within pwd limit propagation delay t phl , t plh 50 35 16 24 30 ns 50% input to 50% output pulse width distortion pwd 10 3 2.5 ns |t plh ? t phl | change vs. temperature 7 3 1.5 ps/?c propagation delay skew t psk 38 16 12 ns between any two units at same operating conditions channel matching codirectional t pskcd 5 3 2.5 ns opposing-direction t pskod 10 6 5 ns jitter 2 2 1 ns 7 codirectional channel matching is the absolute value of the difference in propagation delays between any two channels with inp uts on the same side of the isolation barrier. opposing-directional channel matching is the absolute value of the difference in propagation delays between any two channels with inputs on opposing sides of the isolation barrier. table 20. parameter symbol 1 mbpsCwa, wb, wc grades 25 mbpsCwb, wc grades 100 mbpsCwc grade unit test conditions min typ min min typ max min typ max supply current no load adum1280/adum1285 i dd1 0.75 1.4 5.1 9.0 17 23 ma i dd2 2.7 4.5 4.8 7.0 9.5 15 ma adum1281/adum1286 i dd1 1.6 2.1 3.8 5.0 11 15 ma i dd2 1.7 2.3 3.9 6.2 11 15 ma table 21. for all models parameter symbol min typ max unit test conditions dc specifications logic high input threshold v ih 0.7 v ddx v logic low input threshold v il 0.3 v ddx v logic high output voltages v oh v ddx ? 0.1 v ddx v i ox = ?20 a, v ix = v ixh v ddx ? 0.4 v ddx ? 0.2 v i ox = ?4 ma, v ix = v ixh logic low output voltages v ol 0.0 0.1 v i ox = 20 a, v ix = v ixl 0.2 0.4 v i ox = 4 ma, v ix = v ixl input current per channel i i ?10 +0.01 +10 a 0 v v ix v ddx supply current per channel quiescent input supply current i ddi(q) 0.4 0.75 ma quiescent output supply current i ddo(q) 1.6 2.0 ma dynamic input supply current i ddi(d) 0.08 ma/mbps dynamic output supply current i ddo(d) 0.03 ma/mbps undervoltage-lockout positive v ddx threshold v ddxuv+ 2.6 v negative v ddx threshold v ddxuv? 2.4 v v ddx hysteresis v ddxuvh 0.2 v ac specifications output rise/fall time t r /t f 2.5 ns 10% to 90% common-mode transient immunity 1 |cm| 25 35 kv/s v ix = v ddx , v cm = 1000 v, transient magnitude = 800 v refresh period t r 1.6 s 1 |cm| is the maximum common-mode vo ltage slew rate that can be sustained while maintaining v o > 0.8 v ddx . the common-mode voltage slew rates apply to both rising and falling common-mode voltage edges.
adum1280/adum1281/adum1285/adum1286 data sh eet rev. a | page 10 of 20 package characterist ics table 22. parameter symbol min typ max unit test conditions resistance (input - to - output) 1 r i - o 10 13 ? capacitance (input - to - output) 1 c i - o 2 pf f = 1 m hz input capacitance 2 c i 4.0 pf ic junction - to - ambient thermal resistance ja 85 c/w thermocouple located at center of package underside 1 the device is considered a 2 - terminal device; pin 1 through pin 4 are shorted together and pin 5 through pin 8 are shorted together. 2 input capacitance is from any input data pin to ground. regulatory informati on the adum128x is pending approval by the organizations listed in table 23. see table 27 and table 28 for recommended maximum working voltages for specific cross - isolation waveforms and i nsulation levels. table 23. ul (p ending) csa (p ending) vde (p ending) recognized under ul 1577 component recognition program 1 approved under csa component acceptance notice #5a certified according to din v vde v 0884 - 10 (vde v 088 4 - 10): 2006- 12 2 s i ngle protection, 3000 v rms isolation v oltage basic insulation per csa 60950 - 1 - 03 and iec 60950 - 1, 400 v rms ( 565 v peak) maximum working voltage reinforced insulation, 560 v peak file e214100 file 205078 file 2471900 - 4880 - 0001 1 in accordance with ul 1577, each adum128x is proof tested by applying an insulation test voltage 3600 v rms for 1 second (current leakage detection limit = 6 a). 