voltage regulators 1 an79mxx/an79mxxf series 3-pin negative output voltage regulator (500 ma type) overview the an79mxx series and the an79mxxf series are 3- pin fixed negative output type monolithic voltage regula- tors. stabilized fixed output voltage is obtained from un- stable dc input voltage without using any external com- ponents. 12 types of output voltage are available; ? 5v, ? 6v, ? 7v, ? 8v, ? 9v, ? 10v, ? 12v, ? 15v, ? 18v, ? 20v and ? 24v. they can be used widely in power circuits with current capacity of up to 500ma. features ? no external components ? output voltage: ? 5v, ? 6v, ? 7v, ? 8v, ? 9v, ? 10v, ? 12v, ? 15v, ? 18v, ? 20v, ? 24v ? built-in overcurrent limit circuit ? built-in thermal overload protection circuit ? built-in aso (area of safe operation) protection circuit hsip003-p-0000 an79mxx series unit: mm an79mxxf series unit: mm 2.54 2.54 0.8 (2.0) (2.5) 10.50.3 +0.15 ?0.05 1.4 +0.15 ?0.05 0.45 +0.2 ?0.0 (4.5) 8.70.2 15.40.2 12.50.2 17.00.2 26.10.2 29.00.3 (13.6) (10.35) 4.50.2 10.00.3 1.40.1 3.70.1 2.90.1 3.10 0.10 (0.40) (4.30) 5.30 10.50 0.30 16.70 0.30 4.50 0.25 13.60 0.25 2.54 2 13 0.80 0.20 1.40 0.20 (1.73) 2.77 0.30 3.80 0.25 17.00 0.25 8.70 0.30 2.00 0.25 2.50 0.25 0.40 +0.10 ? 0.05 4.50 0.30 4.20 0.25 block diagram common output input starter voltage reference error amp. r 1 q 1 pass tr r sc current limiter thermal protection r 2 1 3 2 + ? 1: common 2: input 3: output 1: common 2: input 3: output hsip003-p-0000a maintenance/ discontinued maintenance/discontinued includes following four product lifecycle stage. planed maintenance type maintenance type planed discontinued typed discontinued type please visit following url about latest information. http://www.semicon.panasonic.co.jp/en/
an79mxx/an79mxxf series voltage regulators 2 absolute maximum ratings at t a = 25 c electrical characteristics at t a = 25 c ? an79m05, an79m05f ( ? 5v type) v i p d t opr t stg v v w c c ? 35 * 1 ? 40 * 2 15 * 3 10.25 * 3 ? 20 + 80 ? 55 + 150 an79mxx series an79mxxf series * 1 an79m05/f, AN79M06/f, an79m07/f, an79m08/f, an79m09/f, an79m10/f, an79m12/f, an79m15/f, an79m18/f * 2 an79m20/f, an79m24/f * 3 follow the derating curve. when t j exceeds 150 c, the internal circuit cuts off the output. g parameter symbol rating unit input voltage power dissipation operating ambient temperature storage temperature v o ? 5.2 v ? 5 v o v reg in 50 mv 3 v i = ? 7 to ? 25v, t j = 25 c mv reg l mv 20 i o = 5 to 500ma, t j = 25 c mv i o = 5 to 350ma, t j = 25 c v i = ? 8 to ? 18v, t j = 25 c ma 2 1 i bias ma v i = ? 8 to ? 25v, t j = 25 c ma 125 i o = 5 to 350ma, t j = 25 c v no db f = 10hz to 100khz, t a = 25 c 0.8 0.4 30 ? 5.25 100 50 4 60 ? 4.8 ? 4.75 rr v i = ? 8 to ? 18v, i o = 100ma, f = 120hz, t a = 25 c v 1.1 ma 50 ma 1000 v i = ? 35v, t j = 25 c 10 ? 0.4 i o = 5ma, t j = 0 to 125 c ( yp ) v i = ? 7 to ? 25v, i o = 5 to 350ma, p d * t j = 25 c t j = 25 c t j = 25 c t j = 25 c mv/ c ? i bias(in) ? i bias(l) v v dif(min) i o(short) i o(peak) ? v o /t a parameter symbol conditions min typ max unit output voltage output voltage tolerance line regulation load regulation bias current bias current fluctuation to input bias current fluctuation to load output noise voltage ripple rejection ratio minimum input/output voltage difference output short-circuit current peak output current output voltage temperature coefficient note 1) the specified condition t j = 25 c means that the test should be carried out within so short a test time (within 10ms) that the characteristic value drift due to the chip junction temperature rise can be ignored. note 2) unless otherwise specified, v i = ? 