this specification documents the detailed requirements for analog devices space qualified die including die qualification as described for class k in mil - pr f - 38534, appendix c, table c - ii except as modified herein. the manufacturing flow descri bed in the standard die products program brochure at http://www.analog.com/marketsolutions/militaryaerospace/pdf/die_broc.pdf is to be considered a part of this speci fication. t his data sheet specifically details the space grade version of this produc t. a more detailed operational description and a complete data sheet for commercial product grades can be found at www.analog.c om/amp01 the complete part number(s) of this specification follow: part number description amp01 - 000c low - noise precision instrumentation amplifier ma ke no electrical connection to unlabeled pads.
supply voltage (v s ) ................................ ................................ ... 18v dc common mode input voltage ................................ ................. supply voltage differential input voltage: r g ? 2k ? ................................ ................................ ...... 20v dc r g ? 2k ? ................................ ................................ ...... 10v dc output shor t circuit duration ................................ .................... indefinite storage temperature range ................................ .................... - 65 ? c to +150 ? c ambient operating temperature range ................................ ... - 55 ? c to +125 ? c junction temperature (t j )................................................... ....... +150c absolute maximum ratings notes : 1 / stresses above the absolute maximum rating may cause permane nt damage to the device. extended operation at the maximum levels may degrade performance and affect re liability. in accord ance with class - k version of mil - prf - 385 34, appendix c, table c - ii, except as modified herein. (a) qual samples size and qual acceptance criteria C 25/2 (b) qual sample package C dip (c) pre - screen electrical test over temperature performed post - assembly prior to die qualification .
table i notes: 1 / v s = 15v, r s = 10k ? , r l = 2k ? , t a = 25 c, unless otherwise specified.
table ii notes: 1/ v s = 15v, r s = 100 ? , r l = 2k ? , unless otherwise specified. 2/ g = 20r s /r g , accuracy measured at g = 1, 10, 100, and 1000 .
5.1 htrb is not applicable for this drawing. 5.2 burn - in is per mil - std - 883 method 1015 test condition b. 5.3 steady state life test is per mil - std - 883 method 1005.
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