this specification documents the detailed requirements for analog devices space qualified die including die qualification as described for class k in mil - prf - 38534, appendix c, table c - ii except as modified herein. the manufacturing flow describ ed in the standard die products program brochure at http://www.analog.com/aerospace is to be considered a part of this specification. this data sheet specifically details the space grade version of this product. a more detailed operational description and a complete data sheet for commercial product grades can be found at www.analog.com/ad565 the complete part number(s) of this specification follow: part number description ad565 - 000c 12 - bit, c urrent output, complete high speed d/a converter
v cc to power ground . ..0 to +18v dc v ee to power ground ......0 to - 18v dc voltage on dac output (pin 9) .. ..... - 3v dc to +12v dc digital inputs (pins 13 to 24) to power ground . . - 1.0v dc to +7.0v dc ref in to ref ground .... .. . 12v dc bipolar offset to reference ground .. 12v dc 10v span r to reference ground . ...12v dc 20v span r to reference ground . ...24v dc ref out . ...indefinite short to power ground momentary short to v cc power dissipation ..1000 mw storage temperature range. - 65c to +150c operating temperature range. - 55c to +125c junction temperature (t j ) . . .+150c 1 / stresses above the absolute maximum rating may cause per manent damage to the device. extended operation at the maximum levels may degrade performance and affect reliability. positive supply voltage (v cc ) .. +15v negative supply voltage (v ee ) .. .. - 15v operating ambi ent temperature range... .. - 55c to +125c in accordance with class - k version of mil - prf - 38534, appendix c, table c - ii, except as modifie d herein. ( a ) qual sample package C sidebrazed dip ( b ) qual sample size and qual acceptance criteria C 10/0 ( c ) pre - screen electrical test over temperature performed post - assembly prior to die qualification .
? ? ? ? ? ? ? ? ? table i notes: 1 . v cc = +15v, v ee = - 15v, v ih = 2.0v, v il = 0.8v, t a = 25 ? c. 2 . msb on, all other bits off. 3 . the r eference output is loaded with 0.5ma reference input current, 1.0ma bipolar offset current, and 1.5ma additional current. 4 . guaranteed for +11.4 ? v cc ? +16.5v. 5 . guaranteed for - 11.4 ? v ee ? - 16.5v.
? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? t able ii notes: 1 . v cc = +15v, v ee = - 15v, v ih = 2.0v, v il = 0.8v. 2 . msb on, all other bits off. 3 . in subgroup 1, the reference output is loaded with 0.5ma reference input current, 1.0ma bipolar offset current, and 1.5ma add itional current. in subgroup 2 and 3, on ly the 0.5ma reference input current is applied. the reference must be buffered to supply external loads at elevated temperatures. 4 . guaranteed for +11.4 ? v cc ? +16.5v. 5 . guaranteed for - 11.4 ? v ee ? - 16.5v.
? ? 7 .1 ht rb is not applicable for this drawing. 7 .2 burn - in is per mil - std - 883 method 1015 test condition b or c. 7 .3 steady state life test is per mil - std - 883 method 1005.
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