2 in accordance with din v vde v 0884 - 10 , each adum128x is proof tested by applying a n insulation test voltage 1050 v peak for 1 second (partial discharge detection limit = 5 pc). the asterisk (*) marked on the component designates din v vde v 0884 - 10 approval. insulation and safet y - related specificatio ns table 24. parameter symbol value unit conditions rated dielectric insulation voltage 3000 v rms 1 - minute duration minimum external air gap (clearance) l(i01) 4 .0 m m min measured fro m input terminals to output terminals, shortest distance through air minimum external tracking (creepage) l(i02) 4. 0 m m min measured from input terminals to output terminals, shortest distance path along body minimum internal gap (internal clearance) 0. 017 mm min insulation distance through insulation tracking resistance (comparative tracking index ) cti > 400 v din iec 112/vde 0303 part 1 isolation group ii material group (din vde 0110, 1/89, table 1)
data sheet adum1280/adum1281/adum1285/adum1286 rev. a | page 11 of 20 din v vde v 0884 - 10 (vde v 0884 - 10) : 2006 - 12 ins ulation characterist ics these isolators are suitable for reinforced electrical isolation within the safety limit data only . maintenance of the safety data is ensured by protective circuits. the asterisk ( * ) marked on packages denotes din v vde v 0884 - 10 ap proval. table 25. description conditions symbol characteristic unit installation classification per din vde 0110 for rated mains voltage 150 v rms i to iv for rated mains voltage 300 v rms i to iii for rated mains voltage 400 v rms i to ii climatic classification 40/105/21 pollution degree per din vde 0110, table 1 2 maximum working insulation voltage v iorm 560 v p ea k input - to - output test voltage, method b 1 v iorm 1.875 = v pd(m) , 100% production test, t ini = t m = 1 sec, partial discharge < 5 pc v pd(m) 1050 v pea k input - to - output test voltage, method a after environmental tests subgroup 1 v iorm 1.5 = v pd( m) , t ini =60 sec, t m = 10 sec, partial discharge < 5 pc v pd(m) 840 v pea k after input and/or safety test subgroup 2 and subgroup 3 v iorm 1.2 = v pd(m) , t ini = 60 sec, t m = 10 sec, partial discharge < 5 pc v pd(m) 672 v pea k highest allowable overvoltage v iotm 4000 v pea k withstand isolation voltage 1 minute withstand rating v iso 3000 v rms surge isolation voltage v pea k = 10 kv, 1.2 s rise time, 50 s , 50% fall time v iosm 6 000 v pea k safety limiting values maximum value allowed in the event of a failure (see figure 3 ) case temperature t s 150 c side 1 i dd1 current i s1 290 ma insulation resistance at t s v io = 500 v r s >10 9 ? 300 0 50 100 150 200 250 0 50 100 150 200 safety-limiting current (ma) ambient temperature (c) 10444-003 figure 3 . thermal derating curve at v ddx = 5 v , dependence of safety - limiting values with case temperature per din v vde v 0884 - 10 recommended operatin g conditions table 26. parameter symbol min max unit operating temperature t a ?40 +1 2 5 c supply voltages 1 v dd1 , v dd2 a, b, and c grades 2.7 5.5 v wa, wb, and wc grades 3.0 5.5 v input signal rise and fall times 1.0 ms 1 see the dc correctness and magnetic field immunity se ction.