10v, i o = 350ma, c i = 2 f, c o = 1 f and t j = 0 to 125 c. * an79m05: 15w, an79m05f: 10.25w maintenance/ discontinued maintenance/discontinued includes following four product lifecycle stage. planed maintenance type maintenance type planed discontinued typed discontinued type please visit following url about latest information. http://www.semicon.panasonic.co.jp/en/
voltage regulators an79mxx/an79mxxf series 3 electrical characteristics at t a = 25 c (continued) ? AN79M06, AN79M06f ( ? 6v type) ? an79m07, an79m07f ( ? 7v type) v o ? 6.25 v ? 6 v o v reg in 60 mv 5 v i = ? 8 to ? 25v, t j = 25 c mv reg l mv 20 i o = 5 to 500ma, t j = 25 c mv i o = 5 to 350ma, t j = 25 c v i = ? 9 to ? 19v, t j = 25 c ma 2 1.5 i bias ma v i = ? 9 to ? 25v, t j = 25 c ma 150 i o = 5 to 350ma, t j = 25 c v no db f = 10hz to 100khz, t a = 25 c 0.8 0.4 40 ? 6.3 120 60 4 60 ? 5.75 ? 5.7 rr v i = ? 9 to ? 19v, i o = 100ma, f = 120hz, t a = 25 c v 1.1 ma 50 ma 1000 v i = ? 35v, t j = 25 c 10 ? 0.4 i o = 5ma, t j = 0 to 125 c note 1) the specified condition t j = 25 c means that the test should be carried out within so short a test time (within 10ms) that the characteristic value drift due to the chip junction temperature rise can be ignored. note 2) unless otherwise specified, v i = ? 11v, i o = 350ma, c i = 2 f, c o = 1 f and t j = 0 to 125 c * AN79M06: 15w, AN79M06f: 10.25w v i = ? 8 to ? 25v, i o = 5 to 350ma, p d * t j = 25 c t j = 25 c t j = 25 c t j = 25 c mv/ c ? i bias(in) ? i bias(l) v v dif(min) i o(short) i o(peak) ? v o /t a output voltage output voltage tolerance line regulation load regulation bias current bias current fluctuation to load output noise voltage ripple rejection ratio minimum input/output voltage difference output short-circuit current peak output current output voltage temperature coefficient parameter symbol conditions min typ max unit bias current fluctuation to input v o ? 7.3 v ? 7 v o v reg in 70 mv 6 v i = ? 9 to ? 25v, t j = 25 c mv reg l mv 20 i o = 5 to 500ma, t j = 25 c mv i o = 5 to 350ma, t j = 25 c v i = ? 10 to ? 20v, t j = 25 c ma 2 2 i bias ma v i = ? 10 to ? 25v, t j = 25 c ma 175 i o = 5 to 350ma, t j = 25 c v no db f = 10hz to 100khz, t a = 25 c 0.8 0.4 35 ? 7.35 140 70 4 59 ? 6.7 ? 6.65 rr v i = ? 10 to ? 20v, i o = 100ma, f = 120hz, t a = 25 c v 1.1 ma 50 ma 1000 v i = ? 35v, t j = 25 c 10 ? 0.5 i o = 5ma, t j = 0 to 125 c ( yp ) note 1) the specified condition t j = 25 c means that the test should be carried out within so short a test time (within 10ms) that the characteristic value drift due to the chip junction temperature rise can be ignored. note 2) unless otherwise specified, v i = ? 12v, i o = 350ma, c i = 2 f, c o = 1 f and t j = 0 to 125 c * an79m07: 15w, an79m07f: 10.25w v i = ? 9 to ? 25v, i o = 5 to 350ma, p d * t j = 25 c t j = 25 c t j = 25 c t j = 25 c mv/ c ? i bias(in) ? i bias(l) v v dif(min) i o(short) i o(peak) ? v o /t a output voltage output voltage tolerance line regulation load regulation bias current bias current fluctuation to load output noise voltage ripple rejection ratio minimum input/output voltage difference output short-circuit current peak output current output voltage temperature coefficient parameter symbol conditions min typ max unit bias current fluctuation to input maintenance/ discontinued maintenance/discontinued includes following four product lifecycle stage. planed maintenance type maintenance type planed discontinued typed discontinued type please visit following url about latest information. http://www.semicon.panasonic.co.jp/en/
