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1. product profile 1.1 general description 160 w ldmos packaged asymmetrical doherty power transistor for base station applications at frequencies from 2496 mhz to 2690 mhz. [1] test signal: 3gpp test model 1; 1 to 64 dp ch; par = 7.2 db at 0.01 % probability on ccdf. 1.2 features and benefits ? excellent ruggedness ? high efficiency ? low thermal resistance providing excellent thermal stability ? decoupling leads to enable improved video bandwidth ? lower output capacitance for improved performance in doherty applications ? designed for low memory effects prov iding excellent pre-distortability ? internally matched for ease of use ? integrated esd protection ? compliant to restriction of hazardous substances (rohs) directive 2002/95/ec 1.3 applications ? rf power amplifier for w-cdma base statio ns and multi carrier applications in the 2496 mhz to 2690 mhz frequency range blc8g27ls-160av power ldmos transistor rev. 2 ? 3 june 2014 product data sheet table 1. typical performance typical rf performance at t case = 25 ? c in the doherty demo board. test signal f v ds p l(av) g p ? d acpr (mhz) (v) (w) (db) (%) (dbc) 1-carrier w-cdma 2496 to 2690 28 31.6 14.5 43 ? 30 [1]
blc8g27ls-160av all information provided in this document is subject to legal disclaimers. ? nxp semiconductors n.v. 2014. all ri ghts reserved. product data sheet rev. 2 ? 3 june 2014 2 of 14 nxp semiconductors blc8g27ls-160av power ldmos transistor 2. pinning information [1] connected to flange. 3. ordering information 4. limiting values [1] continuous use at maximum temperature will affect the reliability, for details refer to the on-line mtf calculator. 5. thermal characteristics table 2. pinning pin description simplified outline graphic symbol 1 drain1 (main) 2 drain2 (peak) 3 gate1 (main) 4 gate2 (peak) 5 video decoupling (main) 6 video decoupling (peak) 7source [1] d d d table 3. ordering information type number package name description version blc8g27ls-160av - air cavity plastic earless flanged package; 6 leads sot1275-1 table 4. limiting values in accordance with the absolute maximum rating system (iec 60134). symbol parameter conditions min max unit v ds drain-source voltage - 65 v v gs gate-source voltage ? 0.5 +13 v t stg storage temperature ? 65 +150 ?c t j junction temperature [1] - 225 ?c table 5. thermal characteristics symbol parameter conditions typ unit main device r th(j-case) thermal resistance from junction to case t case =80 ?c; v ds =28v; i dq =490ma p l = 32 w 0.509 k/w p l = 100 w 0.363 k/w blc8g27ls-160av all information provided in this document is subject to legal disclaimers. ? nxp semiconductors n.v. 2014. all ri ghts reserved. product data sheet rev. 2 ? 