adum1280/adum1281/ad um1285/adum1286 data sheet rev. a | page 12 of 20 absolute maximum ratings t a = 25c, unless otherwise noted. table 27. parameter rating storage temperature (t st ) range ?65c to +150c ambient operating temperature (t a ) range ?40c to +125c supply voltages (v dd1 , v dd2 ) ?0.5 v to +7.0 v input voltages (v ia , v ib ) ?0.5 v to v ddi + 0.5 v output voltages (v oa , v ob ) ?0.5 v to v dd2 + 0.5 v average output current per pin 1 side 1 (i o1 ) ?10 ma to +10 ma side 2 (i o2 ) ?10 ma to +10 ma common-mode transients 2 ?100 kv/s to +100 kv/s 1 see figure 3 for maximum rated current values for various temperatures. 2 refers to common-mode transients across the insulation barrier. common- mode transients exceeding the ab solute maximum ratings may cause latch-up or permanent damage. stresses above those listed under absolute maximum ratings may cause permanent damage to the device. this is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. exposure to absolute maximum rating conditions for extended periods may affect device reliability. esd caution table 28. maximum continuous working voltage 1 parameter max unit constraint ac voltage, bipolar waveform 565 v peak 50-year minimum lifetime ac voltage, unipolar waveform basic insulation 1131 v peak maximum approved working voltage per iec 60950-1 reinforced insulation 560 v peak maximum approved working voltage per iec 60950-1 and vde v 0884-10 dc voltage basic insulation 1131 v peak maximum approved working voltage per iec 60950-1 reinforced insulation 560 v peak maximum approved working voltage per iec 60950-1 and vde v 0884-10 1 refers to continuous voltage magnitude imposed across the isol ation barrier. see the insulation lifetime section for more deta ils.
data sheet adum1280/adum1281/adum1285/adum1286 rev. a | page 13 of 20 pin configurations a nd function descript ions 1 8 2 7 3 6 4 5 top view (not to scale) adum1280/ adum1285 v dd1 v ia v ib gnd 1 v dd2 v oa v ob gnd 2 10444-004 figure 4 . adu m 128 0 /adum1285 pin configuration table 29. adum1280 / adum1285 pin function descriptions pin no. mnemonic description 1 v dd1 sup ply voltage for isolator side 1 ( 2.7 v to 5.5 v for a, b , and c grades, 3.0 v to 5.5 v for wa, wb , and wc grades). 2 v ia logic input a. 3 v ib logic input b. 4 gnd 1 ground 1. ground reference for isolator side 1. 5 gnd 2 grou nd 2. ground reference for isolator side 2. 6 v ob logic output b. 7 v oa logic output a. 8 v dd2 supply voltage for isolator side 2 ( 2.7 v to 5.5 v for a, b , and c grades, 3.0 v to 5.5 v for wa, wb , and wc grades). 1 8 2 7 3 6 4 5 top view (not to scale) adum1281/ adum1286 v dd1 v oa v ib gnd 1 v dd2 v ia v ob gnd 2 10444-005 figure 5 . adum 128 1 /adum1286 pin configuration table 30. adum1281 / adum1286 pin function descriptions pin no. mne monic description 1 v dd1 supply voltage for isolator side 1 ( 2.7 v to 5.5 v for a, b , and c grades, 3.0 v to 5.5 v for wa, wb , and wc grades). 2 v oa logic output a. 3 v ib logic input b. 4 gnd 1 ground 1. ground reference for isolator side 1. 5 g nd 2 ground 2. ground reference for isolator side 2. 6 v ob logic output b. 7 v ia logic input a. 8 v dd2 supply voltage for isolator side 2 ( 2.7 v to 5.5 v for a, b , and c grades, 3.0 v to 5.5 v for wa, wb , and wc grades). for specific layout guideli nes, refer to the an - 1109 application note, recommendations for control of radiated emissions with i coupler devices .