an79mxx/an79mxxf series voltage regulators 4 electrical characteristics at t a = 25 c (continued) ? an79m08, an79m08f ( ? 8v type) ? an79m09, an79m09f ( ? 9v type) v o ? 8.3 v ? 8 v o v reg in 80 mv 6 v i = ? 10.5 to ? 25v, t j = 25 c mv reg l mv 25 i o = 5 to 500ma, t j = 25 c mv i o = 5 to 350ma, t j = 25 c v i = ? 11 to ? 21v, t j = 25 c ma 2 2 i bias ma v i = ? 10.5 to ? 25v, t j = 25 c ma 200 i o = 5 to 350ma, t j = 25 c v no db f = 10hz to 100khz, t a = 25 c 0.8 0.4 40 ? 8.4 160 80 4 59 ? 7.7 ? 7.6 rr v i = ? 11.5 to ? 21.5v, i o = 100ma, f = 120hz, t a = 25 c v 1.1 ma 50 ma 1000 v i = ? 35v, t j = 25 c 10 ? 0.6 i o = 5ma, t j = 0 to 125 c note 1) the specified condition t j = 25 c means that the test should be carried out within so short a test time (within 10ms) that the characteristic value drift due to the chip junction temperature rise can be ignored. note 2) unless otherwise specified, v i = ? 14v, i o = 350ma, c i = 2 f, c o = 1 f and t j = 0 to 125 c * an79m08: 15w, an79m08f: 10.25w v i = ? 10.5 to ? 25v, i o = 5 to 350ma, p d * t j = 25 c t j = 25 c t j = 25 c t j = 25 c mv/ c ? i bias(in) ? i bias(l) v v dif(min) i o(short) i o(peak) ? v o /t a output voltage output voltage tolerance line regulation load regulation bias current bias current fluctuation to load output noise voltage ripple rejection ratio minimum input/output voltage difference output short-circuit current peak output current output voltage temperature coefficient parameter symbol conditions min typ max unit bias current fluctuation to input v o ? 9.35 v ? 9 v o v reg in 80 mv 7 v i = ? 11.5 to ? 26v, t j = 25 c mv reg l mv 25 i o = 5 to 500ma, t j = 25 c mv i o = 5 to 350ma, t j = 25 c v i = ? 12 to ? 22v, t j = 25 c ma 2 2 i bias ma v i = ? 11.5 to ? 26v, t j = 25 c ma 225 i o = 5 to 350ma, t j = 25 c v no db f = 10hz to 100khz, t a = 25 c 0.8 0.4 50 ? 9.45 180 90 4 58 ? 8.65 ? 8.55 rr v i = ? 12 to ? 22v, i o = 100ma, f = 120hz, t a = 25 c v 1.1 ma 50 ma 1000 v i = ? 35v, t j = 25 c 10 ? 0.6 i o = 5ma, t j = 0 to 125 c ( yp ) note 1) the specified condition t j = 25 c means that the test should be carried out within so short a test time (within 10ms) that the characteristic value drift due to the chip junction temperature rise can be ignored. note 2) unless otherwise specified, v i = ? 15v, i o = 350ma, c i = 2 f, c o = 1 f and t j = 0 to 125 c * an79m09 : 15w, an79m09f : 10.25w v i = ? 11.5 to ? 26v, i o = 5 to 350ma, p d * t j = 25 c t j = 25 c t j = 25 c t j = 25 c mv/ c ? i bias(in) ? i bias(l) v v dif(min) i o(short) i o(peak) ? v o /t a output voltage output voltage tolerance line regulation load regulation bias current bias current fluctuation to input bias current fluctuation to load output noise voltage ripple rejection ratio minimum input/output voltage difference output short-circuit current peak output current output voltage temperature coefficient parameter symbol conditions min typ max unit maintenance/ discontinued maintenance/discontinued includes following four product lifecycle stage. planed maintenance type maintenance type planed discontinued typed discontinued type please visit following url about latest information. http://www.semicon.panasonic.co.jp/en/