3 june 2014 3 of 14 nxp semiconductors blc8g27ls-160av power ldmos transistor 6. characteristics peak device r th(j-case) thermal resistance from junction to case t case =80 ?c; v ds =28v; i dq =490ma p l = 32 w 0.069 k/w p l = 100 w 0.284 k/w table 5. thermal characteristics ?continued symbol parameter conditions typ unit table 6. dc characteristics t j = 25 ? c unless otherwise specified. symbol parameter conditions min typ max unit main device v (br)dss drain-source breakdown voltage v gs =0v; i d =0.9ma 65--v v gs(th) gate-source threshold voltage v ds =10 v; i d =90ma 1.5 1.9 2.3 v v gsq gate-source quiescent voltage v ds =28 v; i d = 300 ma 1.6 2.0 2.4 v i dss drain leakage current v gs =0v; v ds =28v - - 1.4 ? a i dsx drain cut-off current v gs =v gs(th) +3.75 v; v ds =10v -17- a i gss gate leakage current v gs =11v; v ds = 0 v - - 140 na g fs forward transconductance v ds =10v; i d = 90 ma - 0.78 - s r ds(on) drain-source on-state resistance v gs =v gs(th) + 3.75 v; i d =3.15a - 174 260 m ? peak device v (br)dss drain-source breakdown voltage v gs =0v; i d =1.1ma 65--v v gs(th) gate-source threshold voltage v ds =10 v; i d = 110 ma 1.5 1.9 2.3 v v gsq gate-source quiescent voltage v ds =28 v; i d = 600 ma 1.6 2.0 2.4 v i dss drain leakage current v gs =0v; v ds =28v - - 1.4 ? a i dsx drain cut-off current v gs =v gs(th) +3.75 v; v ds =10v -20- a i gss gate leakage current v gs =11v; v ds = 0 v - - 140 na g fs forward transconductance v ds =10v; i d =110ma - 0.97 - s r ds(on) drain-source on-state resistance v gs =v gs(th) + 3.75 v; i d =3.85a - 145 215 m ? table 7. rf characteristics test signal: 1-carrier w-cdma; par = 7.2 db at 0.01 % probability on the ccdf; 3gpp test model 1; 1 - 64 dpch; f 1 = 2496 mhz; f 2 = 2690 mhz; rf performance at v ds =28v; i dq = 250 ma (main); v gs(amp)peak = 0.70 v; t case =25 ? c; unless otherwise specified; in an asymmetrical doherty production test circuit at 2496 mhz to 2690 mhz. symbol parameter conditions min typ max unit g p power gain p l(av) = 31.6 w 13.3 14.3 - db rl in input return loss p l(av) = 31.6 w - ? 13 ? 6db ? d drain efficiency p l(av) = 31.6 w 36 41 - % acpr adjacent channel power ratio p l(av) = 31.6 w - ? 30 ? 25 dbc blc8g27ls-160av all information provided in this document is subject to legal disclaimers. ? nxp semiconductors n.v. 2014. all ri ghts reserved. product data sheet rev. 2 ? 3 june 2014 4 of 14 nxp semiconductors blc8g27ls-160av power ldmos transistor 7. test information 7.1 ruggedness in doherty operation the blc8g27ls-160av is capable of withstanding a load mismatch corresponding to a vswr = 10 : 1 through all phases under the following conditions: v ds =28v; i dq = 250 ma (main); v gs(amp)peak =0.7v; p l = 120 w (cw); f = 2496 mhz. 7.2 impedance information [1] z s and z l defined in figure 1 . [2] at 3 db gain compression. table 8. rf characteristics test signal: 1-carrier w-cdma; par = 7.2 db at 0.01 % probability on the ccdf; 3gpp test model 1; 1 - 64 dpch; f = 2690 mhz; rf performance at v ds = 28 v; i dq = 250 ma (main); v gs(amp)peak = 0.7 v; t case = 25 ? c; unless otherwise specified; in an asymmetrical doherty production test circuit at 2496 mhz to 2690 mhz. symbol parameter conditions min typ max unit par o output peak-to-average ratio p l(av) = 63 w 3.75 4.7 - db p l(m) peak output power 146 170 - w table 9. typical impedance of main device measured load-pull data of main device; i dq = 570 ma (main); v ds = 28 v. f z s [1] z l [1] p l [2] ? d [2] g p [2] (mhz) (? ) (? ) (w) (%) (db) maximum power load 2496 2 ? j6.9 1.6 ? j7.6 109 56 13.7 2600 3 ? j7 1.5 ? j8.1 107 52.8 13.9 2690 5.2 ? j8.7 1.5 ? j8.1 103 54.6 14.8 maximum drain efficiency load 2496 2 ? j6.9 2.6 ? j6.6 89 64 15.6 2600 3 ? j7 2.6 ? j6.6 79 63 16.5 2690 5.2 ? j8.7 2.1 ? j7.1 81 61 16.7 table 10. typical impedance of peak device measured load-pull data of peak device; i dq = 680 ma (peak); v ds = 28 v. f z s [1] z l [1] p l [2] ? d [2] g p [2] (mhz) (? ) (? ) (w) (%) (db) maximum power load 2496 2 ? j6.9 3.3 ? j8.3 128 56.9 15.2 2600 3 ? j7 3.3 ? j8.3 118 57 15.6 2690 5.2 ? j8.7 4 ? j10 120 52.5 15.6 blc8g27ls-160av all information provided in this document is subject to legal disclaimers. ? nxp semiconductors n.v. 2014. all ri ghts reserved. product data sheet rev. 2 ? 3 june 2014 5 of 14 nxp semiconductors blc8g27ls-160av power ldmos transistor [1] z s and z l defined in figure 1 . [2] at 3 db gain compression. 7.3 recommended impedances for doherty design [1] z s and z l defined in figure 1 . [2] at 3 db gain compression. [3] at p l(av) = 44.5 dbm. [1] z s and z l defined in figure 1 . [2] at 3 db gain compression. [3] at p l(av) = 44.5 dbm. maximum drain efficiency load 2496 2 ? j6.9 3.5 ? j5.8 94 63 17 2600 3 ? j7 3.5 ? j5.8 83 60 17.7 2690 5.2 ? j8.7 3.3 ? j7.7 97 59 17.4 fig 1. definition of transistor impedance table 10. typical impedance of peak device ?continued measured load-pull data of peak device; i dq = 680 ma (peak); v ds = 28 v. f z s [1] z l [1] p l [2] ? d [2] g p [2] (mhz) (? ) (? ) (w) (%) (db) d d i g u d l q = / = 6 j d w h table 11. typical impedance of main device at 1 : 1 load measured load-pull data of main device; i dq = 570 ma (main); v ds = 28 v. f z s [1] z l [1] p l [2] ? d [3] g p [3] (mhz) (? ) (? ) (dbm) (%) (db) 2496 2 ? j6.9 2.7 ? j7.1 49.7 40 18.5 2600 3 ? j7 2.7 ? j7.1 49.4 41 19.3 2690 5.2 ? j8.7 2.7 ? j7.1 49.1 42 19.5 table 12. typical impedance of main device at 1 : 2.5 load measured load-pull data of main device; i dq = 750 ma (main); v ds = 28 v. f z s [1] z l [1] p l [2] ? d [3] g p [3] (mhz) (? ) (? ) (dbm) (%) (db) 2496 2 ? j6.9 2.9 ? j4.5 44.56 48 19.8 2600 3 ? j7 2.9 ? j4.5 44.44 53 20.9 2690 5.2 ? j8.7 3 ? j4.9 44.5 50.3 20.8 blc8g27ls-160av all information provided in this document is subject to legal disclaimers. ? nxp semiconductors n.v. 2014. all ri ghts reserved. product data sheet rev. 2 ? 3 june 2014 6 of 14 nxp semiconductors blc8g27ls-160av power ldmos transistor 7.4 vbw in doherty operation the blc8g27ls-160av shows 130 mhz (typical) video bandwidth in doherty demo board in 2600 mhz at v ds =28v; i dq = 250 ma and v gs(amp)peak =0.8v. 7.5 test circuit printed-circuit board (pcb): rogers ro4350b; ? r = 3.5; thickness = 0.508 mm; thickness copper plating = 35 ? m. see table 13 for a list of components. fig 2. component layout table 13. list of components see figure 2 for component layout. component description value remarks c1, c2 multilayer ceramic chip capacitor 0.3 pf atc 600f c4 multilayer ceramic chip capacitor 3.3 pf atc 600f c5, c22, c23, c24, c25, c26, c27 multilayer ceramic chip capacitor 10 pf atc 600f c12, c13 multilayer ceramic chip capacitor 1 ? f murata, smd 1206 c14, c15, c16, c17 multilayer ceramic chip capacitor 10 ? f murata, smd 1206 c18, c19 electroly tic capacitor 2200 ? f, 63 v bccomponents p1, p2, p3 copper foil strip - needed for tuning r1, r2 resistor 5.1 ? smd 0805 3 & |