adum1280/adum1281/adum1285/adum1286 data sh eet rev. a | page 14 of 20 table 31. adum1280 truth table (positive logic) v ia input v ib input v dd1 state v dd2 state v oa output v ob output notes h h powered powered h h l l powered powered l l h l powered powered h l l h powered powered l h l l unpowered powered h h outputs return to the input state within 1 .6 s of v ddi power restoration. x x powered unpowered indeterminate indeterminate outputs return to the input state within 1 .6 s of v ddo power restoration. table 32. adum1281 truth table (positive logic) v ia input v ib input v dd1 state v dd2 state v oa output v ob output notes h h powered powere d h h l l powered powered l l h l powered powered h l l h powered powered l h x l unpowered powered indeterminate h outputs return to the input state within 1 .6 s of v dd1 power restoration. l x powered unpowered h indeterminate outputs return to the input state within 1 .6 s of v ddo power restoration. table 33. adum1285 truth table (positive logic) v ia input v ib input v dd1 state v dd2 state v oa output v ob output notes h h powered powered h h l l powered powered l l h l powered powered h l l h powered powered l h l l unpowered powered l l outputs return to the input state within 1 .6 s of v ddi power restoration. x x powered unpowered indeterminate indeterminate outputs return to the input state within 1 .6 s of v ddo power restoration. table 34. adum1286 truth table (positive logic) v ia input v ib input v dd1 state v dd2 state v oa output v ob output notes h h powered powered h h l l powered powered l l h l powered powered h l l h powered powered l h x l u npowered powered indeterminate l outputs return to the input state within 1 .6 s of v dd1 power restoration. l x powered unpowered l indeterminate outputs return to the input state within 1 .6 s of v ddo power restoration.
data sheet adum1280/adum1281/adum1285/adum1286 rev. a | page 15 of 20 typical performance characteristics 10 0 2 4 6 8 0 20 40 60 80 100 10 30 50 70 90 current (ma) data rate (mbps) 5v 3v 10444-006 figure 6 . typical supply current per input channel vs. data rate for 5 v and 3 v operation 10 0 2 4 6 8 0 20 40 60 80 100 10 30 50 70 90 current (ma) data rate (mbps) 5v 3v 10444-007 figure 7 . typical supply current per output channel vs. data rate for 5 v and 3 v operati on (no output load) 10444-008 10 0 4 2 6 8 0 20 40 60 80 100 10 30 50 70 90 current (ma) data rate (mbps) 5v 3v figure 8 . typical supply current per output channel vs. data rate for 5 v and 3 v operation (15 pf output load) 10444-009 20 0 5 10 15 0 20 40 60 80 100 10 30 50 70 90 current (ma) data rate (mbps) 5v 3v figure 9 . typical adum1280 or adum1285 v dd1 supply current vs. data rate for 5 v and 3 v operation 10444-010 20 0 5 10 15 0 20 40 60 80 100 10 30 50 70 90 current (ma) data rate (mbps) 5v 3v figure 10 . typical adum1280 or adum1285 v dd2 supply current vs. data rate for 5 v and 3 v operation 10444-0 1 1 20 0 5 10 15 0 20 40 60 80 100 10 30 50 70 90 current (ma) data rate (mbps) 5v 3v figure 11 . typical adum1281 or adum1286 v dd1 or v dd2 supply current vs. data rate for 5 v and 3 v operation
adum1280/adum1281/ad um1285/adum1286 data sheet rev. a | page 16 of 20 applications information pc board layout the adum128x digital isolator requires no external interface circuitry for the logic interfaces. power supply bypassing is strongly recommended at both input and output supply pins v dd1 and v dd2 (see figure 12). the capacitor value should be between 0.01 f and 0.1 f. the to tal lead length between both ends of the capacitor and the input power supply pin should not exceed 20 mm. the adum128x can readily meet cispr 22 class a (and fcc class a) emissions standards, as well as the more stringent cispr 22 class b (and fcc class b) standards in an unshielded environment, with proper pcb design choices. refer to the an-1109 applicaton note, recommendations for control of radiated emissions with icoupler devices for pcb- related emi mitigation techniques, including board layout and stack-up issues. propagation delay-related parameters propagation delay is a parameter that describes the time it takes a logic signal to propagate through a component. the input-to- output propagation delay time for a high-to-low transition may differ from the propagation delay time of a low-to-high transition. input (v ix ) output (v ox ) t plh t phl 50% 50% 10444-012 figure 12. propagation delay parameters pulse width distortion is the maximum difference between these two propagation delay values and an indication of how accurately the timing of the input signal is preserved. channel-to-channel matching refers to the maximum amount the propagation delay differs between channels within a single adum128x component. propagation delay skew refers to the maximum amount the propagation delay differs between multiple adum128x components operating under the same conditions. dc correctness and magnetic field immunity positive and