voltage regulators an79mxx/an79mxxf series 5 electrical characteristics at t a = 25 c (continued) ? an79m10, an79m10f ( ? 10v type) ? an79m12, an79m12f ( ? 12v type) v o ? 10.4 v ? 10 v o v reg in 80 mv 7 v i = ? 12.5 to ? 27v, t j = 25 c mv reg l mv 25 i o = 5 to 500ma, t j = 25 c mv i o = 5 to 350ma, t j = 25 c v i = ? 13 to ? 23v, t j = 25 c ma 2 2 i bias ma v i = ? 12.5 to ? 27v, t j = 25 c ma 250 i o = 5 to 350ma, t j = 25 c v no db f = 10hz to 100khz, t a = 25 c 0.8 0.4 50 ? 10.5 200 100 4 58 ? 9.6 ? 9.5 rr v i = ? 13 to ? 23v, i o = 100ma, f = 120hz, t a = 25 c v 1.1 ma 50 ma 1000 v i = ? 35v, t j = 25 c 10 ? 0.7 i o = 5ma, t j = 0 to 125 c ( yp ) note 1) the specified condition t j = 25 c means that the test should be carried out within so short a test time (within 10ms) that the characteristic value drift due to the chip junction temperature rise can be ignored. note 2) unless otherwise specified, v i = ? 16v, i o = 350ma, c i = 2 f, c o = 1 f and t j = 0 to 125 c * an79m10: 15w, an79m10f: 10.25w v i = ? 12.5 to ? 27v, i o = 5 to 350ma, p d * t j = 25 c t j = 25 c t j = 25 c t j = 25 c mv/ c ? i bias(in) ? i bias(l) v v dif(min) i o(short) i o(peak) ? v o /t a output voltage output voltage tolerance line regulation load regulation bias current bias current fluctuation to load output noise voltage ripple rejection ratio minimum input/output voltage difference output short-circuit current peak output current output voltage temperature coefficient parameter symbol conditions min typ max unit bias current fluctuation to input v o ? 12.5 v ? 12 v o v reg in 80 mv 8 v i = ? 14.5 to ? 30v, t j = 25 c mv reg l mv 25 i o = 5 to 500ma, t j = 25 c mv i o = 5 to 350ma, t j = 25 c v i = ? 15 to ? 25v, t j = 25 c ma 2 2 i bias ma v i = ? 14.5 to ? 30v, t j = 25 c ma 300 i o = 5 to 350ma, t j = 25 c v no db f = 10hz to 100khz, t a = 25 c 0.8 0.4 50 ? 12.6 240 120 4 57 ? 11.5 ? 11.4 rr v i = ? 15 to ? 25v, i o = 100ma, f = 120hz, t a = 25 c v 1.1 ma 50 ma 1000 v i = ? 35v, t j = 25 c 10 ? 0.8 i o = 5ma, t j = 0 to 125 c note 1) the specified condition t j = 25 c means that the test should be carried out within so short a test time (within 10ms) that the characteristic value drift due to the chip junction temperature rise can be ignored. note 2) unless otherwise specified, v i = ? 19v, i o = 350ma, c i = 2 f, c o = 1 f and t j = 0 to 125 c * an79m12: 15w, an79m12f: 10.25w v i = ? 14.5 to ? 30v, i o = 5 to 350ma, p d * t j = 25 c t j = 25 c t j = 25 c t j = 25 c mv/ c ? i bias(in) ? i bias(l) v v dif(min) i o(short) i o(peak) ? v o /t a output voltage output voltage tolerance line regulation load regulation bias current bias current fluctuation to load output noise voltage ripple rejection ratio minimum input/output voltage difference output short-circuit current peak output current output voltage temperature coefficient parameter symbol conditions min typ max unit bias current fluctuation to input maintenance/ discontinued maintenance/discontinued includes following four product lifecycle stage. planed maintenance type maintenance type planed discontinued typed discontinued type please visit following url about latest information. http://www.semicon.panasonic.co.jp/en/
