doc. no : qw0905-lwk2043/p1 rev. : d date : 31 - may. - 2005 data sheet lwk2043/p1 round type led lamps ligitek electronics co.,ltd. property of ligitek only
directivity radiation note : 1.all dimension are in millimeter tolerance is ? 0.25mm unless otherwise noted. 2.specifications are subject to change without notice. part no. lwk2043/p1 page 1/5 package dimensions ligitek electronics co.,ltd. property of ligitek only 1.5max 25.0min 10.55 ? 0.5 2.54typ 1.0min ?? 0.5 typ 3.0 4.0 5.2 4.2
ligitek electronics co.,ltd. property of ligitek only absolute maximum ratings at ta=25 j typical electrical & optical characteristics (ta=25 j ) note : 1.the forward voltage data did not including ? 0.1v testing tolerance. 2. the luminous intensity data did not including ? 15% testing tolerance. tstg storage temperature part no material lwk2043/p1 emitted ingan/gan white water clear lens color soldering temperature tsol part no. lwk2043/p1 i f forward current operating temperature reverse current @5v power dissipation peak forward current duty 1/10@10khz topr ir pd i fp parameter symbol -30~ +100 luminous intensity @20ma(mcd) viewing angle 2 c 1/2 (deg) forward voltage @20ma(v) 4.0 3.5 max. 3400 1100 30 min. typ. max 260 j for 5 sec max (2mm from body) j page 2/5 30 ma -20~ +80 50 j g a 120 100 ma mw wk ratings unit chromaticity coordinates x y 0.28 0.28 v 150 esd electrostatic discharge typ.
0.400 0.35 0.360 0.35 0.345 0.34 0.385 0.34 0.385 0.34 0.345 0.34 0.330 0.33 0.370 0.33 0.370 0.33 0.330 0.33 0.315 0.32 0.355 0.32 0.355 0.32 0.315 0.32 0.300 0.31 0.340 0.31 0.26 0.265 0.26 0.225 0.27 0.240 0.27 0.280 0.27 0.280 0.27 0.240 0.28 0.255 0.28 0.295 0.28 0.295 0.28 0.255 0.29 0.270 0.29 0.310 0.29 0.310 0.29 0.270 0.30 0.285 0.30 0.325 0.30 0.325 0.30 0.285 0.31 0.300 0.31 0.340 0.265 0.26 0.225 0.26 0.210 0.25 0.250 0.25 0.250 0.25 0.210 0.25 0.195 0.24 0.235 0.24 0.235 0.24 0.195 0.24 0.180 0.23 0.220 0.23 0.220 0.23 0.180 0.23 0.165 0.22 0.205 0.22 0.205 0.22 0.165 0.22 0.150 0.21 0.190 0.21 b5 a5 c4 b4 a4 c3 b3 a3 a2 b2 c2 c1 b1 y x x y ligitek electronics co.,ltd. property of ligitek only part no. lwk2043/p1 page 3/5 bin bin y bin a1 . chromaticity coordinates specifications for bin grading x . cie chromaticity diagram
fig.5 luminous spectrum(ta=25 j ) typical electro-optical characteristics curve 1.0 3.0 4.0 0 1 intensity wavelength (nm) 0.5 relative intensity@20ma normalize @25 j forward voltage@20ma normalize @25 j 20 ambient temperature( j ) ambient temperature( j ) 0 -20 -40 0.8 0 -40 -20 100 80 60 40 20 0.0 60 100 80 40 fig.4 relative intensity vs. temperature 2.5 1.0 0.9 1.1 1.5 1.0 2.0 fig.3 forward voltage vs. temperature 1.2 3.0 relative intensity normalize @20ma forward current(ma) forward current(ma) forward voltage(v) 2.0 5.0 1 10 0.0 0.5 1.0 1.5 2.0 100 1000 fig.2 relative intensity vs. forward current fig.1 forward current vs. forward voltage 2.5 3.0 1 10 100 1000 wk chip spectral radiance 80 400 500 600 40 20 60 100 700 800 0 page 4/5 ligitek electronics co.,ltd. property of ligitek only
mil-std-202:103b jis c 7021: b-11 mil-std-202: 208d mil-std-750: 2026 mil-std-883: 2003 jis c 7021: a-2 mil-std-202: 210a mil-std-750: 2031 jis c 7021: a-1 mil-std-202: 107d mil-std-750: 1051 mil-std-883: 1011 1.t.sol=260 j? 5 j 2.dwell time= 10 ? 1sec. this test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. solderability test 1.t.sol=230 j? 5 j 2.dwell time=5 ? 1sec this test intended to see soldering well performed or not. 1.ta=105 j? 5 j &-40 j? 5 j (10min) (10min) 2.total 10 cycles solder resistance test thermal shock test high temperature high humidity test 1.ta=65 j? 5 j 2.rh=90 %~95 % 3.t=240hrs ? 2hrs the purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. the purpose of this test is the resistance of the device under tropical for hous. part no. lwk2043/p1 reliability test: page 5/5 reference standard mil-std-750: 1026 mil-std-883: 1005 jis c 7021: b-1 jis c 7021: b-12 mil-std-883:1008 jis c 7021: b-10 1.under room temperature 2.if=20ma 3.t=1000 hrs (-24hrs, + 72hrs) this test is conducted for the purpose of detemining the resisance of a part in electrical and themal stressed. low temperature storage test 1.ta=-40 j? 5 j 2.t=1000 hrs (-24hrs, + 72hrs) high temperature storage test operating life test 1.ta=105 j? 5 j 2.t=1000 hrs (-24hrs, + 72hrs) the purpose of this is the resistance of the device which is laid under ondition of high temperature for hours. the purpose of this is the resistance of the device which is laid under condition of low temperature for hours. test item test condition description ligitek electronics co.,ltd. property of ligitek only
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