negative logic transitions at the isolator input cause narrow (~1 ns) pulses to be sent via the transformer to the decoder. the decoder is bistable and is, therefore, either set or reset by the pulses indicating input logic transitions. in the absence of logic transitions at the input for more than ~1.6 s, a periodic set of refresh pulses indicative of the correct input state are sent to ensure dc correctness at the output. if the decoder receives no pulses for more than about 6.4 s, the input side is assumed to be unpowered or nonfunctional, in which case, the isolator output is forced to a default low state by the watchdog timer circuit. the limitation on the devices magnetic field immunity is set by the condition in which induced voltage in the transformer receiving coil is sufficiently large to either falsely set or reset the decoder. the following analysis defines such conditions. the adum1280 is examined in a 3 v operating condition because it represents the most susceptible mode of operation of this product. the pulses at the transformer output have an amplitude greater than 1.5 v. the decoder has a sensing threshold of about 1.0 v, therefore establishing a 0.5 v margin in which induced voltages can be tolerated. the voltage induced across the receiving coil is given by v = (? d / dt ) ? r n 2 ; n = 1, 2, , n where: is the magnetic flux density. r n is the radius of the n th turn in the receiving coil. n is the number of turns in the receiving coil. given the geometry of the receiving coil in the adum1280 and an imposed requirement that the induced voltage be, at most, 50% of the 0.5 v margin at the decoder, a maximum allowable magnetic field is calculated, as shown in figure 13. magnetic field frequency (hz) 100 maximum allowable magnetic flux density (kgauss) 0.001 1m 10 0.01 1k 10k 10m 0.1 1 100m 100k 10444-013 figure 13. maximum allowable external magnetic flux density
data sheet adum1280/adum1281/adum1285/adum1286 rev. a | page 17 of 20 for example, at a magnetic field frequency of 1 mhz, the maximum allowable magnetic field of 0. 08 kgauss induces a voltage of 0.25 v at the receiving coil. this is about 50% of the sensing threshold and does not ca use a faulty output transition. if such an event occurs, with the worst - case polarity, during a transmitted pulse , it would reduce the received pulse from >1.0 v to 0.75 v. this is still well above the 0.5 v sensing threshold of the decoder. the preceding magnetic flux density values correspond to specific current magnitudes at given distances away from the adum1280 transformers. figure 14 expresses these allowable cur rent magni - tudes as a function of frequency for selected distances. t he adum1280 is very insensitive to external fields. o nly extremely large, high frequency currents, very close to the compone nt could potentially be a concern. for the 1 mhz example noted, one would have to place a 0.2 k a current 5 mm away from the adum1280 to affect component operation. magnetic field frequency (hz) maximum allowable current (ka) 1000 100 10 1 0.1 0.01 1k 10k 100m 100k 1m 10m distance = 5mm distance = 1m distance = 100mm 10444-014 figure 14 . maximum allowable current for various current to adum1280 spacings note that at combinations of strong magnetic field and high frequency, any loops formed by printed circuit board traces could induce sufficiently large error voltages to trigger the thresholds of succeeding circuitry. take care to avoid pcb structures that form loops. power consumption the supply current at a given channel of the adum 128x isolator is a function of the supply voltage, the data rate of the channel , and the output load of the channel . for each input channel, the supply current is given by i ddi = i ddi ( q ) f 0.5 f r i ddi = i d di ( d) (2 f ? f r ) + i ddi ( q ) f > 0.5 f r for each output channel, the supply current is given by i dd o = i ddo ( q ) f 0.5 f r i ddo = ( i ddo ( d ) + (0.5 10 ?3 ) c l v ddo ) (2 f ? f r ) + i ddo ( q ) f > 0.5 f r where: i ddi (d) , i ddo (d) are the input and output dynamic supply currents per channe l (ma/ mbps ). c l is the output load capacitance (pf). v ddo is the output supply voltage (v). f is the input logic signa l frequency (mhz); it is half the input data rate , expressed in units of mbps . f r is the input stage refresh rate ( mbps ) = 1/ t r (s) . i ddi (q) , i ddo (q) are the specified input and output quiescent supply currents (ma). to calculate the total v dd1 and v dd2 supply current, the supply currents for each input and output channel corresponding to v dd1 and v dd2 are calculated and totaled. figure 6 and figure 7 show per - channel supply currents as a function of data rate for an unloaded output condition. figure 8 show s the per - channel supply current as a function of data r ate for a 15 pf output condition. figure 9 through figure 11 show the total v dd1 and v dd2 supply current as a function of data rate for adum1280 / adum1281 channel configurations.