an79mxx/an79mxxf series voltage regulators 6 electrical characteristics at t a = 25 c (continued) ? an79m15, an79m15f ( ? 15v type) ? an79m18, an79m18f ( ? 18v type) v o ? 15.6 v ? 15 v o v reg in 80 mv 10 v i = ? 17.5 to ? 30v, t j = 25 c mv reg l mv 25 i o = 5 to 500ma, t j = 25 c mv i o = 5 to 350ma, t j = 25 c v i = ? 18 to ? 28v, t j = 25 c ma 2 3 i bias ma v i = ? 17.5 to ? 30v, t j = 25 c ma 375 i o = 5 to 350ma, t j = 25 c v no db f = 10hz to 100khz, t a = 25 c 0.8 0.4 50 ? 15.75 240 120 4 56 ? 14.4 ? 14.25 rr v i = ? 18 to ? 28v, i o = 100ma, f = 120hz, t a = 25 c v 1.1 ma 50 ma 1000 v i = ? 35v, t j = 25 c 10 ? 0.9 i o = 5ma, t j = 0 to 125 c note 1) the specified condition t j = 25 c means that the test should be carried out within so short a test time (within 10ms) that the characteristic value drift due to the chip junction temperature rise can be ignored. note 2) unless otherwise specified, v i = ? 23v, i o = 350ma, c i = 2 f, c o = 1 f and t j = 0 to 125 c * an79m15: 15w, an79m15f: 10.25w v i = ? 17.5 to ? 30v, i o = 5 to 350ma, p d * t j = 25 c t j = 25 c t j = 25 c t j = 25 c mv/ c ? i bias(in) ? i bias(l) v v dif(min) i o(short) i o(peak) ? v o /t a output voltage output voltage tolerance line regulation load regulation bias current bias current fluctuation to load output noise voltage ripple rejection ratio minimum input/output voltage difference output short-circuit current peak output current output voltage temperature coefficient parameter symbol conditions min typ max unit bias current fluctuation to input v o ? 18.7 v ? 18 v o v reg in 80 mv 10 v i = ? 21 to ? 33v, t j = 25 c mv reg l mv 30 i o = 5 to 500ma, t j = 25 c mv i o = 5 to 350ma, t j = 25 c v i = ? 22 to ? 32v, t j = 25 c ma 2 5 i bias ma v i = ? 21 to ? 33v, t j = 25 c ma 450 i o = 5 to 350ma, t j = 25 c v no db f = 10hz to 100khz, t a = 25 c 0.8 0.4 50 ? 18.9 300 150 4 55 ? 17.3 ? 17.1 rr v i = ? 22 to ? 32v, i o = 100ma, f = 120hz, t a = 25 c v 1.1 ma 50 ma 1000 v i = ? 35v, t j = 25 c 10 ? 1 i o = 5ma, t j = 0 to 125 c ( yp ) note 1) the specified condition t j = 25 c means that the test should be carried out within so short a test time (within 10ms) that the characteristic value drift due to the chip junction temperature rise can be ignored. note 2) unless otherwise specified, v i = ? 27v, i o = 350ma, c i = 2 f, c o = 1 f and t j = 0 to 125 c * an79m18: 15w, an79m18f: 10.25w v i = ? 21 to ? 33v, i o = 5 to 350ma, p d * t j = 25 c t j = 25 c t j = 25 c t j = 25 c mv/ c ? i bias(in) ? i bias(l) v v dif(min) i o(short) i o(peak) ? v o /t a output voltage output voltage tolerance line regulation load regulation bias current bias current fluctuation to load output noise voltage ripple rejection ratio minimum input/output voltage difference output short-circuit current peak output current output voltage temperature coefficient parameter symbol conditions min typ max unit bias current fluctuation to input maintenance/ discontinued maintenance/discontinued includes following four product lifecycle stage. planed maintenance type maintenance type planed discontinued typed discontinued type please visit following url about latest information. http://www.semicon.panasonic.co.jp/en/