adum1280/adum1281/adum1285/adum1286 data sh eet rev. a | page 18 of 20 insulation lifetime all insulation structures eventually break down when subjected to voltage stress over a sufficiently long period. the rate of in sulation degradation is dependent on the characteristics of the voltage waveform applied across the insulation. in addition to the testing performed by the regulato ry agencies, analog devices carries out an extensive set of evaluations to determine the lif etime of the insulation structure within the adum128x . analog devices performs accelerated life testing using voltage levels higher than the rated continuous working voltage. acceleration factors for several o perating conditions are determined. these factors allow calculation of the time to failure at the actual working voltage. the values shown in table 28 summarize the peak voltage for 50 years of service life for a bipolar ac operating condition and the maximum csa/vde approved working voltages. in many cases, the approved working voltage is higher than the 50- year service life voltage. operation at these high working voltages can lead to shortened insulation life in some cases. the insulation lifetime of the adum128x depends on the voltage waveform type imposed across the isolation barrier. the i coupler insulation structure degrades at different rates depending on whe ther the waveform is bipolar ac, unipolar ac, or dc. figure 15, figure 16 , and figure 17 illustrate these different isolation voltage waveforms. bipolar ac voltage is the most s tringent environment. the goal of a 50 - year operating lifetime under the ac bipolar condition determines the analog devices recommended maximum working voltage. in the case of unipolar ac or dc voltage, the stress on the insulation is significantly lower . this allows operation at higher working voltages while still achieving a 50 - year service life. the working voltages listed in table 28 can be applied while main - taining the 50 - year minimum lifetime provided the v oltage conforms to either the unipolar ac or dc voltage case. any cross - insulation voltage waveform that does not conform to figure 16 or figure 17 should be treated as a bipolar ac waveform, and its peak voltage should be limited to the 50 - year lifetime voltage value listed in table 28. note that the voltage presented in figure 17 is shown as sinusoidal for illustration purposes only. it is meant to represent any voltage waveform varying between 0 v and some limiting value. the limiting value can be positive or negative, but the voltage cannot cross 0 v. 0v rated peak voltage 10444-015 figure 15 . bipolar ac waveform 0v rated peak voltage 10444-016 figure 16 . unipolar ac waveform 0v rated peak voltage 10444-017 figure 17 . dc waveform
data sheet adum1280/adum1281/adum1285/adum1286 rev. a | page 19 of 20 outline dimensions controlling dimensions are in millimeters; inch dimensions (in parentheses) are rounded-off millimeter equivalents for reference only and are not appropriate for use in design. compliant to jedec standards ms-012-aa 012407-a 0.25 (0.0098) 0.17 (0.0067) 1.27 (0.0500) 0.40 (0.0157) 0.50 (0.0196) 0.25 (0.0099) 45 8 0 1.75 (0.0688) 1.35 (0.0532) seating plane 0.25 (0.0098) 0.10 (0.0040) 4 1 85 5.00 (0.1968) 4.80 (0.1890) 4.00 (0.1574) 3.80 (0.1497) 1.27 (0.0500) bsc 6.20 (0.2441) 5.80 (0.2284) 0.51 (0.0201) 0.31 (0.0122) coplanarity 0.10 figure 18. 8-lead standard small outline package [soic_n] narrow body (r-8) dimensions shown in millimeters (inches) ordering guide model 1 ,2,3 no. of inputs, v dd1 side no. of inputs, v dd2 side max data rate max prop delay, 5 v output default state temperature range package description package option adum1280arz 2 0 1 mbps 50 high ?40 c to +125 c 8-lead soic_n r-8 adum1280warz 2 0 1 mbps 50 high ?40 c to +125 c 8-lead soic_n r-8 adum1280brz 2 0 25 mbps 35 high ?40 c to +125 c 8-lead soic_n r-8 adum1280wbrz 2 0 25 mbps 35 high ?40 c to +125 c 8-lead soic_n r-8 adum1280crz 2 0 100 mbps 24 high ?40 c to +125 c 8-lead soic_n r-8 adum1280wcrz 2 0 100 mbps 24 high ?40 c to +125 c 8-lead soic_n r-8 adum1281arz 1 1 1 mbps 50 high ?40 c to +125 c 8-lead soic_n r-8 adum1281warz 1 1 1 mbps 50 high ?40 c to +125 c 8-lead soic_n r-8 adum1281brz 1 1 25 mbps 35 high ?40 c to +125 c 8-lead soic_n r-8 adum1281wbrz 1 1 25 mbps 35 high ?40 c to +125 c 8-lead soic_n r-8 adum1281crz 1 1 100 mbps 24 high ?40 c to +125 c 8-lead soic_n r-8 adum1281wcrz 1 1 100 mbps 24 high ?40 c to +125 c 8-lead soic_n r-8 adum1285arz 2 0 1 mbps 50 low ?40 c to +125 c 8-lead soic_n r-8 adum1285warz 2 0 1 mbps 50 low ?40 c to +125 c 8-lead soic_n r-8 adum1285brz 2 0 25 mbps 35 low ?40 c to +125 c 8-lead soic_n r-8 adum1285wbrz 2 0 25 mbps 35 low ?40 c to +125 c 8-lead soic_n r-8 adum1285crz 2 0 100 mbps 24 low ?40 c to +125 c 8-lead soic_n r-8 adum1285wcrz 2 0 100 mbps 24 low ?40 c to +125 c 8-lead soic_n r-8 adum1286arz 1 1 1 mbps 50 low ?40 c to +125 c 8-lead soic_n r-8 adum1286warz 1 1 1 mbps 50 low ?40 c to +125 c 8-lead soic_n r-8 adum1286brz 1 1 25 mbps 35 low ?40 c to +125 c 8-lead soic_n r-8 adum1286wbrz 1 1 25 mbps 35 low ?40 c to +125 c 8-lead soic_n r-8 adum1286crz 1 1 100 mbps 24 low ?40 c to +125 c 8-lead soic_n r-8 ADUM1286WCRZ 1 1 100 mbps 24 low ?40 c to +125 c 8-lead soic_n r-8 1 z = rohs compliant part. 2 tape and reel are available. the addition of an -rl7 suffix designates a 7 (1,000 unit s) tape and reel option. 3 w = qualified for auto motive applications. automotive products the adum1280w , adum1281w , adum1285w , and adum1286w models are available with controlled manufacturing to support the quality and reliability requirements of automotive applications. note that these automotive models may have specifications that differ from the commercial models; therefore, designers should review th e specifications section of this data sheet carefully. only th e automotive grade products shown are available for use in automotive applications. contact your local analog devices account representative for specific product ordering information and to obtain the specific automotive reliability reports for these mo dels.
adum1280/adum1281/adum1285/adum1286 data sh eet rev. a | page 20 of 20 notes ? 2012 C 2013 analog devices, inc. all rights reserved. trademarks and registered trademarks are the property of their respective owners. d10444 - 0 - 3/13(a)

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