voltage regulators an79mxx/an79mxxf series 7 electrical characteristics at t a = 25 c (continued) ? an79m20, an79m20f ( ? 20v type) ? an79m24, an79m24f ( ? 24v type) v o ? 20.8 v ? 20 v o v reg in 80 mv 10 v i = ? 23 to ? 35v, t j = 25 c mv reg l mv 30 i o = 5 to 500ma, t j = 25 c mv i o = 5 to 350ma, t j = 25 c v i = ? 24 to ? 34v, t j = 25 c ma 2 5 i bias ma v i = ? 23 to ? 35v, t j = 25 c ma 500 i o = 5 to 350ma, t j = 25 c v no db f = 10hz to 100khz, t a = 25 c 0.8 0.4 50 ? 21 300 150 4 54 ? 19.2 ? 19 rr v i = ? 24 to ? 34v, i o = 100ma, f = 120hz, t a = 25 c v 1.1 ma 50 ma 1000 v i = ? 35v, t j = 25 c 10 ? 1 i o = 5ma, t j = 0 to 125 c note 1) the specified condition t j = 25 c means that the test should be carried out within so short a test time (within 10ms) that the characteristic value drift due to the chip junction temperature rise can be ignored. note 2) unless otherwise specified, v i = ? 29v, i o = 350ma, c i = 2 f, c o = 1 f and t j = 0 to 125 c * an79m20: 15w, an79m20f: 10.25w v i = ? 23 to ? 35v, i o = 5 to 350ma, p d * t j = 25 c t j = 25 c t j = 25 c t j = 25 c mv/ c ? i bias(in) ? i bias(l) v v dif(min) i o(short) i o(peak) ? v o /t a output voltage output voltage tolerance line regulation load regulation bias current bias current fluctuation to load output noise voltage ripple rejection ratio minimum input/output voltage difference output short-circuit current peak output current output voltage temperature coefficient parameter conditions min typ max unit bias current fluctuation to input symbol v o ? 25 v ? 24 v o v reg in 80 mv 10 v i = ? 27 to ? 38v, t j = 25 c mv reg l mv 30 i o = 5 to 500ma, t j = 25 c mv i o = 5 to 350ma, t j = 25 c v i = ? 27 to ? 37v, t j = 25 c ma 2 5 i bias ma v i = ? 27 to ? 38v, t j = 25 c ma 600 i o = 5 to 350ma, t j = 25 c v no db f = 10hz to 100khz, t a = 25 c 0.8 0.4 70 ? 25.2 300 150 4 54 ? 23 ? 22.8 rr v i = ? 28 to ? 38v, i o = 100ma, f = 120hz, t a = 25 c v 1.1 ma 50 ma 1000 v i = ? 35v, t j = 25 c 10 ? 1 i o = 5ma, t j = 0 to 125 c ( yp ) note 1) the specified condition t j = 25 c means that the test should be carried out within so short a test time (within 10ms) that the characteristic value drift due to the chip junction temperature rise can be ignored. note 2) unless otherwise specified, v i = ? 33v, i o = 350ma, c i = 2 f, c o = 1 f and t j = 0 to 125 c * an79m24 : 15w, an79m24f : 10.25w v i = ? 27 to ? 38v, i o = 5 to 350ma, p d * t j = 25 c t j = 25 c t j = 25 c t j = 25 c mv/ c ? i bias(in) ? i bias(l) v v dif(min) i o(short) i o(peak) ? v o /t a output voltage output voltage tolerance line regulation load regulation bias current bias current fluctuation to load output noise voltage ripple rejection ratio minimum input/output voltage difference output short-circuit current peak output current output voltage temperature coefficient parameter symbol conditions min typ max unit bias current fluctuation to input maintenance/ discontinued maintenance/discontinued includes following four product lifecycle stage. planed maintenance type maintenance type planed discontinued typed discontinued type please visit following url about latest information. http://www.semicon.panasonic.co.jp/en/
an79mxx/an79mxxf series voltage regulators 8 main characteristics 120 100 80 60 40 20 0 10 100 an79m05/f i o = 100ma 1k 10k 100k frequency f (hz) ripple rejection ratio rr (db) rr ? f 0246810 20 15 10 5 an79m05/f 0 1020304050 1 0 ? 1 ? 2 1.0 0.5 0 an79m05/f 1.4 1.2 1.0 0.8 0.6 0.4 ? 50 0 50 100 150 i o = 500ma i o = 200ma i o = 100ma i o = 10ma an79m05/f p d ? t a (an79mxx series) p d ? t a (an79mxxf series) v dif(min) ? t j 10 0 ? 10 ? 20 (1) (2) (3) (4) 0 25 50 75 100 125 150 0 2 4 6 8 10 12 14 16 0 25 50 75 100 125 150 0 2 4 6 8 10 12 14 16 (1) (2) (3) (4) ambient temperature t a ( c ) power dissipation p d ( w ) thermal resistance value: r th(j-c) = 5 c/w (max.) r th(j-a) = 65 c/w (max.) installation condition to heat sink tightening torque 6kgcm heat radiation compound used (1) infinite heat sink: 15.0w (2) 5 c/w heat sink: 12.5w (3) 15 c/w heat sink: 6.3w (4) without heat sink: 1.923w ambient temperature t a ( c ) power dissipation p d ( w ) thermal resistance value: r th(j-c) = 12.2 c/w (max.) r th(j-a) = 65 c/w (max.) installation condition to heat sink tightening torque 6kgcm heat radiation compound used (1) infinite heat sink: 10.25w (2) 5 c/w heat sink: 7.3w (3) 15 c/w heat sink: 4.5w (4) without heat sink: 1.923w junction temperature t j ( c) minimum input/output voltage difference v dif(min) (v) time t ( s) output voltage fluctuation (mv) input voltage v i (v) input transient response time t ( s) output voltage fluctuation (v) load current i o (a) load transient response maintenance/ discontinued maintenance/discontinued includes following four product lifecycle stage. planed maintenance type maintenance type planed discontinued typed discontinued type please visit following url about latest information. http://www.semicon.panasonic.co.jp/en/
voltage regulators an79mxx/an79mxxf series 9 usage notes 1. cautions for a basic circuit c i : when a wiring from a smoothing circuit to a three-pin regulator is long, it is likely to oscillate at output. a capacitor of 0.1 f to 0.47 f should be connected near an input pin. c o : deadly needed to prevent from oscillation (0.33 f to 1.0 f). it is recommended to use a capacitor of a small internal imped- ance (ex. tantalum capacitor) when using it under a low tem- perature. when any sudden change of load current is likely to occur, con- nect an electrolytic capacitor of 10 f to 100 f to improve a transitional response of output voltage. d i : normally unnecessary. but add it in the case that there is a residual voltage at the output capacitor co even after switching off the supply power because a current is likely to flow into an output pin of the ic and damage the ic. 2. other caution items 1) short-circuit between the input pin and gnd pin if the input pin is short-circuitted to gnd or is cut off when a large capacitance capacitor has been con- nected to the ic's load, a voltage of a capacitor con- nected to an output pin is applied between input/out- put of the ic and this likely results in damage of the ic. it is necessary, therefore, to connect a diode, as shown in figure 2, to counter the reverse bias between input/output pins. 2) floating of gnd pin if a gnd pin is made floating in an operating mode, an unstabilized input voltage is outputted. in this case, a thermal protection circuit inside the ic does not normally operate. in this state, if the load is short-circuited or overloaded, it is likely to damage the ic. application circuit example figure 1 c o v o c i v i d i 1 3 2 in gnd out output figure 2 c o 1 3 2 ? + an78mxx an78mxxf an79mxx an79mxxf 1 f 0.1 f 0.3 f 2 f common common common ct input output input output ? v o + v o ? + ? + basic regulator circuit connect c i of 2 f when the input line is long. c o improves the transient response. 1 f c o ? v o c i ? v i input output 2 an79mxx an79mxxf common 3 1 ? + ? + maintenance/ discontinued maintenance/discontinued includes following four product lifecycle stage. planed maintenance type maintenance type planed discontinued typed discontinued type please visit following url about latest information. http://www.semicon.panasonic.co.jp/en/
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